Low-power switched capacitor voltage reference

Low-power analog design represents a developing technological trend as it emerges from a rather limited range of applications to a much wider arena affecting mainstream market segments. It especially affects portable electronics with respect to battery life, performance, and physical size. Meanwhile, low-power analog design enables technologies such as sensor networks and RFID. Research opportunities abound to exploit the potential of low power analog design, apply low-power to established fields, and explore new applications. The goal of this effort is to design a low-power reference circuit that delivers an accurate reference with very minimal power consumption. The circuit and device level low-power design techniques are suitable for a wide range of applications. To meet this goal, switched capacitor bandgap architecture was chosen. It is the most suitable for developing a systematic, and groundup, low-power design approach. In addition, the low-power analog cell library developed would facilitate building a more complex low-power system. A low-power switched capacitor bandgap was designed, fabricated, and fully tested. The bandgap generates a stable 0.6-V reference voltage, in both the discrete-time and continuous-time domain. The system was thoroughly tested and individual building blocks were characterized. The reference voltage is temperature stable, with less than a 100 ppm/°C drift, over a --60 dB power supply rejection, and below a 1 [Mu]A total supply current (excluding optional track-and-hold). Besides using it as a voltage reference, potential applications are also described using derivatives of this switched capacitor bandgap, specifically supply supervisory and on-chip thermal regulation

Integrated Electronics for Wireless Imaging Microsystems with CMUT Arrays

Integration of transducer arrays with interface electronics in the form of single-chip CMUT-on-CMOS has emerged into the field of medical ultrasound imaging and is transforming this field. It has already been used in several commercial products such as handheld full-body imagers and it is being implemented by commercial and academic groups for Intravascular Ultrasound and Intracardiac Echocardiography. However, large attenuation of ultrasonic waves transmitted through the skull has prevented ultrasound imaging of the brain. This research is a prime step toward implantable wireless microsystems that use ultrasound to image the brain by bypassing the skull. These microsystems offer autonomous scanning (beam steering and focusing) of the brain and transferring data out of the brain for further processing and image reconstruction. The objective of the presented research is to develop building blocks of an integrated electronics architecture for CMUT based wireless ultrasound imaging systems while providing a fundamental study on interfacing CMUT arrays with their associated integrated electronics in terms of electrical power transfer and acoustic reflection which would potentially lead to more efficient and high-performance systems. A fully wireless architecture for ultrasound imaging is demonstrated for the first time. An on-chip programmable transmit (TX) beamformer enables phased array focusing and steering of ultrasound waves in the transmit mode while its on-chip bandpass noise shaping digitizer followed by an ultra-wideband (UWB) uplink transmitter minimizes the effect of path loss on the transmitted image data out of the brain. A single-chip application-specific integrated circuit (ASIC) is de- signed to realize the wireless architecture and interface with array elements, each of which includes a transceiver (TRX) front-end with a high-voltage (HV) pulser, a high-voltage T/R switch, and a low-noise amplifier (LNA). Novel design techniques are implemented in the system to enhance the performance of its building blocks. Apart from imaging capability, the implantable wireless microsystems can include a pressure sensing readout to measure intracranial pressure. To do so, a power-efficient readout for pressure sensing is presented. It uses pseudo-pseudo differential readout topology to cut down the static power consumption of the sensor for further power savings in wireless microsystems. In addition, the effect of matching and electrical termination on CMUT array elements is explored leading to new interface structures to improve bandwidth and sensitivity of CMUT arrays in different operation regions. Comprehensive analysis, modeling, and simulation methodologies are presented for further investigation.Ph.D

In-situ and In-field temperature and transistor BTI sensing techniques with microprocessor level implementation

