19 research outputs found

    Strain-Engineered MOSFETs

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    This book brings together new developments in the area of strain-engineered MOSFETs using high-mibility substrates such as SIGe, strained-Si, germanium-on-insulator and III-V semiconductors into a single text which will cover the materials aspects, principles, and design of advanced devices, their fabrication and applications. The book presents a full TCAD methodology for strain-engineering in Si CMOS technology involving data flow from process simulation to systematic process variability simulation and generation of SPICE process compact models for manufacturing for yield optimization

    Energy efficient core designs for upcoming process technologies

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    Energy efficiency has been a first order constraint in the design of micro processors for the last decade. As Moore's law sunsets, new technologies are being actively explored to extend the march in increasing the computational power and efficiency. It is essential for computer architects to understand the opportunities and challenges in utilizing the upcoming process technology trends in order to design the most efficient processors. In this work, we consider three process technology trends and propose core designs that are best suited for each of the technologies. The process technologies are expected to be viable over a span of timelines. We first consider the most popular method currently available to improve the energy efficiency, i.e. by lowering the operating voltage. We make key observations regarding the limiting factors in scaling down the operating voltage for general purpose high performance processors. Later, we propose our novel core design, ScalCore, one that can work in high performance mode at nominal Vdd, and in a very energy-efficient mode at low Vdd. The resulting core design can operate at much lower voltages providing higher parallel performance while consuming lower energy. While lowering Vdd improves the energy efficiency, CMOS devices are fundamentally limited in their low voltage operation. Therefore, we next consider an upcoming device technology -- Tunneling Field-Effect Transistors (TFETs), that is expected to supplement CMOS device technology in the near future. TFETs can attain much higher energy efficiency than CMOS at low voltages. However, their performance saturates at high voltages and, therefore, cannot entirely replace CMOS when high performance is needed. Ideally, we desire a core that is as energy-efficient as TFET and provides as much performance as CMOS. To reach this goal, we characterize the TFET device behavior for core design and judiciously integrate TFET units, CMOS units in a single core. The resulting core, called HetCore, can provide very high energy efficiency while limiting the slowdown when compared to a CMOS core. Finally, we analyze Monolithic 3D (M3D) integration technology that is widely considered to be the only way to integrate more transistors on a chip. We present the first analysis of the architectural implications of using M3D for core design and show how to partition the core across different layers. We also address one of the key challenges in realizing the technology, namely, the top layer performance degradation. We propose a critical path based partitioning for logic stages and asymmetric bit/port partitioning for storage stages. The result is a core that performs nearly as well as a core without any top layer slowdown. When compared to a 2D baseline design, an M3D core not only provides much higher performance, it also reduces the energy consumption at the same time. In summary, this thesis addresses one of the fundamental challenges in computer architecture -- overcoming the fact that CMOS is not scaling anymore. As we increase the computing power on a single chip, our ability to power the entire chip keeps decreasing. This thesis proposes three solutions aimed at solving this problem over different timelines. Across all our solutions, we improve energy efficiency without compromising the performance of the core. As a result, we are able to operate twice as many cores with in the same power budget as regular cores, significantly alleviating the problem of dark silicon

    Expanding the toolbox of atomic scale processing

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    Op Amp Design in Nanoscale Processes Using Fixed-Length Devices

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    Analog integrated circuit design has become increasingly difficult in modern fabrication processes. The motivation for digital speed has posed problems for mixed-signal projects that wish to implement digital and analog blocks on the same chip. With the introduction of multigate transistors (also known as FinFETs), the challenges for analog design increase. This is due to the fact that FinFET devices will no longer have a continuum of width and lengths sizes (as previous technologies have exhibited), but instead, these parameters are now quantized. This work proposes a potential solution to the fixed-length problem, in a topology termed the ``series-stack". Foundries plan to launch the FinFET technology with a number of fixed-sized transistors (typically with minimum length). To the digital designer, this poses little problem, but for analog circuits, not being able to control device length compromises the ability to meet gain specifications. This work explores a simple method for implementing longer devices: connecting transistors in series, herein called series-stack. To test the feasibility of this architecture, a two-stage CMOS operational amplifier is designed. In lieu of application-specific design constraints, a structure strategy is presented. A key motivation for the series-stack as well as the design strategy is to bring the analog design process up a level of abstraction. The amplifier was planned to be put through the entire design cycle, from conception to lab testing, giving insight into the accuracy of simulation models. Schematic and post-layout results were collected from the TSMC 65nm kit. Analysis of the results yield obvious simulation discrepancies. Namely, the schematic simulation vastly overestimates the parasitic resistances and capacitances when using finger-gate techniques. This is an important problem for which possible solutions are discussed. Additionally, the results show significant differences between conventional bulk length and series-stack, with a relative error spanning from 2% to 20% depending on the performance metric. Yet, most discrepancies are expected, and the two implementations follow similar trends with respect to current density and length. A final verdict cannot be delivered until physical chip testing is conducted, which is left to future work (complications in timeline did not allow for the lab test results to be included). Although chip testing was not completed, a thorough testing plan is formulated. Despite physical testing, the series-stack is deemed a suitable alternative to long transistor designs, especially when considering the organizational advantages at the layout level

    Spintronic device modeling and evaluation using modular approach to spintronics

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    Spintronics technology finds itself in an exciting stage today. Riding on the backs of rapid growth and impressive advances in materials and phenomena, it has started to make headway in the memory industry as solid state magnetic memories (STT-MRAM) and is considered a possible candidate to replace the CMOS when its scaling reaches physical limits. It is necessary to bring all these advances together in a coherent fashion to explore and evaluate the potential of spintronic devices. This work creates a framework for this exploration and evaluation based on Modular Approach to Spintronics, which encapsulate the physics of transport of charge and spin through materials and the phenomenology of magnetic dynamics and interaction in benchmarked elemental modules. These modules can then be combined together to form spin-circuit models of complex spintronic devices and structures which can be simulated using SPICE like circuit simulators. In this work we demonstrate how Modular Approach to Spintronics can be used to build spin-circuit models of functional spintronic devices of all types: memory, logic, and oscillators. We then show how Modular Approach to Spintronics can help identify critical factors behind static and dynamic dissipation in spintronic devices and provide remedies by exploring the use of various alternative materials and phenomena. Lastly, we show the use of Modular Approach to Spintronics in exploring new paradigms of computing enabled by the inherent physics of spintronic devices. We hope that this work will encourage more research and experiments that will establish spintronics as a viable technology for continued advancement of electronics

    Advances in Solid State Circuit Technologies

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    This book brings together contributions from experts in the fields to describe the current status of important topics in solid-state circuit technologies. It consists of 20 chapters which are grouped under the following categories: general information, circuits and devices, materials, and characterization techniques. These chapters have been written by renowned experts in the respective fields making this book valuable to the integrated circuits and materials science communities. It is intended for a diverse readership including electrical engineers and material scientists in the industry and academic institutions. Readers will be able to familiarize themselves with the latest technologies in the various fields
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