Optical anisotropy induced by ion bombardment of Ag(001)

Grazing incidence ion bombardment results in the formation of nanoripples that induce an anisotropic optical reflection The evolution of the reflectance anisotropy has been monitored in situ with reflectance anisotropy spectroscopy. The Rayleigh-Rice theory (RRT) has been used to analyze the optical spectra quantitatively and provides the evolution of the average ripple period and root-mean-squared surface roughness. After an incipient phase, both the increase in the periodicity and the roughness vary roughly with the square root of the sputter time. Additional high-resolution low-energy electron diffraction (HR-LEED) measurements have been performed to characterize details of the average structure created by ion bombardment

Surface evolution during crystalline silicon film growth by low-temperature hot-wire chemical vapor deposition on silicon substrates

We investigate the low-temperature growth of crystalline thin silicon films: epitaxial, twinned, and polycrystalline, by hot-wire chemical vapor deposition (HWCVD). Using Raman spectroscopy, spectroscopic ellipsometry, and atomic force microscopy, we find the relationship between surface roughness evolution and (i) the substrate temperature (230–350 °C) and (ii) the hydrogen dilution ratio (H2/SiH4=0–480). The absolute silicon film thickness for fully crystalline films is found to be the most important parameter in determining surface roughness, hydrogen being the second most important. Higher hydrogen dilution increases the surface roughness as expected. However, surface roughness increases with increasing substrate-temperature, in contrast to previous studies of crystalline Si growth. We suggest that the temperature-dependent roughness evolution is due to the role of hydrogen during the HWCVD process, which in this high hydrogen dilution regime allows for epitaxial growth on the rms roughest films through a kinetic growth regime of shadow-dominated etch and desorption and redeposition of growth species

Analysis of geologic terrain models for determination of optimum SAR sensor configuration and optimum information extraction for exploration of global non-renewable resources. Pilot study: Arkansas Remote Sensing Laboratory, part 1, part 2, and part 3

Computer-generated radar simulations and mathematical geologic terrain models were used to establish the optimum radar sensor operating parameters for geologic research. An initial set of mathematical geologic terrain models was created for three basic landforms and families of simulated radar images were prepared from these models for numerous interacting sensor, platform, and terrain variables. The tradeoffs between the various sensor parameters and the quantity and quality of the extractable geologic data were investigated as well as the development of automated techniques of digital SAR image analysis. Initial work on a texture analysis of SEASAT SAR imagery is reported. Computer-generated radar simulations are shown for combinations of two geologic models and three SAR angles of incidence

Characterization and mapping of surface physical properties of Mars from CRISM multi-angular data: application to Gusev Crater and Meridiani Planum

The analysis of the surface texture from the particle (grain size, shape and internal structure) to its organization (surface roughness) provides information on the geological processes. CRISM multi-angular observations (varied emission angles) allow to characterize the surface scattering behavior which depends on the composition but also the material physical properties (e.g., grain size, shape, internal structure, the surface roughness). After an atmospheric correction by the Multi-angle Approach for Retrieval of the Surface Reflectance from CRISM Observations, the surface reflectances at different geometries are analyzed by inverting the Hapke photometric model depending on the single scattering albedo, the 2-term phase function, the macroscopic roughness and the 2-term opposition effects. Surface photometric maps are created to observe the spatial variations of surface scattering properties as a function of geological units at the CRISM spatial resolution (200m/pixel). An application at the Mars Exploration Rover (MER) landing sites located at Gusev Crater and Meridiani Planum where orbital and in situ observations are available, is presented. Complementary orbital observations (e.g. CRISM spectra, THermal EMission Imaging System, High Resolution Imaging Science Experiment images) are used for interpreting the estimated Hapke photometric parameters in terms of physical properties. The in situ observations are used as ground truth to validate the interpretations. Varied scattering properties are observed inside a CRISM observation (5x10km) suggesting that the surfaces are controlled by local geological processes (e.g. volcanic resurfacing, aeolian and impact processes) rather than regional or global. Consistent results with the in situ observations are observed thus validating the approach and the use of photometry for the characterization of Martian surface physical properties

Quasi-specular reflection from particulate media

Specular reflection is known to play an important role in many fields of scattering applications, e.g., in remote sensing, computer graphics, optimization of visual appearance of industrial products. Usually it can be assumed that the object has a solid surface and that the properties of the surface will dictate the behavior of the specular component. In this study I will show that media consisting of wavelength-sized particles can also have a quasi-specular reflection in cases where there is ordered structure in the media. I will also show that the quasi-specular reflection in particulate media is more than just a surface effect, and planar particle arrangement below the very surface can give arise to quasi-specular reflection. This study shows that the quasi-specular reflection may contribute in some cases in the backscattering direction, together with coherent backscattering and shadow-hiding effects

Quantitative flaw characterization with scanning laser acoustic microscopy

Surface roughness and diffraction are two factors that have been observed to affect the accuracy of flaw characterization with scanning laser acoustic microscopy. In accuracies can arise when the surface of the test sample is acoustically rough. It is shown that, in this case, Snell's law is no longer valid for determining the direction of sound propagation within the sample. The relationship between the direction of sound propagation within the sample, the apparent flaw depth, and the sample's surface roughness is investigated. Diffraction effects can mask the acoustic images of minute flaws and make it difficult to establish their size, depth, and other characteristics. It is shown that for Fraunhofer diffraction conditions the acoustic image of a subsurface defect corresponds to a two-dimensional Fourier transform. Transforms based on simulated flaws are used to infer the size and shape of the actual flaw

Light scattering from cold rolled aluminum surfaces

We present experimental light scattering measurements from aluminum surfaces obtained by cold rolling. We show that our results are consistent with a scale invariant description of the roughness of these surfaces. The roughness parameters that we obtain from the light scattering experiment are consistent with those obtained from Atomic Force Microscopy measurements