In modern deep-scaled CMOS technologies, various silicon-related pitfalls present challenges to the long-term performance of microprocessors. Such challenges include (1) local hot spots, which breach the thermal limitations of a microprocessor, and (2) transistor aging, especially NBTI, which degrades transistor threshold voltage, ultimately threatening the reliability of the entire memory block. In previous systems, the dummy circuit was placed next to the subject, where the dummy was frequently analyzed, and the readout was used to infer the condition of the target. Due to rapidly changing ambient conditions (e.g., temperature and voltage) and the potential scale of the target dimensions, such metrics may not accurately represent the condition of the target. Moreover, such temperature sensors and canary circuits occupy a significant area. Therefore, it would be highly preferable to monitor the target circuit in-situ, i.e., to sense the precise transistor at operation. It is also important to achieve an accurate sensing metric. When the temperature is analyzed, the readout should account for voltage and process variations. While sensing the aging degradation, the readout should account for voltage and temperature fluctuations. This would allow testing during in-field operation, while the circuits achieve area-efficiency. This research had two stages. One result of the first stage was a silicon test chip that was a compact temperature sensor. It involved a family of PTAT+CTAT sensor front-ends that unitized only 6 to 8 conventional CMOS logic devices, yielding a smaller sized chip. The sensor demonstrates accuracy within the target and achieves a 14.3x smaller foot print than preceding published designs. The second product of the first stage was a PMOS aging sensor used in 6T SRAM circuits. The test chip has a real SRAM array, integrated with the proposed PMOS NBTI sensor. It can sense real PMOS NBTI effects in any bit cell (in-situ) and provide robust readings of temperature and voltage (in-field). Intensive aging tests validated the proposed sensing technique. The second stage was focused on implementing the in-situ and in-field sensing techniques in a real processor. The MIPS microprocessor had a modified instruction cache (I$) and instruction set architecture. With the addition of new instruction aging sensing and minor modification of the circuits, the processor can execute aging sensing opportunistically to evaluate the aging level of its instruction cache. A software framework was developed and verified to estimate the retention voltage of the instruction cache over the lifetime of the chip. An area-efficient SoC was developed that could transform the instruction cache into an ambient temperature sensor. It had a physically unclonable function (PUF), and it was built with an area-saving technique similar to the earlier work. This thesis has four chapters. They are presented in chronological and they are aligned with the research described above

Architectures and Circuit Techniques for High-Performance Field-Programmable CMOS Software Defined Radios

Next-generation wireless communication systems put more stringent performance requirements on the wireless RF receiver circuits. Sensitivity, linearity, bandwidth and power consumption are some of the most important specifications that often face tightly coupled tradeoffs between them. To increase the data throughput, a large number of fragmented spectrums are being introduced to the wireless communication standards. Carrier aggregation technology needs concurrent communication across several non-contiguous frequency bands, which results in a rapidly growing number of band combinations. Supporting all the frequency bands and their aggregation combinations increases the complexity of the RF receivers. Highly flexible software defined radio (SDR) is a promising technology to address these applications scenarios with lower complexity by relaxing the specifications of the RF filters or eliminating them. However, there are still many technology challenges with both the receiver architecture and the circuit implementations. The performance requirements of the receivers can also vary across different application scenario and RF environments. Field-programmable dynamic performance tradeoff can potentially reduce the power consumption of the receiver. In this dissertation, we address the performance enhancement challenges in the wideband SDRs by innovations at both the circuit building block level and the receiver architecture level. A series of research projects are conducted to push the state-of-the-art performance envelope and add features such as field-programmable performance tradeoff and concurrent reception. The projects originate from the concept of thermal noise canceling techniques and further enhance the RF performance and add features for more capable SDR receivers. Four generations of prototype LNA or receiver chips are designed, and each of them pushes at least one aspect of the RF performance such as bandwidth, linearity, and NF. A noise-canceling distributed LNA breaks the tradeoff between NF and RF bandwidth by introducing microwave circuit techniques from the distributed amplifiers. The LNA architecture uniquely provides ultra high bandwidth and low NF at low frequencies. A family of field-programmable LNA realized field-programmable performance tradeoff with current-reuse programmable transconductance cells. Interferer-reflecting loops can be applied around the LNAs to improve their input linearity by rejecting the out-of-band interferers with a wideband low in- put impedance. A low noise transconductance amplifier (LNTA) that operates in class-AB-C is invented to can handle rail-to-rail out-of-band blocker without saturation. Class-AB and class-C transconductors form a composite amplifier to increase the linear range of the input voltage. A new antenna interface named frequency-translational quadrature-hybrid (FTQH) breaks the input impedance matching requirement of the LNAs by introducing quadrature hybrid couplers to the CMOS RFIC design. The FTQH receiver achieves wideband sub-1dB NF and supports scalable massive frequency-agile concurrent reception

