Parametric macromodeling of lossy and dispersive multiconductor transmission lines

We propose an innovative parametric macromodeling technique for lossy and dispersive multiconductor transmission lines (MTLs) that can be used for interconnect modeling. It is based on a recently developed method for the analysis of lossy and dispersive MTLs extended by using the multivariate orthonormal vector fitting (MOVF) technique to build parametric macromodels in a rational form. They take into account design parameters, such as geometrical layout or substrate features, in addition to frequency. The presented technique is suited to generate state-space models and synthesize equivalent circuits, which can be easily embedded into conventional SPICE-like solvers. Parametric macromodels allow to perform design space exploration, design optimization, and sensitivity analysis efficiently. Numerical examples validate the proposed approach in both frequency and time domain

Transient simulation of complex electronic circuits and systems operating at ultra high frequencies

The electronics industry worldwide faces increasingly difficult challenges in a bid to produce ultra-fast, reliable and inexpensive electronic devices. Electronic manufacturers rely on the Electronic Design Automation (EDA) industry to produce consistent Computer A id e d Design (CAD) simulation tools that w ill enable the design of new high-performance integrated circuits (IC), the key component of a modem electronic device. However, the continuing trend towards increasing operational frequencies and shrinking device sizes raises the question of the capability of existing circuit simulators to accurately and efficiently estimate circuit behaviour. The principle objective of this thesis is to advance the state-of-art in the transient simulation of complex electronic circuits and systems operating at ultra high frequencies. Given a set of excitations and initial conditions, the research problem involves the determination of the transient response o f a high-frequency complex electronic system consisting of linear (interconnects) and non-linear (discrete elements) parts with greatly improved efficien cy compared to existing methods and with the potential for very high accuracy in a way that permits an effective trade-off between accuracy and computational complexity. High-frequency interconnect effects are a major cause of the signal degradation encountered b y a signal propagating through linear interconnect networks in the modem IC. Therefore, the development of an interconnect model that can accurately and efficiently take into account frequency-dependent parameters of modem non-uniform interconnect is of paramount importance for state-of-art circuit simulators. Analytical models and models based on a set of tabulated data are investigated in this thesis. Two novel, h igh ly accurate and efficient interconnect simulation techniques are developed. These techniques combine model order reduction methods with either an analytical resonant model or an interconnect model generated from frequency-dependent sparameters derived from measurements or rigorous full-wave simulation. The latter part o f the thesis is concerned with envelope simulation. The complex mixture of profoundly different analog/digital parts in a modern IC gives rise to multitime signals, where a fast changing signal arising from the digital section is modulated by a slower-changing envelope signal related to the analog part. A transient analysis of such a circuit is in general very time-consuming. Therefore, specialised methods that take into account the multi-time nature o f the signal are required. To address this issue, a novel envelope simulation technique is developed. This technique combines a wavelet-based collocation method with a multi-time approach to result in a novel simulation technique that enables the desired trade-off between the required accuracy and computational efficiency in a simple and intuitive way. Furthermore, this new technique has the potential to greatly reduce the overall design cycle

Delay Extraction Based Equivalent Elmore Model For RLC On-Chip Interconnects

As feature sizes for VLSI technology is shrinking, associated with higher operating frequency, signal integrity analysis of on-chip interconnects has become a real challenge for circuit designers. For this purpose, computer-aided-design (CAD) tools are necessary to simulate signal propagation of on-chip interconnects which has been an active area for research. Although SPICE models exist which can accurately predict signal degradation of interconnects, they are computationally expensive. As a result, more effective and analytic models for interconnects are required to capture the response at the output of high speed VLSI circuits. This thesis contributes to the development of efficient and closed form solution models for signal integrity analysis of on-chip interconnects. The proposed model uses a delay extraction algorithm to improve the accuracy of two-pole Elmore based models used in the analysis of on-chip distributed RLC interconnects. In the proposed scheme, the time of fight signal delay is extracted without increasing the number of poles or affecting the stability of the transfer function. This algorithm is used for both unit step and ramp inputs. From the delay rational approximation of the transfer function, analytic fitted expressions are obtained for the 50% delay and rise time for unit step input. The proposed algorithm is tested on point to point interconnections and tree structure networks. Numerical examples illustrate improved 50% delay and rise time estimates when compared to traditional Elmore based two-pole models

