Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture

Desde el punto de vista de seguridad, la certificación aeronáutica de aplicaciones críticas de vuelo requiere diferentes técnicas que son usadas para prevenir fallos en los equipos electrónicos. Los fallos de tipo hardware debido a la radiación solar que existe a las alturas standard de vuelo, como SEU (Single Event Upset) y MCU (Multiple Bit Upset), provocan un cambio de estado de los bits que soportan la información almacenada en memoria. Estos fallos se producen, por ejemplo, en la memoria de configuración de una FPGA, que es donde se definen todas las funcionalidades. Las técnicas de protección requieren normalmente de redundancias que incrementan el coste, número de componentes, tamaño de la memoria y peso. En la fase de desarrollo de aplicaciones críticas de vuelo, generalmente se utilizan una serie de estándares o recomendaciones de diseño como ABD100, RTCA DO-160, IEC62395, etc, y diferentes técnicas de protección para evitar fallos del tipo SEU o MCU. Estas técnicas están basadas en procesos tecnológicos específicos como memorias robustas, codificaciones para detección y corrección de errores (EDAC), redundancias software, redundancia modular triple (TMR) o soluciones a nivel sistema. Esta tesis está enfocada a minimizar e incluso suprimir los efectos de los SEUs y MCUs que particularmente ocurren en la electrónica de avión como consecuencia de la exposición a radiación de partículas no cargadas (como son los neutrones) que se encuentra potenciada a las típicas alturas de vuelo. La criticidad en vuelo que tienen determinados sistemas obligan a que dichos sistemas sean tolerantes a fallos, es decir, que garanticen un correcto funcionamiento aún cuando se produzca un fallo en ellos. Es por ello que soluciones como las presentadas en esta tesis tienen interés en el sector industrial. La Tesis incluye una descripción inicial de la física de la radiación incidente sobre aeronaves, y el análisis de sus efectos en los componentes electrónicos aeronaúticos basados en semiconductor, que desembocan en la generación de SEUs y MCUs. Este análisis permite dimensionar adecuadamente y optimizar los procedimientos de corrección que se propongan posteriormente. La Tesis propone un sistema de corrección de fallos SEUs y MCUs que permita cumplir la condición de Sistema Tolerante a Fallos, a la vez que minimiza los niveles de redundancia y de complejidad de los códigos de corrección. El nivel de redundancia es minimizado con la introducción del concepto propuesto HSB (Hardwired Seed Bits), en la que se reduce la información esencial a unos pocos bits semilla, neutros frente a radiación. Los códigos de corrección requeridos se reducen a la corrección de un único error, gracias al uso del concepto de Distancia Virtual entre Bits, a partir del cual será posible corregir múltiples errores simultáneos (MCUs) a partir de códigos simples de corrección. Un ejemplo de aplicación de la Tesis es la implementación de una Protección Tolerante a Fallos sobre la memoria SRAM de una FPGA. Esto significa que queda protegida no sólo la información contenida en la memoria sino que también queda auto-protegida la función de protección misma almacenada en la propia SRAM. De esta forma, el sistema es capaz de auto-regenerarse ante un SEU o incluso un MCU, independientemente de la zona de la SRAM sobre la que impacte la radiación. Adicionalmente, esto se consigue con códigos simples tales como corrección por bit de paridad y Hamming, minimizando la dedicación de recursos de computación hacia tareas de supervisión del sistema.For airborne safety critical applications certification, different techniques are implemented to prevent failures in electronic equipments. The HW failures at flying heights of aircrafts related to solar radiation such as SEU (Single-Event-Upset) and MCU (Multiple Bit Upset), causes bits alterations that corrupt the information at memories. These HW failures cause errors, for example, in the Configuration-Code of an FPGA that defines the functionalities. The protection techniques require classically redundant functionalities that increases the cost, components, memory space and weight. During the development phase for airborne safety critical applications, different aerospace standards are generally recommended as ABD100, RTCA-DO160, IEC62395, etc, and different techniques are classically used to avoid failures such as SEU or MCU. These techniques are based on specific technology processes, Hardened memories, error detection and correction codes (EDAC), SW redundancy, Triple Modular Redundancy (TMR) or