Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs

SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of Single Event Upsets (SEUs) in digital devices. These faults have particularly adverse effects on SRAM-based FPGA systems because not only can they temporarily affect the behaviour of the system by changing the contents of flip-flops or memories, but they can also permanently change the functionality implemented by the system itself, by changing the content of the configuration memory. Designing safety-critical applications requires accurate methodologies to evaluate the system’s sensitivity to SEUs as early as possible during the design process. Moreover it is necessary to detect the occurrence of SEUs during the system life-time. To this purpose test patterns should be generated during the design process, and then applied to the inputs of the system during its operation. In this thesis we propose a set of software tools that could be used by designers of SRAM-based FPGA safety-critical applications to assess the sensitivity to SEUs of the system and to generate test patterns for in-service testing. The main feature of these tools is that they implement a model of SEUs affecting the configuration bits controlling the logic and routing resources of an FPGA device that has been demonstrated to be much more accurate than the classical stuck-at and open/short models, that are commonly used in the analysis of faults in digital devices. By keeping this accurate fault model into account, the proposed tools are more accurate than similar academic and commercial tools today available for the analysis of faults in digital circuits, that do not take into account the features of the FPGA technology.. In particular three tools have been designed and developed: (i) ASSESS: Accurate Simulator of SEuS affecting the configuration memory of SRAM-based FPGAs, a simulator of SEUs affecting the configuration memory of an SRAM-based FPGA system for the early assessment of the sensitivity to SEUs; (ii) UA2TPG: Untestability Analyzer and Automatic Test Pattern Generator for SEUs Affecting the Configuration Memory of SRAM-based FPGAs, a static analysis tool for the identification of the untestable SEUs and for the automatic generation of test patterns for in-service testing of the 100% of the testable SEUs; and (iii) GABES: Genetic Algorithm Based Environment for SEU Testing in SRAM-FPGAs, a Genetic Algorithm-based Environment for the generation of an optimized set of test patterns for in-service testing of SEUs. The proposed tools have been applied to some circuits from the ITC’99 benchmark. The results obtained from these experiments have been compared with results obtained by similar experiments in which we considered the stuck-at fault model, instead of the more accurate model for SEUs. From the comparison of these experiments we have been able to verify that the proposed software tools are actually more accurate than similar tools today available. In particular the comparison between results obtained using ASSESS with those obtained by fault injection has shown that the proposed fault simulator has an average error of 0:1% and a maximum error of 0:5%, while using a stuck-at fault simulator the average error with respect of the fault injection experiment has been 15:1% with a maximum error of 56:2%. Similarly the comparison between the results obtained using UA2TPG for the accurate SEU model, with the results obtained for stuck-at faults has shown an average difference of untestability of 7:9% with a maximum of 37:4%. Finally the comparison between fault coverages obtained by test patterns generated for the accurate model of SEUs and the fault coverages obtained by test pattern designed for stuck-at faults, shows that the former detect the 100% of the testable faults, while the latter reach an average fault coverage of 78:9%, with a minimum of 54% and a maximum of 93:16%

Flight test results of the strapdown hexad inertial reference unit (SIRU). Volume 2: Test report

Results of flight tests of the Strapdown Inertial Reference Unit (SIRU) navigation system are presented. The fault tolerant SIRU navigation system features a redundant inertial sensor unit and dual computers. System software provides for detection and isolation of inertial sensor failures and continued operation in the event of failures. Flight test results include assessments of the system's navigational performance and fault tolerance. Performance shortcomings are analyzed

Hierarchical Communication Diagrams

Formal modelling languages range from strictly textual ones like process algebra scripts to visual modelling languages based on hierarchical graphs like coloured Petri nets. Approaches equipped with visual modelling capabilities make developing process easier and help users to cope with more complex systems. Alvis is a modelling language that combines possibilities of formal models verification with flexibility and simplicity of practical programming languages. The paper deals with hierarchical communication diagrams - the visual layer of the Alvis modelling language. It provides all necessary information to model system structure with Alvis, to manipulate a model hierarchy and to understand a model semantics. All considered concepts are discussed using illustrative examples

NASA Space Engineering Research Center Symposium on VLSI Design

The NASA Space Engineering Research Center (SERC) is proud to offer, at its second symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories and the electronics industry. These featured speakers share insights into next generation advances that will serve as a basis for future VLSI design. Questions of reliability in the space environment along with new directions in CAD and design are addressed by the featured speakers

A hierarchical test generation methodology for digital circuits

A new hierarchical modeling and test generation technique for digital circuits is presented. First, a high-level circuit model and a bus fault model are introduced—these generalize the classical gate-level circuit model and the single-stuck-line (SSL) fault model. Faults are represented by vectors allowing many faults to be implicitly tested in parallel. This is illustrated in detail for the special case of array circuits using a new high-level representation, called the modified pseudo-sequential model, which allows simultaneous test generation for faults on individual lines of a multiline bus. A test generation algorithm called VPODEM is then developed to generate tests for bus faults in high-level models of arbitrary combinational circuits. VPODEM reduces to standard PODEM if gate-level circuit and fault models are used. This method can be used to generate tests for general circuits in a hierarchical fashion, with both high- and low-level fault types, yielding 100 percent SSL fault coverage with significantly fewer test patterns and less test generation effort than conventional one-level approaches. Experimental results are presented for representative circuits to compare VPODEM to standard PODEM and to random test generation techniques, demonstrating the advantages of the proposed hierarchical approach.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/43007/1/10836_2004_Article_BF00137388.pd

Синтез самопроверяемых схем встроенного контроля на основе метода логического дополнения до равновесного кода «2 из 4»

The article explores the peculiarities of self-checking integrated control circuits synthesis by the Boolean complement method based on the "2-out-of-4'' constant-weight code. The article describes the features of integrated control circuits implementation by the Boolean complement method. It is noted that it is possible to synthesize the structures of discrete devices, which have less structural redundancy than in situation of the control circuit implementation by the method of duplication. The effect in structural redundancy reducing is achieved by minimizing the complexity of the control logic block technical implementation and using checkers that are simpler in their structures than the comparator in the system of duplication. The article proposes a method of the integrated control circuit organization based on determining the values of control functions taking into account the maintenance of testability of elements of addition by modulo two in the Boolean complement block and the checker of the "2-out-of-4" code.Исследуются особенности синтеза самопроверяемых схем встроенного контроля по методу логического дополнения на основе равновесного кода «2 из 4». Описываются особенности реализации схем встроенного контроля по методу логического дополнения. Отмечается возможность синтеза структур дискретных устройств, имеющих меньшую структурную избыточность, чем при реализации схемы контроля по методу дублирования. Эффект в снижении структурной избыточности достигается за счет минимизации сложности технической реализации блока контрольной логики и использования более простых по своим структурам тестеров, чем компаратор в системе дублирования. Предлагается способ организации схемы встроенного контроля, основанный на доопределении значений контрольных функций с учетом обеспечения тестируемости элементов сложения по модулю два в блоке логического дополнения и тестера кода «2 из 4»

Design of a Microprogram Control Unit with Concurrent Error Detection

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryOffice of Naval Research / N00039-80-C-0556U of I OnlyRestricted to UIUC communit