Low-temperature oxidation effects on the morphological and structural properties of hexagonal Zn nanodisks

Ambient-atmosphere oxidation in the temperature range of 90-450 C was performed over Zn films composed by well-faceted hexagonal nanodisks, which were deposited by thermal evaporation. Morphological and structural properties of oxidized Zn nanodisks were studied by scanning electron microscopy, transmission electron microscopy, energy dispersive spectroscopy, X-ray diffraction, and Raman scattering measurements. It was found that Zn nanodisks keep its original shape only when they are annealed at 90 or 150 C. Smooth oxidation ocurred only on the rectangular faces of Zn nandodisks heated at 150 C. Thermal oxidation at 250 C favored growth of ZnO nanoneedles over the surface of the Zn nanodisks. Hexagonal-shape of Zn nanodisks was transformed completely into a complex morphology composed by different shaped particles, with further increase in oxidation temperature to 450 C