System level solutions. This Thesis is focussed to minimize, and even to remove, the effects of SEUs and MCUs, that particularly occurs in the airborne electronics as a consequence of its exposition to solar radiation of non-charged particles (for example the neutrons). These non-charged particles are even powered at flying altitudes due to aircraft volume. The safety categorization of different equipments/functionalities requires a design based on fault-tolerant approach that means, the system will continue its normal operation even if a failure occurs. The solution proposed in this Thesis is relevant for the industrial sector because of its Fault-tolerant capability. Thesis includes an initial description for the physics of the solar radiation that affects into aircrafts, and also the analyses of their effects into the airborne electronics based on semiconductor components that create the SEUs and MCUs. This detailed analysis allows the correct sizing and also the optimization of the procedures used to correct the errors. This Thesis proposes a system that corrects the SEUs and MCUs allowing the fulfilment of the Fault-Tolerant requirement, reducing the redundancy resources and also the complexity of the correction codes. The redundancy resources are minimized thanks to the introduction of the concept of HSB (Hardwired Seed Bits), in which the essential information is reduced to a few seed bits, neutral to radiation. The correction codes required are reduced to the correction of one error thanks to the use of the concept of interleaving distance between adjacent bits, this allows the simultaneous multiple error correction with simple single error correcting codes. An example of the application of this Thesis is the implementation of the Fault-tolerant architecture of an SRAM-based FPGA. That means that the information saved in the memory is protected but also the correction functionality is auto protected as well, also saved into SRAM memory. In this way, the system is able to self-regenerate the information lost in case of SEUs or MCUs. This is independent of the SRAM area affected by the radiation. Furthermore, this performance is achieved by means simple error correcting codes, as parity bits or Hamming, that minimize the use of computational resources to this supervision tasks for system.Programa Oficial de Doctorado en Ingeniería Eléctrica, Electrónica y AutomáticaPresidente: Luis Alfonso Entrena Arrontes.- Secretario: Pedro Reviriego Vasallo.- Vocal: Mª Luisa López Vallej

inSense: A Variation and Fault Tolerant Architecture for Nanoscale Devices

Transistor technology scaling has been the driving force in improving the size, speed, and power consumption of digital systems. As devices approach atomic size, however, their reliability and performance are increasingly compromised due to reduced noise margins, difficulties in fabrication, and emergent nano-scale phenomena. Scaled CMOS devices, in particular, suffer from process variations such as random dopant fluctuation (RDF) and line edge roughness (LER), transistor degradation mechanisms such as negative-bias temperature instability (NBTI) and hot-carrier injection (HCI), and increased sensitivity to single event upsets (SEUs). Consequently, future devices may exhibit reduced performance, diminished lifetimes, and poor reliability. This research proposes a variation and fault tolerant architecture, the inSense architecture, as a circuit-level solution to the problems induced by the aforementioned phenomena. The inSense architecture entails augmenting circuits with introspective and sensory capabilities which are able to dynamically detect and compensate for process variations, transistor degradation, and soft errors. This approach creates ``smart\u27\u27 circuits able to function despite the use of unreliable devices and is applicable to current CMOS technology as well as next-generation devices using new materials and structures. Furthermore, this work presents an automated prototype implementation of the inSense architecture targeted to CMOS devices and is evaluated via implementation in ISCAS \u2785 benchmark circuits. The automated prototype implementation is functionally verified and characterized: it is found that error detection capability (with error windows from $\approx$30-400ps) can be added for less than 2\% area overhead for circuits of non-trivial complexity. Single event transient (SET) detection capability (configurable with target set-points) is found to be functional, although it generally tracks the standard DMR implementation with respect to overheads

