정적 램 및 파워 게이트 회로에 대한 전압 및 보존용 공간 할당 문제

학위논문(박사) -- 서울대학교대학원 : 공과대학 전기·정보공학부, 2021.8. 김태환.칩의 저전력 동작은 중요한 문제이며, 공정이 발전하면서 그 중요성은 점점 커지고 있다. 본 논문은 칩을 구성하는 정적 램(SRAM) 및 로직(logic) 각각에 대해서 저전력으로 동작시키는 방법론을 논한다. 우선, 본 논문에서는 칩을 문턱 전압 근처의 전압(NTV)에서 동작시키고자 할 때 모니터링 회로의 측정을 통해 칩 내의 모든 SRAM 블록에서 동작 실패가 발생하지 않는 최소 동작 전압을 추론하는 방법론을 제안한다. 칩을 NTV 영역에서 동작시키는 것은 에너지 효율성을 증대시킬 수 있는 매우 효과적인 방법 중 하나이지만 SRAM의 경우 동작 실패 때문에 동작 전압을 낮추기 어렵다. 하지만 칩마다 영향을 받는 공정 변이가 다르므로 최소 동작 전압은 칩마다 다르며, 모니터링을 통해 이를 추론해낼 수 있다면 칩별로 SRAM에 서로 다른 전압을 인가해 에너지 효율성을 높일 수 있다. 본 논문에서는 다음과 같은 과정을 통해 이 문제를 해결한다: (1) 디자인 인프라 설계 단계에서는 SRAM의 최소 동작 전압을 추론하고 칩 생산 단계에서는 SRAM 모니터의 측정을 통해 전압을 인가하는 방법론을 제안한다; (2) 칩의 SRAM 비트셀(bitcell)과 주변 회로를 포함한 SRAM 블록들의 공정 변이를 모니터링할 수 있는 SRAM 모니터와 SRAM 모니터에서 모니터링할 대상을 정의한다; (3) SRAM 모니터의 측정값을 이용해 같은 칩에 존재하는 모든 SRAM 블록에서 목표 신뢰수준 내에서 읽기, 쓰기, 및 접근 동작 실패가 발생하지 않는 최소 동작 전압을 추론한다. 벤치마크 회로의 실험 결과는 본 논문에서 제안한 방법을 따라 칩별로 SRAM 블록들의 최소 동작 전압을 다르게 인가할 경우, 기존 방법대로 모든 칩에 동일한 전압을 인가하는 것 대비 수율은 같은 수준으로 유지하면서 SRAM 비트셀 배열의 전력 소모를 감소시킬 수 있음을 보인다. 두 번째로, 본 논문에서는 파워 게이트 회로에서 기존의 보존용 공간 할당 방법들이 지니고 있는 문제를 해결하고 누설 전력 소모를 더 줄일 수 있는 방법론을 제안한다. 기존의 보존용 공간 할당 방법은 멀티플렉서 피드백 루프가 있는 모든 플립플롭에는 무조건 보존용 공간을 할당해야 해야 하기 때문에 다중 비트 보존용 공간의 장점을 충분히 살리지 못하는 문제가 있다. 본 논문에서는 다음과 같은 방법을 통해 보존용 공간을 최소화하는 문제를 해결한다: (1) 보존용 공간 할당 과정에서 멀티플렉서 피드백 루프를 무시할 수 있는 조건을 제시하고, (2) 해당 조건을 이용해 멀티플렉서 피드백 루프가 있는 플립플롭이 많이 존재하는 회로에서 보존용 공간을 최소화한다; (3) 추가로, 플립플롭에 이미 할당된 보존용 공간 중 일부를 제거할 수 있는 조건을 찾고, 이를 이용해 보존용 공간을 더 감소시킨다. 벤치마크 회로의 실험 결과는 본 논문에서 제안한 방법론이 기존의 보존용 공간 할당 방법론보다 더 적은 보존용 공간을 할당하며, 따라서 칩의 면적 및 전력 소모를 감소시킬 수 있음을 보인다.Low power operation of a chip is an important issue, and its importance is increasing as the process technology advances. This dissertation addresses the methodology of operating at low power for each of the SRAM and logic constituting the chip. Firstly, we propose a methodology to infer the minimum operating voltage at which SRAM failure does not occur in all SRAM blocks in the chip operating on near threshold voltage (NTV) regime through the measurement of a monitoring circuit. Operating the chip on NTV regime is one of the most effective ways to increase energy efficiency, but in case of SRAM, it is difficult to lower the operating voltage because of SRAM failure. However, since the process variation on each chip is different, the minimum operating voltage is also different for each chip. If it is possible to infer the minimum operating voltage of SRAM blocks of each chip through monitoring, energy efficiency can be increased by applying different voltage. In this dissertation, we propose a new methodology of resolving this problem. Specifically, (1) we propose to infer minimum operation voltage of SRAM in design infra development phase, and assign the voltage using measurement of SRAM monitor in silicon production phase; (2) we define a SRAM monitor and features to be monitored that can monitor process variation on SRAM blocks including SRAM bitcell and peripheral circuits; (3) we propose a new methodology of inferring minimum operating voltage of SRAM blocks in a chip that does not cause read, write, and access failures under a target confidence level. Through experiments with benchmark circuits, it is confirmed that applying different voltage to SRAM blocks in each chip that inferred by our proposed