Characterization of interdiffusion around miscibility gap of lattice matched InGaAs/InP quantum wells by high resolution x-ray diffraction

Copyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. This article appeared in Journal of Applied Physics 101, 013502 (2007) and may be found at

A one-dimensional Fourier analogue computer and its application to the refinement of the structure of cubanite

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Geology, 1954.Vita.Includes bibliographical references (leaves 64-67).Leonid V. Azároff.Ph.D

The minimum crystal size needed for a complete diffraction data set

A formula for absolute scattering power is derived to include spot fading arising from radiation damage and the crystal volume needed to collect diffraction data to a given resolution is calculated

Two-Crystal X-Ray Spectrometer Attachment

AbstractA two-crystal spectrometer that makes full use of conventional diffractometet: or spectrometer motions has been constructed so that it can be easily attached to a commercial instrument. The requisite degree of parallelism of the two crystalrotation axes is maintained by keeping both parallel to a single ground surface. Special alignment aids have been constructed to facilitate the rapid alignment of the instrument, which can be operated manually in 1″ intervals or used for automatic scanning in steps of 0.01°. Some guide lines for comparing the relative performance of spectrometers in X-ray absorption spectroscopy are suggested.</jats:p