근사 컴퓨팅을 이용한 회로 노화 보상과 에너지 효율적인 신경망 구현

학위논문 (박사) -- 서울대학교 대학원 : 공과대학 전기·정보공학부, 2020. 8. 이혁재.Approximate computing reduces the cost (energy and/or latency) of computations by relaxing the correctness (i.e., precision) of computations up to the level, which is dependent on types of applications. Moreover, it can be realized in various hierarchies of computing system design from circuit level to application level. This dissertation presents the methodologies applying approximate computing across such hierarchies; compensating aging-induced delay in logic circuit by dynamic computation approximation (Chapter 1), designing energy-efficient neural network by combining low-power and low-latency approximate neuron models (Chapter 2), and co-designing in-memory gradient descent module with neural processing unit so as to address a memory bottleneck incurred by memory I/O for high-precision data (Chapter 3). The first chapter of this dissertation presents a novel design methodology to turn the timing violation caused by aging into computation approximation error without the reliability guardband or increasing the supply voltage. It can be realized by accurately monitoring the critical path delay at run-time. The proposal is evaluated at two levels: RTL component level and system level. The experimental results at the RTL component level show a significant improvement in terms of (normalized) mean squared error caused by the timing violation and, at the system level, show that the proposed approach successfully transforms the aging-induced timing violation errors into much less harmful computation approximation errors, therefore it recovers image quality up to perceptually acceptable levels. It reduces the dynamic and static power consumption by 21.45% and 10.78%, respectively, with 0.8% area overhead compared to the conventional approach. The second chapter of this dissertation presents an energy-efficient neural network consisting of alternative neuron models; Stochastic-Computing (SC) and Spiking (SP) neuron models. SC has been adopted in various fields to improve the power efficiency of systems by performing arithmetic computations stochastically, which approximates binary computation in conventional computing systems. Moreover, a recent work showed that deep neural network (DNN) can be implemented in the manner of stochastic computing and it greatly reduces power consumption. However, Stochastic DNN (SC-DNN) suffers from problem of high latency as it processes only a bit per cycle. To address such problem, it is proposed to adopt Spiking DNN (SP-DNN) as an input interface for SC-DNN since SP effectively processes more bits per cycle than SC-DNN. Moreover, this chapter resolves the encoding mismatch problem, between two different neuron models, without hardware cost by compensating the encoding mismatch with synapse weight calibration. A resultant hybrid DNN (SPSC-DNN) consists of SP-DNN as bottom layers and SC-DNN as top layers. Exploiting the reduced latency from SP-DNN and low-power consumption from SC-DNN, the