methodology can save overall power consumption of SRAM bitcell array compared to applying same voltage to SRAM blocks in all chips, while meeting the same yield target. Secondly, we propose a methodology to resolve the problem of the conventional retention storage allocation methods and thereby further reduce leakage power consumption of power gated circuit. Conventional retention storage allocation methods have problem of not fully utilizing the advantage of multi-bit retention storage because of the unavoidable allocation of retention storage on flip-flops with mux-feedback loop. In this dissertation, we propose a new methodology of breaking the bottleneck of minimizing the state retention storage. Specifically, (1) we find a condition that mux-feedback loop can be disregarded during the retention storage allocation; (2) utilizing the condition, we minimize the retention storage of circuits that contain many flip-flops with mux-feedback loop; (3) we find a condition to remove some of the retention storage already allocated to each of flip-flops and propose to further reduce the retention storage. Through experiments with benchmark circuits, it is confirmed that our proposed methodology allocates less retention storage compared to the state-of-the-art methods, occupying less cell area and consuming less power.1 Introduction 1 1.1 Low Voltage SRAM Monitoring Methodology 1 1.2 Retention Storage Allocation on Power Gated Circuit 5 1.3 Contributions of this Dissertation 8 2 SRAM On-Chip Monitoring Methodology for High Yield and Energy Efficient Memory Operation at Near Threshold Voltage 13 2.1 SRAM Failures 13 2.1.1 Read Failure 13 2.1.2 Write Failure 15 2.1.3 Access Failure 16 2.1.4 Hold Failure 16 2.2 SRAM On-chip Monitoring Methodology: Bitcell Variation 18 2.2.1 Overall Flow 18 2.2.2 SRAM Monitor and Monitoring Target 18 2.2.3 Vfail to Vddmin Inference 22 2.3 SRAM On-chip Monitoring Methodology: Peripheral Circuit IR Drop and Variation 29 2.3.1 Consideration of IR Drop 29 2.3.2 Consideration of Peripheral Circuit Variation 30 2.3.3 Vddmin Prediction including Access Failure Prohibition 33 2.4 Experimental Results 41 2.4.1 Vddmin Considering Read and Write Failures 42 2.4.2 Vddmin Considering Read/Write and Access Failures 45 2.4.3 Observation for Practical Use 45 3 Allocation of Always-On State Retention Storage for Power Gated Circuits - Steady State Driven Approach 49 3.1 Motivations and Analysis 49 3.1.1 Impact of Self-loop on Power Gating 49 3.1.2 Circuit Behavior Before Sleeping 52 3.1.3 Wakeup Latency vs. Retention Storage 54 3.2 Steady State Driven Retention Storage Allocation 56 3.2.1 Extracting Steady State Self-loop FFs 57 3.2.2 Allocating State Retention Storage 59 3.2.3 Designing and Optimizing Steady State Monitoring Logic 59 3.2.4 Analysis of the Impact of Steady State Monitoring Time on the Standby Power 63 3.3 Retention Storage Refinement Utilizing Steadiness 65 3.3.1 Extracting Flip-flops for Retention Storage Refinement 66 3.3.2 Designing State Monitoring Logic and Control Signals 68 3.4 Experimental Results 73 3.4.1 Comparison of State Retention Storage 75 3.4.2 Comparison of Power Consumption 79 3.4.3 Impact on Circuit Performance 82 3.4.4 Support for Immediate Power Gating 83 4 Conclusions 89 4.1 Chapter 2 89 4.2 Chapter 3 90박

