Capacitance-to-Digital Converter for Ultra-Low-Power Wireless Sensor Nodes

Power consumption is one of the main design constraints in today’s integrated circuits. For systems like wearable electronics, UAVs, IOT systems powered by batteries which are charged using the energy harvested from various sources like RF, Thermal, Solar and Vibration, ultra-low power consumption is paramount. In these systems, Transducers which convert physical parameters into electrical parameters and the analog-to-digital converters (ADCs) are key components as the interface between the analog world and the digital domain. This thesis addresses the design challenges, strategies, as well as circuit techniques of ultra-low-power signal Front End used in several low power electronic systems in general and pressure measurement systems in particular. In this thesis, Capacitance to Digital Converter based pressure measurement system has been implemented. Here we present a general-purpose, wide-range CDC that combines a correlated double sampling (CDS) approach with a differential asynchronous SAR ADC. Since the sensor capacitor is sampled only twice per conversion, energy per conversion is low. Furthermore, since the CDS separates the sensor capacitor from the CDAC, a full differential input voltage range is preserved. The CDC has a 2.5-to-75.5pF conversion range. Monotonic SAR ADC was designed in 180nm CMOS with 1-V power supply and a 1-kS/s sampling rate with switching energy of about 100nW

Analysis of Analog to Digital Converter for Biomedical Applications

This paper presents an ADC which can be used for biomedical application like pacemaker. For the low-power operation, monotonic switching scheme and operating voltage reduction have been implemented in the design. The 10bit 1.8V rail-to-rail (SAR) ADC is realized using UMC 0.18µm CMOS process. Simulations are performed by spectre simulation. From static performance, offset error and full scale error are noticed. This performance issue can be corrected by reducing discharge in capacitor by implementing sampling switch as bootstrapped switch and proper selection of common-mode voltage where 20fF is used as unit capacitance

Energy aware ultra-low power SAR ADC in 180nm CMOS for biomedical application

Power consumption is one of the main design constraints in today’s integrated circuits. For systems powered by batteries, such as implantable biomedical devices, ultra-low power consumption is paramount. In these systems, analog-to-digital converters (ADCs) are key components as the interface between the analog world and the digital domain. This thesis addresses the design challenges, strategies, as well as circuit techniques of ultra-low-power ADCs for medical implant devices. In this thesis four architectures of SAR ADC is implemented with different energy efficiency. In first architecture, conventional SAR ADC was designed in 180nm CMOS technology with a 1-V power supply and a 1-kS/s sampling rate for monitoring bio potential signals, the ADC achieves a signal-to-noise and distortion ratio of 57.16 dB and consumes 43 nW power, resulting in a figure of merit of 73 fJ/conversion-step. In second architecture, Split capacitor SAR ADC was designed in 180nm CMOS with same resolution and sampling speed

DIGITALLY ASSISTED TECHNIQUES FOR NYQUIST RATE ANALOG-to-DIGITAL CONVERTERS

With the advance of technology and rapid growth of digital systems, low power high speed analog-to-digital converters with great accuracy are in demand. To achieve high effective number of bits Analog-to-Digital Converter(ADC) calibration as a time consuming process is a potential bottleneck for designs. This dissertation presentsa fully digital background calibration algorithm for a 7-bit redundant flash ADC using split structure and look-up table based correction. Redundant comparators are used in the flash ADC design of this work in order to tolerate large offset voltages while minimizing signal input capacitance. The split ADC structure helps by eliminating the unknown input signal from the calibration path. The flash ADC has been designed in 180nm IBM CMOS technology and fabricated through MOSIS. This work was supported by Analog Devices, Wilmington,MA. While much research on ADC design has concentrated on increasing resolution and sample rate, there are many applications (e.g. biomedical devices and sensor networks) that do not require high performance but do require low power energy efficient ADCs. This dissertation also explores on design of a low quiescent current 100kSps Successive Approximation (SAR) ADC that has been used as an error detection ADC for an automotive application in 350nm CD (CMOS-DMOS) technology. This work was supported by ON Semiconductor Corp, East Greenwich,RI

An efficient tool for the assisted design of SAR ADCs capacitive DACs

The optimal design of SAR ADCs requires the accurate estimate of nonlinearity and parasitic capacitance effects in the feedback charge redistribution DAC. Since both contributions depend on the specific array topology, complex calculations, custom modeling and heavy simulations in common circuit design environments are often required. This paper presents a MATLAB-based numerical environment to assist the design of the charge redistribution DACs adopted in SAR ADCs. The tool performs both parametric and statistical simulations taking into account capacitive mismatch and parasitic capacitances computing both differential and integral nonlinearity (DNL, INL). An excellent agreement is obtained with the results of circuit simulators (e.g. Cadence Spectre) featuring up to 10^4 shorter simulation time, allowing statistical simulations that would be otherwise impracticable. The switching energy and SNDR degradation due to static nonlinear effects are also estimated. Simulations and measurements on three designed and two fabricated prototypes confirm that the proposed tool can be used as a valid instrument to assist the design of a charge redistribution SAR ADC and to predict its static and dynamic metrics

Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

NOISE SHAPING IN SAR ADC

The successive approximation register (SAR) analog-to-digital converter (ADC) is currently the most popular type of ADC architecture, owing to its power efficiency. They are also used in multichannel systems, where power efficiency is of high importance because of the large number of simultaneously working channels. However, the SAR ADC architecture is not the most area efficient. In SAR ADCs, the binary weighted capacitive digital-to-analog converter (DAC) is used, which means that one additional bit of resolution costs double the increase of area. Oversampling and noise shaping are methods that allow an increase in resolution without an increase of area. In this paper we present the new SAR ADC architectures with a noise shaping. A first-order noise transfer function (NTF) with zero located nearly at one can be achieved. We propose two modifications of the architecture: with zero-only NTF and with the NTF with additional pole. The additional pole theoretically increases the efficiency of noise shaping to further 3 dB. The architectures were applied to the design of SAR ADCs in a 65 nm complementary metal-oxide semiconductor (CMOS) with OSR equal to 10. A 6-bit capacitive DAC was used. The proposed  architectures  provide nearly 4 additional bits in ENOB. The equalent input bandwitdth is equal to 200 kHz with the sampling rate equal to 4 MS/s

Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications

A power-scalable SAR ADC for sensor applications is presented. The ADC features a reconfigurable 5-to-10-bit DAC whose power scales exponentially with resolution. At low resolutions where noise and linearity requirements are reduced, supply voltage scaling is leveraged to further reduce the energy-per-conversion. The ADC operates up to 2 MS/s at 1 V and 5 kS/s at 0.4 V, and its power scales linearly with sample rate down to leakage levels of 53 nW at 1 V and 4 nW at 0.4 V. Leakage power-gating during a SLEEP mode in between conversions reduces total power by up to 14% at sample rates below 1 kS/s. Prototyped in a low-power 65 nm CMOS process, the ADC in 10-bit mode achieves an INL and DNL of 0.57 LSB and 0.58 LSB respectively at 0.6 V, and the Nyquist SNDR and SFDR are 55 dB and 69 dB respectively at 0.55 V and 20 kS/s. The ADC achieves an optimal FOM of 22.4 fJ/conversion-step at 0.55 V in 10-bit mode. The combined techniques of DAC resolution and voltage scaling maximize efficiency at low resolutions, resulting in an FOM that increases by only 7x over the 5-bit scaling range, improving upon a 32x degradation that would otherwise arise from truncation of bits from an ADC of fixed resolution and voltage.United States. Defense Advanced Research Projects AgencyNatural Sciences and Engineering Research Council of Canad