Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results

Programmable neural logic

Circuits of threshold elements (Boolean input, Boolean output neurons) have been shown to be surprisingly powerful. Useful functions such as XOR, ADD and MULTIPLY can be implemented by such circuits more efficiently than by traditional AND/OR circuits. In view of that, we have designed and built a programmable threshold element. The weights are stored on polysilicon floating gates, providing long-term retention without refresh. The weight value is increased using tunneling and decreased via hot electron injection. A weight is stored on a single transistor allowing the development of dense arrays of threshold elements. A 16-input programmable neuron was fabricated in the standard 2 μm double-poly, analog process available from MOSIS. We also designed and fabricated the multiple threshold element introduced in [5]. It presents the advantage of reducing the area of the layout from O(n^2) to O(n); (n being the number of variables) for a broad class of Boolean functions, in particular symmetric Boolean functions such as PARITY. A long term goal of this research is to incorporate programmable single/multiple threshold elements, as building blocks in field programmable gate arrays

A new architecture for single-event upset detection & reconfiguration of SRAM-based FPGAs

Field Programmable Gate Arrays (FPGA) are used in a variety of applications, ranging from consumer electronics to devices in spacecrafts because of their flexibility in achieving requirements such as low cost, high performance, and fast turnaround. SRAM-based FPGAs can experience single bit flips in the configuration memory due to high-energy neutrons or alpha particles hitting critical nodes in the SRAM cells, by transferring enough energy to effect the change. High energy particles can be emitted by cosmic radiation or traces of radioactive elements in device packaging. The result of this could range from unwanted functional or data modification, data loss in the system, to damage to the cell where the charged particle makes impact. This phenomenon is known as a Single Event Upset (SEU) and makes fault tolerance a critical requirement in FPGA design. This research proposes a shift in architecture from current SRAM-based FPGAs such as Xilinx Virtex. The proposed architecture includes an inherent SEU detection through parity checking of the configuration memory. The inherent SEU detection sets a syndrome flag when an odd number of bit flips occur within a data frame of the configuration memory. To correct a fault, the FPGA the affected data frame is partially reconfigured. Existing and proposed solutions include: Triple Modular Redundancy (TMR) systems; readback and compare the configuration memory; and periodically reprogramming the entire configuration memory, also known as scrubbing. The advantages afforded by the proposed architecture over existing solutions include: faster error detection and correction latency over the readback method and better area and power overhead over TMR

Enhancing Real-time Embedded Image Processing Robustness on Reconfigurable Devices for Critical Applications

Nowadays, image processing is increasingly used in several application fields, such as biomedical, aerospace, or automotive. Within these fields, image processing is used to serve both non-critical and critical tasks. As example, in automotive, cameras are becoming key sensors in increasing car safety, driving assistance and driving comfort. They have been employed for infotainment (non-critical), as well as for some driver assistance tasks (critical), such as Forward Collision Avoidance, Intelligent Speed Control, or Pedestrian Detection. The complexity of these algorithms brings a challenge in real-time image processing systems, requiring high computing capacity, usually not available in processors for embedded systems. Hardware acceleration is therefore crucial, and devices such as Field Programmable Gate Arrays (FPGAs) best fit the growing demand of computational capabilities. These devices can assist embedded processors by significantly speeding-up computationally intensive software algorithms. Moreover, critical applications introduce strict requirements not only from the real-time constraints, but also from the device reliability and algorithm robustness points of view. Technology scaling is highlighting reliability problems related to aging phenomena, and to the increasing sensitivity of digital devices to external radiation events that can cause transient or even permanent faults. These faults can lead to wrong information processed or, in the worst case, to a dangerous system failure. In this context, the reconfigurable nature of FPGA devices can be exploited to increase the system reliability and robustness by leveraging Dynamic Partial Reconfiguration features. The research work presented in this thesis focuses on the development of techniques for implementing efficient and robust real-time embedded image processing hardware accelerators and systems for mission-critical applications. Three main challenges have been faced and will be discussed, along with proposed solutions, throughout the thesis: (i) achieving real-time performances, (ii) enhancing algorithm robustness, and (iii) increasing overall system's dependability. In order to ensure real-time performances, efficient FPGA-based hardware accelerators implementing selected image processing algorithms have been developed. Functionalities offered by the target technology, and algorithm's characteristics have been constantly taken into account while designing such accelerators, in order to efficiently tailor algorithm's operations to available hardware resources. On the other hand, the key idea for increasing image processing algorithms' robustness is to introduce self-adaptivity features at algorithm level, in order to maintain constant, or improve, the quality of results for a wide range of input conditions, that are not always fully predictable at design-time (e.g., noise level variations). This has been accomplished by measuring at run-time some characteristics of the input images, and then tuning the algorithm parameters based on such estimations. Dynamic reconfiguration features of modern reconfigurable FPGA have been extensively exploited in order to integrate run-time adaptivity into the designed hardware accelerators. Tools and methodologies have been also developed in order to increase the overall system dependability during reconfiguration processes, thus providing safe run-time adaptation mechanisms. In addition, taking into account the target technology and the environments in which the developed hardware accelerators and systems may be employed, dependability issues have been analyzed, leading to the development of a platform for quickly assessing the reliability and characterizing the behavior of hardware accelerators implemented on reconfigurable FPGAs when they are affected by such faults

