Regression modeling for digital test of ΣΔ modulators

The cost of Analogue and Mixed-Signal circuit testing is an important bottleneck in the industry, due to timeconsuming verification of specifications that require state-ofthe- art Automatic Test Equipment. In this paper, we apply the concept of Alternate Test to achieve digital testing of converters. By training an ensemble of regression models that maps simple digital defect-oriented signatures onto Signal to Noise and Distortion Ratio (SNDR), an average error of 1:7% is achieved. Beyond the inference of functional metrics, we show that the approach can provide interesting diagnosis information.Ministerio de Educación y Ciencia TEC2007-68072/MICJunta de Andalucía TIC 5386, CT 30

Analog circuit fault diagnosis via FOA-LSSVM

At present, the research on fault detection and diagnosis technology is very significant to improve the reliability of the equipment, which can greatly improve the safety and efficiency of the equipment. This paper proposes a new fault detection and diagnosis means based on the FOA-LSSVM algorithm. Experimental results demonstrate that the algorithm is effective for the detection and diagnosis of analog circuit faults. In addition, the model also demonstrate good generalization ability

A Review of Bayesian Methods in Electronic Design Automation

The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]

Review of Machine Learning Approaches In Fault Diagnosis applied to IoT System

International audienceWith increasing complex systems, low production costs, and changing technologies, for this reason, the automatic fault diagnosis using artificial intelligence (AI) techniques is more in more applied. In addition, with the emergence of the use of reconfigurable systems, AI can assist in self-maintenance of complex systems. The purpose of this article is to summarize the diagnosis research of systems using AI approaches and examine their application particularly in the field of diagnosis of complex systems. It covers articles published from 2002 to 2018 using Machine Learning tools for fault diagnosis in industrial systems

ADIC: Anomaly Detection Integrated Circuit in 65nm CMOS utilizing Approximate Computing

In this paper, we present a low-power anomaly detection integrated circuit (ADIC) based on a one-class classifier (OCC) neural network. The ADIC achieves low-power operation through a combination of (a) careful choice of algorithm for online learning and (b) approximate computing techniques to lower average energy. In particular, online pseudoinverse update method (OPIUM) is used to train a randomized neural network for quick and resource efficient learning. An additional 42% energy saving can be achieved when a lighter version of OPIUM method is used for training with the same number of data samples lead to no significant compromise on the quality of inference. Instead of a single classifier with large number of neurons, an ensemble of K base learner approach is chosen to reduce learning memory by a factor of K. This also enables approximate computing by dynamically varying the neural network size based on anomaly detection. Fabricated in 65nm CMOS, the ADIC has K = 7 Base Learners (BL) with 32 neurons in each BL and dissipates 11.87pJ/OP and 3.35pJ/OP during learning and inference respectively at Vdd = 0.75V when all 7 BLs are enabled. Further, evaluated on the NASA bearing dataset, approximately 80% of the chip can be shut down for 99% of the lifetime leading to an energy efficiency of 0.48pJ/OP, an 18.5 times reduction over full-precision computing running at Vdd = 1.2V throughout the lifetime.Comment: 1

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

Fault Diagnosis of HVDC Systems Using Machine Learning Based Methods

With the development of high-power electronic technology, HVDC system is applied in the power system because of advantages in large-capacity and long-distance transmission, stability, and flexibility. Therefore, as the guarantee of reliable operating of HVDC system, fault diagnosis of the HVDC system is of great significance. In the current variety methods used in fault diagnosis, Machine Learning based methods have become a hotspot. To this end, the performance of several commonly used machine learning classifiers is compared in HVDC system. First of all, nine faults both in AC systems and DC systems of the HVDC system are set in the HVDC model in Simulink. Therefore, 10 operating states corresponding to the faults and normal operating are considered as the output classes of classifier. Seven parameters, such as DC voltage and DC current, are selected as fault feature parameters of each sample. By simulating the HVDC system in 10 operating states (including normal operating state) correspondingly, 20000 samples, each containing seven parameters, be obtained during the fault period. Then, the training sample set and the test sample set are established by 80% and 20% of the whole sample set. Subsequently, Decision Trees, the Support Vector Machine (SVM), K-Nearest Neighborhood Classifier (KNN), Ensemble classifiers, Discriminant Analysis, Backward Propagation Neural Network (BP-NN), long Short-Term Memory Neural Network (LSTM-NN), Extreme Learning Machine (ELM) was trained and tested. The accuracy of testing is used as the performance index of the model. In particular, for BP-NN, the impact of different transfer functions and learning rules combinations on the accuracy of the model was tested. For ELM, the impact of different activation functions on accuracy is tested. The results have shown that ELM and Bagged Trees have the best performance in HVDC fault diagnosis. The accuracy of these two methods are 92.23% and 96.5% respectively. However, in order to achieve better accuracy in ELM model, a large number of hidden layer nodes are set so that training time increases sharply

