Digital Circuit Design Using Floating Gate Transistors

Floating gate (flash) transistors are used exclusively for memory applications today. These applications include SD cards of various form factors, USB flash drives and SSDs. In this thesis, we explore the use of flash transistors to implement digital logic circuits. Since the threshold voltage of flash transistors can be modified at a fine granularity during programming, several advantages are obtained by our flash-based digital circuit design approach. For one, speed binning at the factory can be controlled with precision. Secondly, an IC can be re-programmed in the field, to negate effects such as aging, which has been a significant problem in recent times, particularly for mission-critical applications. Thirdly, unlike a regular MOSFET, which has one threshold voltage level, a flash transistor can have multiple threshold voltage levels. The benefit of having multiple threshold voltage levels in a flash transistor is that it allows the ability to encode more symbols in each device, unlike a regular MOSFET. This allows us to implement multi-valued logic functions natively. In this thesis, we evaluate different flash-based digital circuit design approaches and compare their performance with a traditional CMOS standard cell-based design approach. We begin by evaluating our design approach at the cell level to optimize the design’s delay, power energy and physical area characteristics. The flash-based approach is demonstrated to be better than the CMOS standard cell approach, for these performance metrics. Afterwards, we present the performance of our design approach at the block level. We describe a synthesis flow to decompose a circuit block into a network of interconnected flash-based circuit cells. We also describe techniques to optimize the resulting network of flash-based circuit cells using don’t cares. Our optimization approach distinguishes itself from other optimization techniques that use don’t cares, since it a) targets a flash-based design flow, b) optimizes clusters of logic nodes at once instead of one node at a time, c) attempts to reduce the number of cubes instead of reducing the number of literals in each cube and d) performs optimization on the post-technology mapped netlist which results in a direct improvement in result quality, as compared to pre-technology mapping logic optimization that is typically done in the literature. The resulting network characteristics (delay, power, energy and physical area) are presented. These results are compared with a standard cell-based realization of the same block (obtained using commercial tools) and we demonstrate significant improvements in all the design metrics. We also study flash-based FPGA designs (both static and dynamic), and present the tradeoff of delay, power dissipation and energy consumption of the various designs. Our work differs from previously proposed flash-based FPGAs, since we embed the flash transistors (which store the configuration bits) directly within the logic and interconnect fabrics. We also present a detailed description of how the programming of the configuration bits is accomplished, for all the proposed designs

Digital Circuit Design Using Floating Gate Transistors

Floating gate (flash) transistors are used exclusively for memory applications today. These applications include SD cards of various form factors, USB flash drives and SSDs. In this thesis, we explore the use of flash transistors to implement digital logic circuits. Since the threshold voltage of flash transistors can be modified at a fine granularity during programming, several advantages are obtained by our flash-based digital circuit design approach. For one, speed binning at the factory can be controlled with precision. Secondly, an IC can be re-programmed in the field, to negate effects such as aging, which has been a significant problem in recent times, particularly for mission-critical applications. Thirdly, unlike a regular MOSFET, which has one threshold voltage level, a flash transistor can have multiple threshold voltage levels. The benefit of having multiple threshold voltage levels in a flash transistor is that it allows the ability to encode more symbols in each device, unlike a regular MOSFET. This allows us to implement multi-valued logic functions natively. In this thesis, we evaluate different flash-based digital circuit design approaches and compare their performance with a traditional CMOS standard cell-based design approach. We begin by evaluating our design approach at the cell level to optimize the design’s delay, power energy and physical area characteristics. The flash-based approach is demonstrated to be better than the CMOS standard cell approach, for these performance metrics. Afterwards, we present the performance of our design approach at the block level. We describe a synthesis flow to decompose a circuit block into a network of interconnected flash-based circuit cells. We also describe techniques to optimize the resulting network of flash-based circuit cells using don’t cares. Our optimization approach distinguishes itself from other optimization techniques that use don’t cares, since it a) targets a flash-based design flow, b) optimizes clusters of logic nodes at once instead of one node at a time, c) attempts to reduce the number of cubes instead of reducing the number of literals in each cube and d) performs optimization on the post-technology mapped netlist which results in a direct improvement in result quality, as compared to pre-technology mapping logic optimization that is typically done in the literature. The resulting network characteristics (delay, power, energy and physical area) are presented. These results are compared with a standard cell-based realization of the same block (obtained using commercial tools) and we demonstrate significant improvements in all the design metrics. We also study flash-based FPGA designs (both static and dynamic), and present the tradeoff of delay, power dissipation and energy consumption of the various designs. Our work differs from previously proposed flash-based FPGAs, since we embed the flash transistors (which store the configuration bits) directly within the logic and interconnect fabrics. We also present a detailed description of how the programming of the configuration bits is accomplished, for all the proposed designs

Deterministic, Efficient Variation of Circuit Components to Improve Resistance to Reverse Engineering

This research proposes two alternative methods for generating semantically equivalent circuit variants which leave the circuit\u27s internal structure pseudo-randomly determined. Component fusion deterministically selects subcircuits using a component identification algorithm and replaces them using a deterministic algorithm that generates canonical logic forms. Component encryption seeks to alter the semantics of individual circuit components using an encoding function, but preserves the overall circuit semantics by decoding signal values later in the circuit. Experiments were conducted to examine the performance of component fusion and component encryption against representative trials of subcircuit selection-and-replacement and Boundary Blurring, two previously defined methods for circuit obfuscation. Overall, results support the conclusion that both component fusion and component encryption generate more secure variants than previous methods and that these variants are more efficient in terms of required circuit delay and the power and area required for their implementation