Efficient cache architectures for reliable hybrid voltage operation using EDC codes

Semiconductor technology evolution enables the design of sensor-based battery-powered ultra-low-cost chips (e.g., below 1 p) required for new market segments such as body, urban life and environment monitoring. Caches have been shown to be the highest energy and area consumer in those chips. This paper proposes a novel, hybrid-operation (high Vcc, ultra-low Vcc), single-Vcc domain cache architecture based on replacing energy-hungry bitcells (e.g., 10T) by more energy-efficient and smaller cells (e.g., 8T) enhanced with Error Detection and Correction (EDC) features for high reliability and performance predictability. Our architecture is proven to largely outperform existing solutions in terms of energy and area.Postprint (author’s final draft

Design of Low-Voltage Digital Building Blocks and ADCs for Energy-Efficient Systems

Increasing number of energy-limited applications continue to drive the demand for designing systems with high energy efficiency. This tutorial covers the main building blocks of a system implementation including digital logic, embedded memories, and analog-to-digital converters and describes the challenges and solutions to designing these blocks for low-voltage operation

Design and analysis of SRAMs for energy harvesting systems

PhD ThesisAt present, the battery is employed as a power source for wide varieties of microelectronic systems ranging from biomedical implants and sensor net-works to portable devices. However, the battery has several limitations and incurs many challenges for the majority of these systems. For instance, the design considerations of implantable devices concern about the battery from two aspects, the toxic materials it contains and its lifetime since replacing the battery means a surgical operation. Another challenge appears in wire-less sensor networks, where hundreds or thousands of nodes are scattered around the monitored environment and the battery of each node should be maintained and replaced regularly, nonetheless, the batteries in these nodes do not all run out at the same time. Since the introduction of portable systems, the area of low power designs has witnessed extensive research, driven by the industrial needs, towards the aim of extending the lives of batteries. Coincidentally, the continuing innovations in the field of micro-generators made their outputs in the same range of several portable applications. This overlap creates a clear oppor-tunity to develop new generations of electronic systems that can be powered, or at least augmented, by energy harvesters. Such self-powered systems benefit applications where maintaining and replacing batteries are impossi-ble, inconvenient, costly, or hazardous, in addition to decreasing the adverse effects the battery has on the environment. The main goal of this research study is to investigate energy harvesting aware design techniques for computational logic in order to enable the capa- II bility of working under non-deterministic energy sources. As a case study, the research concentrates on a vital part of all computational loads, SRAM, which occupies more than 90% of the chip area according to the ITRS re-ports. Essentially, this research conducted experiments to find out the design met-ric of an SRAM that is the most vulnerable to unpredictable energy sources, which has been confirmed to be the timing. Accordingly, the study proposed a truly self-timed SRAM that is realized based on complete handshaking protocols in the 6T bit-cell regulated by a fully Speed Independent (SI) tim-ing circuitry. The study proved the functionality of the proposed design in real silicon. Finally, the project enhanced other performance metrics of the self-timed SRAM concentrating on the bit-line length and the minimum operational voltage by employing several additional design techniques.Umm Al-Qura University, the Ministry of Higher Education in the Kingdom of Saudi Arabia, and the Saudi Cultural Burea

Robust Circuit Design for Low-Voltage VLSI.

