Estimation of Analog Parametric Test Metrics Using Copulas

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Fast, non-monte-carlo estimation of transient performance variation due to device mismatch

This paper describes an efficient way of simulating the effects of device random mismatch on circuit transient characteristics, such as variations in delay or in frequency. The proposed method models DC random offsets as equivalent AC pseudo-noises and leverages the fast, linear periodically time-varying (LPTV) noise analysis available from RF circuit simulators. Therefore, the method can be considered as an extension to DC match analysis and offers a large speed-up compared to the traditional Monte-Carlo analysis. Although the assumed linear perturbation model is valid only for small variations, it enables easy ways to estimate correlations among variations and identify the most sensitive design parameters to mismatch, all at no additional simulation cost. Three benchmarks measuring the variations in the input offset voltage of a clocked comparator, the delay of a logic path, and the frequency of an oscillator demonstrate the speed improvement of about 100-1000x compared to a 1000-point Monte-Carlo method

Spatial Correlation Robust Inference with Errors in Location or Distance

This paper presents results from a Monte Carlo study concerning inference with spatially dependent data. We investigate the impact of location/distance measurement errors upon the accuracy of parametric and nonparametric estimators of asymptotic variances. Nonparametric estimators are quite robust to such errors, method of moments estimators perform surprisingly well, and MLE estimators are very poor. We also present and evaluate a specification test based on a parametric bootstrap that has good power properties for the types of measurement error we consider.

Spatial correlation robust inference with Errors in Location or Distance

This paper presents results from a Monte Carlo study concerning inference with spatially dependent data. It investigates the impact of location/distance measurement errors upon the accuracy of parametric and nonparametric estimators of asymptotic variances.

Intersection Bounds: estimation and inference

We develop a practical and novel method for inference on intersection bounds, namely bounds defined by either the infimum or supremum of a parametric or nonparametric function, or equivalently, the value of a linear programming problem with a potentially infinite constraint set. Our approach is especially convenient in models comprised of a continuum of inequalities that are separable in parameters, and also applies to models with inequalities that are non-separable in parameters. Since analog estimators for intersection bounds can be severely biased in finite samples, routinely underestimating the length of the identified set, we also offer a (downward/upward) median unbiased estimator of these (upper/lower) bounds as a natural by-product of our inferential procedure. Furthermore, our method appears to be the first and currently only method for inference in nonparametric models with a continuum of inequalities. We develop asymptotic theory for our method based on the strong approximation of a sequence of studentized empirical processes by a sequence of Gaussian or other pivotal processes. We provide conditions for the use of nonparametric kernel and series estimators, including a novel result that establishes strong approximation for general series estimators, which may be of independent interest. We illustrate the usefulness of our method with Monte Carlo experiments and an empirical example.

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field. Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions

A Review of Bayesian Methods in Electronic Design Automation

The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]

Stochastic Yield Analysis of Rare Failure Events in High-Dimensional Variation Space

As semiconductor industry kept shrinking the feature size to nanometer scale, circuit reliability has become an area of growing concern due to the uncertainty introduced by process variations. For highly-replicated standard cells, the failure event for each individual component must be extremely rare in order to maintain sufficiently high yield rate. Existing yield analysis approaches works fine at low dimension, but less effective either when there are a large amount of circuit parameters, or when the failure samples are distributed in multiple regions. In this thesis, four novel high sigma analysis approaches have been proposed. First, we propose an adaptive importance sampling (AIS) algorithm. AIS has several iterations of sampling region adjustments, while existing methods pre-decide a static sampling distribution. At each iteration, AIS generates samples from current proposed distribution. Next, AIS carefully assigns weight to each sample based on its tilted occurrence probability between failure region and current failure region distribution. Then we design two adaptive frameworks based on Resampling and population Metropolis-Hastings (MH) to iteratively search for failure regions. Second, we develop an Adaptive Clustering and Sampling (ACS) method to estimate the failure rate of high-dimensional and multi-failure-region circuit cases. The basic idea of the algorithm is to cluster failure samples and build global sampling distribution at each iteration. Specifically, in clustering step, we propose a multi-cone clustering method, which partitions the parametric space and clusters failure samples. Then global sampling distribution is constructed from a set of weighted Gaussian distributions. Next, we calculate importance weight for each sample based on the discrepancy between sampling distribution and target distribution. Failure probability is updated at the end of each iteration. This clustering and sampling procedure proceeds iteratively until all the failure regions are covered.Moreover, two meta-model based approaches are proposed for high sigma analysis. The Low-Rank Tensor Approximation (LRTA) formulate the meta-model in tensor space by representing a multi-way tensor into a finite sum of rank-one tensor. The polynomial degree of our LRTA model grows linearly with circuit dimension, which makes it especially promising for high-dimensional circuit problems. Then we solve our LRTA model efficiently with a robust greedy algorithm, and calibrate iteratively with an adaptive sampling method. The meta-model based importance sampling (MIS) method utilizes Gaussian Process meta-model to construct quasi-optimal importance sampling distribution, and performs Markov Chain Monte Carlo (MCMC) simulation to generate new samples from the proposed distribution. By updating our global Importance Sampling estimator in an iterated framework, MIS leads to better efficiency and higher accuracy than traditional importance sampling methods. Experiment results validate that the proposed approaches are 3 orders faster than Monte Carlo, and more accurate than both academia solutions such as importance sampling and classification based methods, and industrial solutions such as mixture IS used by Intel

A machine learning approach to portfolio pricing and risk management for high-dimensional problems

We present a general framework for portfolio risk management in discrete time, based on a replicating martingale. This martingale is learned from a finite sample in a supervised setting. The model learns the features necessary for an effective low-dimensional representation, overcoming the curse of dimensionality common to function approximation in high-dimensional spaces. We show results based on polynomial and neural network bases. Both offer superior results to naive Monte Carlo methods and other existing methods like least-squares Monte Carlo and replicating portfolios.Comment: 30 pages (main), 10 pages (appendix), 3 figures, 22 table