Conception, optimisation, et vérification formelle de techniques de tolérance aux fautes pour circuits

Technology shrinking and voltage scaling increase the risk of fault occurrences in digital circuits. To address this challenge, engineers use fault-tolerance techniques to mask or, at least, to detect faults. These techniques are especially needed in safety critical domains (e.g., aerospace, medical, nuclear, etc.), where ensuring the circuit functionality and fault-tolerance is crucial. However, the verification of functional and fault-tolerance properties is a complex problem that cannot be solved with simulation-based methodologies due to the need to check a huge number of executions and fault occurrence scenarios. The optimization of the overheads imposed by fault-tolerance techniques also requires the proof that the circuit keeps its fault-tolerance properties after the optimization.In this work, we propose a verification-based optimization of existing fault-tolerance techniques as well as the design of new techniques and their formal verification using theorem proving. We first investigate how some majority voters can be removed from Triple-Modular Redundant (TMR) circuits without violating their fault-tolerance properties. The developed methodology clarifies how to take into account circuit native error-masking capabilities that may exist due to the structure of the combinational part or due to the way the circuit is used and communicates with the surrounding device.Second, we propose a family of time-redundant fault-tolerance techniques as automatic circuit transformations. They require less hardware resources than TMR alternatives and could be easily integrated in EDA tools. The transformations are based on the novel idea of dynamic time redundancy that allows the redundancy level to be changed "on-the-fly" without interrupting the computation. Therefore, time-redundancy can be used only in critical situations (e.g., above Earth poles where the radiation level is increased), during the processing of crucial data (e.g., the encryption of selected data), or during critical processes (e.g., a satellite computer reboot).Third, merging dynamic time redundancy with a micro-checkpointing mechanism, we have created a double-time redundancy transformation capable of masking transient faults. Our technique makes the recovery procedure transparent and the circuit input/output behavior remains unchanged even under faults. Due to the complexity of that method and the need to provide full assurance of its fault-tolerance capabilities, we have formally certified the technique using the Coq proof assistant. The developed proof methodology can be applied to certify other fault-tolerance techniques implemented through circuit transformations at the netlist level.La miniaturisation de la gravure et l'ajustement dynamique du voltage augmentent le risque de fautes dans les circuits intégrés. Pour pallier cet inconvénient, les ingénieurs utilisent des techniques de tolérance aux fautes pour masquer ou, au moins, détecter les fautes. Ces techniques sont particulièrement utilisées dans les domaines critiques (aérospatial, médical, nucléaire, etc.) où les garanties de bon fonctionnement des circuits et leurs tolérance aux fautes sont cruciales. Cependant, la vérification de propriétés fonctionnelles et de tolérance aux fautes est un problème complexe qui ne peut être résolu par simulation en raison du grand nombre d'exécutions possibles et de scénarios d'occurrence des fautes. De même, l'optimisation des surcoûts matériels ou temporels imposés par ces techniques demande de garantir que le circuit conserve ses propriétés de tolérance aux fautes après optimisation.Dans cette thèse, nous décrivons une optimisation de techniques de tolérance aux fautes classiques basée sur des analyses statiques, ainsi que de nouvelles techniques basées sur la redondance temporelle. Nous présentons comment leur correction peut être vérifiée formellement à l'aide d'un assistant de preuves.Nous étudions d'abord comment certains voteurs majoritaires peuvent être supprimés des circuits basés sur la redondance matérielle triple (TMR) sans violer leurs propriétés de tolérance. La méthodologie développée prend en compte les particularités des circuits (par ex. masquage logique d'erreurs) et des entrées/sorties pour optimiser la technique TMR.Deuxièmement, nous proposons une famille de techniques utilisant la redondance temporelle comme des transformations automatiques de circuits. Elles demandent moins de ressources matérielles que TMR et peuvent être facilement intégrés dans les outils de CAO. Les transformations sont basées sur une nouvelle idée de redondance temporelle dynamique qui permet de modifier le niveau de redondance «à la volée» sans interrompre le calcul. Le niveau de redondance peut être augmenté uniquement dans les situations critiques (par exemple, au-dessus des pôles où le niveau de rayonnement est élevé), lors du traitement de données cruciales (par exemple, le cryptage de données sensibles), ou pendant des processus critiques (par exemple, le redémarrage de l'ordinateur d'un satellite).Troisièmement, en associant la redondance temporelle dynamique avec un mécanisme de micro-points de reprise, nous proposons une transformation avec redondance temporelle double capable de masquer les fautes transitoires. La procédure de recouvrement est transparente et le comportement entrée/sortie du circuit reste identique même lors d'occurrences de fautes. En raison de la complexité de cette méthode, la garantie totale de sa correction a nécessité une certification formelle en utilisant l'assistant de preuves Coq. La méthodologie développée peut être appliquée pour certifier d'autres techniques de tolérance aux fautes exprimées comme des transformations de circuits