An Approach to Emulate and Validate the Effects of Single Event Upsets using the PREDICT FUTRE Hardware Integrated Framework

Due to the advances in electronics design automation industry, worldwide, the integrated approach to model and emulate the single event effects due to cosmic radiation, in particular single event upsets or single event transients is gaining momentum. As of now, no integrated methodology to inject the fault in parallel to functional test vectors or to estimate the effects of radiation for a selected function in system on chip at design phase exists. In this paper, a framework, PRogrammable single Event effects Demonstrator for dIgital Chip Technologies (PREDICT) failure assessment for radiation effects is developed using a hardware platform and aided by genetic algorithms addressing all the above challenges. A case study is carried out to evaluate the frameworks capability to emulate the effects of radiation using the co-processor as design under test (DUT) function. Using the ML605 and Virtex-6 evaluation board for single and three particle simulations with the layered atmospheric conditions, the proposed framework consumes approximately 100 min and 300 min, respectively; it consumes 600 min for 3 particle random atmospheric conditions, using the 64 GB RAM, 64-bit operating system with 3.1 GHz processor based workstation. The framework output transforms the 4 MeVcm2/mg linear energy transfer to a single event transient pulse width of 2 μs with 105 amplification factor for visualisation, which matches well with the existing experimental results data. Using the framework, the effects of radiation for the co-processing module are estimated during the design phase and the success rate of the DUT is found to be 48 per cent

Multiple bit error correcting architectures over finite fields

This thesis proposes techniques to mitigate multiple bit errors in GF arithmetic circuits. As GF arithmetic circuits such as multipliers constitute the complex and important functional unit of a crypto-processor, making them fault tolerant will improve the reliability of circuits that are employed in safety applications and the errors may cause catastrophe if not mitigated. Firstly, a thorough literature review has been carried out. The merits of efficient schemes are carefully analyzed to study the space for improvement in error correction, area and power consumption. Proposed error correction schemes include bit parallel ones using optimized BCH codes that are useful in applications where power and area are not prime concerns. The scheme is also extended to dynamically correcting scheme to reduce decoder delay. Other method that suits low power and area applications such as RFIDs and smart cards using cross parity codes is also proposed. The experimental evaluation shows that the proposed techniques can mitigate single and multiple bit errors with wider error coverage compared to existing methods with lesser area and power consumption. The proposed scheme is used to mask the errors appearing at the output of the circuit irrespective of their cause. This thesis also investigates the error mitigation schemes in emerging technologies (QCA, CNTFET) to compare area, power and delay with existing CMOS equivalent. Though the proposed novel multiple error correcting techniques can not ensure 100% error mitigation, inclusion of these techniques to actual design can improve the reliability of the circuits or increase the difficulty in hacking crypto-devices. Proposed schemes can also be extended to non GF digital circuits

Predictive Reliability and Fault Management in Exascale Systems: State of the Art and Perspectives

© ACM, 2020. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in ACM Computing Surveys, Vol. 53, No. 5, Article 95. Publication date: September 2020. https://doi.org/10.1145/3403956[EN] Performance and power constraints come together with Complementary Metal Oxide Semiconductor technology scaling in future Exascale systems. Technology scaling makes each individual transistor more prone to faults and, due to the exponential increase in the number of devices per chip, to higher system fault rates. Consequently, High-performance Computing (HPC) systems need to integrate prediction, detection, and recovery mechanisms to cope with faults efficiently. This article reviews fault detection, fault prediction, and recovery techniques in HPC systems, from electronics to system level. We analyze their strengths and limitations. Finally, we identify the promising paths to meet the reliability levels of Exascale systems.This work has received funding from the European Union's