10 research outputs found

    Experimental study of the sensitivity of a porous silicon ring resonator sensor using continuous in-flow measurements

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    A highly sensitive photonic sensor based on a porous silicon ring resonator was developed and experimentally characterized. The photonic sensing structure was fabricated by exploiting a porous silicon double layer, where the top layer of a low porosity was used to form photonic elements by e-beam lithography and the bottom layer of a high porosity was used to confine light in the vertical direction. The sensing performance of the ring resonator sensor based on porous silicon was compared for the different resonances within the analyzed wavelength range both for transverse-electric and transverse-magnetic polarizations. We determined that a sensitivity up to 439 nm/RIU for low refractive index changes can be achieved depending on the optical field distribution given by each resonance/polarization

    Tip-mould microcontact printing for functionalisation of optical microring resonator

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    We present an approach to functionalise optical microring resonators as hybridisation platforms, using tip-mould reactive microcontact printing process. Derived from reactive microcontact printing using an ad hoc mould of polydimethylsiloxane (PDMS), the method functionalises single microring resonator with a target-specific capture agent. The authors report the functionalisation of silicon nitride (SiN) 200 ÎŒm diameter microring resonator with single-strand DNA and the hybridisation detection of 100 nM target analyte, while concurrently monitoring not-functionalised microring as a control sensor. Results show that the functionalisation approach permits to address single microring resonators with mutual distance lower than 100 ÎŒm with high precision, enabling a better integration of multiple spotting zones on the chip concerning traditional functionalisation procedures

    Optomechanical Modulation Spectroscopy of Bound States in the Continuum in a Dielectric Metasurface

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    Elusive features in photonic and electronic devices can be detected by means of advanced, time-domain spectroscopic techniques. In this paper we introduce a modulation spectroscopy based on the optomechanical interaction of photonic and mechanical modes. Applying the technique to a Si metasurface and its drumlike mechanical modes, we detect narrow-band quasi-bound-state-in-the-continuum (quasi-BIC) modes close to normal incidence, where their measurement can be hindered by a high-symmetry protection and undesired background modes. Showing a visibility enhancement of more than one order of magnitude, the optomechanical modulation spectroscopy can be an innovative tool for precise spectroscopy of a wide set of photonic devices, including the goal of measuring purely symmetry protected BIC resonances

    Optomechanical Modulation Spectroscopy of Bound-States-In-The-Continuum in a dielectric metasurface

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    Elusive features in photonic and electronic devices can be detected by means of advanced, time-domain spectroscopic techniques. In this letter we introduce a novel kind of modulation spectroscopy, based on the optomechanical interaction of photonic and mechanical modes. Applying the technique to a Si metasurface and its drum-like mechanical modes, we detect narrow-band quasi-Bound-State-in-the-Continuum (q-BIC) modes close to normal incidence, where their measurement can be hindered by a high symmetry protection and undesired background modes. Showing a visibility enhancement of more than one order of magnitude, the optomechanical modulation spectroscopy can be an innovative tool for precise spectroscopy of a wide set of photonic devices, including the goal of measuring purely symmetry protected BIC resonances.Comment: 7 pages, 4 figure
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