proposed SPSC-DNN achieves improved energy-efficiency with lower error-rate compared to SC-DNN and SP-DNN in same network configuration. The third chapter of this dissertation proposes GradPim architecture, which accelerates the parameter updates by in-memory processing which is codesigned with 8-bit floating-point training in Neural Processing Unit (NPU) for deep neural networks. By keeping the high precision processing algorithms in memory, such as the parameter update incorporating high-precision weights in its computation, the GradPim architecture can achieve high computational efficiency using 8-bit floating point in NPU and also gain power efficiency by eliminating massive high-precision data transfers between NPU and off-chip memory. A simple extension of DDR4 SDRAM utilizing bank-group parallelism makes the operation designs in processing-in-memory (PIM) module efficient in terms of hardware cost and performance. The experimental results show that the proposed architecture can improve the performance of the parameter update phase in the training by up to 40% and greatly reduce the memory bandwidth requirement while posing only a minimal amount of overhead to the protocol and the DRAM area.근사 컴퓨팅은 연산의 정확도의 손실을 어플리케이션 별 적절한 수준까지 허용함으로써 연산에 필요한 비용 (에너지나 지연시간)을 줄인다. 게다가, 근사 컴퓨팅은 컴퓨팅 시스템 설계의 회로 계층부터 어플리케이션 계층까지 다양한 계층에 적용될 수 있다. 본 논문에서는 근사 컴퓨팅 방법론을 다양한 시스템 설계의 계층에 적용하여 전력과 에너지 측면에서 이득을 얻을 수 있는 방법들을 제안하였다. 이는, 연산 근사화 (computation Approximation)를 통해 회로의 노화로 인해 증가된 지연시간을 추가적인 전력소모 없이 보상하는 방법과 (챕터 1), 근사 뉴런모델 (approximate neuron model)을 이용해 에너지 효율이 높은 신경망을 구성하는 방법 (챕터 2), 그리고 메모리 대역폭으로 인한 병목현상 문제를 높은 정확도 데이터를 활용한 연산을 메모리 내에서 수행함으로써 완화시키는 방법을 (챕터3) 제안하였다. 첫 번째 챕터는 회로의 노화로 인한 지연시간위반을 (timing violation) 설계마진이나 (reliability guardband) 공급전력의 증가 없이 연산오차 (computation approximation error)를 통해 보상하는 설계방법론 (design methodology)를 제안하였다. 이를 위해 주요경로의 (critical path) 지연시간을 동작시간에 정확하게 측정할 필요가 있다. 여기서 제안하는 방법론은 RTL component와 system 단계에서 평가되었다. RTL component 단계의 실험결과를 통해 제안한 방식이 표준화된 평균제곱오차를 (normalized mean squared error) 상당히 줄였음을 볼 수 있다. 그리고 system 단계에서는 이미지처리 시스템에서 이미지의 품질이 인지적으로 충분히 회복되는 것을 보임으로써 회로노화로 인해 발생한 지연시간위반 오차가 에러의 크기가 작은 연산오차로 변경되는 것을 확인 할 수 있었다. 결론적으로, 제안된 방법론을 따랐을 때 0.8%의 공간을 (area) 더 사용하는 비용을 지불하고 21.45%의 동적전력소모와 (dynamic power consumption) 10.78%의 정적전력소모의 (static power consumption) 감소를 달성할 수 있었다. 두 번째 챕터는 근사 뉴런모델을 활용하는 고-에너지효율의 신경망을 (neural network) 제안하였다. 본 논문에서 사용한 두 가지의 근사 뉴런모델은 확률컴퓨팅과 (stochastic computing) 스파이킹뉴런 (spiking neuron) 이론들을 기반으로 모델링되었다. 확률컴퓨팅은 산술연산들을 확률적으로 수행함으로써 이진연산을 낮은 전력소모로 수행한다. 최근에 확률컴퓨팅 뉴런모델을 이용하여 심층 신경망 (deep neural network)를 구현할 수 있다는 연구가 진행되었다. 그러나, 확률컴퓨팅을 뉴런모델링에 활용할 경우 심층신경망이 매 클락사이클마다 (clock cycle) 하나의 비트만을 (bit) 처리하므로, 지연시간 측면에서 매우 나쁠 수 밖에 없는 문제가 있다. 따라서 본 논문에서는 이러한 문제를 해결하기 위하여 스파이킹 뉴런모델로 구성된 스파이킹 심층신경망을 확률컴퓨팅을 활용한 심층신경망 구조와 결합하였다. 스파이킹 뉴런모델의 경우 매 클락사이클마다 여러 비트를 처리할 수 있으므로 심층신경망의 입력 인터페이스로 사용될 경우 지연시간을 줄일 수 있다. 하지만, 확률컴퓨팅 뉴런모델과 스파이킹 뉴런모델의 경우 부호화 (encoding) 방식이 다른 문제가 있다. 따라서 본 논문에서는 해당 부호화 불일치 문제를 모델의 파라미터를 학습할 때 고려함으로써, 파라미터들의 값이 부호화 불일치를 고려하여 조절 (calibration) 될 수 있도록 하여 문제를 해결하였다. 