New Techniques to Reduce the Execution Time of Functional Test Programs

The compaction of test programs for processor-based systems is of utmost practical importance: Software-Based Self-Test (SBST) is nowadays increasingly adopted, especially for in-field test of safety-critical applications, and both the size and the execution time of the test are critical parameters. However, while compacting the size of binary test sequences has been thoroughly studied over the years, the reduction of the execution time of test programs is still a rather unexplored area of research. This paper describes a family of algorithms able to automatically enhance an existing test program, reducing the time required to run it and, as a side effect, its size. The proposed solutions are based on instruction removal and restoration, which is shown to be computationally more efficient than instruction removal alone. Experimental results demonstrate the compaction capabilities, and allow analyzing computational costs and effectiveness of the different algorithms

Built-In Test Sequence Generation for Synchronous Sequential Circuits Based on Loading and Expansion of Test Subsequences

We describe an on-chip test generation scheme for synchronous sequential circuits that allows at-speed testing of such circuits. The proposed scheme is based on loading of (short) input sequences into an on-chip memory, and expansion of these sequences on-chip into test sequences. Complete coverage of modeled faults is achieved by basing the selection of the loaded sequences on a deterministic test sequence T 0, and ensuring that every fault detected by T 0 is detected by the expanded version of at least one loaded sequence. Experimental results presented for benchmark circuits show that the length of the sequence that needs to be stored at any time is on the average 10 % of the length of T 0, and that the total length of all the loaded sequences is on the average 46 % of the length of T 0. 1

Test Cost Reduction for Logic Circuits——Reduction of Test Data Volume and Test Application Time——

論理回路の大規模化とともに,テストコストの増大が深刻な問題となっている.特に大規模な論理回路では,テストデータ量やテスト実行時間の削減が,テストコスト削減の重要な課題である.本論文では,高い故障検出率のテストパターンをできるだけ少ないテストベクトル数で実現するためのテストコンパクション技術,付加ハードウェアによるテストデータの展開・伸長を前提に圧縮を行うテストコンプレッション技術,及び,スキャン設計回路におけるテスト実行時間削減技術について概説する

An Efficient Test Relaxation Technique for Synchronous Sequential Circuits

Testing systems-on-a-chip (SOC) involves applying huge amounts of test data, which is stored in the tester memory and then transferred to the circuit under test (CUT) during test application. Therefore, practical techniques, such as test compression and compaction, are required to reduce the amount of test data in order to reduce both the total testing time and the memory requirements for the tester. Test-set relaxation can improve the efficiency of both test compression and test compaction. In addition, the relaxation process can identify selfinitializing test sequences for synchronous sequential circuits. In this paper, we propose an efficient test relaxation technique for synchronous sequential circuits that maximizes the number of unspecified bits while maintaining the same fault coverage as the original test set

An Efficient Test Relaxation Technique for Synchronous Sequential Circuits

Testing systems-on-a-chip (SOC) involves applying huge amounts of test data, which is stored in the tester memory and then transferred to the circuit under test (CUT) during test application. Therefore, practical techniques, such as test compression and compaction, are required to reduce the amount of test data in order to reduce both the total testing time and the memory requirements for the tester. Test-set relaxation can improve the efficiency of both test compression and test compaction. In addition, the relaxation process can identify selfinitializing test sequences for synchronous sequential circuits. In this paper, we propose an efficient test relaxation technique for synchronous sequential circuits that maximizes the number of unspecified bits while maintaining the same fault coverage as the original test set