Reconfigurable Receiver Front-Ends for Advanced Telecommunication Technologies

The exponential growth of converging technologies, including augmented reality, autonomous vehicles, machine-to-machine and machine-to-human interactions, biomedical and environmental sensory systems, and artificial intelligence, is driving the need for robust infrastructural systems capable of handling vast data volumes between end users and service providers. This demand has prompted a significant evolution in wireless communication, with 5G and subsequent generations requiring exponentially improved spectral and energy efficiency compared to their predecessors. Achieving this entails intricate strategies such as advanced digital modulations, broader channel bandwidths, complex spectrum sharing, and carrier aggregation scenarios. A particularly challenging aspect arises in the form of non-contiguous aggregation of up to six carrier components across the frequency range 1 (FR1). This necessitates receiver front-ends to effectively reject out-of-band (OOB) interferences while maintaining high-performance in-band (IB) operation. Reconfigurability becomes pivotal in such dynamic environments, where frequency resource allocation, signal strength, and interference levels continuously change. Software-defined radios (SDRs) and cognitive radios (CRs) emerge as solutions, with direct RF-sampling receivers offering a suitable architecture in which the frequency translation is entirely performed in digital domain to avoid analog mixing issues. Moreover, direct RF- sampling receivers facilitate spectrum observation, which is crucial to identify free zones, and detect interferences. Acoustic and distributed filters offer impressive dynamic range and sharp roll off characteristics, but their bulkiness and lack of electronic adjustment capabilities limit their practicality. Active filters, on the other hand, present opportunities for integration in advanced CMOS technology, addressing size constraints and providing versatile programmability. However, concerns about power consumption, noise generation, and linearity in active filters require careful consideration.This thesis primarily focuses on the design and implementation of a low-voltage, low-power RFFE tailored for direct sampling receivers in 5G FR1 applications. The RFFE consists of a balun low-noise amplifier (LNA), a Q-enhanced filter, and a programmable gain amplifier (PGA). The balun-LNA employs noise cancellation, current reuse, and gm boosting for wideband gain and input impedance matching. Leveraging FD-SOI technology allows for programmable gain and linearity via body biasing. The LNA's operational state ranges between high-performance and high-tolerance modes, which are apt for sensitivityand blocking tests, respectively. The Q-enhanced filter adopts noise-cancelling, current-reuse, and programmable Gm-cells to realize a fourth-order response using two resonators. The fourth-order filter response is achieved by subtracting the individual response of these resonators. Compared to cascaded and magnetically coupled fourth-order filters, this technique maintains the large dynamic range of second-order resonators. Fabricated in 22-nm FD-SOI technology, the RFFE achieves 1%-40% fractional bandwidth (FBW) adjustability from 1.7 GHz to 6.4 GHz, 4.6 dB noise figure (NF) and an OOB third-order intermodulation intercept point (IIP3) of 22 dBm. Furthermore, concerning the implementation uncertainties and potential variations of temperature and supply voltage, design margins have been considered and a hybrid calibration scheme is introduced. A combination of on-chip and off-chip calibration based on noise response is employed to effectively adjust the quality factors, Gm-cells, and resonance frequencies, ensuring desired bandpass response. To optimize and accelerate the calibration process, a reinforcement learning (RL) agent is used.Anticipating future trends, the concept of the Q-enhanced filter extends to a multiple-mode filter for 6G upper mid-band applications. Covering the frequency range from 8 to 20 GHz, this RFFE can be configured as a fourth-order dual-band filter, two bandpass filters (BPFs) with an OOB notch, or a BPF with an IB notch. In cognitive radios, the filter’s transmission zeros can be positioned with respect to the carrier frequencies of interfering signals to yield over 50 dB blocker rejection

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Modeling and Analysis of Noise and Interconnects for On-Chip Communication Link Design