Analytic Delay Model of RLC Interconnects using Numerical Inversion of the Laplace Transform

Signal integrity analysis for on-chip interconnect becomes increasingly important in high-speed designs. SPICE, a conventional circuit simulator, can provide accurate prediction for interconnects, however, using SPICE is extremely computationally expensive. On the other hand, explicit moment matching technique can produce unstable poles for highly accurate approximations and implicit moment matching technique can obtain more accurate approximations at the expense of computational complexity. This thesis presents an analytic model to efficiently estimate the signal delays of RLC on-chip interconnects. It uses the numerical inversion of Laplace transform (NILT) to obtain time function, suitable for transient analysis. Since the integration formula of the NILT is numerically stable for higher order approximations, the developed algorithm provides a mechanism to increase the accuracy for delay estimation. Numerical examples are implemented and compared with HSPICE, two-pole model and Passive Reduced-Order Interconnect Macromodeling Algorithm (PRIMA) to illustrate the efficiency and validity of the proposed work

HIGH PERFORMANCE CLOCK DISTRIBUTION FOR HIGH-SPEED VLSI SYSTEMS

Tohoku University堀口 進課

Investigation of Interconnect and Device Designs for Emerging Post-MOSFET and Beyond Silicon Technologies

Title from PDF of title page viewed May 31, 2017Dissertation advisor: Masud H. ChowdhuryVitaIncludes bibliographical references (pages 94-108)Thesis (Ph.D.)--School of Computing and Engineering and Department of Physics and Astronomy. University of Missouri--Kansas City, 2016The integrated circuit industry has been pursuing Moore’s curve down to deep nanoscale dimensions that would lead to the anticipated delivery of 100 billion transistors on a 300 mm² die operating below 1V supply in the next 5-10 years. However, the grand challenge is to reliably and efficiently take the full advantage of the unprecedented computing power offered by the billions of nanoscale transistors on a single chip. To mitigate this challenge, the limitations of both the interconnecting wires and semiconductor devices in integrated circuits have to be addressed. At the interconnect level, the major challenge in current high density integrated circuit is the electromagnetic and electrostatic impacts in the signal carrying lines. Addressing these problems require better analysis of interconnect resistance, inductance, and capacitance. Therefore, this dissertation has proposed a new delay model and analyzed the time-domain output response of complex poles, real poles, and double poles for resistance-inductance capacitance interconnect network based on a second order approximate transfer function. Both analytical models and simulation results show that the real poles model is much faster than the complex poles model, and achieves significantly higher accuracy in order to characterize the overshoot and undershoot of the output responses. On the other hand, the semiconductor industry is anticipating that within a decade silicon devices will be unable to meet the demands at nanoscale due to dimension and material scaling. Recently, molybdenum disulfide (MoS₂) has emerged as a new super material to replace silicon in future semiconductor devices. Besides, conventional field effect transistor technology is also reaching its thermodynamic limit. Breaking this thermal and physical limit requires adoption of new devices based on tunneling mechanism. Keeping the above mentioned trends, this dissertation also proposed a multilayer MoS₂ channel-based tunneling transistor and identifies the fundamental parameters and design specifications that need to be optimized in order to achieve higher ON-currents. A simple analytical model of the proposed device is derived by solving the time-independent Schrodinger equation. It is analytically proven that the proposed device can offer an ON-current of 80 A/m, a subthreshold swing (S) of 9.12 mV/decade, and a / ratio of 10¹².Introduction -- Previous models on interconnect designs -- Proposed delay model for interconnect design -- Investigation of tunneling for field effect transistor -- Study of molybdenum disulfide for FET applications -- Proposed molybdenum disulfide based tunnel transistor -- Conclusion -- Appendix A. Derivation of time delay model -- Appendix B. Derivation of tunneling current model Appendix C. Derivation of subthreshold swing mode