Horizon 2020 (H2020) research and innovation program under the FET-HPC Grant Agreement No. 801137 (RECIPE). Jaume Abella was also partially supported by the Ministry of Economy and Competitiveness of Spain under Contract No. TIN2015-65316-P and under Ramon y Cajal Postdoctoral Fellowship No. RYC-2013-14717, as well as by the HiPEAC Network of Excellence. Ramon Canal is partially supported by the Generalitat de Catalunya under Contract No. 2017SGR0962.Canal, R.; Hernández Luz, C.; Tornero-Gavilá, R.; Cilardo, A.; Massari, G.; Reghenzani, F.; Fornaciari, W.... (2020). Predictive Reliability and Fault Management in Exascale Systems: State of the Art and Perspectives. ACM Computing Surveys. 53(5):1-32. https://doi.org/10.1145/3403956S132535Abella, J., Hernandez, C., Quinones, E., Cazorla, F. J., Conmy, P. R., Azkarate-askasua, M., … Vardanega, T. (2015). WCET analysis methods: Pitfalls and challenges on their trustworthiness. 10th IEEE International Symposium on Industrial Embedded Systems (SIES). doi:10.1109/sies.2015.7185039E. Agullo L. Giraud A. Guermouche J. Roman and M. Zounon. 2013. Towards resilient parallel linear Krylov solvers: Recover-restart strategies. INRIA Research Report RR-8324. E. Agullo L. Giraud A. Guermouche J. Roman and M. Zounon. 2013. Towards resilient parallel linear Krylov solvers: Recover-restart strategies. INRIA Research Report RR-8324.Agullo, E., Giraud, L., Salas, P., & Zounon, M. (2016). Interpolation-Restart Strategies for Resilient Eigensolvers. SIAM Journal on Scientific Computing, 38(5), C560-C583. doi:10.1137/15m1042115Al-Qawasmeh, A. M., Pasricha, S., Maciejewski, A. A., & Siegel, H. J. (2015). Power and Thermal-Aware Workload Allocation in Heterogeneous Data Centers. IEEE Transactions on Computers, 64(2), 477-491. doi:10.1109/tc.2013.116ARM. 2017. ARM Reliability Availability and Serviceability (RAS) Specification—ARMv8 for the ARMv8-A Architecture Profile. White paper. Retrieved from https://developer.arm.com/docs/ddi0587/latest. ARM. 2017. ARM Reliability Availability and Serviceability (RAS) Specification—ARMv8 for the ARMv8-A Architecture Profile. White paper. Retrieved from https://developer.arm.com/docs/ddi0587/latest.Avizienis, A., Laprie, J.-C., Randell, B., & Landwehr, C. (2004). Basic concepts and taxonomy of dependable and secure computing. IEEE Transactions on Dependable and Secure Computing, 1(1), 11-33. doi:10.1109/tdsc.2004.2Bautista-Gomez, L., Zyulkyarov, F., Unsal, O., & McIntosh-Smith, S. (2016). Unprotected Computing: A Large-Scale Study of DRAM Raw Error Rate on a Supercomputer. SC16: International Conference for High Performance Computing, Networking, Storage and Analysis. doi:10.1109/sc.2016.54Berrocal, E., Bautista-Gomez, L., Di, S., Lan, Z., & Cappello, F. (2017). Toward General Software Level Silent Data Corruption Detection for Parallel Applications. IEEE Transactions on Parallel and Distributed Systems, 28(12), 3642-3655. doi:10.1109/tpds.2017.2735971M.-A. Breuer and A. D. Friedman. 1976. Diagnosis 8 Reliable Design of Digital Systems. Springer. M.-A. Breuer and A. D. Friedman. 1976. Diagnosis 8 Reliable Design of Digital Systems. Springer.P. Bridges K. Ferreira M. Heroux and M. Hoemmen. 2012. Fault-tolerant linear solvers via selective reliability. ArXiv e-prints June 2012. arXiv:1206.1390 [math.NA]. P. Bridges K. Ferreira M. Heroux and M. Hoemmen. 2012. Fault-tolerant linear solvers via selective reliability. ArXiv e-prints June 2012. arXiv:1206.1390 [math.NA].F. Cappello A. Geist W. Gropp S. Kale B. Kramer and M. Snir. 2014. Toward exascale resilience: 2014 update. Supercomput. Front. Innovat. 1 1 (2014). http://superfri.org/superfri/article/view/14. F. Cappello A. Geist W. Gropp S. Kale B. Kramer and M. Snir. 2014. Toward exascale resilience: 2014 update. Supercomput. Front. Innovat. 1 1 (2014). http://superfri.org/superfri/article/view/14.F. J. Cazorla L. Kosmidis E. Mezzetti C. Hernandez J. Abella and T. Vardanega. 2019. Probabilistic worst-case timing analysis: Taxonomy and comprehensive survey. ACM Comput. Surv. 52 1 Article 14 (Feb. 2019) 35 pages. DOI:https://doi.org/10.1145/3301283 F. J. Cazorla L. Kosmidis E. Mezzetti C. Hernandez J. Abella and T. Vardanega. 