Design of two-stage class AB CMOS buffers: a systematic approach

A systematic approach for the design of two-stage class AB CMOS unity-gain buffers is proposed. It is based on the inclusion of a class AB operation to class A Miller amplifier topologies in unity-gain negative feedback by a simple technique that does not modify quiescent currents, supply requirements, noise performance, or static power. Three design examples are fabricated in a 0.5 μm CMOS process. Measurement results show slew rate improvement factors of approximately 100 for the class AB buffers versus their class A counterparts for the same quiescent power consumption (< 200 μW)

Investigation of charge coupled device correlation techniques

Analog Charge Transfer Devices (CTD's) offer unique advantages to signal processing systems, which often have large development costs, making it desirable to define those devices which can be developed for general system's use. Such devices are best identified and developed early to give system's designers some interchangeable subsystem blocks, not requiring additional individual development for each new signal processing system. The objective of this work is to describe a discrete analog signal processing device with a reasonably broad system use and to implement its design, fabrication, and testing

High-Linearity Self-Biased CMOS Current Buffer

A highly linear fully self-biased class AB current buffer designed in a standard 0.18 mu m CMOS process with 1.8 V power supply is presented in this paper. It is a simple structure that, with a static power consumption of 48 mu W, features an input resistance as low as 89 Omega, high accuracy in the input-output current ratio and total harmonic distortion (THD) figures lower than -60 dB at 30 mu A amplitude signal and 1 kHz frequency. Robustness was proved through Monte Carlo and corner simulations, and finally validated through experimental measurements, showing that the proposed configuration is a suitable choice for high performance low voltage low power applications

Pipelined analog-to-digital conversion using current-mode reference shifting

Dissertação para obtenção do grau de Mestre em Engenharia Electrotécnica e de ComputadoresPipeline Analog-to-digital converters (ADCs) are the most popular architecture for high-speed medium-to-high resolution applications. A fundamental, but often unreferenced building block of pipeline ADCs are the reference voltage circuits. They are required to maintain a stable reference with low output impedance to drive large internal switched capacitor loads quickly. Achieving this usually leads to a scheme that consumes a large portion of the overall power and area. A review of the literature shows that the required stable reference can be achieved with either on-chip buffering or with large off-chip decoupling capacitors. On-chip buffering is ideal for system integration but requires a high speed buffer with high power dissipation. The use of a reference with off-chip decoupling results in significant power savings but increases the pads of chip, the count of external components and the overall system cost. Moreover the amount of ringing on the internal reference voltage caused by the series inductance of the package makes this solution not viable for high speed ADCs. To address this challenge, a pipeline ADC employing a multiplying digital-to-analog converter (MDAC) with current-mode reference shifting is presented. Consequently, no reference voltages and, therefore, no voltage buffers are necessary. The bias currents are generated on-chip by a reference current generator that dissipates low power. The proposed ADC is designed in a 65 nm CMOS technology and operates at sampling rates ranging from 10 to 80 MS/s. At 40 MS/s the ADC dissipates 10.8 mW from a 1.2 V power supply and achieves an SNDR of 57.2 dB and a THD of -68 dB, corresponding to an ENOB of 9.2 bit. The corresponding figure of merit is 460 fJ/step

A 1.2-V 10- µW NPN-Based Temperature Sensor in 65-nm CMOS With an Inaccuracy of 0.2 °C (3σ) From 70 °C to 125 °C

An NPN-based temperature sensor with digital output transistors has been realized in a 65-nm CMOS process. It achieves a batch-calibrated inaccuracy of ±0.5 ◦C (3¾) and a trimmed inaccuracy of ±0.2 ◦C (3¾) over the temperature range from −70 ◦C to 125 ◦C. This performance is obtained by the use of NPN transistors as sensing elements, the use of dynamic techniques, i.e. correlated double sampling and dynamic element matching, and a single room-temperature trim. The sensor draws 8.3 μA from a 1.2-V supply and occupies an area of 0.1 mm2

A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers

The virtual ground reference buffer (VGRB) technique is introduced as a means to improve the performance of switched-capacitor circuits. The technique enhances the performance by improving the feedback factor of the op-amp without affecting the signal gain. The bootstrapping action of the level-shifting buffers relaxes key op-amp performance requirements including unity-gain bandwidth, noise, open-loop gain and offset compared with conventional circuits. This reduces the design complexity and the power consumption of op-amp based circuits. Based on this technique, a 12 b pipelined ADC is implemented in 65 nm CMOS that achieves 67.0 dB SNDR at 250 MS/s and consumes 49.7 mW of power from a 1.2 V power supply

A 90 nm CMOS 16 Gb/s Transceiver for Optical Interconnects

Interconnect architectures which leverage high-bandwidth optical channels offer a promising solution to address the increasing chip-to-chip I/O bandwidth demands. This paper describes a dense, high-speed, and low-power CMOS optical interconnect transceiver architecture. Vertical-cavity surface-emitting laser (VCSEL) data rate is extended for a given average current and corresponding reliability level with a four-tap current summing FIR transmitter. A low-voltage integrating and double-sampling optical receiver front-end provides adequate sensitivity in a power efficient manner by avoiding linear high-gain elements common in conventional transimpedance-amplifier (TIA) receivers. Clock recovery is performed with a dual-loop architecture which employs baud-rate phase detection and feedback interpolation to achieve reduced power consumption, while high-precision phase spacing is ensured at both the transmitter and receiver through adjustable delay clock buffers. A prototype chip fabricated in 1 V 90 nm CMOS achieves 16 Gb/s operation while consuming 129 mW and occupying 0.105 mm^2

Design of an Active Harmonic Rejection N-Path Filter for Highly Tunable RF Channel Selection

As the number of wireless devices in the world increases, so does the demand for flexible radio receiver architectures capable of operating over a wide range of frequencies and communication protocols. The resonance-based channel-select filters used in traditional radio architectures have a fixed frequency response, making them poorly suited for such a receiver. The N-path filter is based on 1960s technology that has received renewed interest in recent years for its application as a linear high Q filter at radio frequencies. N-path filters use passive mixers to apply a frequency transformation to a baseband low-pass filter in order to achieve a high-Q band-pass response at high frequencies. The clock frequency determines the center frequency of the band-pass filter, which makes the filter highly tunable over a broad frequency range. Issues with harmonic transfer and poor attenuation limit the feasibility of using N-path filters in practice. The goal of this thesis is to design an integrated active N-path filter that improves upon the passive N-path filter’s poor harmonic rejection and limited outof- band attenuation. The integrated circuit (IC) is implemented using the CMRF8SF 130nm CMOS process. The design uses a multi-phase clock generation circuit to implement a harmonic rejection mixer in order to suppress the 3rd and 5th harmonic. The completed active N-path filter has a tuning range of 200MHz to 1GHz and the out-ofband attenuation exceeds 60dB throughout this range. The frequency response exhibits a 14.7dB gain at the center frequency and a -3dB bandwidth of 6.8MHz