이러한 분석의 결과로, 앞 쪽에는 스파이킹 심층신경망을 배치하고 뒷 쪽애는 확률컴퓨팅 심층신경망을 배치하는 혼성신경망을 제안하였다. 혼성신경망은 스파이킹 심층신경망을 통해 매 클락사이클마다 처리되는 비트 양의 증가로 인한 지연시간 감소 효과와 확률컴퓨팅 심층신경망의 저전력 소모 특성을 모두 활용함으로써 각 심층신경망을 따로 사용하는 경우 대비 우수한 에너지 효율성을 비슷하거나 더 나은 정확도 결과를 내면서 달성한다. 세 번째 챕터는 심층신경망을 8비트 부동소숫점 연산으로 학습하는 신경망처리유닛의 (neural processing unit) 파라미터 갱신을 (parameter update) 메모리-내-연산으로 (in-memory processing) 가속하는 GradPIM 아키텍쳐를 제안하였다. GradPIM은 8비트의 낮은 정확도 연산은 신경망처리유닛에 남기고, 높은 정확도를 가지는 데이터를 활용하는 연산은 (파라미터 갱신) 메모리 내부에 둠으로써 신경망처리유닛과 메모리간의 데이터통신의 양을 줄여, 높은 연산효율과 전력효율을 달성하였다. 또한, GradPIM은 bank-group 수준의 병렬화를 이루어 내 높은 내부 대역폭을 활용함으로써 메모리 대역폭을 크게 확장시킬 수 있게 되었다. 또한 이러한 메모리 구조의 변경이 최소화되었기 때문에 추가적인 하드웨어 비용도 최소화되었다. 실험 결과를 통해 GradPIM이 최소한의 DRAM 프로토콜 변화와 DRAM칩 내의 공간사용을 통해 심층신경망 학습과정 중 파라미터 갱신에 필요한 시간을 40%만큼 향상시켰음을 보였다.Chapter I: Dynamic Computation Approximation for Aging Compensation 1 1.1 Introduction 1 1.1.1 Chip Reliability 1 1.1.2 Reliability Guardband 2 1.1.3 Approximate Computing in Logic Circuits 2 1.1.4 Computation approximation for Aging Compensation 3 1.1.5 Motivational Case Study 4 1.2 Previous Work 5 1.2.1 Aging-induced Delay 5 1.2.2 Delay-Configurable Circuits 6 1.3 Proposed System 8 1.3.1 Overview of the Proposed System 8 1.3.2 Proposed Adder 9 1.3.3 Proposed Multiplier 11 1.3.4 Proposed Monitoring Circuit 16 1.3.5 Aging Compensation Scheme 19 1.4 Design Methodology 20 1.5 Evaluation 24 1.5.1 Experimental setup 24 1.5.2 RTL component level Adder/Multiplier 27 1.5.3 RTL component level Monitoring circuit 30 1.5.4 System level 31 1.6 Summary 38 Chapter II: Energy-Efficient Neural Network by Combining Approximate Neuron Models 40 2.1 Introduction 40 2.1.1 Deep Neural Network (DNN) 40 2.1.2 Low-power designs for DNN 41 2.1.3 Stochastic-Computing Deep Neural Network 41 2.1.4 Spiking Deep Neural Network 43 2.2 Hybrid of Stochastic and Spiking DNNs 44 2.2.1 Stochastic-Computing vs Spiking Deep Neural Network 44 2.2.2 Combining Spiking Layers and Stochastic Layers 46 2.2.3 Encoding Mismatch 47 2.3 Evaluation 49 2.3.1 Latency and Test Error 49 2.3.2 Energy Efficiency 51 2.4 Summary 54 Chapter III: GradPIM: In-memory Gradient Descent in Mixed-Precision DNN Training 55 3.1 Introduction 55 3.1.1 Neural Processing Unit 55 3.1.2 Mixed-precision Training 56 3.1.3 Mixed-precision Training with In-memory Gradient Descent 57 3.1.4 DNN Parameter Update Algorithms 59 3.1.5 Modern DRAM Architecture 61 3.1.6 Motivation 63 3.2 Previous Work 65 3.2.1 Processing-In-Memory 65 3.2.2 Co-design Neural Processing Unit and Processing-In-Memory 66 3.2.3 Low-precision Computation in NPU 67 3.3 GradPIM 68 3.3.1 GradPIM Architecture 68 3.3.2 GradPIM Operations 69 3.3.3 Timing Considerations 70 3.3.4 Update Phase Procedure 73 3.3.5 Commanding GradPIM 75 3.4 NPU Co-design with GradPIM 76 3.4.1 NPU Architecture 76 3.4.2 Data Placement 79 3.5 Evaluation 82 3.5.1 Evaluation Methodology 82 3.5.2 Experimental Results 83 3.5.3 Sensitivity Analysis 88 3.5.4 Layer Characterizations 90 3.5.5 Distributed Data Parallelism 90 3.6 Summary 92 3.6.1 Discussion 92 Bibliography 113 요약 114Docto

