99 research outputs found

    Microwave and Millimeter-Wave Signal Power Generation

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    Analog hardware security and hardware authentication

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    Hardware security and hardware authentication have become more and more important concerns in the manufacture of trusted integrated circuits. In this dissertation, a detailed study of hardware Trojans in analog circuits characterized by the presence of extra operating points or modes is presented. In a related study, a counterfeit countermeasure method based upon PUF authentication circuits is proposed for addressing the growing proliferation of counterfeit integrated circuits in the supply chain. Most concerns about hardware Trojans in semiconductor devices are based upon an implicit assumption that attackers will focus on embedding Trojans in digital hardware by making malicious modifications to the Boolean operation of a circuit. In stark contrast, hardware Trojans can be easily embedded in some of the most basic analog circuits. In this work, a particularly insidious class of analog hardware Trojans that require no architectural modifications, no area or power overhead, and prior to triggering, that leave no signatures in any power domains or delay paths is introduced. The Power/Architecture/Area/Signature Transparent (PAAST) characteristics help the Trojan “hide” and make them very difficult to detect with existing hardware Trojan detection methods. Cleverly hidden PAAST Trojans are nearly impossible to detect with the best simulation and verification tools, even if a full and accurate disclosure of the circuit schematic and layout is available. Aside from the work of the author of this dissertation and her classmates, the literature is void of discussions of PAAST analog hardware Trojans. In this work, examples of circuits showing the existence of PAAST analog hardware Trojans are given, the PAAST characteristics of these types of hardware Trojans are discussed, and heuristic detection methods that can help to detect these analog hardware Trojans are proposed. Another major and growing problem in the modern IC supply chain is the proliferation of counterfeit chips that are often characterized by different or inferior performance characteristics and reduced reliability when compared with authentic parts. A counterfeit countermeasure method is proposed that should lower the entry barrier for major suppliers of commercial off the shelf (COTS) parts to offer authenticated components to the military and other customers that have high component reliability requirements. The countermeasure is based upon a PUF authentication circuit that requires no area, pin, or power overhead, and causes no degradation of performance of existing and future COTS components

    Cumulative index to NASA Tech Briefs, 1986-1990, volumes 10-14

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    Tech Briefs are short announcements of new technology derived from the R&D activities of the National Aeronautics and Space Administration. These briefs emphasize information considered likely to be transferrable across industrial, regional, or disciplinary lines and are issued to encourage commercial application. This cumulative index of Tech Briefs contains abstracts and four indexes (subject, personal author, originating center, and Tech Brief number) and covers the period 1986 to 1990. The abstract section is organized by the following subject categories: electronic components and circuits, electronic systems, physical sciences, materials, computer programs, life sciences, mechanics, machinery, fabrication technology, and mathematics and information sciences

    Radar Technology

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    In this book “Radar Technology”, the chapters are divided into four main topic areas: Topic area 1: “Radar Systems” consists of chapters which treat whole radar systems, environment and target functional chain. Topic area 2: “Radar Applications” shows various applications of radar systems, including meteorological radars, ground penetrating radars and glaciology. Topic area 3: “Radar Functional Chain and Signal Processing” describes several aspects of the radar signal processing. From parameter extraction, target detection over tracking and classification technologies. Topic area 4: “Radar Subsystems and Components” consists of design technology of radar subsystem components like antenna design or waveform design

    NASA thesaurus. Volume 3: Definitions

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    Publication of NASA Thesaurus definitions began with Supplement 1 to the 1985 NASA Thesaurus. The definitions given here represent the complete file of over 3,200 definitions, complimented by nearly 1,000 use references. Definitions of more common or general scientific terms are given a NASA slant if one exists. Certain terms are not defined as a matter of policy: common names, chemical elements, specific models of computers, and nontechnical terms. The NASA Thesaurus predates by a number of years the systematic effort to define terms, therefore not all Thesaurus terms have been defined. Nevertheless, definitions of older terms are continually being added. The following data are provided for each entry: term in uppercase/lowercase form, definition, source, and year the term (not the definition) was added to the NASA Thesaurus. The NASA History Office is the authority for capitalization in satellite and spacecraft names. Definitions with no source given were constructed by lexicographers at the NASA Scientific and Technical Information (STI) Facility who rely on the following sources for their information: experts in the field, literature searches from the NASA STI database, and specialized references

    Applied Measurement Systems

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    Measurement is a multidisciplinary experimental science. Measurement systems synergistically blend science, engineering and statistical methods to provide fundamental data for research, design and development, control of processes and operations, and facilitate safe and economic performance of systems. In recent years, measuring techniques have expanded rapidly and gained maturity, through extensive research activities and hardware advancements. With individual chapters authored by eminent professionals in their respective topics, Applied Measurement Systems attempts to provide a comprehensive presentation and in-depth guidance on some of the key applied and advanced topics in measurements for scientists, engineers and educators
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