Time-Domain Macromodeling of High Speed Distributed Networks

With the rapid growth in density, operating speeds and complexity of modern very-large-scale integration (VLSI) circuits, there is a growing demand on efficient and accurate modeling and simulation of high speed interconnects and packages in order to ensure the signal integrity, reliability and performance of electronic systems. Such models can be derived from the knowledge of the physical characteristics of the structure or based on the measured port-to-port response.In the first part of this thesis, a passive macromodeling technique based on Method of Characteristics (referred as Passive Method of Characteristics or PMoC) is described which is applicable for modeling of electrically long high-speed interconnect networks. This algorithm is based on extracting the propagation delay of the interconnect followed by a low order rational approximation to capture the attenuation effects. The key advantage of the algorithm is that the curve fitting to realize the macromodel depends only on per-unit-length (p.u.l.) parameters and not on the length of the transmission line. In this work, the PMoC is developed to model multiconductor transmission lines.Next, an efficient approach for time domain sensitivity analysis of lossy high speed interconnects in the presence of nonlinear terminations is presented based on PMoC. An important feature of the proposed method is that the sensitivities are obtained from the solution of the original network, leading to significant computational advantages. The sensitivity analysis is also used to optimize the physical parameters of the network to satisfy the required design constraints. A time-domain macromodel for lossy multiconductor transmission lines exposed to electromag¬netic interference is also described in this thesis based on PMoC. The algorithm provides an efficient mechanism to ensure the passivity of the macromodel for different line lengths. Numerical examples illustrate that when compared to other passive incident field coupling algorithms, the proposed method is efficient in modeling electrically long interconnects since delay extraction without segmentation is used to capture the frequency response.In addition, this thesis discusses macromodeling techniques for complex packaging structures based on the frequency-domain behavior of the system obtained from measurements or electromagnetic simulators. Such techniques approximate the transfer function of the interconnect network as a rational function which can be embedded with modern circuit simulators with integrated circuit emphasis (SPICE). One of the most popular tools for rational approximations of measured or simulated data is based on vector fitting (VF) algorithms. Nonetheless, the vector fitting algorithms usually suffer convergence issues and lack of accuracy when dealing with noisy measured data. As a part of this thesis, a methodology is presented to improve the convergence and accuracy issues of vector fitting algorithm based on instrumental variable technique. This methodology is based on obtaining the “instruments” in an iterative manner and do not increase the complexity of vector fitting to capture the frequency response and minimize the biasing

Solid State Circuits Technologies

The evolution of solid-state circuit technology has a long history within a relatively short period of time. This technology has lead to the modern information society that connects us and tools, a large market, and many types of products and applications. The solid-state circuit technology continuously evolves via breakthroughs and improvements every year. This book is devoted to review and present novel approaches for some of the main issues involved in this exciting and vigorous technology. The book is composed of 22 chapters, written by authors coming from 30 different institutions located in 12 different countries throughout the Americas, Asia and Europe. Thus, reflecting the wide international contribution to the book. The broad range of subjects presented in the book offers a general overview of the main issues in modern solid-state circuit technology. Furthermore, the book offers an in depth analysis on specific subjects for specialists. We believe the book is of great scientific and educational value for many readers. I am profoundly indebted to the support provided by all of those involved in the work. First and foremost I would like to acknowledge and thank the authors who worked hard and generously agreed to share their results and knowledge. Second I would like to express my gratitude to the Intech team that invited me to edit the book and give me their full support and a fruitful experience while working together to combine this book