A verification technique for multiple soft fault diagnosis of linear analog circuits

The paper deals with multiple soft fault diagnosis of linear analog circuits. A fault verification method is developed that allows estimating the values of a set of the parameters considered as potentially faulty. The method exploits the transmittance of the circuit and is based on a diagnostic test leading to output signal in discrete form. Applying Z-transform a diagnostic equation is written which is next reproduced. The obtained system of equations consisting of larger number of equations than the number of the parameters is solved using appropriate numerical approach. The method is adapted to real circumstances taking into account scattering of the fault–free parameters within their tolerance ranges and some errors produced by the method. In consequence, the results provided by the method have the form of ranges including the values of the tested parameters. To illustrate the method two examples of real electronic circuits are given

Fault-based Analysis of Industrial Cyber-Physical Systems

The fourth industrial revolution called Industry 4.0 tries to bridge the gap between traditional Electronic Design Automation (EDA) technologies and the necessity of innovating in many indus- trial fields, e.g., automotive, avionic, and manufacturing. This complex digitalization process in- volves every industrial facility and comprises the transformation of methodologies, techniques, and tools to improve the efficiency of every industrial process. The enhancement of functional safety in Industry 4.0 applications needs to exploit the studies related to model-based and data-driven anal- yses of the deployed Industrial Cyber-Physical System (ICPS). Modeling an ICPS is possible at different abstraction levels, relying on the physical details included in the model and necessary to describe specific system behaviors. However, it is extremely complicated because an ICPS is com- posed of heterogeneous components related to different physical domains, e.g., digital, electrical, and mechanical. In addition, it is also necessary to consider not only nominal behaviors but even faulty behaviors to perform more specific analyses, e.g., predictive maintenance of specific assets. Nevertheless, these faulty data are usually not present or not available directly from the industrial machinery. To overcome these limitations, constructing a virtual model of an ICPS extended with different classes of faults enables the characterization of faulty behaviors of the system influenced by different faults. In literature, these topics are addressed with non-uniformly approaches and with the absence of standardized and automatic methodologies for describing and simulating faults in the different domains composing an ICPS. This thesis attempts to overcome these state-of-the-art gaps by proposing novel methodologies, techniques, and tools to: model and simulate analog and multi-domain systems; abstract low-level models to higher-level behavioral models; and monitor industrial systems based on the Industrial Internet of Things (IIOT) paradigm. Specifically, the proposed contributions involve the exten- sion of state-of-the-art fault injection practices to improve the ICPSs safety, the development of frameworks for safety operations automatization, and the definition of a monitoring framework for ICPSs. Overall, fault injection in analog and digital models is the state of the practice to en- sure functional safety, as mentioned in the ISO 26262 standard specific for the automotive field. Starting from state-of-the-art defects defined for analog descriptions, new defects are proposed to enhance the IEEE P2427 draft standard for analog defect modeling and coverage. Moreover, dif- ferent techniques to abstract a transistor-level model to a behavioral model are proposed to speed up the simulation of faulty circuits. Therefore, unlike the electrical domain, there is no extensive use of fault injection techniques in the mechanical one. Thus, extending the fault injection to the mechanical and thermal fields allows for supporting the definition and evaluation of more reliable safety mechanisms. Hence, a taxonomy of mechanical faults is derived from the electrical domain by exploiting the physical analogies. Furthermore, specific tools are built for automatically instru- menting different descriptions with multi-domain faults. The entire work is proposed as a basis for supporting the creation of increasingly resilient and secure ICPS that need to preserve functional safety in any operating context

Measurements, Models, Systems and Design

531 s.