Voltage scaling is an effective way to reduce the overall power consumption, but the major challenges in low voltage operations include performance degradation and reliability issues due to PVT variations. This dissertation discusses three key circuit components that are critical in low-voltage VLSI. Level converters must be a reliable interface between two voltage domains, but the reduced on/off-current ratio makes it extremely difficult to achieve robust conversions at low voltages. Two static designs are proposed: LC2 adopts a novel pulsed-operation and modulates its pull-up strength depending on its state. A 3-sigma robustness is guaranteed using a current margin plot; SLC inherently reduces the contention by diode-insertion. Improvements in performance, power, and robustness are measured from 130nm CMOS test chips. SRAM is a major bottleneck in voltage-scaling due to its inherent ratioed-bitcell design. The proposed 7T SRAM alleviates the area overhead incurred by 8T bitcells and provides robust operation down to 0.32V in 180nm CMOS test chips with 3.35fW/bit leakage. Auto-Shut-Off provides a 6.8x READ energy reduction, and its innate Quasi-Static READ has been demonstrated which shows a much improved READ error rate. A use of PMOS Pass-Gate improves the half-select robustness by directly modulating the device strength through bitline voltage. Clocked sequential elements, flip-flops in short, are ubiquitous in today’s digital systems. The proposed S2CFF is static, single-phase, contention-free, and has the same number of devices as in TGFF. It shows a 40% power reduction as well as robust low-voltage operations in fabricated 45nm SOI test chips. Its simple hold-time path and the 3.4x improvement in 3-sigma hold-time is presented. A new on-chip flip-flop testing harness is also proposed, and measured hold-time variations of flip-flops are presented.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/111525/1/yejoong_1.pd

Statistical analysis and design of subthreshold operation memories

This thesis presents novel methods based on a combination of well-known statistical techniques for faster estimation of memory yield and their application in the design of energy-efficient subthreshold memories. The emergence of size-constrained Internet-of-Things (IoT) devices and proliferation of the wearable market has brought forward the challenge of achieving the maximum energy efficiency per operation in these battery operated devices. Achieving this sought-after minimum energy operation is possible under sub-threshold operation of the circuit. However, reliable memory operation is currently unattainable at these ultra-low operating voltages because of the memory circuit's vanishing noise margins which shrink further in the presence of random process variations. The statistical methods, presented in this thesis, make the yield optimization of the sub-threshold memories computationally feasible by reducing the SPICE simulation overhead. We present novel modifications to statistical sampling techniques that reduce the SPICE simulation overhead in estimating memory failure probability. These sampling scheme provides 40x reduction in finding most probable failure point and 10x reduction in estimating failure probability using the SPICE simulations compared to the existing proposals. We then provide a novel method to create surrogate models of the memory margins with better extrapolation capability than the traditional regression methods. These models, based on Gaussian process regression, encode the sensitivity of the memory margins with respect to each individual threshold variation source in a one-dimensional kernel. We find that our proposed additive kernel based models have 32% smaller out-of-sample error (that is, better extrapolation capability outside training set) than using the six-dimensional universal kernel like Radial Basis Function (RBF). The thesis also explores the topological modifications to the SRAM bitcell to achieve faster read operation at the sub-threshold operating voltages. We present a ten-transistor SRAM bitcell that achieves 2x faster read operation than the existing ten-transistor sub-threshold SRAM bitcells, while ensuring similar noise margins. The SRAM bitcell provides 70% reduction in dynamic energy at the cost of 42% increase in the leakage energy per read operation. Finally, we investigate the energy efficiency of the eDRAM gain-cells as an alternative to the SRAM bitcells in the size-constrained IoT devices. We find that reducing their write path leakage current is the only way to reduce the read energy at Minimum Energy operation Point (MEP). Further, we study the effect of transistor up-sizing under the presence of threshold voltage variations on the mean MEP read energy by performing statistical analysis based on the ANOVA test of the full-factorial experimental design.Esta tesis presenta nuevos métodos basados en una combinación de técnicas estadísticas conocidas para la estimación rápida del rendimiento de la memoria y su aplicación en el diseño de memorias de energia eficiente de sub-umbral. La aparición de los dispositivos para el Internet de las cosas (IOT) y la proliferación del mercado portátil ha presentado el reto de lograr la máxima eficiencia energética por operación de estos dispositivos operados con baterias. La eficiencia de energía es posible si se considera la operacion por debajo del umbral de los circuitos. Sin embargo, la operación confiable de memoria es actualmente inalcanzable en estos bajos niveles de voltaje debido a márgenes de ruido de fuga del circuito de memoria, los cuales se pueden reducir aún más en presencia de variaciones randomicas de procesos. Los métodos estadísticos, que se presentan en esta tesis, hacen que la optimización del rendimiento de las memorias por debajo del umbral computacionalmente factible mediante la simulación SPICE. Presentamos nuevas modificaciones a las técnicas de muestreo estadístico que reducen la sobrecarga de simulación SPICE en la estimación de la probabilidad de fallo de memoria. Estos esquemas de muestreo proporciona una reducción de 40 veces en la búsqueda de puntos de fallo más probable, y 10 veces la reducción en la estimación de la probabilidad de fallo mediante las simulaciones SPICE en comparación con otras propuestas existentes. A continuación, se proporciona un método novedoso para crear modelos sustitutos de los márgenes de memoria con una mejor capacidad de extrapolación que los métodos tradicionales de regresión. Estos modelos, basados en el proceso de regresión Gaussiano, codifican la sensibilidad de los márgenes de memoria con respecto a cada fuente de variación de umbral individual en un núcleo de una sola dimensión. Los modelos propuestos, basados en kernel aditivos, tienen un error 32% menor que el error out-of-sample (es decir, mejor capacidad de extrapolación fuera del conjunto de entrenamiento) en comparacion con el núcleo universal de seis dimensiones como la función de base radial (RBF). La tesis también explora las modificaciones topológicas a la celda binaria SRAM para alcanzar velocidades de lectura mas rapidas dentro en el contexto de operaciones en el umbral de tensiones de funcionamiento. Presentamos una celda binaria SRAM de diez transistores que consigue aumentar en 2 veces la operación de lectura en comparacion con las celdas sub-umbral de SRAM de diez transistores existentes, garantizando al mismo tiempo los márgenes de ruido similares. La celda binaria SRAM proporciona una reducción del 70% en energía dinámica a costa del aumento del 42% en la energía de fuga por las operaciones de lectura. Por último, se investiga la eficiencia energética de las células de ganancia eDRAM como una alternativa a los bitcells SRAM en los dispositivos de tamaño limitado IOT. Encontramos que la reducción de la corriente de fuga en el path de escritura es la única manera de reducir la energía de lectura en el Punto Mínimo de Energía (MEP). Además, se estudia el efecto del transistor de dimensionamiento en virtud de la presencia de variaciones de voltaje de umbral en la media de energia de lecture MEP mediante el análisis estadístico basado en la prueba de ANOVA del diseño experimental factorial completo.Postprint (published version