2019. Probabilistic worst-case timing analysis: Taxonomy and comprehensive survey. ACM Comput. Surv. 52 1 Article 14 (Feb. 2019) 35 pages. DOI:https://doi.org/10.1145/3301283Chan, C. S., Pan, B., Gross, K., Vaidyanathan, K., & Rosing, T. Š. (2014). Correcting vibration-induced performance degradation in enterprise servers. ACM SIGMETRICS Performance Evaluation Review, 41(3), 83-88. doi:10.1145/2567529.2567555Chantem, T., Hu, X. S., & Dick, R. P. (2011). Temperature-Aware Scheduling and Assignment for Hard Real-Time Applications on MPSoCs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 19(10), 1884-1897. doi:10.1109/tvlsi.2010.2058873Chen, M. Y., Kiciman, E., Fratkin, E., Fox, A., & Brewer, E. (s. f.). Pinpoint: problem determination in large, dynamic Internet services. Proceedings International Conference on Dependable Systems and Networks. doi:10.1109/dsn.2002.1029005Chen, Z. (2011). Algorithm-based recovery for iterative methods without checkpointing. Proceedings of the 20th international symposium on High performance distributed computing - HPDC ’11. doi:10.1145/1996130.1996142Chen, Z. (2013). Online-ABFT. Proceedings of the 18th ACM SIGPLAN symposium on Principles and practice of parallel programming - PPoPP ’13. doi:10.1145/2442516.2442533Coskun, A. K., Rosing, T. S., Mihic, K., De Micheli, G., & Leblebici, Y. (2006). Analysis and Optimization of MPSoC Reliability. Journal of Low Power Electronics, 2(1), 56-69. doi:10.1166/jolpe.2006.007G. Da Costa A. Oleksiak W. Piatek J. Salom and L. Sisó. 2015. Minimization of costs and energy consumption in a data center by a workload-based capacity management. In Energy Efficient Data Centers S. Klingert M. Chinnici and M. Rey Porto (Eds.). Springer International Publishing Cham 102--119. G. Da Costa A. Oleksiak W. Piatek J. Salom and L. Sisó. 2015. Minimization of costs and energy consumption in a data center by a workload-based capacity management. In Energy Efficient Data Centers S. Klingert M. Chinnici and M. Rey Porto (Eds.). Springer International Publishing Cham 102--119.Cupertino, L., Da Costa, G., Oleksiak, A., Pia¸tek, W., Pierson, J.-M., Salom, J., … Zilio, T. (2015). Energy-efficient, thermal-aware modeling and simulation of data centers: The CoolEmAll approach and evaluation results. Ad Hoc Networks, 25, 535-553. doi:10.1016/j.adhoc.2014.11.002Dally, W. J. (1991). Express cubes: improving the performance of k-ary n-cube interconnection networks. IEEE Transactions on Computers, 40(9), 1016-1023. doi:10.1109/12.83652Dauwe, D., Pasricha, S., Maciejewski, A. A., & Siegel, H. J. (2018). Resilience-Aware Resource Management for Exascale Computing Systems. IEEE Transactions on Sustainable Computing, 3(4), 332-345. doi:10.1109/tsusc.2018.2797890R. I. Davis and A. Burns. 2011. A survey of hard real-time scheduling for multiprocessor systems. ACM Comput. Surv. 43 4 Article 35 (Oct. 2011) 44 pages. DOI:https://doi.org/10.1145/1978802.1978814 R. I. Davis and A. Burns. 2011. A survey of hard real-time scheduling for multiprocessor systems. ACM Comput. Surv. 43 4 Article 35 (Oct. 2011) 44 pages. DOI:https://doi.org/10.1145/1978802.1978814Di, S., & Cappello, F. (2016). Adaptive Impact-Driven Detection of Silent Data Corruption for HPC Applications. IEEE Transactions on Parallel and Distributed Systems, 27(10), 2809-2823. doi:10.1109/tpds.2016.2517639Di, S., Guo, H., Gupta, R., Pershey, E. R., Snir, M., & Cappello, F. (2019). Exploring Properties and Correlations of Fatal Events in a Large-Scale HPC System. IEEE Transactions on Parallel and Distributed Systems, 30(2), 361-374. doi:10.1109/tpds.2018.2864184Di, S., Robert, Y., Vivien, F., & Cappello, F. (2017). Toward an Optimal Online Checkpoint Solution under a Two-Level HPC Checkpoint Model. IEEE Transactions on Parallel and Distributed Systems, 28(1), 244-259. doi:10.1109/tpds.2016.2546248J. Dongarra T. Herault and Y. Robert. 2015. Fault Tolerance Techniques for High-Performance Computing. Springer. J. Dongarra T. Herault and Y. Robert. 2015. Fault Tolerance Techniques for High-Performance Computing. Springer.DOWNING, S., & SOCIE, D. (1982). Simple rainflow counting algorithms. International Journal of Fatigue, 4(1), 31-40. doi:10.1016/0142-1123(82)90018-4Eghbalkhah, B., Kamal, M., Afzali-Kusha, H., Afzali-Kusha, A., Ghaznavi-Ghoushchi, M. B., & Pedram, M. (2015). Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits. Microelectronics Reliability, 55(8), 1152-1162. doi:10.1016/j.microrel.2015.06.004Gottscho, M., Shoaib, M., Govindan, S., Sharma, B., Wang, D., & Gupta, P. (2017). Measuring the Impact of Memory Errors on Application  Performance. IEEE Computer Architecture Letters, 16(1), 51-55. doi:10.1109/lca.2016.2599513Greenberg, A., Hamilton, J. R., Jain, N., Kandula, S., Kim, C., Lahiri, P., … Sengupta, S. (2011). VL2. Communications of the ACM, 54(3), 95-104. doi:10.1145/1897852.1897877Heroux, M. A., Bartlett, R. A., Howle, V. E., Hoekstra, R. J., Hu, J. J., Kolda, T. G., … Stanley, K. S. (2005). An overview of the Trilinos project. ACM Transactions on Mathematical