This thesis considers modeling and analysis of noise and interconnects in onchip communication. Besides transistor count and speed, the capabilities of a modern design are often limited by on-chip communication links. These links typically consist of multiple interconnects that run parallel to each other for long distances between functional or memory blocks. Due to the scaling of technology, the interconnects have considerable electrical parasitics that affect their performance, power dissipation and signal integrity. Furthermore, because of electromagnetic coupling, the interconnects in the link need to be considered as an interacting group instead of as isolated signal paths. There is a need for accurate and computationally effective models in the early stages of the chip design process to assess or optimize issues affecting these interconnects. For this purpose, a set of analytical models is developed for on-chip data links in this thesis. First, a model is proposed for modeling crosstalk and intersymbol interference. The model takes into account the effects of inductance, initial states and bit sequences. Intersymbol interference is shown to affect crosstalk voltage and propagation delay depending on bus throughput and the amount of inductance. Next, a model is proposed for the switching current of a coupled bus. The model is combined with an existing model to evaluate power supply noise. The model is then applied to reduce both functional crosstalk and power supply noise caused by a bus as a trade-off with time. The proposed reduction method is shown to be effective in reducing long-range crosstalk noise. The effects of process variation on encoded signaling are then modeled. In encoded signaling, the input signals to a bus are encoded using additional signaling circuitry. The proposed model includes variation in both the signaling circuitry and in the wires to calculate the total delay variation of a bus. The model is applied to study level-encoded dual-rail and 1-of-4 signaling. In addition to regular voltage-mode and encoded voltage-mode signaling, current-mode signaling is a promising technique for global communication. A model for energy dissipation in RLC current-mode signaling is proposed in the thesis. The energy is derived separately for the driver, wire and receiver termination.Siirretty Doriast

PHY Link Design and Optimization For High-Speed Low-Power Communication Systems

The ever-growing demands for high-bandwidth data transfer have been pushing towards advancing research efforts in the field of high-performing communication systems. Studies on the performance of single chip, e.g. faster multi-core processors and higher system memory capacity, have been explored. To further enhance the system performance, researches have been focused on the improvement of data-transfer bandwidth for chip-to-chip communication in the high-speed serial link. Many solutions have been addressed to overcome the bottleneck caused by the non-idealties such as bandwidth-limited electrical channel that connects two link devices and varieties of undesired noise in the communication systems. Nevertheless, with these solutions data have run into limitations of the timing margins for high-speed interfaces running at multiple gigabits per second data rates on low-cost Printed Circuit Board (PCB) material with constrained power budget. Therefore, the challenge in designing a physical layer (PHY) link for high-speed communication systems turns out to be power-efficient, reliable and cost-effective. In this context, this dissertation is intended to focus on architectural design, system-level and circuit-level verification of a PHY link as well as system performance optimization in respective of power, reliability and adaptability in high-speed communication systems. The PHY is mainly composed of clock data recovery (CDR), equalizers (EQs) and high- speed I/O drivers. Symmetrical structure of the PHY link is usually duplicated in both link devices for bidirectional data transmission. By introducing training mechanisms into high-speed communication systems, the timing in one link device is adaptively aligned to the timing condition specified in the other link device despite of different skews or induced jitter resulting from process, voltage and temperature (PVT) variations in the individual link. With reliable timing relationships among the interface signals provided, the total system bandwidth is dramatically improved. On the other hand, interface training offers high flexibility for reuse without further investigation on high demanding components involved in high costs. In the training mode, a CDR module is essential for reconstructing the transmitted bitstream to achieve the best data eye and to detect the edges of data stream in asynchronous systems or source-synchronous systems. Generally, the CDR works as a feedback control system that aligns its output clock to the center of the received data. In systems that contain multiple data links, the overall CDR power consumption increases linearly with the increase in number of links as one CDR is required for each link. Therefore, a power-efficient CDR plays a significant role in such systems with parallel links. Furthermore, a high performance CDR requires low jitter generation in spite of high input jitter. To minimize the trade-off between power consumption and CDR jitter, a novel CDR architecture is proposed by utilizing the proportional-integral (PI) controller and three times sampling scheme. Meanwhile, signal integrity (SI) becomes critical as the data rate exceeds several gigabits per second. Distorted data due to the non-idealties in systems are likely to reduce the signal quality aggressively and result in intolerable transmission errors in worst case scenarios, thus affect the system effective bandwidth. Hence, additional trainings such as transmitter (Tx) and receiver (Rx) EQ trainings for SI purpose are inserted into the interface training. Besides, a simplified system architecture with unsymmetrical placement of adaptive Rx and Tx EQs in a single link device is proposed and analyzed by using different coefficient adaptation algorithms. This architecture enables to reduce a large number of EQs through the training, especially in case of parallel links. Meanwhile, considerable power and chip area are saved. Finally, high-speed I/O driver against PVT variations is discussed. Critical issues such as overshoot and undershoot interfering with the data are primarily accompanied by impedance mismatch between the I/O driver and its transmitting channel. By applying PVT compensation technique I/O driver impedances can be effectively calibrated close to the target value. Different digital impedance calibration algorithms against PVT variations are implemented and compared for achieving fast calibration and low power requirements

