Automatic programming methodologies for electronic hardware fault monitoring

This paper presents three variants of Genetic Programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling of electronic circuits can be best performed by the Stressor - susceptibility interaction model. A circuit or a system is considered to be failed once the stressor has exceeded the susceptibility limits. For on-line prediction, validated stressor vectors may be obtained by direct measurements or sensors, which after pre-processing and standardization are fed into the GP models. Empirical results are compared with artificial neural networks trained using backpropagation algorithm and classification and regression trees. The performance of the proposed method is evaluated by comparing the experiment results with the actual failure model values. The developed model reveals that GP could play an important role for future fault monitoring systems.This research was supported by the International Joint Research Grant of the IITA (Institute of Information Technology Assessment) foreign professor invitation program of the MIC (Ministry of Information and Communication), Korea

Fault simulation for structural testing of analogue integrated circuits

In this thesis the ANTICS analogue fault simulation software is described which provides a statistical approach to fault simulation for accurate analogue IC test evaluation. The traditional figure of fault coverage is replaced by the average probability of fault detection. This is later refined by considering the probability of fault occurrence to generate a more realistic, weighted test metric. Two techniques to reduce the fault simulation time are described, both of which show large reductions in simulation time with little loss of accuracy. The final section of the thesis presents an accurate comparison of three test techniques and an evaluation of dynamic supply current monitoring. An increase in fault detection for dynamic supply current monitoring is obtained by removing the DC component of the supply current prior to measurement

Teaching old sensors New tricks: archetypes of intelligence

In this paper a generic intelligent sensor software architecture is described which builds upon the basic requirements of related industry standards (IEEE 1451 and SEVA BS- 7986). It incorporates specific functionalities such as real-time fault detection, drift compensation, adaptation to environmental changes and autonomous reconfiguration. The modular based structure of the intelligent sensor architecture provides enhanced flexibility in regard to the choice of specific algorithmic realizations. In this context, the particular aspects of fault detection and drift estimation are discussed. A mixed indicative/corrective fault detection approach is proposed while it is demonstrated that reversible/irreversible state dependent drift can be estimated using generic algorithms such as the EKF or on-line density estimators. Finally, a parsimonious density estimator is presented and validated through simulated and real data for use in an operating regime dependent fault detection framework

Measurements, Models, Systems and Design

531 s.

Quantum Computing

Quantum mechanics---the theory describing the fundamental workings of nature---is famously counterintuitive: it predicts that a particle can be in two places at the same time, and that two remote particles can be inextricably and instantaneously linked. These predictions have been the topic of intense metaphysical debate ever since the theory's inception early last century. However, supreme predictive power combined with direct experimental observation of some of these unusual phenomena leave little doubt as to its fundamental correctness. In fact, without quantum mechanics we could not explain the workings of a laser, nor indeed how a fridge magnet operates. Over the last several decades quantum information science has emerged to seek answers to the question: can we gain some advantage by storing, transmitting and processing information encoded in systems that exhibit these unique quantum properties? Today it is understood that the answer is yes. Many research groups around the world are working towards one of the most ambitious goals humankind has ever embarked upon: a quantum computer that promises to exponentially improve computational power for particular tasks. A number of physical systems, spanning much of modern physics, are being developed for this task---ranging from single particles of light to superconducting circuits---and it is not yet clear which, if any, will ultimately prove successful. Here we describe the latest developments for each of the leading approaches and explain what the major challenges are for the future.Comment: 26 pages, 7 figures, 291 references. Early draft of Nature 464, 45-53 (4 March 2010). Published version is more up-to-date and has several corrections, but is half the length with far fewer reference

Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

The demand and relevance of efficient analog fault diagnosis methods for modern RF and microwave integrated circuits increases with the growing need and complexity of analog and mixed-signal circuitry. The well-established digital fault diagnosis methods are insufficient for analog circuitry due to the intrinsic complexity in analog faults and their corresponding identification process. In this work, we present an artificial neural network (ANN) modeling approach to efficiently emulate the injection of analog faults in RF circuits. The resulting meta-model is used for fault identification by applying an optimization-based process using a constrained parameter extraction formulation. A generalized neural modeling formulation to include auxiliary measurements in the circuit is proposed. This generalized formulation significantly increases the uniqueness of the faults identification process. The proposed methodology is illustrated by two faulty analog circuits: a CMOS RF voltage amplifier and a reconfigurable bandpass microstrip filter

A Review of Bayesian Methods in Electronic Design Automation

The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]