Hybrid constraint-based test pattern generation

The role of testing in Integrated circuit (IC) is to determine the correctness of manufactured circuits. Therefore, testing is important since the fraction of good chips sold in the market yields the quality of the product. Automatic test equipment (ATE) is equipment that used in manufacturing test. The advance in IC technology make the memory needed for ATE is big. However, this could be lessened by reducing the data volume inserted in the ATE. This could be achieved through test compaction like fault collapsing. In this research, hybrid constraint-based test pattern generation proposed that include fault injection, Automatic test pattern generation (ATPG) and fault simulation. The fault injection is creating the faulty circuits while the ATPG searching the test patterns. For the fault simulation, it calculates the fault coverage of the ATPG system. In the fault injection, the functional fault modeling adopted which applied the fault collapsing. This fault collapsing is aiding in test compaction. Five experiments being done on eight Circuit under tests (CUTs) from the International Torino Conference (ITC) '99 benchmark circuits. The high-level and gate-level fault coverage, and the test length for this CUTs have been obtained from this experiments. The average of compaction ratio that obtained by the proposed method is 5.42%

NONLINEAR OPERATORS FOR IMAGE PROCESSING: DESIGN, IMPLEMENTATION AND MODELING TECHNIQUES FOR POWER ESTIMATION

1998/1999Negli ultimi anni passati le applicazioni multimediali hanno visto uno sviluppo notevole, trovando applicazione in un gran numero di campi. Applicazioni come video conferenze, diagnostica medica, telefonia mobile e applicazioni militari necessitano il trattamento di una gran mole di dati ad alta velocità. Pertanto, l'elaborazione di immagini e di dati vocali è molto importante ed è stata oggetto di numerosi sforzi, nel tentativo di trovare algoritmi sempre più veloci ed efficaci. Tra gli algoritmi proposti, noi crediamo che gli operatori razionali svolgano un ruolo molto importante, grazie alla loro versatilità ed efficacia nell'elaborazione di dati. Negli ultimi anni sono stati proposti diversi algoritmi, dimostrando che questi operatori possono essere molto vantaggiosi in diverse applicazioni, producendo buoni risultati. Lo scopo di questo lavoro è di realizzare alcuni di questi algoritmi e, quindi, dimostrare che i filtri razionali, in particolare, possono essere realizzati senza ricorrere a sistemi di grandi dimensioni e possono raggiungere frequenze operative molto alte. Una volta che il blocco fondamentale di un sistema basato su operatori razionali sia stato realizzato, esso pu6 essere riusato con successo in molte altre applicazioni. Dal punto di vista del progettista, è importante avere uno schema generale di studio, che lo renda capace di studiare le varie configurazioni del sistema da realizzare e di analizzare i compromessi tra le variabili di progetto. In particolare, per soddisfare l'esigenza di metodi versatili per la stima della potenza, abbiamo sviluppato una tecnica di macro modellizazione che permette al progettista di stimare velocemente ed accuratamente la potenza dissipata da un circuito. La tesi è organizzata come segue: Nel Capitolo 1 alcuni sono presentati alcuni algoritmi studiati per la realizzazione. Ne viene data solo una veloce descrizione, lasciando comunque al lettore interessato dei riferimenti bibliografici. Nel Capitolo 2 vengono discusse le architetture fondamentali usate per la realizzazione. Principalmente sono state usate architetture a pipeline, ma viene data anche una descrizione degli approcci oggigiorno disponibili per l'ottimizzazione delle temporizzazioni. Nel Capitolo 3 sono presentate le realizzazioni di due sistemi studiati per questa tesi. Gli approcci seguiti si basano su ASIC e FPGA. Richiedono tecniche e soluzioni diverse per il progetto del sistema, per cui é interessante vedere cosa pu6 essere fatto nei due casi. Infine, nel Capitolo 4, descriviamo la nostra tecnica di macro modellizazione per la stima di potenza, dando una breve visione delle tecniche finora proposte e facendo vedere quali sono i vantaggi che il nostro metodo comporta per il progetto.In the past few years, multimedia application have been growing very fast, being applied to a large variety of fields. Applications like video conference, medical diagnostic, mobile phones, military applications require to handle large amount of data at high rate. Images as well as voice data processing are therefore very important and they have been subjected to a lot of efforts in order to find always faster and effective algorithms. Among image processing algorithms, we believe that rational operators assume an important role, due to their versatility and effectiveness in data processing. In the last years, several algorithms have been proposed, demonstrating that these operators can be very suitable in different applications with very good results. The aim of this work is to implement some of these algorithm and, therefore, demonstrate that rational filters, in particular, can be implemented without requiring large sized systems and they can operate at very high frequencies. Once the basic building block of a rational based system has been implemented, it can be successfully reused in many other applications. From the designer point of view, it is important to have a general framework, which makes it able to study various configurations of the system to be implemented and analyse the trade-off among the design variables. In particular, to meet the need far versatile tools far power estimation, we developed a new macro modelling technique, which allows the designer to estimate the power dissipated by a circuit quickly and accurately. The thesis is organized as follows: In chapter 1 we present some of the algorithms which have been studied for implementation. Only a brief overview is given, leaving to the interested reader some references in literature. In chapter 2 we discuss the basic architectures used for the implementations. Pipelined structures have been mainly used for this thesis, but an overview of the nowaday available approaches for timing optimization is presented. In chapter 3 we present two of the implementation designed for this thesis. The approaches followed are ASIC driven and FPGA drive. They require different techniques and different solution for the design of the system, therefore it is interesting to see what can be done in both the cases. Finally, in chapter 4, we describe our macro modelling techniques for power estimation, giving a brief overview of the up to now proposed techniques and showing the advantages our method brings to the design.XII Ciclo1969Versione digitalizzata della tesi di dottorato cartacea