Approximate and timing-speculative hardware design for high-performance and energy-efficient video processing

Since the end of transistor scaling in 2-D appeared on the horizon, innovative circuit design paradigms have been on the rise to go beyond the well-established and ultraconservative exact computing. Many compute-intensive applications – such as video processing – exhibit an intrinsic error resilience and do not necessarily require perfect accuracy in their numerical operations. Approximate computing (AxC) is emerging as a design alternative to improve the performance and energy-efficiency requirements for many applications by trading its intrinsic error tolerance with algorithm and circuit efficiency. Exact computing also imposes a worst-case timing to the conventional design of hardware accelerators to ensure reliability, leading to an efficiency loss. Conversely, the timing-speculative (TS) hardware design paradigm allows increasing the frequency or decreasing the voltage beyond the limits determined by static timing analysis (STA), thereby narrowing pessimistic safety margins that conventional design methods implement to prevent hardware timing errors. Timing errors should be evaluated by an accurate gate-level simulation, but a significant gap remains: How these timing errors propagate from the underlying hardware all the way up to the entire algorithm behavior, where they just may degrade the performance and quality of service of the application at stake? This thesis tackles this issue by developing and demonstrating a cross-layer framework capable of performing investigations of both AxC (i.e., from approximate arithmetic operators, approximate synthesis, gate-level pruning) and TS hardware design (i.e., from voltage over-scaling, frequency over-clocking, temperature rising, and device aging). The cross-layer framework can simulate both timing errors and logic errors at the gate-level by crossing them dynamically, linking the hardware result with the algorithm-level, and vice versa during the evolution of the application’s runtime. Existing frameworks perform investigations of AxC and TS techniques at circuit-level (i.e., at the output of the accelerator) agnostic to the ultimate impact at the application level (i.e., where the impact is truly manifested), leading to less optimization. Unlike state of the art, the framework proposed offers a holistic approach to assessing the tradeoff of AxC and TS techniques at the application-level. This framework maximizes energy efficiency and performance by identifying the maximum approximation levels at the application level to fulfill the required good enough quality. This thesis evaluates the framework with an 8-way SAD (Sum of Absolute Differences) hardware accelerator operating into an HEVC encoder as a case study. Application-level results showed that the SAD based on the approximate adders achieve savings of up to 45% of energy/operation with an increase of only 1.9% in BD-BR. On the other hand, VOS (Voltage Over-Scaling) applied to the SAD generates savings of up to 16.5% in energy/operation with around 6% of increase in BD-BR. The framework also reveals that the boost of about 6.96% (at 50°) to 17.41% (at 75° with 10- Y aging) in the maximum clock frequency achieved with TS hardware design is totally lost by the processing overhead from 8.06% to 46.96% when choosing an unreliable algorithm to the blocking match algorithm (BMA). We also show that the overhead can be avoided by adopting a reliable BMA. This thesis also shows approximate DTT (Discrete Tchebichef Transform) hardware proposals by exploring a transform matrix approximation, truncation and pruning. The results show that the approximate DTT hardware proposal increases the maximum frequency up to 64%, minimizes the circuit area in up to 43.6%, and saves up to 65.4% in power dissipation. The DTT proposal mapped for FPGA shows an increase of up to 58.9% on the maximum frequency and savings of about 28.7% and 32.2% on slices and dynamic power, respectively compared with stat