Design and application of reconfigurable circuits and systems

Open Acces

Using embedded hardware monitor cores in critical computer systems

The integration of FPGA devices in many different architectures and services makes monitoring and real time detection of errors an important concern in FPGA system design. A monitor is a tool, or a set of tools, that facilitate analytic measurements in observing a given system. The goal of these observations is usually the performance analysis and optimisation, or the surveillance of the system. However, System-on-Chip (SoC) based designs leave few points to attach external tools such as logic analysers. Thus, an embedded error detection core that allows observation of critical system nodes (such as processor cores and buses) should enforce the operation of the FPGA-based system, in order to prevent system failures. The core should not interfere with system performance and must ensure timely detection of errors. This thesis is an investigation onto how a robust hardware-monitoring module can be efficiently integrated in a target PCI board (with FPGA-based application processing features) which is part of a critical computing system. [Continues.

Using Relocatable Bitstreams for Fault Tolerance

This research develops a method for relocating reconfigurable modules on the Virtex-II (Pro) family of Field Programmable Gate Arrays (FPGAs). A bitstream translation program is developed which correctly changes the location of a partial bitstream that implements a module on the FPGA. To take advantage of relocatable modules, three fault-tolerance circuit designs are developed and tested. This circuit can operate through a fault by efficiently removing the faulty module and replacing it with a relocated module without faults. The FPGA can recover from faults at a known location, without the need for external intervention using an embedded fault recovery system. The recovery system uses an internal PowerPC to relocate the modules and reprogram the FPGA. Due to the limited architecture of the target FPGA and Xilinx tool errors, an FPGA with automatic fault recovery could not be demonstrated. However, the various components needed to do this type of recovery have been implemented and demonstrated individually

Field Programmable Gate Arrays Usage in Industrial Automation Systems

Tato disertační práce se zabývá využitím programovatelných hradlových polí (FPGA) v diagnostice měničů, využívajících spínaných IGBT tranzistorů. Je zaměřena na budiče těchto výkonových tranzistorů a jejich struktury. Přechodné jevy veličin, jako jsou IG, VGE, VCE během procesu přepínání (zapnutí, vypnutí), mohou poukazovat na degradaci IGBT. Pro měření a monitorování těchto veličin byla navržena nová architektura budiče IGBT. Rychlé měření a monitorování během přepínacího děje vyžaduje vysokou vzorkovací frekvenci. Proto jsou navrhovány paralelní vysokorychlostní AD převodníky (> 50 MSPS). Práce je zaměřena převážně na návrh zařízení s FPGA včetně hardware a software. Byla navržena nová deska plošných spojů s FPGA, která plní požadované funkce, jako je řízení IGBT pomocí vícenásobných paralelních koncových stupňů, monitorování a diagnostiku, a propojení s řídicí jednotkou měniče.This doctoral thesis deals with the usage of Field Programmable Gate Arrays (FPGAs) in a diagnosis of power inverters which use the IGBTs transistors as switching devices. It is focused on the IGBT gate drives and their structures. As long as the transient phenomena and other quantities such as IG, VGE, VCE shows the IGBT degradation during the switching process (turn-on, turn-off), a new IGBT gate driver architecture is proposed for measuring and monitoring these quantities. Quick measurements and monitoring during the IGBT switching process require high sampling frequencies. Therefore, high speed parallel ADC converters (> 50MSPS) are proposed. The thesis is focused on the FPGA design (hardware, software). A new FPGA board is designed for desired functions implementation such as IGBT driving using multiple stages, IGBT monitoring and diagnosis, and interfacing to inverter controller.