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Cache designs for reliable hybrid high and ultra-low voltage operation

Increasing demand for implementing highly-miniaturized battery-powered ultra-low-cost systems (e.g., below 1 USD) in emerging applications such as body, urban life and environment monitoring, etc., has introduced many challenges in the chip design. Such applications require high performance occasionally, but very little energy consumption during most of the time in order to extend battery lifetime. In addition, they require real-time guarantees. The most suitable technological solution for those devices consists of using hybrid processors able to operate at: (i) high voltage to provide high performance and (ii) near-/sub-threshold (NST) voltage to provide ultra-low energy consumption. However, the most efficient SRAM memories for each voltage level differ and it is mandatory trading off different SRAM designs, especially in cache memories, which occupy most of the processor¿s area. In this Thesis, we analyze the performance/power tradeoffs involved in the design of SRAM L1 caches for reliable hybrid high and NST Vcc operation from a microarchitectural perspective. We develop new, simple, single-Vcc domain hybrid cache architectures and data management mechanisms that satisfy all stringent needs of our target market. Proposed solutions are shown to have high energy efficiency with negligible impact on average performance while maintaining strong performance guarantees as required for our target market

Circuits and Systems Advances in Near Threshold Computing

Modern society is witnessing a sea change in ubiquitous computing, in which people have embraced computing systems as an indispensable part of day-to-day existence. Computation, storage, and communication abilities of smartphones, for example, have undergone monumental changes over the past decade. However, global emphasis on creating and sustaining green environments is leading to a rapid and ongoing proliferation of edge computing systems and applications. As a broad spectrum of healthcare, home, and transport applications shift to the edge of the network, near-threshold computing (NTC) is emerging as one of the promising low-power computing platforms. An NTC device sets its supply voltage close to its threshold voltage, dramatically reducing the energy consumption. Despite showing substantial promise in terms of energy efficiency, NTC is yet to see widescale commercial adoption. This is because circuits and systems operating with NTC suffer from several problems, including increased sensitivity to process variation, reliability problems, performance degradation, and security vulnerabilities, to name a few. To realize its potential, we need designs, techniques, and solutions to overcome these challenges associated with NTC circuits and systems. The readers of this book will be able to familiarize themselves with recent advances in electronics systems, focusing on near-threshold computing