Design Techniques for Energy-Quality Scalable Digital Systems

Energy efficiency is one of the key design goals in modern computing. Increasingly complex tasks are being executed in mobile devices and Internet of Things end-nodes, which are expected to operate for long time intervals, in the orders of months or years, with the limited energy budgets provided by small form-factor batteries. Fortunately, many of such tasks are error resilient, meaning that they can toler- ate some relaxation in the accuracy, precision or reliability of internal operations, without a significant impact on the overall output quality. The error resilience of an application may derive from a number of factors. The processing of analog sensor inputs measuring quantities from the physical world may not always require maximum precision, as the amount of information that can be extracted is limited by the presence of external noise. Outputs destined for human consumption may also contain small or occasional errors, thanks to the limited capabilities of our vision and hearing systems. Finally, some computational patterns commonly found in domains such as statistics, machine learning and operational research, naturally tend to reduce or eliminate errors. Energy-Quality (EQ) scalable digital systems systematically trade off the quality of computations with energy efficiency, by relaxing the precision, the accuracy, or the reliability of internal software and hardware components in exchange for energy reductions. This design paradigm is believed to offer one of the most promising solutions to the impelling need for low-energy computing. Despite these high expectations, the current state-of-the-art in EQ scalable design suffers from important shortcomings. First, the great majority of techniques proposed in literature focus only on processing hardware and software components. Nonetheless, for many real devices, processing contributes only to a small portion of the total energy consumption, which is dominated by other components (e.g. I/O, memory or data transfers). Second, in order to fulfill its promises and become diffused in commercial devices, EQ scalable design needs to achieve industrial level maturity. This involves moving from purely academic research based on high-level models and theoretical assumptions to engineered flows compatible with existing industry standards. Third, the time-varying nature of error tolerance, both among different applications and within a single task, should become more central in the proposed design methods. This involves designing “dynamic” systems in which the precision or reliability of operations (and consequently their energy consumption) can be dynamically tuned at runtime, rather than “static” solutions, in which the output quality is fixed at design-time. This thesis introduces several new EQ scalable design techniques for digital systems that take the previous observations into account. Besides processing, the proposed methods apply the principles of EQ scalable design also to interconnects and peripherals, which are often relevant contributors to the total energy in sensor nodes and mobile systems respectively. Regardless of the target component, the presented techniques pay special attention to the accurate evaluation of benefits and overheads deriving from EQ scalability, using industrial-level models, and on the integration with existing standard tools and protocols. Moreover, all the works presented in this thesis allow the dynamic reconfiguration of output quality and energy consumption. More specifically, the contribution of this thesis is divided in three parts. In a first body of work, the design of EQ scalable modules for processing hardware data paths is considered. Three design flows are presented, targeting different technologies and exploiting different ways to achieve EQ scalability, i.e. timing-induced errors and precision reduction. These works are inspired by previous approaches from the literature, namely Reduced-Precision Redundancy and Dynamic Accuracy Scaling, which are re-thought to make them compatible with standard Electronic Design Automation (EDA) tools and flows, providing solutions to overcome their main limitations. The second part of the thesis investigates the application of EQ scalable design to serial interconnects, which are the de facto standard for data exchanges between processing hardware and sensors. In this context, two novel bus encodings are proposed, called Approximate Differential Encoding and Serial-T0, that exploit the statistical characteristics of data produced by sensors to reduce the energy consumption on the bus at the cost of controlled data approximations. The two techniques achieve different results for data of different origins, but share the common features of allowing runtime reconfiguration of the allowed error and being compatible with standard serial bus protocols. Finally, the last part of the manuscript is devoted to the application of EQ scalable design principles to displays, which are often among the most energy- hungry components in mobile systems. The two proposals in this context leverage the emissive nature of Organic Light-Emitting Diode (OLED) displays to save energy by altering the displayed image, thus inducing an output quality reduction that depends on the amount of such alteration. The first technique implements an image-adaptive form of brightness scaling, whose outputs are optimized in terms of balance between power consumption and similarity with the input. The second approach achieves concurrent power reduction and image enhancement, by means of an adaptive polynomial transformation. Both solutions focus on minimizing the overheads associated with a real-time implementation of the transformations in software or hardware, so that these do not offset the savings in the display. For each of these three topics, results show that the aforementioned goal of building EQ scalable systems compatible with existing best practices and mature for being integrated in commercial devices can be effectively achieved. Moreover, they also show that very simple and similar principles can be applied to design EQ scalable versions of different system components (processing, peripherals and I/O), and to equip these components with knobs for the runtime reconfiguration of the energy versus quality tradeoff

