Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac

VLSI Architecture and Design

Integrated circuit technology is rapidly approaching a state where feature sizes of one micron or less are tractable. Chip sizes are increasing slowly. These two developments result in considerably increased complexity in chip design. The physical characteristics of integrated circuit technology are also changing. The cost of communication will be dominating making new architectures and algorithms both feasible and desirable. A large number of processors on a single chip will be possible. The cost of communication will make designs enforcing locality superior to other types of designs. Scaling down feature sizes results in increase of the delay that wires introduce. The delay even of metal wires will become significant. Time tends to be a local property which will make the design of globally synchronous systems more difficult. Self-timed systems will eventually become a necessity. With the chip complexity measured in terms of logic devices increasing by more than an order of magnitude over the next few years the importance of efficient design methodologies and tools become crucial. Hierarchical and structured design are ways of dealing with the complexity of chip design. Structered design focuses on the information flow and enforces a high degree of regularity. Both hierarchical and structured design encourage the use of cell libraries. The geometry of the cells in such libraries should be parameterized so that for instance cells can adjust there size to neighboring cells and make the proper interconnection. Cells with this quality can be used as a basis for "Silicon Compilers"

System Reliability Evaluation Using Concurrent Multi-Level Simulation of Structural Faults

This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software syste

Optimising Simulation Data Structures for the Xeon Phi

In this paper, we propose a lock-free architecture to accelerate logic gate circuit simulation using SIMD multi-core machines. We evaluate its performance on different test circuits simulated on the Intel Xeon Phi and 2 other machines. Comparisons are presented of this software/hardware combination with reported performances of GPU and other multi-core simulation platforms. Comparisons are also given between the lock free architecture and a leading commercial simulator running on the same Intel hardware

Deductive Fault Simulation Technique for Asynchronous Circuits

Fault simulator for acpASC needs to deal with hazards, oscillations and races. The simplest algorithm for simulating faults is the serial fault simulation technique which was successfully used for the acpASC. Faster fault simulation techniques, for example deductive fault simulation, was previously used for the combinational and synchronous sequential circuits only. In this paper a deductive fault simulator for the stuck-at faults of acSI acpASC is presented. An algorithm for the propagation of the fault lists is proposed which can deal with the complex gates of the acpASC. The implemented deductive fault simulator was tested using acSI benchmark circuits. The experimental results show significant reduction of the computation time and negligible increase of the memory requirements in comparison with the serial fault simulation technique

Doctor of Philosophy

dissertationThe design of integrated circuit (IC) requires an exhaustive verification and a thorough test mechanism to ensure the functionality and robustness of the circuit. This dissertation employs the theory of relative timing that has the advantage of enabling designers to create designs that have significant power and performance over traditional clocked designs. Research has been carried out to enable the relative timing approach to be supported by commercial electronic design automation (EDA) tools. This allows asynchronous and sequential designs to be designed using commercial cad tools. However, two very significant holes in the flow exist: the lack of support for timing verification and manufacturing test. Relative timing (RT) utilizes circuit delay to enforce and measure event sequencing on circuit design. Asynchronous circuits can optimize power-performance product by adjusting the circuit timing. A thorough analysis on the timing characteristic of each and every timing path is required to ensure the robustness and correctness of RT designs. All timing paths have to conform to the circuit timing constraints. This dissertation addresses back-end design robustness by validating full cyclical path timing verification with static timing analysis and implementing design for testability (DFT). Circuit reliability and correctness are necessary aspects for the technology to become commercially ready. In this study, scan-chain, a commercial DFT implementation, is applied to burst-mode RT designs. In addition, a novel testing approach is developed along with scan-chain to over achieve 90% fault coverage on two fault models: stuck-at fault model and delay fault model. This work evaluates the cost of DFT and its coverage trade-off then determines the best implementation. Designs such as a 64-point fast Fourier transform (FFT) design, an I2C design, and a mixed-signal design are built to demonstrate power, area, performance advantages of the relative timing methodology and are used as a platform for developing the backend robustness. Results are verified by performing post-silicon timing validation and test. This work strengthens overall relative timed circuit flow, reliability, and testability

Submicron Systems Architecture Project : Semiannual Technical Report

The Mosaic C is an experimental fine-grain multicomputer based on single-chip nodes. The Mosaic C chip includes 64KB of fast dynamic RAM, processor, packet interface, ROM for bootstrap and self-test, and a two-dimensional selftimed router. The chip architecture provides low-overhead and low-latency handling of message packets, and high memory and network bandwidth. Sixty-four Mosaic chips are packaged by tape-automated bonding (TAB) in an 8 x 8 array on circuit boards that can, in turn, be arrayed in two dimensions to build arbitrarily large machines. These 8 x 8 boards are now in prototype production under a subcontract with Hewlett-Packard. We are planning to construct a 16K-node Mosaic C system from 256 of these boards. The suite of Mosaic C hardware also includes host-interface boards and high-speed communication cables. The hardware developments and activities of the past eight months are described in section 2.1. The programming system that we are developing for the Mosaic C is based on the same message-passing, reactive-process, computational model that we have used with earlier multicomputers, but the model is implemented for the Mosaic in a way that supports finegrain concurrency. A process executes only in response to receiving a message, and may in execution send messages, create new processes, and modify its persistent variables before it either exits or becomes dormant in preparation for receiving another message. These computations are expressed in an object-oriented programming notation, a derivative of C++ called C+-. The computational model and the C+- programming notation are described in section 2.2. The Mosaic C runtime system, which is written in C+-, provides automatic process placement and highly distributed management of system resources. The Mosaic C runtime system is described in section 2.3

Testability Analysis of Synchronous Sequential Circuits Based On Structural Data

Bounds on test sequence length can be used as a testability measure. We give a procedure to compute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds

CFSIM: A concurrent compiled-code functional simulator for hopCP

Journal ArticleControl intensive ICs pose a significant challenge to the users of formal methods in designing hardware. These ICs have to support a wide variety of requirements including synchronous and asynchronous operations, polling and interrupt-driven modes of operation, multiple concurrent threads of execution, complex computations, and programmability. In this paper, we illustrate the use of formal methods in the design of a control intensive IC called the "Intel 8251" Universal Synchronous/Asynchronous Receiver/Transmitter (USART), using our formal hardware description language 'hopCP'. A feature of hopCP is that it supports communication via asynchronous ports (distributed shared variables writable by exactly one process), in addition to synchronous message passing. We show the usefulness of this combination of communication constructs. We outline static analysis algorithms to determine safe usages of asynchronous ports, and also to discover other static properties of the specification. We discuss a compiled-code concurrent functional simulator called CFSIM, as well as the use of concurrent testers for driving CFSIM. The use of a semantically well specified and simple language, and the associated analysis/simulation tools helps conquer the complexity of specifying and validating control intensive ICs

Quantum-dot Cellular Automata: Review Paper

Quantum-dot Cellular Automata (QCA) is one of the most important discoveries that will be the successful alternative for CMOS technology in the near future. An important feature of this technique, which has attracted the attention of many researchers, is that it is characterized by its low energy consumption, high speed and small size compared with CMOS.  Inverter and majority gate are the basic building blocks for QCA circuits where it can design the most logical circuit using these gates with help of QCA wire. Due to the lack of availability of review papers, this paper will be a destination for many people who are interested in the QCA field and to know how it works and why it had taken lots of attention recentl