Validation by Measurements of a IC Modeling Approach for SiP Applications

The growing importance of signal integrity (SI) analysis in integrated circuits (ICs), revealed by modern systemin-package methods, is demanding for new models for the IC sub-systems which are both accurate, efficient and extractable by simple measurement procedures. This paper presents the contribution for the establishment of an integrated IC modeling approach whose performance is assessed by direct comparison with the signals measured in laboratory of two distinct memory IC devices. Based on the identification of the main blocks of a typical IC device, the modeling approach consists of a network of system-level sub-models, some of which with already demonstrated accuracy, which simulated the IC interfacing behavior. Emphasis is given to the procedures that were developed to validate by means of laboratory measurements (and not by comparison with circuit-level simulations) the model performance, which is a novel and important aspect that should be considered in the design of IC models that are useful for SI analysi

Printed Circuit Board (PCB) design process and fabrication

This module describes main characteristics of Printed Circuit Boards (PCBs). A brief history of PCBs is introduced in the first chapter. Then, the design processes and the fabrication of PCBs are addressed and finally a study case is presented in the last chapter of the module.Peer ReviewedPostprint (published version

Analysis and design of power delivery networks exploiting simulation tools and numerical optimization techniques

A higher performance of computing systems is being demanded year after year, driving the digital industry to fiercely compete for offering the fastest computer system at the lowest cost. In addition, as computing system performance is growing, power delivery networks (PDN) and power integrity (PI) designs are getting increasingly more relevance due to the faster speeds and more parallelism required to obtain the required performance growth. The largest data throughput at the lowest power consumption is a common goal for most of the commercial computing systems. As a consequence of this performance growth and power delivery tradeoffs, the complexity involved in analyzing and designing PDN in digital systems is being increased. This complexity drives longer design cycle times when using traditional design tools. For this reason, the need of using more efficient design methods is getting more relevance in order to keep designing and launching products in a faster manner to the market. This trend pushes PDN designers to look for methodologies to simplify analysis and reduce design cycle times. The main objective for this Master’s thesis is to propose alternative methods by exploiting reliable simulation approaches and efficient numerical optimization techniques to analyze and design PDN to ensure power integrity. This thesis explores the use of circuital models and electromagnetic (EM) field solvers in combination with numerical optimization methods, including parameter extraction (PE) formulations. It also establishes a sound basis for using space mapping (SM) methodologies in future developments, in a way that we exploit the advantages of the most accurate and powerful models, such as 3D full-wave EM simulators, but conserving the simplicity and low computational resourcing of the analytical, circuital, and empirical models

A Fully-Integrated Quad-Band GSM/GPRS CMOS Power Amplifier

Concentric distributed active transformers (DAT) are used to implement a fully-integrated quad-band power amplifier (PA) in a standard 130 nm CMOS process. The DAT enables the power amplifier to integrate the input and output matching networks on the same silicon die. The PA integrates on-chip closed-loop power control and operates under supply voltages from 2.9 V to 5.5 V in a standard micro-lead-frame package. It shows no oscillations, degradation, or failures for over 2000 hours of operation with a supply of 6 V at 135° under a VSWR of 15:1 at all phase angles and has also been tested for more than 2 million device-hours (with ongoing reliability monitoring) without a single failure under nominal operation conditions. It produces up to +35 dBm of RF power with power-added efficiency of 51%

IC immunity modeling process validation using on-chip measurements

International audienceDeveloping integrated circuit (IC) immunity models and simulation flow has become one of the major concerns of ICs suppliers to predict whether a chip will pass susceptibility tests before fabrication and avoid redesign cost. This paper presents an IC immunity modeling process including the standard immunity test applied to a dedicated test chip. An on-chip voltage sensor is used to characterize the radio frequency interference propagation inside the chip and thus validate the immunity modeling process

On signalling over through-silicon via (TSV) interconnects in 3-D integrated circuits.

This paper discusses signal integrity (SI) issues and signalling techniques for Through Silicon Via (TSV) interconnects in 3-D Integrated Circuits (ICs). Field-solver extracted parasitics of TSVs have been employed in Spice simulations to investigate the effect of each parasitic component on performance metrics such as delay and crosstalk and identify a reduced-order electrical model that captures all relevant effects. We show that in dense TSV structures voltage-mode (VM) signalling does not lend itself to achieving high data-rates, and that current-mode (CM) signalling is more effective for high throughput signalling as well as jitter reduction. Data rates, energy consumption and coupled noise for the different signalling modes are extracted

High-Performance Bioinstrumentation for Real-Time Neuroelectrochemical Traumatic Brain Injury Monitoring

Traumatic brain injury (TBI) has been identified as an important cause of death and severe disability in all age groups and particularly in children and young adults. Central to TBIs devastation is a delayed secondary injury that occurs in 30–40% of TBI patients each year, while they are in the hospital Intensive Care Unit (ICU). Secondary injuries reduce survival rate after TBI and usually occur within 7 days post-injury. State-of-art monitoring of secondary brain injuries benefits from the acquisition of high-quality and time-aligned electrical data i.e., ElectroCorticoGraphy (ECoG) recorded by means of strip electrodes placed on the brains surface, and neurochemical data obtained via rapid sampling microdialysis and microfluidics-based biosensors measuring brain tissue levels of glucose, lactate and potassium. This article progresses the field of multi-modal monitoring of the injured human brain by presenting the design and realization of a new, compact, medical-grade amperometry, potentiometry and ECoG recording bioinstrumentation. Our combined TBI instrument enables the high-precision, real-time neuroelectrochemical monitoring of TBI patients, who have undergone craniotomy neurosurgery and are treated sedated in the ICU. Electrical and neurochemical test measurements are presented, confirming the high-performance of the reported TBI bioinstrumentation