Fault Diagnosis of HVDC Systems Using Machine Learning Based Methods

With the development of high-power electronic technology, HVDC system is applied in the power system because of advantages in large-capacity and long-distance transmission, stability, and flexibility. Therefore, as the guarantee of reliable operating of HVDC system, fault diagnosis of the HVDC system is of great significance. In the current variety methods used in fault diagnosis, Machine Learning based methods have become a hotspot. To this end, the performance of several commonly used machine learning classifiers is compared in HVDC system. First of all, nine faults both in AC systems and DC systems of the HVDC system are set in the HVDC model in Simulink. Therefore, 10 operating states corresponding to the faults and normal operating are considered as the output classes of classifier. Seven parameters, such as DC voltage and DC current, are selected as fault feature parameters of each sample. By simulating the HVDC system in 10 operating states (including normal operating state) correspondingly, 20000 samples, each containing seven parameters, be obtained during the fault period. Then, the training sample set and the test sample set are established by 80% and 20% of the whole sample set. Subsequently, Decision Trees, the Support Vector Machine (SVM), K-Nearest Neighborhood Classifier (KNN), Ensemble classifiers, Discriminant Analysis, Backward Propagation Neural Network (BP-NN), long Short-Term Memory Neural Network (LSTM-NN), Extreme Learning Machine (ELM) was trained and tested. The accuracy of testing is used as the performance index of the model. In particular, for BP-NN, the impact of different transfer functions and learning rules combinations on the accuracy of the model was tested. For ELM, the impact of different activation functions on accuracy is tested. The results have shown that ELM and Bagged Trees have the best performance in HVDC fault diagnosis. The accuracy of these two methods are 92.23% and 96.5% respectively. However, in order to achieve better accuracy in ELM model, a large number of hidden layer nodes are set so that training time increases sharply

Baseline Data from Servo Motors in a Robotic Arm for Autonomous Machine Fault Diagnosis

Fault diagnosis can prolong the life of machines if potential sources of failure are discovered and corrected before they occur. Supervised machine learning, or the use of training data to enable machines to discover these faults on their own, makes failure prevention much easier. The focus of this thesis is to investigate the feasibility of creating datasets of various faults at both the component and system level for a servomotor and a compatible robotic arm, such that this data can be used in machine learning algorithms for fault diagnosis. The faults induced at the component level in different servomotors include: low lubrication, no lubrication, two gears chipped, and four gears chipped. Each fault was also examined at 180, 135, 90, and 45-degree swings of the servo arm. Component level data was obtained using an Arduino microcontroller and a feedback wire in each servomotor to obtain the actual position of the servo arm, which allowed for the calculation of the difference in actual and theoretical position and the speed of the servo arm at the various faults. System level data was obtained using OptiTrack’s motion tracking software, Motive, to track the position of two reflective markers on the hand of the robotic arm. At the component level, the low lubrication and no lubrication faults did not exhibit a large difference from the normal servomotor, whereas the servomotors with the gears chipped exhibited significant differences when compared to the normal servomotor. When evaluating the difference in position and speed of the servo arm at larger degree sweeps it was more evident that failure occurred, as opposed to the data at smaller degree sweeps. At the system level, the error was not as visible in the data as there wasn’t much distinction between the speeds of the robotic arm’s hand when the servomotors with faults were placed in it. The results of this work indicate that servomotors can be used to create fault behavior datasets at the component and system level that are usable for machine learning