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Efficient fault tolerance for selected scientific computing algorithms on heterogeneous and approximate computer architectures

Scientific computing and simulation technology play an essential role to solve central challenges in science and engineering. The high computational power of heterogeneous computer architectures allows to accelerate applications in these domains, which are often dominated by compute-intensive mathematical tasks. Scientific, economic and political decision processes increasingly rely on such applications and therefore induce a strong demand to compute correct and trustworthy results. However, the continued semiconductor technology scaling increasingly imposes serious threats to the reliability and efficiency of upcoming devices. Different reliability threats can cause crashes or erroneous results without indication. Software-based fault tolerance techniques can protect algorithmic tasks by adding appropriate operations to detect and correct errors at runtime. Major challenges are induced by the runtime overhead of such operations and by rounding errors in floating-point arithmetic that can cause false positives. The end of Dennard scaling induces central challenges to further increase the compute efficiency between semiconductor technology generations. Approximate computing exploits the inherent error resilience of different applications to achieve efficiency gains with respect to, for instance, power, energy, and execution times. However, scientific applications often induce strict accuracy requirements which require careful utilization of approximation techniques. This thesis provides fault tolerance and approximate computing methods that enable the reliable and efficient execution of linear algebra operations and Conjugate Gradient solvers using heterogeneous and approximate computer architectures. The presented fault tolerance techniques detect and correct errors at runtime with low runtime overhead and high error coverage. At the same time, these fault tolerance techniques are exploited to enable the execution of the Conjugate Gradient solvers on approximate hardware by monitoring the underlying error resilience while adjusting the approximation error accordingly. Besides, parameter evaluation and estimation methods are presented that determine the computational efficiency of application executions on approximate hardware. An extensive experimental evaluation shows the efficiency and efficacy of the presented methods with respect to the runtime overhead to detect and correct errors, the error coverage as well as the achieved energy reduction in executing the Conjugate Gradient solvers on approximate hardware

Cross-Layer Approaches for an Aging-Aware Design of Nanoscale Microprocessors

Thanks to aggressive scaling of transistor dimensions, computers have revolutionized our life. However, the increasing unreliability of devices fabricated in nanoscale technologies emerged as a major threat for the future success of computers. In particular, accelerated transistor aging is of great importance, as it reduces the lifetime of digital systems. This thesis addresses this challenge by proposing new methods to model, analyze and mitigate aging at microarchitecture-level and above

MANAGING AND LEVERAGING VARIATIONS AND NOISE IN NANOMETER CMOS

Advanced CMOS technologies have enabled high density designs at the cost of complex fabrication process. Variation in oxide thickness and Random Dopant Fluctuation (RDF) lead to variation in transistor threshold voltage Vth. Current photo-lithography process used for printing decreasing critical dimensions result in variation in transistor channel length and width. A related challenge in nanometer CMOS is that of on-chip random noise. With decreasing threshold voltage and operating voltage; and increasing operating temperature, CMOS devices are more sensitive to random on-chip noise in advanced technologies. In this thesis, we explore novel circuit techniques to manage the impact of process variation in nanometer CMOS technologies. We also analyze the impact of on-chip noise on CMOS circuits and propose techniques to leverage or manage impact of noise based on the application. True Random Number Generator (TRNG) is an interesting cryptographic primitive that leverages on-chip noise to generate random bits; however, it is highly sensitive to process variation. We explore novel metastability circuits to alleviate the impact of variations and at the same time leverage on-chip noise sources like Random Thermal Noise and Random Telegraph Noise (RTN) to generate high quality random bits. We develop stochastic models for metastability based TRNG circuits to analyze the impact of variation and noise. The stochastic models are used to analyze and compare low power, energy efficient and lightweight post-processing techniques targeted to low power applications like System on Chip (SoC) and RFID. We also propose variation aware circuit calibration techniques to increase reliability. We extended this technique to a more generic application of designing Post-Si Tunable (PST) clock buffers to increase parametric yield in the presence of process variation. Apart from one time variation due to fabrication process, transistors undergo constant change in threshold voltage due to aging/wear-out effects and RTN. Process variation affects conventional sensors and introduces inaccuracies during measurement. We present a lightweight wear-out sensor that is tolerant to process variation and provides a fine grained wear-out sensing. A similar circuit is designed to sense fluctuation in transistor threshold voltage due to RTN. Although thermal noise and RTN are leveraged in applications like TRNG, they affect the stability of sensitive circuits like Static Random Access Memory (SRAM). We analyze the impact of on-chip noise on Bit Error Rate (BER) and post-Si test coverage of SRAM cells

