14 research outputs found

    The Rate of Charge Tunneling Is Insensitive to Polar Terminal Groups in Self-Assembled Monolayers in Ag TS S(CH 2 ) n M(CH 2 ) m T//Ga 2 O 3 /EGaIn Junctions

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    This paper describes a physical‐organic studyof the effect of uncharged, polar, functional groups on the rate of charge transport by tunneling across self‐assembled monolayer (SAM)‐based large‐area junctions of the form AgTSS(CH2)nM(CH2)mT//Ga2O3/EGaIn. Here AgTS is a template‐stripped silver substrate, ‐M‐ and ‐T are “middle” and “terminal” functional groups, and EGaIn is eutectic galliumindium alloy. A range of uncharged polar groups (‐T), having permanent dipole moments in the range 0.5 < μ <4.5, were incorporated into the SAM. A comparison of the electrical characteristics of these junctions with junctions formed from n‐alkanethiolates led to the conclusion that the rates of charge tunneling are insensitive to the replacement of terminal alkyl groups with terminal polar groups. The current densities measured in this work suggest that the tunneling decay parameter (β) and injection current (Jo) for SAMs terminated in non‐polar n‐alkyl groups, and polar groups, are statistically indistinguishable.Chemistry and Chemical Biolog

    Fluorination, and Tunneling across Molecular Junctions

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    This paper describes the influence of the substitution of fluorine for hydrogen on the rate of charge transport by hole tunneling through junctions of the form AgTSO2C(CH2)n(CF2)mT//Ga2O3/EGaIn, where T is methyl (CH3) or trifluoromethyl (CF3). Alkanoate-based self-assembled monolayers (SAMs) having perfluorinated groups (RF) show current densities that are lower (by factors of 20–30) than those of the homologous hydrocarbons (RH), while the attenuation factors of the simplified Simmons equation for methylene (β = (1.05 ± 0.02)nCH2–1) and difluoromethylene (β = (1.15 ± 0.02)nCF2–1) are similar (although the value for (CF2)n is statistically significantly larger). A comparative study focusing on the terminal fluorine substituents in SAMs of ω-tolyl- and -phenyl-alkanoates suggests that the C–F//Ga2O3 interface is responsible for the lower tunneling currents for CF3. The decrease in the rate of charge transport in SAMs with RF groups (relative to homologous RH groups) is plausibly due to an increase in the height of the tunneling barrier at the T//Ga2O3 interface, and/or to weak van der Waals interactions at that interface.Chemistry and Chemical Biolog

    Odd–Even Effects in Charge Transport across n -Alkanethiolate-Based SAMs

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    This paper compares rates of charge transport across self-assembled monolayers (SAMs) of n-alkanethiolates having odd and even numbers of carbon atoms (nodd and neven) using junctions with the structure MTS/SAM//Ga2O3/EGaIn (M = Au or Ag). Measurements of current density, J(V), across SAMs of n-alkanethiolates on AuTS and AgTS demonstrated a statistically significant odd–even effect on AuTS, but not on AgTS, that could be detected using this technique. Statistical analysis showed the values of tunneling current density across SAMs of n-alkanethiolates on AuTS with nodd and neven belonging to two separate sets, and while there is a significant difference between the values of injection current density, J0, for these two series (log|J0Au,even| = 4.0 ± 0.3 and log|J0Au,odd| = 4.5 ± 0.3), the values of tunneling decay constant, β, for nodd and neven alkyl chains are indistinguishable (βAu,even = 0.73 ± 0.02 Å–1, and βAu,odd= 0.74 ± 0.02 Å–1). A comparison of electrical characteristics across junctions of n-alkanethiolate SAMs on gold and silver electrodes yields indistinguishable values of β and J0 and indicates that a change that substantially alters the tilt angle of the alkyl chain (and, therefore, the thickness of the SAM) has no influence on the injection current density across SAMs of n-alkanethiolates.Chemistry and Chemical Biolog

    Formation of highly ordered self-assembled monolayers of alkynes on Au(111) substrate

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    Self-assembled monolayers (SAMs), prepared by reaction of terminal n-alkynes (HC≡C(CH2)nCH3, n = 5, 7, 9, and 11) with Au(111) at 60 °C were characterized using scanning tunneling microscopy (STM), infrared reflection absorption spectroscopy (IRRAS), X-ray photoelectron spectroscopy (XPS), and contact angles of water. In contrast to previous spectroscopic studies of this type of SAMs, these combined microscopic and spectroscopic experiments confirm formation of highly ordered SAMs having packing densities and molecular chain orientations very similar to those of alkanethiolates on Au(111). Physical properties, hydrophobicity, high surface order, and packing density, also suggest that SAMs of alkynes are similar to SAMs of alkanethiols. The formation of high-quality SAMs from alkynes requires careful preparation and manipulation of reactants in an oxygen-free environment; trace quantities of O2 lead to oxidized contaminants and disordered surface films. The oxidation process occurs during formation of the SAM by oxidation of the −C≡C– group (most likely catalyzed by the gold substrate in the presence of O2)

    Influence of the Contact Area on the Current Density across Molecular Tunneling Junctions Measured with EGaIn Top-Electrodes

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    This paper describes the relationship between the rates of charge transport (by tunneling) across self-assembled monolayers (SAMs) in a metal/SAM//Ga<sub>2</sub>O<sub>3</sub>/EGaIn junction and the geometric contact area (<i>A</i><sub>g</sub>) between the conical Ga<sub>2</sub>O<sub>3</sub>/EGaIn top-electrode and the bottom-electrode. Measurements of current density, <i>J</i>(<i>V</i>), across SAMs of decanethiolate on silver demonstrate that <i>J</i>(<i>V</i>) increases with <i>A</i><sub>g</sub> when the contact area is small (<i>A</i><sub>g</sub> < 1000 μm<sup>2</sup>), but reaches a plateau between 1000 and 4000 μm<sup>2</sup>, where <i>J</i>(0.5 V) ≈ 10<sup>–0.52±0.10</sup> A/cm<sup>2</sup>. The method used to fabricate Ga<sub>2</sub>O<sub>3</sub>/EGaIn electrodes generates a tip whose apex is thicker and rougher than its thin, smoother sides. When <i>A</i><sub>g</sub> is small, the Ga<sub>2</sub>O<sub>3</sub>/EGaIn electrode contacts the bottom-electrode principally over this rough apex and forms irreproducible areas of electrical contact. When <i>A</i><sub>g</sub> is large, the contact is through the smoother regions peripheral to the apex and is much more reproducible. Measurements of contact pressure between conical EGaIn electrodes and atomic force microscope cantilevers demonstrate that the nominal contact pressure (governed by the mechanical behavior of the oxide skin) decreases approximately inversely with the diameter of geometric contact. This self-regulation of pressure prevents damage to the SAM and makes the ratio of electrical contact area to geometric footprint approximately constant
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