An On-line BIST RAM Architecture with Self Repair Capabilities

The emerging field of self-repair computing is expected to have a major impact on deployable systems for space missions and defense applications, where high reliability, availability, and serviceability are needed. In this context, RAM (random access memories) are among the most critical components. This paper proposes a built-in self-repair (BISR) approach for RAM cores. The proposed design, introducing minimal and technology-dependent overheads, can detect and repair a wide range of memory faults including: stuck-at, coupling, and address faults. The test and repair capabilities are used on-line, and are completely transparent to the external user, who can use the memory without any change in the memory-access protocol. Using a fault-injection environment that can emulate the occurrence of faults inside the module, the effectiveness of the proposed architecture in terms of both fault detection and repairing capability was verified. Memories of various sizes have been considered to evaluate the area-overhead introduced by this proposed architectur

NASA JSC neural network survey results

A survey of Artificial Neural Systems in support of NASA's (Johnson Space Center) Automatic Perception for Mission Planning and Flight Control Research Program was conducted. Several of the world's leading researchers contributed papers containing their most recent results on artificial neural systems. These papers were broken into categories and descriptive accounts of the results make up a large part of this report. Also included is material on sources of information on artificial neural systems such as books, technical reports, software tools, etc

Efficient Logging in Non-Volatile Memory by Exploiting Coherency Protocols

Non-volatile memory (NVM) technologies such as PCM, ReRAM and STT-RAM allow processors to directly write values to persistent storage at speeds that are significantly faster than previous durable media such as hard drives or SSDs. Many applications of NVM are constructed on a logging subsystem, which enables operations to appear to execute atomically and facilitates recovery from failures. Writes to NVM, however, pass through a processor's memory system, which can delay and reorder them and can impair the correctness and cost of logging algorithms. Reordering arises because of out-of-order execution in a CPU and the inter-processor cache coherence protocol. By carefully considering the properties of these reorderings, this paper develops a logging protocol that requires only one round trip to non-volatile memory while avoiding expensive computations. We show how to extend the logging protocol to building a persistent set (hash map) that also requires only a single round trip to non-volatile memory for insertion, updating, or deletion

Infrastructures and Algorithms for Testable and Dependable Systems-on-a-Chip

Every new node of semiconductor technologies provides further miniaturization and higher performances, increasing the number of advanced functions that electronic products can offer. Silicon area is now so cheap that industries can integrate in a single chip usually referred to as System-on-Chip (SoC), all the components and functions that historically were placed on a hardware board. Although adding such advanced functionality can benefit users, the manufacturing process is becoming finer and denser, making chips more susceptible to defects. Today’s very deep-submicron semiconductor technologies (0.13 micron and below) have reached susceptibility levels that put conventional semiconductor manufacturing at an impasse. Being able to rapidly develop, manufacture, test, diagnose and verify such complex new chips and products is crucial for the continued success of our economy at-large. This trend is expected to continue at least for the next ten years making possible the design and production of 100 million transistor chips. To speed up the research, the National Technology Roadmap for Semiconductors identified in 1997 a number of major hurdles to be overcome. Some of these hurdles are related to test and dependability. Test is one of the most critical tasks in the semiconductor production process where Integrated Circuits (ICs) are tested several times starting from the wafer probing to the end of production test. Test is not only necessary to assure fault free devices but it also plays a key role in analyzing defects in the manufacturing process. This last point has high relevance since increasing time-to-market pressure on semiconductor fabrication often forces foundries to start volume production on a given semiconductor technology node before reaching the defect densities, and hence yield levels, traditionally obtained at that stage. The feedback derived from test is the only way to analyze and isolate many of the defects in today’s processes and to increase process’s yield. With the increasing need of high quality electronic products, at each new physical assembly level, such as board and system assembly, test is used for debugging, diagnosing and repairing the sub-assemblies in their new environment. Similarly, the increasing reliability, availability and serviceability requirements, lead the users of high-end products performing periodic tests in the field throughout the full life cycle. To allow advancements in each one of the above scaling trends, fundamental changes are expected to emerge in different Integrated Circuits (ICs) realization disciplines such as IC design, packaging and silicon process. These changes have a direct impact on test methods, tools and equipment. Conventional test equipment and methodologies will be inadequate to assure high quality levels. On chip specialized block dedicated to test, usually referred to as Infrastructure IP (Intellectual Property), need to be developed and included in the new complex designs to assure that new chips will be adequately tested, diagnosed, measured, debugged and even sometimes repaired. In this thesis, some of the scaling trends in designing new complex SoCs will be analyzed one at a time, observing their implications on test and identifying the key hurdles/challenges to be addressed. The goal of the remaining of the thesis is the presentation of possible solutions. It is not sufficient to address just one of the challenges; all must be met at the same time to fulfill the market requirements

Fine-Grain Checkpointing with In-Cache-Line Logging

Non-Volatile Memory offers the possibility of implementing high-performance, durable data structures. However, achieving performance comparable to well-designed data structures in non-persistent (transient) memory is difficult, primarily because of the cost of ensuring the order in which memory writes reach NVM. Often, this requires flushing data to NVM and waiting a full memory round-trip time. In this paper, we introduce two new techniques: Fine-Grained Checkpointing, which ensures a consistent, quickly recoverable data structure in NVM after a system failure, and In-Cache-Line Logging, an undo-logging technique that enables recovery of earlier state without requiring cache-line flushes in the normal case. We implemented these techniques in the Masstree data structure, making it persistent and demonstrating the ease of applying them to a highly optimized system and their low (5.9-15.4\%) runtime overhead cost.Comment: In 2019 Architectural Support for Programming Languages and Operating Systems (ASPLOS 19), April 13, 2019, Providence, RI, US

Educational package based on the MIPS architecture for FPGA platforms

Tese de mestrado integrado. Engenharia Electrotécnica e de Computadores (Major em Telecomunicações). Faculdade de Engenharia. Universidade do Porto. 200

Content addressable memory project

A parameterized version of the tree processor was designed and tested (by simulation). The leaf processor design is 90 percent complete. We expect to complete and test a combination of tree and leaf cell designs in the next period. Work is proceeding on algorithms for the computer aided manufacturing (CAM), and once the design is complete we will begin simulating algorithms for large problems. The following topics are covered: (1) the practical implementation of content addressable memory; (2) design of a LEAF cell for the Rutgers CAM architecture; (3) a circuit design tool user's manual; and (4) design and analysis of efficient hierarchical interconnection networks