Hardware Fault Injection

Hardware fault injection is the widely accepted approach to evaluate the behavior of a circuit in the presence of faults. Thus, it plays a key role in the design of robust circuits. This chapter presents a comprehensive review of hardware fault injection techniques, including physical and logical approaches. The implementation of effective fault injection systems is also analyzed. Particular emphasis is made on the recently developed emulation-based techniques, which can provide large flexibility along with unprecedented levels of performance. These capabilities provide a way to tackle reliability evaluation of complex circuits.Publicad

Harnessing Simulation Acceleration to Solve the Digital Design Verification Challenge.

Today, design verification is by far the most resource and time-consuming activity of any new digital integrated circuit development. Within this area, the vast majority of the verification effort in industry relies on simulation platforms, which are implemented either in hardware or software. A "simulator" includes a model of each component of a design and has the capability of simulating its behavior under any input scenario provided by an engineer. Thus, simulators are deployed to evaluate the behavior of a design under as many input scenarios as possible and to identify and debug all incorrect functionality. Two features are critical in simulators for the validation effort to be effective: performance and checking/debugging capabilities. A wide range of simulator platforms are available today: on one end of the spectrum there are software-based simulators, providing a very rich software infrastructure for checking and debugging the design's functionality, but executing only at 1-10 simulation cycles per second (while actual chips operate at GHz speeds). At the other end of the spectrum, there are hardware-based platforms, such as accelerators, emulators and even prototype silicon chips, providing higher performances by 4 to 9 orders of magnitude, at the cost of very limited or non-existent checking/debugging capabilities. As a result, today, simulation-based validation is crippled: one can either have satisfactory performance on hardware-accelerated platforms or critical infrastructures for checking/debugging on software simulators, but not both. This dissertation brings together these two ends of the spectrum by presenting solutions that offer high-performance simulation with effective checking and debugging capabilities. Specifically, it addresses the performance challenge of software simulators by leveraging inexpensive off-the-shelf graphics processors as massively parallel execution substrates, and then exposing the parallelism inherent in the design model to that architecture. For hardware-based platforms, the dissertation provides solutions that offer enhanced checking and debugging capabilities by abstracting the relevant data to be logged during simulation so to minimize the cost of collection, transfer and processing. Altogether, the contribution of this dissertation has the potential to solve the challenge of digital design verification by enabling effective high-performance simulation-based validation.PHDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/99781/1/dchatt_1.pd

NASA Space Engineering Research Center Symposium on VLSI Design

The NASA Space Engineering Research Center (SERC) is proud to offer, at its second symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories and the electronics industry. These featured speakers share insights into next generation advances that will serve as a basis for future VLSI design. Questions of reliability in the space environment along with new directions in CAD and design are addressed by the featured speakers