Algorithm to layout (ATL) systems for VLSI design

PhD ThesisThe complexities involved in custom VLSI design together with the failure of CAD techniques to keep pace with advances in the fabrication technology have resulted in a design bottleneck. Powerful tools are required to exploit the processing potential offered by the densities now available. Describing a system in a high level algorithmic notation makes writing, understanding, modification, and verification of a design description easier. It also removes some of the emphasis on the physical issues of VLSI design, and focus attention on formulating a correct and well structured design. This thesis examines how current trends in CAD techniques might influence the evolution of advanced Algorithm To Layout (ATL) systems. The envisaged features of an example system are specified. Particular attention is given to the implementation of one its features COPTS (Compilation Of Occam Programs To Schematics). COPTS is capable of generating schematic diagrams from which an actual layout can be derived. It takes a description written in a subset of Occam and generates a high level schematic diagram depicting its realisation as a VLSI system. This diagram provides the designer with feedback on the relative placement and interconnection of the operators used in the source code. It also gives a visual representation of the parallelism defined in the Occam description. Such diagrams are a valuable aid in documenting the implementation of a design. Occam has also been selected as the input to the design system that COPTS is a feature of. The choice of Occam was made on the assumption that the most appropriate algorithmic notation for such a design system will be a suitable high level programming language. This is in contrast to current automated VLSI design systems, which typically use a hardware des~ription language for input. These special purpose languages currently concentrate on handling structural/behavioural information and have limited ability to express algorithms. Using a language such as Occam allows a designer to write a behavioural description which can be compiled and executed as a simulator, or prototype, of the system. The programmability introduced into the design process enables designers to concentrate on a design's underlying algorithm. The choice of this algorithm is the most crucial decision since it determines the performance and area of the silicon implementation. The thesis is divided into four sections, each of several chapters. The first section considers VLSI design complexity, compares the expert systems and silicon compilation approaches to tackling it, and examines its parallels with software complexity. The second section reviews the advantages of using a conventional programming language for VLSI system descriptions. A number of alternative high level programming languages are considered for application in VLSI design. The third section defines the overall ATL system COPTS is envisaged to be part of, and considers the schematic representation of Occam programs. The final section presents a summary of the overall project and suggestions for future work on realising the full ATL system

Japanese cooperative R&D projects in software technology

Includes bibliographical references (leaves 50-55).Michael A. Cusumano

SAGA: A project to automate the management of software production systems

The project to automate the management of software production systems is described. The SAGA system is a software environment that is designed to support most of the software development activities that occur in a software lifecycle. The system can be configured to support specific software development applications using given programming languages, tools, and methodologies. Meta-tools are provided to ease configuration. Several major components of the SAGA system are completed to prototype form. The construction methods are described

RON-BEAM DEBUG AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS

A current research project at IMAG/TIM3 Laboratory aims at an integrated test system combining the use of the Scanning Electron Microscope (SEM), used in voltage contrast mode, with a new high-level approach of fault location in complex VLSI circuits, in order to reach a complete automated diagnosis process. Two research themes are induced by this project, which are: prototype validation of known circuits, on which CAD information is available, and failure analysis of unknown circuits, which are compared to reference circuits. For prototype validation, a knowledge-based approach to fault location is used. Concerning failure analysis, automatic image comparison based on pattern recog- nition techniques is performed. The purpose of the paper is to present these two methodologies, focusing on the SEM-based data acquisition process