Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths

It is expected that the soft error rate (SER) of combinational logic will increase significantly. Previous solutions to mitigate soft errors in combinational logic suffer from delay penalty or area/power overhead. In this paper, we proposed an output remapping technique to reduce SER of critical paths. Experimental results show up to about 20X increase in Qcritical. So the SER is reduced significantly. This method does not introduce any delay penalty. The area/power overhead is limited as well. The output remapping method is based on our novel glitch width model. The analysis shows that output remapping technique works well along with technology scaling

Applications technology satellite gravity gradient stabilization system Quarterly progress report, 1 Jul. - 30 Oct. 1966

Gravity gradient stabilization systems for Application Technology Satellite

Proceedings of the Caltech Conference on Very Large Scale Integration, held at the California Institute of Technology 22 - 24 January 1979 ; Organized by the Caltech Computer Science Department and the Caltech Industrial Associates Office

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Parity-based Error Detection with Recomputation for Fault-tolerant Spaceborne Computing

In radiation environment (e.g., space, nuclear reactor), electronics can fail due to bitflips in the flipflops of integrated circuits. A common solution is to triplicate the flipflops and connect their outputs to a voter. If one of the three bits is flipped, then the voter outputs the majority value and tolerates the error. This method is called triple modular redundancya (TMR). TMR can cause about 300% area redundancy. An alternative way is error detection with on-demand recomputation, where the recomputation is done by repeating the failed processing request to the processing circuit. The computation is done in consecutive transactions, which we call transaction-based processing. We implemented and evaluated the aforementioned alternative approach using parity checking on the Microsemi ProASIC3 FPGA, which is often used in space applications. The results show that parity-based error detection with our system recovery approach can save up to 54% of the area overhead that would be caused by the TMR, and achieve in most circuits slightly better timing results than TMR on ProASIC3. This area saving can be the key for fitting the application to a space-constrained chip

Methods to improve the reliability and resiliency of near/sub-threshold digital circuits

Energy consumption is one of the primary bottlenecks to both large and small scale modern compute platforms. Reducing the operating voltage of digital circuits to voltages where the supply voltage is near or below the threshold of the transistors has recently gained attention as a method to reduce the energy required for computations by as much as 6 times. However, when operating at near/sub-threshold voltages (where the supply voltage is near or below the threshold of the transistors), imperfections in transistor manufacturing, changes in temperature, and other difficult-to-predict factors cause wide variations in the timing of Complementary Metal-Oxide Semiconductor (CMOS) circuits due to an increased sensitivity at lower voltages. These increased variations result in poor aggregate performance and cause increased rates of error occurrence in computation. This work introduces several new methods to improve the reliability of near/sub-threshold circuits. The first is a design automation technique that is used to aid in low-voltage digital standard cell synthesis. Second, two circuit-level techniques are also introduced that aim to improve the reliability and resiliency of digital circuits by means of completion/error detection. These techniques are shown to improve speed and lower energy consumption at low overheads compared to previous methods. Most importantly, these circuit-level methods are specifically designed to operate at low voltages and can themselves tolerate variations and operation in harsh environments. Finally, a test-chip prototype designed in 65nm-CMOS demonstrates the practicality and feasibility of a proposed current sensing error detector

Hardware Error Detection Using AN-Codes

Due to the continuously decreasing feature sizes and the increasing complexity of integrated circuits, commercial off-the-shelf (COTS) hardware is becoming less and less reliable. However, dedicated reliable hardware is expensive and usually slower than commodity hardware. Thus, economic pressure will most likely result in the usage of unreliable COTS hardware in safety-critical systems. The usage of unreliable, COTS hardware in safety-critical systems results in the need for software-implemented solutions for handling execution errors caused by this unreliable hardware. In this thesis, we provide techniques for detecting hardware errors that disturb the execution of a program. The detection provided facilitates handling of these errors, for example, by retry or graceful degradation. We realize the error detection by transforming unsafe programs that are not guaranteed to detect execution errors into safe programs that detect execution errors with a high probability. Therefore, we use arithmetic AN-, ANB-, ANBD-, and ANBDmem-codes. These codes detect errors that modify data during storage or transport and errors that disturb computations as well. Furthermore, the error detection provided is independent of the hardware used. We present the following novel encoding approaches: - Software Encoded Processing (SEP) that transforms an unsafe binary into a safe execution at runtime by applying an ANB-code, and - Compiler Encoded Processing (CEP) that applies encoding at compile time and provides different levels of safety by using different arithmetic codes. In contrast to existing encoding solutions, SEP and CEP allow to encode applications whose data and control flow is not completely predictable at compile time. For encoding, SEP and CEP use our set of encoded operations also presented in this thesis. To the best of our knowledge, we are the first ones that present the encoding of a complete RISC instruction set including boolean and bitwise logical operations, casts, unaligned loads and stores, shifts and arithmetic operations. Our evaluations show that encoding with SEP and CEP significantly reduces the amount of erroneous output caused by hardware errors. Furthermore, our evaluations show that, in contrast to replication-based approaches for detecting errors, arithmetic encoding facilitates the detection of permanent hardware errors. This increased reliability does not come for free. However, unexpectedly the runtime costs for the different arithmetic codes supported by CEP compared to redundancy increase only linearly, while the gained safety increases exponentially