Digital Intensive Mixed Signal Circuits with In-situ Performance Monitors

University of Minnesota Ph.D. dissertation.November 2016. Major: Electrical/Computer Engineering. Advisor: Chris Kim. 1 computer file (PDF); x, 137 pages.Digital intensive circuit design techniques of different mixed-signal systems such as data converters, clock generators, voltage regulators etc. are gaining attention for the implementation of modern microprocessors and system-on-chips (SoCs) in order to fully utilize the benefits of CMOS technology scaling. Moreover different performance improvement schemes, for example, noise reduction, spur cancellation, linearity improvement etc. can be easily performed in digital domain. In addition to that, increasing speed and complexity of modern SoCs necessitate the requirement of in-situ measurement schemes, primarily for high volume testing. In-situ measurements not only obviate the need for expensive measurement equipments and probing techniques, but also reduce the test time significantly when a large number of chips are required to be tested. Several digital intensive circuit design techniques are proposed in this dissertation along with different in-situ performance monitors for a variety of mixed signal systems. First, a novel beat frequency quantization technique is proposed in a two-step VCO quantizer based ADC implementation for direct digital conversion of low amplitude bio- potential signals. By direct conversion, it alleviates the requirement of the area and power consuming analog-frontend (AFE) used in a conventional ADC designs. This prototype design is realized in a 65nm CMOS technology. Measured SNDR is 44.5dB from a 10mVpp, 300Hz signal and power consumption is only 38μW. Next, three different clock generation circuits, a phase-locked loop (PLL), a multiplying delay-locked loop (MDLL) and a frequency-locked loop (FLL) are presented. First a 0.4-to-1.6GHz sub-sampling fractional-N all digital PLL architecture is discussed that utilizes a D-flip-flop as a digital sub-sampler. Measurement results from a 65nm CMOS test-chip shows 5dB lower phase noise at 100KHz offset frequency, compared to a conventional architecture. The Digital PLL (DPLL) architecture is further extended for a digital MDLL implementation in order to suppress the VCO phase noise beyond the DPLL bandwidth. A zero-offset aperture phase detector (APD) and a digital- to-time converter (DTC) are employed for static phase-offset (SPO) cancellation. A unique in-situ detection circuitry achieves a high resolution SPO measurement in time domain. A 65nm test-chip shows 0.2-to-1.45GHz output frequency range while reducing the phase-noise by 9dB compared to a DPLL. Next, a frequency-to-current converter (FTC) based fractional FLL is proposed for a low accuracy clock generation in an extremely low area for IoT application. High density deep-trench capacitors are used for area reduction. The test-chip is fabricated in a 32nm SOI technology that takes only 0.0054mm2 active area. A high-resolution in-situ period jitter measurement block is also incorporated in this design. Finally, a time based digital low dropout (DLDO) regulator architecture is proposed for fine grain power delivery over a wide load current dynamic range and input/output voltage in order to facilitate dynamic voltage and frequency scaling (DVFS). High- resolution beat frequency detector dynamically adjusts the loop sampling frequency for ripple and settling time reduction due to load transients. A fixed steady-state voltage offset provides inherent active voltage positioning (AVP) for ripple reduction. Circuit simulations in a 65nm technology show more than 90% current efficiency for 100X load current variation, while it can operate for an input voltage range of 0.6V – 1.2V