Design for Reliability and Low Power in Emerging Technologies

Die fortlaufende Verkleinerung von Transistor-Strukturgrößen ist einer der wichtigsten Antreiber für das Wachstum in der Halbleitertechnologiebranche. Seit Jahrzehnten erhöhen sich sowohl Integrationsdichte als auch Komplexität von Schaltkreisen und zeigen damit einen fortlaufenden Trend, der sich über alle modernen Fertigungsgrößen erstreckt. Bislang ging das Verkleinern von Transistoren mit einer Verringerung der Versorgungsspannung einher, was zu einer Reduktion der Leistungsaufnahme führte und damit eine gleichbleibenden Leistungsdichte sicherstellte. Doch mit dem Beginn von Strukturgrößen im Nanometerbreich verlangsamte sich die fortlaufende Skalierung. Viele Schwierigkeiten, sowie das Erreichen von physikalischen Grenzen in der Fertigung und Nicht-Idealitäten beim Skalieren der Versorgungsspannung, führten zu einer Zunahme der Leistungsdichte und, damit einhergehend, zu erschwerten Problemen bei der Sicherstellung der Zuverlässigkeit. Dazu zählen, unter anderem, Alterungseffekte in Transistoren sowie übermäßige Hitzeentwicklung, nicht zuletzt durch stärkeres Auftreten von Selbsterhitzungseffekten innerhalb der Transistoren. Damit solche Probleme die Zuverlässigkeit eines Schaltkreises nicht gefährden, werden die internen Signallaufzeiten üblicherweise sehr pessimistisch kalkuliert. Durch den so entstandenen zeitlichen Sicherheitsabstand wird die korrekte Funktionalität des Schaltkreises sichergestellt, allerdings auf Kosten der Performance. Alternativ kann die Zuverlässigkeit des Schaltkreises auch durch andere Techniken erhöht werden, wie zum Beispiel durch Null-Temperatur-Koeffizienten oder Approximate Computing. Wenngleich diese Techniken einen Großteil des üblichen zeitlichen Sicherheitsabstandes einsparen können, bergen sie dennoch weitere Konsequenzen und Kompromisse. Bleibende Herausforderungen bei der Skalierung von CMOS Technologien führen außerdem zu einem verstärkten Fokus auf vielversprechende Zukunftstechnologien. Ein Beispiel dafür ist der Negative Capacitance Field-Effect Transistor (NCFET), der eine beachtenswerte Leistungssteigerung gegenüber herkömmlichen FinFET Transistoren aufweist und diese in Zukunft ersetzen könnte. Des Weiteren setzen Entwickler von Schaltkreisen vermehrt auf komplexe, parallele Strukturen statt auf höhere Taktfrequenzen. Diese komplexen Modelle benötigen moderne Power-Management Techniken in allen Aspekten des Designs. Mit dem Auftreten von neuartigen Transistortechnologien (wie zum Beispiel NCFET) müssen diese Power-Management Techniken neu bewertet werden, da sich Abhängigkeiten und Verhältnismäßigkeiten ändern. Diese Arbeit präsentiert neue Herangehensweisen, sowohl zur Analyse als auch zur Modellierung der Zuverlässigkeit von Schaltkreisen, um zuvor genannte Herausforderungen auf mehreren Designebenen anzugehen. Diese Herangehensweisen unterteilen sich in konventionelle Techniken ((a), (b), (c) und (d)) und unkonventionelle Techniken ((e) und (f)), wie folgt: $\textbf{(a)}$ Analyse von Leistungszunahmen in Zusammenhang mit der Maximierung von Leistungseffizienz beim Betrieb nahe der Transistor Schwellspannung, insbesondere am optimalen Leistungspunkt. Das genaue Ermitteln eines solchen optimalen Leistungspunkts ist eine besondere Herausforderung bei Multicore Designs, da dieser sich mit den jeweiligen Optimierungszielsetzungen und der Arbeitsbelastung verschiebt. $\textbf{(b)}$ Aufzeigen versteckter Interdependenzen zwischen Alterungseffekten bei Transistoren und Schwankungen