Designing Efficient Network Interfaces For System Area Networks

The network is the key component of a Cluster of Workstations/PCs. Its performance, measured in terms of bandwidth and latency, has a great impact on the overall system performance. It quickly became clear that traditional WAN/LAN technology is not too well suited for interconnecting powerful nodes into a cluster. Their poor performance too often slows down communication-intensive applications. This observation led to the birth of a new class of networks called System Area Networks (SAN). The ATOLL network introduces a new optimized architecture for SANs. On a single chip, not one but four network interfaces (NI) have been implemented, together with an on-chip 4x4 full-duplex switch and four link interfaces. This unique "Network on a Chip" architecture is best suited for interconnecting SMP nodes, where multiple CPUs are given an exclusive NI and do not have to share a single interface. It also removes the need for any additional switching hardware, since the four byte-wide full-duplex links can be connected by cables with neighbor nodes in an arbitrary network topology

Hardware Error Detection Using AN-Codes

Due to the continuously decreasing feature sizes and the increasing complexity of integrated circuits, commercial off-the-shelf (COTS) hardware is becoming less and less reliable. However, dedicated reliable hardware is expensive and usually slower than commodity hardware. Thus, economic pressure will most likely result in the usage of unreliable COTS hardware in safety-critical systems. The usage of unreliable, COTS hardware in safety-critical systems results in the need for software-implemented solutions for handling execution errors caused by this unreliable hardware. In this thesis, we provide techniques for detecting hardware errors that disturb the execution of a program. The detection provided facilitates handling of these errors, for example, by retry or graceful degradation. We realize the error detection by transforming unsafe programs that are not guaranteed to detect execution errors into safe programs that detect execution errors with a high probability. Therefore, we use arithmetic AN-, ANB-, ANBD-, and ANBDmem-codes. These codes detect errors that modify data during storage or transport and errors that disturb computations as well. Furthermore, the error detection provided is independent of the hardware used. We present the following novel encoding approaches: - Software Encoded Processing (SEP) that transforms an unsafe binary into a safe execution at runtime by applying an ANB-code, and - Compiler Encoded Processing (CEP) that applies encoding at compile time and provides different levels of safety by using different arithmetic codes. In contrast to existing encoding solutions, SEP and CEP allow to encode applications whose data and control flow is not completely predictable at compile time. For encoding, SEP and CEP use our set of encoded operations also presented in this thesis. To the best of our knowledge, we are the first ones that present the encoding of a complete RISC instruction set including boolean and bitwise logical operations, casts, unaligned loads and stores, shifts and arithmetic operations. Our evaluations show that encoding with SEP and CEP significantly reduces the amount of erroneous output caused by hardware errors. Furthermore, our evaluations show that, in contrast to replication-based approaches for detecting errors, arithmetic encoding facilitates the detection of permanent hardware errors. This increased reliability does not come for free. However, unexpectedly the runtime costs for the different arithmetic codes supported by CEP compared to redundancy increase only linearly, while the gained safety increases exponentially

Cost modelling and concurrent engineering for testable design

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.As integrated circuits and printed circuit boards increase in complexity, testing becomes a major cost factor of the design and production of the complex devices. Testability has to be considered during the design of complex electronic systems, and automatic test systems have to be used in order to facilitate the test. This fact is now widely accepted in industry. Both design for testability and the usage of automatic test systems aim at reducing the cost of production testing or, sometimes, making it possible at all. Many design for testability methods and test systems are available which can be configured into a production test strategy, in order to achieve high quality of the final product. The designer has to select from the various options for creating a test strategy, by maximising the quality and minimising the total cost for the electronic system. This thesis presents a methodology for test strategy generation which is based on consideration of the economics during the life cycle of the electronic system. This methodology is a concurrent engineering approach which takes into account all effects of a test strategy on the electronic system during its life cycle by evaluating its related cost. This objective methodology is used in an original test strategy planning advisory system, which allows for test strategy planning for VLSI circuits as well as for digital electronic systems. The cost models which are used for evaluating the economics of test strategies are described in detail and the test strategy planning system is presented. A methodology for making decisions which are based on estimated costing data is presented. Results of using the cost models and the test strategy planning system for evaluating the economics of test strategies for selected industrial designs are presented