Test and Testability of Asynchronous Circuits

The ever-increasing transistor shrinkage and higher clock frequencies are causing serious clock distribution, power management, and reliability issues. Asynchronous design is predicted to have a significant role in tackling these challenges because of its distributed control mechanism and on-demand, rather than continuous, switching activity. Null Convention Logic (NCL) is a robust and low-power asynchronous paradigm that introduces new challenges to test and testability algorithms because 1) the lack of deterministic timing in NCL complicates the management of test timing, 2) all NCL gates are state-holding and even simple combinational circuits show sequential behaviour, and 3) stuck-at faults on gate internal feedback (GIF) of NCL gates do not always cause an incorrect output and therefore are undetectable by automatic test pattern generation (ATPG) algorithms. Existing test methods for NCL use clocked hardware to control the timing of test. Such test hardware could introduce metastability issues into otherwise highly robust NCL devices. Also, existing test techniques for NCL handle the high-statefulness of NCL circuits by excessive incorporation of test hardware which imposes additional area, propagation delay and power consumption. This work, first, proposes a clockless self-timed ATPG that detects all faults on the gate inputs and a share of the GIF faults with no added design for test (DFT). Then, the efficacy of quiescent current (IDDQ) test for detecting GIF faults undetectable by a DFT-less ATPG is investigated. Finally, asynchronous test hardware, including test points, a scan cell, and an interleaved scan architecture, is proposed for NCL-based circuits. To the extent of our knowledge, this is the first work that develops clockless, self-timed test techniques for NCL while minimising the need for DFT, and also the first work conducted on IDDQ test of NCL. The proposed methods are applied to multiple NCL circuits with up to 2,633 NCL gates (10,000 CMOS Boolean gates), in 180 and 45 nm technologies and show average fault coverage of 88.98% for ATPG alone, 98.52% including IDDQ test, and 99.28% when incorporating test hardware. Given that this fault coverage includes detection of GIF faults, our work has 13% higher fault coverage than previous work. Also, because our proposed clockless test hardware eliminates the need for double-latching, it reduces the average area and delay overhead of previous studies by 32% and 50%, respectively

Harnessing Simulation Acceleration to Solve the Digital Design Verification Challenge.

Today, design verification is by far the most resource and time-consuming activity of any new digital integrated circuit development. Within this area, the vast majority of the verification effort in industry relies on simulation platforms, which are implemented either in hardware or software. A "simulator" includes a model of each component of a design and has the capability of simulating its behavior under any input scenario provided by an engineer. Thus, simulators are deployed to evaluate the behavior of a design under as many input scenarios as possible and to identify and debug all incorrect functionality. Two features are critical in simulators for the validation effort to be effective: performance and checking/debugging capabilities. A wide range of simulator platforms are available today: on one end of the spectrum there are software-based simulators, providing a very rich software infrastructure for checking and debugging the design's functionality, but executing only at 1-10 simulation cycles per second (while actual chips operate at GHz speeds). At the other end of the spectrum, there are hardware-based platforms, such as accelerators, emulators and even prototype silicon chips, providing higher performances by 4 to 9 orders of magnitude, at the cost of very limited or non-existent checking/debugging capabilities. As a result, today, simulation-based validation is crippled: one can either have satisfactory performance on hardware-accelerated platforms or critical infrastructures for checking/debugging on software simulators, but not both. This dissertation brings together these two ends of the spectrum by presenting solutions that offer high-performance simulation with effective checking and debugging capabilities. Specifically, it addresses the performance challenge of software simulators by leveraging inexpensive off-the-shelf graphics processors as massively parallel execution substrates, and then exposing the parallelism inherent in the design model to that architecture. For hardware-based platforms, the dissertation provides solutions that offer enhanced checking and debugging capabilities by abstracting the relevant data to be logged during simulation so to minimize the cost of collection, transfer and processing. Altogether, the contribution of this dissertation has the potential to solve the challenge of digital design verification by enabling effective high-performance simulation-based validation.PHDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/99781/1/dchatt_1.pd

Architecture FPGA améliorée et flot de conception pour une reconfiguration matérielle en ligne efficace

The self-reconfiguration capabilities of modern FPGA architectures pave the way for dynamic applications able to adapt to transient events. The CAD flows of modern architectures are nowadays mature but limited by the constraints induced by the complexity of FPGA circuits. In this thesis, multiple contributions are developed to propose an FPGA architecture supporting the dynamic placement of hardware tasks. First, an intermediate representation of these tasks configuration data, independent from their final position, is presented. This representation allows to compress the task data up to 11x with regard to its conventional raw counterpart. An accompanying CAD flow, based on state-of-the-art tools, is proposed to generate relocatable tasks from a high-level description. Then, the online behavior of this mechanism is studied. Two algorithms allowing to decode and create in real-time the conventional bit-stream are described. In addition, an enhancement of the FPGA interconnection network is proposedto increase the placement flexibility of heterogeneous tasks, at the cost of a 10% increase in average of the critical path delay. Eventually, a configurable substitute to the configuration memory found in FPGAs is studied to ease their partial reconfiguration.Les capacités d'auto-reconfiguration des architectures FPGA modernes ouvrent la voie à des applications dynamiques capables d'adapter leur fonctionnement pour répondre à des évènements ponctuels. Les flots de reconfiguration des architectures commerciales sont aujourd'hui aboutis mais limités par des contraintes inhérentes à la complexité de ces circuits. Dans cette thèse, plusieurs contributions sont avancées afin de proposer une architecture FPGA reconfigurable permettant le placement dynamique de tâches matérielles. Dans un premier temps, une représentation intermédiaire des données de configuration de ces tâches, indépendante de leur positionnement final, est présentée. Cette représentation permet notamment d'atteindre des taux de compression allant jusqu'à 11x par rapport à la représentation brute d'une tâche. Un flot de conception basé sur des outils de l'état de l'art accompagne cette représentation et génère des tâches relogeables à partir d'une description haut-niveau. Ensuite, le comportement en ligne de ce mécanisme est étudié. Deux algorithmes permettant le décodage de ces tâches et la génération en temps-réel des données de configuration propres à l'architectures son décrits. Par ailleurs, une amélioration du réseau d'interconnexion d'une architecture FPGA est proposée pour accroître la flexibilité du placement de tâches hétérogènes, avec une augmentation de 10% en moyenne du délai du chemin critique. Enfin, une alternative programmable aux mémoires de configuration de ces circuits est étudiée pour faciliter leur reconfiguration partielle