Out-of-sample generalizations for supervised manifold learning for classification

Supervised manifold learning methods for data classification map data samples residing in a high-dimensional ambient space to a lower-dimensional domain in a structure-preserving way, while enhancing the separation between different classes in the learned embedding. Most nonlinear supervised manifold learning methods compute the embedding of the manifolds only at the initially available training points, while the generalization of the embedding to novel points, known as the out-of-sample extension problem in manifold learning, becomes especially important in classification applications. In this work, we propose a semi-supervised method for building an interpolation function that provides an out-of-sample extension for general supervised manifold learning algorithms studied in the context of classification. The proposed algorithm computes a radial basis function (RBF) interpolator that minimizes an objective function consisting of the total embedding error of unlabeled test samples, defined as their distance to the embeddings of the manifolds of their own class, as well as a regularization term that controls the smoothness of the interpolation function in a direction-dependent way. The class labels of test data and the interpolation function parameters are estimated jointly with a progressive procedure. Experimental results on face and object images demonstrate the potential of the proposed out-of-sample extension algorithm for the classification of manifold-modeled data sets

A Survey on Metric Learning for Feature Vectors and Structured Data

The need for appropriate ways to measure the distance or similarity between data is ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such good metrics for specific problems is generally difficult. This has led to the emergence of metric learning, which aims at automatically learning a metric from data and has attracted a lot of interest in machine learning and related fields for the past ten years. This survey paper proposes a systematic review of the metric learning literature, highlighting the pros and cons of each approach. We pay particular attention to Mahalanobis distance metric learning, a well-studied and successful framework, but additionally present a wide range of methods that have recently emerged as powerful alternatives, including nonlinear metric learning, similarity learning and local metric learning. Recent trends and extensions, such as semi-supervised metric learning, metric learning for histogram data and the derivation of generalization guarantees, are also covered. Finally, this survey addresses metric learning for structured data, in particular edit distance learning, and attempts to give an overview of the remaining challenges in metric learning for the years to come.Comment: Technical report, 59 pages. Changes in v2: fixed typos and improved presentation. Changes in v3: fixed typos. Changes in v4: fixed typos and new method