Multi-Sensor Data Fusion Approach for Kinematic Quantities

A theoretical framework to implement multi-sensor data fusion methods for kinematic quantities is proposed. All methods defined through the framework allow the combination of signals obtained from position, velocity and acceleration sensors addressing the same target, and improvement in the observation of the kinematics of the target. Differently from several alternative methods, the considered ones need no dynamic and/or error models to operate and can be implemented with low computational burden. In fact, they gain measurements by summing filtered versions of the heterogeneous kinematic quantities. In particular, in the case of position measurement, the use of filters with finite impulse responses, all characterized by finite gain throughout the bandwidth, in place of straightforward time-integrative operators, prevents the drift that is typically produced by the offset and low-frequency noise affecting velocity and acceleration data. A simulated scenario shows that the adopted method keeps the error in a position measurement, obtained indirectly from an accelerometer affected by an offset equal to 1 ppm on the full scale, within a few ppm of the full-scale position. If the digital output of the accelerometer undergoes a second-order time integration, instead, the measurement error would theoretically rise up to 1 n(n + 1) ppm in the full scale at the n-th 2 discrete time instant. The class of methods offered by the proposed framework is therefore interesting in those applications in which the direct position measurements are characterized by poor accuracy and one has also to look at the velocity and acceleration data to improve the tracking of a target

Methods and Systems for Fault Diagnosis in Nuclear Power Plants

This research mainly deals with fault diagnosis in nuclear power plants (NPP), based on a framework that integrates contributions from fault scope identification, optimal sensor placement, sensor validation, equipment condition monitoring, and diagnostic reasoning based on pattern analysis. The research has a particular focus on applications where data collected from the existing SCADA (supervisory, control, and data acquisition) system is not sufficient for the fault diagnosis system. Specifically, the following methods and systems are developed. A sensor placement model is developed to guide optimal placement of sensors in NPPs. The model includes 1) a method to extract a quantitative fault-sensor incidence matrix for a system; 2) a fault diagnosability criterion based on the degree of singularities of the incidence matrix; and 3) procedures to place additional sensors to meet the diagnosability criterion. Usefulness of the proposed method is demonstrated on a nuclear power plant process control test facility (NPCTF). Experimental results show that three pairs of undiagnosable faults can be effectively distinguished with three additional sensors selected by the proposed model. A wireless sensor network (WSN) is designed and a prototype is implemented on the NPCTF. WSN is an effective tool to collect data for fault diagnosis, especially for systems where additional measurements are needed. The WSN has distributed data processing and information fusion for fault diagnosis. Experimental results on the NPCTF show that the WSN system can be used to diagnose all six fault scenarios considered for the system. A fault diagnosis method based on semi-supervised pattern classification is developed which requires significantly fewer training data than is typically required in existing fault diagnosis models. It is a promising tool for applications in NPPs, where it is usually difficult to obtain training data under fault conditions for a conventional fault diagnosis model. The proposed method has successfully diagnosed nine types of faults physically simulated on the NPCTF. For equipment condition monitoring, a modified S-transform (MST) algorithm is developed by using shaping functions, particularly sigmoid functions, to modify the window width of the existing standard S-transform. The MST can achieve superior time-frequency resolution for applications that involves non-stationary multi-modal signals, where classical methods may fail. Effectiveness of the proposed algorithm is demonstrated using a vibration test system as well as applications to detect a collapsed pipe support in the NPCTF. The experimental results show that by observing changes in time-frequency characteristics of vibration signals, one can effectively detect faults occurred in components of an industrial system. To ensure that a fault diagnosis system does not suffer from erroneous data, a fault detection and isolation (FDI) method based on kernel principal component analysis (KPCA) is extended for sensor validations, where sensor faults are detected and isolated from the reconstruction errors of a KPCA model. The method is validated using measurement data from a physical NPP. The NPCTF is designed and constructed in this research for experimental validations of fault diagnosis methods and systems. Faults can be physically simulated on the NPCTF. In addition, the NPCTF is designed to support systems based on different instrumentation and control technologies such as WSN and distributed control systems. The NPCTF has been successfully utilized to validate the algorithms and WSN system developed in this research. In a real world application, it is seldom the case that one single fault diagnostic scheme can meet all the requirements of a fault diagnostic system in a nuclear power. In fact, the values and performance of the diagnosis system can potentially be enhanced if some of the methods developed in this thesis can be integrated into a suite of diagnostic tools. In such an integrated system, WSN nodes can be used to collect additional data deemed necessary by sensor placement models. These data can be integrated with those from existing SCADA systems for more comprehensive fault diagnosis. An online performance monitoring system monitors the conditions of the equipment and provides key information for the tasks of condition-based maintenance. When a fault is detected, the measured data are subsequently acquired and analyzed by pattern classification models to identify the nature of the fault. By analyzing the symptoms of the fault, root causes of the fault can eventually be identified

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations