187,255 research outputs found

    AFTI/F-16 digital flight control system experience

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    The Advanced Flighter Technology Integration (AFTI) F-16 program is investigating the integration of emerging technologies into an advanced fighter aircraft. The three major technologies involved are the triplex digital flight control system; decoupled aircraft flight control; and integration of avionics, pilot displays, and flight control. In addition to investigating improvements in fighter performance, the AFTI/F-16 program provides a look at generic problems facing highly integrated, flight-crucial digital controls. An overview of the AFTI/F-16 systems is followed by a summary of flight test experience and recommendations

    Deep Space Network information system architecture study

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    The purpose of this article is to describe an architecture for the Deep Space Network (DSN) information system in the years 2000-2010 and to provide guidelines for its evolution during the 1990s. The study scope is defined to be from the front-end areas at the antennas to the end users (spacecraft teams, principal investigators, archival storage systems, and non-NASA partners). The architectural vision provides guidance for major DSN implementation efforts during the next decade. A strong motivation for the study is an expected dramatic improvement in information-systems technologies, such as the following: computer processing, automation technology (including knowledge-based systems), networking and data transport, software and hardware engineering, and human-interface technology. The proposed Ground Information System has the following major features: unified architecture from the front-end area to the end user; open-systems standards to achieve interoperability; DSN production of level 0 data; delivery of level 0 data from the Deep Space Communications Complex, if desired; dedicated telemetry processors for each receiver; security against unauthorized access and errors; and highly automated monitor and control

    Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery

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    The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling soft errors in the logic and memories that allow meeting the desired failures-in-time (FIT) target are key to keep harnessing the benefits of Moore's law. The failure to scale the soft error rate caused by particle strikes, may soon limit the total number of cores that one may have running at the same time. This paper proposes a light-weight and scalable architecture to eliminate silent data corruption errors (SDC) and detected unrecoverable errors (DUE) of a core. The architecture uses acoustic wave detectors for error detection. We propose to recover by confining the errors in the cache hierarchy, allowing us to deal with the relatively long detection latencies. Our results show that the proposed mechanism protects the whole core (logic, latches and memory arrays) incurring performance overhead as low as 0.60%. © 2014 IEEE.Peer ReviewedPostprint (author's final draft

    DeSyRe: on-Demand System Reliability

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    The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

    Resilience in Numerical Methods: A Position on Fault Models and Methodologies

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    Future extreme-scale computer systems may expose silent data corruption (SDC) to applications, in order to save energy or increase performance. However, resilience research struggles to come up with useful abstract programming models for reasoning about SDC. Existing work randomly flips bits in running applications, but this only shows average-case behavior for a low-level, artificial hardware model. Algorithm developers need to understand worst-case behavior with the higher-level data types they actually use, in order to make their algorithms more resilient. Also, we know so little about how SDC may manifest in future hardware, that it seems premature to draw conclusions about the average case. We argue instead that numerical algorithms can benefit from a numerical unreliability fault model, where faults manifest as unbounded perturbations to floating-point data. Algorithms can use inexpensive "sanity" checks that bound or exclude error in the results of computations. Given a selective reliability programming model that requires reliability only when and where needed, such checks can make algorithms reliable despite unbounded faults. Sanity checks, and in general a healthy skepticism about the correctness of subroutines, are wise even if hardware is perfectly reliable.Comment: Position Pape

    Mechanistic modeling of architectural vulnerability factor

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    Reliability to soft errors is a significant design challenge in modern microprocessors owing to an exponential increase in the number of transistors on chip and the reduction in operating voltages with each process generation. Architectural Vulnerability Factor (AVF) modeling using microarchitectural simulators enables architects to make informed performance, power, and reliability tradeoffs. However, such simulators are time-consuming and do not reveal the microarchitectural mechanisms that influence AVF. In this article, we present an accurate first-order mechanistic analytical model to compute AVF, developed using the first principles of an out-of-order superscalar execution. This model provides insight into the fundamental interactions between the workload and microarchitecture that together influence AVF. We use the model to perform design space exploration, parametric sweeps, and workload characterization for AVF
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