Software, 31(3), 397-423. doi:10.1145/1089014.1089021Hoffmann, G. A., Trivedi, K. S., & Malek, M. (2007). A Best Practice Guide to Resource Forecasting for Computing Systems. IEEE Transactions on Reliability, 56(4), 615-628. doi:10.1109/tr.2007.909764Hsiao, M. Y., Carter, W. C., Thomas, J. W., & Stringfellow, W. R. (1981). Reliability, Availability, and Serviceability of IBM Computer Systems: A Quarter Century of Progress. IBM Journal of Research and Development, 25(5), 453-468. doi:10.1147/rd.255.0453Hughes, G. F., Murray, J. F., Kreutz-Delgado, K., & Elkan, C. (2002). Improved disk-drive failure warnings. IEEE Transactions on Reliability, 51(3), 350-357. doi:10.1109/tr.2002.802886S. Hukerikar and C. Engelmann. 2017. Resilience design patterns: A structured approach to resilience at extreme scale. Supercomput. Front. Innov. 4 3 (2017). DOI:https://doi.org/10.14529/jsfi170301 S. Hukerikar and C. Engelmann. 2017. Resilience design patterns: A structured approach to resilience at extreme scale. Supercomput. Front. Innov. 4 3 (2017). DOI:https://doi.org/10.14529/jsfi170301Hussain, H., Malik, S. U. R., Hameed, A., Khan, S. U., Bickler, G., Min-Allah, N., … Rayes, A. (2013). A survey on resource allocation in high performance distributed computing systems. Parallel Computing, 39(11), 709-736. doi:10.1016/j.parco.2013.09.009Intel Corporation. [n.d.]. Intel Xeon Processor E7 Family: Reliability Availability and Serviceability. White paper. https://www.intel.com/content/www/us/en/processors/xeon/xeon-e7-family-ras-server-paper.html. Intel Corporation. [n.d.]. Intel Xeon Processor E7 Family: Reliability Availability and Serviceability. White paper. https://www.intel.com/content/www/us/en/processors/xeon/xeon-e7-family-ras-server-paper.html.Jha, S., Formicola, V., Martino, C. D., Dalton, M., Kramer, W. T., Kalbarczyk, Z., & Iyer, R. K. (2018). Resiliency of HPC Interconnects: A Case Study of Interconnect Failures and Recovery in Blue Waters. IEEE Transactions on Dependable and Secure Computing, 15(6), 915-930. doi:10.1109/tdsc.2017.2737537Kiciman, E., & Fox, A. (2005). Detecting Application-Level Failures in Component-Based Internet Services. IEEE Transactions on Neural Networks, 16(5), 1027-1041. doi:10.1109/tnn.2005.853411Kim, T., Sun, Z., Cook, C., Zhao, H., Li, R., Wong, D., & Tan, S. X.-D. (2016). Invited - Cross-layer modeling and optimization for electromigration induced reliability. Proceedings of the 53rd Annual Design Automation Conference. doi:10.1145/2897937.2905010Kurowski, K., Oleksiak, A., Piątek, W., Piontek, T., Przybyszewski, A., & Węglarz, J. (2013). DCworms – A tool for simulation of energy efficiency in distributed computing infrastructures. Simulation Modelling Practice and Theory, 39, 135-151. doi:10.1016/j.simpat.2013.08.007Langou, J., Chen, Z., Bosilca, G., & Dongarra, J. (2008). Recovery Patterns for Iterative Methods in a Parallel Unstable Environment. SIAM Journal on Scientific Computing, 30(1), 102-116. doi:10.1137/040620394J. C. Laprie (Ed.). 1995. Dependability—Its Attributes Impairments and Means. Springer-Verlag Berlin. J. C. Laprie (Ed.). 1995. Dependability—Its Attributes Impairments and Means. Springer-Verlag Berlin.Laprie, J.-C. (s. f.). DEPENDABLE COMPUTING AND FAULT TOLERANCE : CONCEPTS AND TERMINOLOGY. Twenty-Fifth International Symposium on Fault-Tolerant Computing, 1995, ’ Highlights from Twenty-Five Years’. doi:10.1109/ftcsh.1995.532603Lasance, C. J. M. (2003). Thermally driven reliability issues in microelectronic systems: status-quo and challenges. Microelectronics Reliability, 43(12), 1969-1974. doi:10.1016/s0026-2714(03)00183-5Yinglung Liang, Yanyong Zhang, Sivasubramaniam, A., Jette, M., & Sahoo, R. (s. f.). BlueGene/L Failure Analysis and Prediction Models. International Conference on Dependable Systems and Networks (DSN’06). doi:10.1109/dsn.2006.18Lin, T.-T. Y., & Siewiorek, D. P. (1990). Error log analysis: statistical modeling and heuristic trend analysis. IEEE Transactions on Reliability, 39(4), 419-432. doi:10.1109/24.58720Losada, N., González, P., Martín, M. J., Bosilca, G., Bouteiller, A., & Teranishi, K. (2020). Fault tolerance of MPI applications in exascale systems: The ULFM solution. Future Generation Computer Systems, 106, 467-481. doi:10.1016/j.future.2020.01.026Lyons, R. E., & Vanderkulk, W. (1962). The Use of Triple-Modular Redundancy to Improve Computer Reliability. IBM Journal of Research and Development, 6(2), 200-209. doi:10.1147/rd.62.0200M. Médard and S. S. Lumetta. 2003. Network Reliability and Fault Tolerance. American Cancer Society. Retrieved from arXiv:https://onlinelibrary.wiley.com/doi/pdf/10.1002/0471219282.eot281. M. Médard and S. S. Lumetta. 2003. Network Reliability and Fault Tolerance. American Cancer Society. Retrieved from arXiv:https://onlinelibrary.wiley.com/doi/pdf/10.1002/0471219282.eot281.Moody, A., Bronevetsky, G., Mohror, K., & de Supinski, B. (2010). Detailed Modeling, Design, and Evaluation of a Scalable Multi-level Checkpointing System. doi:10.2172/984082Moor Insights 8 Strategy. 2017. AMD EPYC Brings New RAS Capability. White paper. Retrieved from https://www.amd.com/system/files/2017-06/AMD-EPYC-Brings-New-RAS-Capability.pdf. Moor Insights 8 Strategy. 2017. AMD EPYC Brings New RAS Capability. White paper. Retrieved from https://www.amd.com/system/files/2017-06/AMD-EPYC-Brings-New-RAS-Capability.pdf.Mulas, F., Atienza, D., Acquaviva, A., Carta, S., Benini, L., & De Micheli, G. (2009). Thermal Balancing Policy for Multiprocessor Stream Computing Platforms. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 28(12), 1870-1882. doi:10.1109/tcad.2009.2032372Oleksiak, A., Kierzynka, M., Piatek, W., Agosta, G., Barenghi, A., Brandolese, C., … Janssen, U. (2017). M2DC – Modular Microserver DataCentre with heterogeneous hardware. Microprocessors and Microsystems, 52, 117-130. doi:10.1016/j.micpro.2017.05.019Oxley, M. A., Jonardi, E., Pasricha, S., Maciejewski, A. A., Siegel, H. J., Burns, P. J., & Koenig, G. A. (2018). Rate-based thermal, power, and co-location aware resource management for heterogeneous data centers. Journal of Parallel and Distributed Computing, 112, 126-139. doi:10.1016/j.jpdc.2017.04.015K. O’brien I. Pietri R. Reddy A. Lastovetsky and R. Sakellariou. 2017. A survey of power and energy predictive models in HPC systems and applications. ACM Comput. Surv. 50 3 Article 37 (June 2017) 38 pages. DOI:https://doi.org/10.1145/3078811 K. O’brien I. Pietri R. Reddy A. Lastovetsky and R. Sakellariou. 2017. A survey of power and energy predictive models in HPC systems and applications. ACM Comput. Surv. 50 3 Article 37 (June 2017) 38 pages. DOI:https://doi.org/10.1145/3078811Park, S.-M., & Humphrey, M. (2011). Predictable High-Performance Computing Using Feedback Control and Admission Control. IEEE Transactions on Parallel and Distributed Systems, 22(3), 396-411. doi:10.1109/tpds.2010.100Pfefferman, J. D., & Cernuschi-Frias, B. (2002). A nonparametric nonstationary procedure for failure prediction. IEEE Transactions on Reliability, 51(4), 434-442. doi:10.1109/tr.2002.804733Rangan, K. K., Wei, G.-Y., & Brooks, D. (2009). Thread motion. ACM SIGARCH Computer Architecture News, 37(3), 302-313. doi:10.1145/1555815.1555793Paolo Rech. [n.d.]. Reliability Issues in Current and Future Supercomputers. Retrieved from http://energysfe.ufsc.br/slides/Paolo-Rech-260917.pdf. Paolo Rech. [n.d.]. Reliability Issues in Current and Future Supercomputers. Retrieved from http://energysfe.ufsc.br/slides/Paolo-Rech-260917.pdf.F. Reghenzani G. Massari and W. Fornaciari. 2019. The real-time Linux kernel: A survey on PREEMPT_RT. Comput. Surveys 52 1 Article 18 (Feb. 2019) 36 pages. DOI:https://doi.org/10.1145/3297714 F. Reghenzani G. Massari and W. Fornaciari. 2019. The real-time Linux kernel: A survey on PREEMPT_RT. Comput. Surveys 52 1 Article 18 (Feb. 2019) 36 pages. DOI:https://doi.org/10.1145/3297714F. Salfner M. Lenk and M. Malek. 2010. A survey of online failure prediction methods. ACM Comput. Surv. 42 3 Article 10 (March 2010) 42 pages. DOI:https://doi.org/10.1145/1670679.1670680 F. Salfner M. Lenk and M. Malek. 2010. A survey of online failure prediction methods. ACM Comput. Surv. 42 3 Article 10 (March 2010) 42 pages. DOI:https://doi.org/10.1145/1670679.1670680Salfner, F., Schieschke, M., & Malek, M. (2006). Predicting failures of computer systems: a case study for a telecommunication system. Proceedings 20th IEEE International Parallel & Distributed Processing Symposium. doi:10.1109/ipdps.2006.1639672Shi, L., Chen, H., Sun, J., & Li, K. (2012). vCUDA: GPU-Accelerated High-Performance Computing in Virtual Machines. IEEE Transactions on Computers, 61(6), 804-816. doi:10.1109/tc.2011.112D. P. Siewiorek and R. S. Swarz. 1998. Reliable Computer Systems 3rd ed. A. K. Peters Ltd. D. P. Siewiorek and R. S. Swarz. 1998. Reliable Computer Systems 3rd ed. A. K. Peters Ltd.Singh, S., & Chana, I. (2016). A Survey on Resource Scheduling in Cloud Computing: Issues and Challenges. Journal of Grid Computing, 14(2), 217-264. doi:10.1007/s10723-015-9359-2Slegel, T. J., Averill, R. M., Check, M. A., Giamei, B. C., Krumm, B. W., Krygowski, C. A., … Webb, C. F. (1999). IBM’s S/390 G5 microprocessor design. IEEE Micro, 19(2), 12-23. doi:10.1109/40.755464Sridhar, A., Sabry, M. M., & Atienza, D. (2014). A Semi-Analytical Thermal Modeling Framework for Liquid-Cooled ICs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 33(8), 1145-1158. doi:10.1109/tcad.2014.2323194Sridharan, V., DeBardeleben, N., Blanchard, S., Ferreira, K. B., Stearley, J., Shalf, J., & Gurumurthi, S. (2015). Memory Errors in Modern Systems. ACM SIGARCH Computer Architecture News, 43(1), 297-310. doi:10.1145/2786763.2694348Stathis, J. H. (2018). The physics of NBTI: What do we really know? 2018 IEEE International Reliability Physics Symposium (IRPS). doi:10.1109/irps.2018.8353539Stellner, G. (s. f.). CoCheck: checkpointing and process migration for MPI. Proceedings of International Conference on Parallel Processing. doi:10.1109/ipps.1996.508106Stone, J. E., Gohara, D., & Shi, G. (2010). OpenCL: A Parallel Programming Standard for Heterogeneous Computing Systems. Computing in Science & Engineering, 12(3), 66-73. doi:10.1109/mcse.2010.69Subasi, O., Di, S., Bautista-Gomez, L., Balaprakash, P., Unsal, O., Labarta, J., … Cappello, F. (2018). Exploring the capabilities of support vector machines in detecting silent data corruptions. Sustainable Computing: Informatics and Systems, 19, 277-290. doi:10.1016/j.suscom.2018.01.004Tang, D., & Iyer, R. K. (1993). Dependability measurement and modeling of a multicomputer system. IEEE Transactions on Computers, 42(1), 62-75. doi:10.1109/12.192214D. Turnbull and N. Alldrin. 2003. Failure Prediction in Hardware Systems. Tech. rep. University of California San Diego CA. Retrieved from http://www.cs.ucsd.edu/ dturnbul/Papers/ServerPrediction.pdf. D. Turnbull and N. Alldrin. 2003. Failure Prediction in Hardware Systems. Tech. rep. University of California San Diego CA. Retrieved from http://www.cs.ucsd.edu/ dturnbul/Papers/ServerPrediction.pdf.Vilalta, R., Apte, C. V., Hellerstein, J. L., Ma, S., & Weiss, S. M. (2002). Predictive algorithms in the management of computer systems. IBM Systems Journal, 41(3), 461-474. doi:10.1147/sj.413.0461Vinoski, S. (2007). Reliability with Erlang. IEEE Internet Com

A fault-tolerant multiprocessor architecture for aircraft, volume 1

A fault-tolerant multiprocessor architecture is reported. This architecture, together with a comprehensive information system architecture, has important potential for future aircraft applications. A preliminary definition and assessment of a suitable multiprocessor architecture for such applications is developed

ENHANCEMENT OF MARKOV RANDOM FIELD MECHANISM TO ACHIEVE FAULT-TOLERANCE IN NANOSCALE CIRCUIT DESIGN

As the MOSFET dimensions scale down towards nanoscale level, the reliability of circuits based on these devices decreases. Hence, designing reliable systems using these nano-devices is becoming challenging. Therefore, a mechanism has to be devised that can make the nanoscale systems perform reliably using unreliable circuit components. The solution is fault-tolerant circuit design. Markov Random Field (MRF) is an effective approach that achieves fault-tolerance in integrated circuit design. The previous research on this technique suffers from limitations at the design, simulation and implementation levels. As improvements, the MRF fault-tolerance rules have been validated for a practical circuit example. The simulation framework is extended from thermal to a combination of thermal and random telegraph signal (RTS) noise sources to provide a more rigorous noise environment for the simulation of circuits build on nanoscale technologies. Moreover, an architecture-level improvement has been proposed in the design of previous MRF gates. The redesigned MRF is termed as Improved-MRF. The CMOS, MRF and Improved-MRF designs were simulated under application of highly noisy inputs. On the basis of simulations conducted for several test circuits, it is found that Improved-MRF circuits are 400 whereas MRF circuits are only 10 times more noise-tolerant than the CMOS alternatives. The number of transistors, on the other hand increased from a factor of 9 to 15 from MRF to Improved-MRF respectively (as compared to the CMOS). Therefore, in order to provide a trade-off between reliability and the area overhead required for obtaining a fault-tolerant circuit, a novel parameter called as ‘Reliable Area Index’ (RAI) is introduced in this research work. The value of RAI exceeds around 1.3 and 40 times for MRF and Improved-MRF respectively as compared to CMOS design which makes Improved- MRF to be still 30 times more efficient circuit design than MRF in terms of maintaining a suitable trade-off between reliability and area-consumption of the circuit