in der Versorgungsspannung durch „IR-drops“. Eine neuartige Technik wird vorgestellt, die sowohl Über- als auch Unterschätzungen bei der Ermittlung des zeitlichen Sicherheitsabstands vermeidet und folglich den kleinsten, dennoch ausreichenden Sicherheitsabstand ermittelt. $\textbf{(c)}$ Eindämmung von Alterungseffekten bei Transistoren durch „Graceful Approximation“, eine Technik zur Erhöhung der Taktfrequenz bei Bedarf. Der durch Alterungseffekte bedingte zeitlich Sicherheitsabstand wird durch Approximate Computing Techniken ersetzt. Des Weiteren wird Quantisierung verwendet um ausreichend Genauigkeit bei den Berechnungen zu gewährleisten. $\textbf{(d)}$ Eindämmung von temperaturabhängigen Verschlechterungen der Signallaufzeit durch den Betrieb nahe des Null-Temperatur Koeffizienten (N-ZTC). Der Betrieb bei N-ZTC minimiert temperaturbedingte Abweichungen der Performance und der Leistungsaufnahme. Qualitative und quantitative Vergleiche gegenüber dem traditionellen zeitlichen Sicherheitsabstand werden präsentiert. $\textbf{(e)}$ Modellierung von Power-Management Techniken für NCFET-basierte Prozessoren. Die NCFET Technologie hat einzigartige Eigenschaften, durch die herkömmliche Verfahren zur Spannungs- und Frequenzskalierungen zur Laufzeit (DVS/DVFS) suboptimale Ergebnisse erzielen. Dies erfordert NCFET-spezifische Power-Management Techniken, die in dieser Arbeit vorgestellt werden. $\textbf{(f)}$ Vorstellung eines neuartigen heterogenen Multicore Designs in NCFET Technologie. Das Design beinhaltet identische Kerne; Heterogenität entsteht durch die Anwendung der individuellen, optimalen Konfiguration der Kerne. Amdahls Gesetz wird erweitert, um neue system- und anwendungsspezifische Parameter abzudecken und die Vorzüge des neuen Designs aufzuzeigen. Die Auswertungen der vorgestellten Techniken werden mithilfe von Implementierungen und Simulationen auf Schaltkreisebene (gate-level) durchgeführt. Des Weiteren werden Simulatoren auf Systemebene (system-level) verwendet, um Multicore Designs zu implementieren und zu simulieren. Zur Validierung und Bewertung der Effektivität gegenüber dem Stand der Technik werden analytische, gate-level und system-level Simulationen herangezogen, die sowohl synthetische als auch reale Anwendungen betrachten

Microarchitectural Low-Power Design Techniques for Embedded Microprocessors

With the omnipresence of embedded processing in all forms of electronics today, there is a strong trend towards wireless, battery-powered, portable embedded systems which have to operate under stringent energy constraints. Consequently, low power consumption and high energy efficiency have emerged as the two key criteria for embedded microprocessor design. In this thesis we present a range of microarchitectural low-power design techniques which enable the increase of performance for embedded microprocessors and/or the reduction of energy consumption, e.g., through voltage scaling. In the context of cryptographic applications, we explore the effectiveness of instruction set extensions (ISEs) for a range of different cryptographic hash functions (SHA-3 candidates) on a 16-bit microcontroller architecture (PIC24). Specifically, we demonstrate the effectiveness of light-weight ISEs based on lookup table integration and microcoded instructions using finite state machines for operand and address generation. On-node processing in autonomous wireless sensor node devices requires deeply embedded cores with extremely low power consumption. To address this need, we present TamaRISC, a custom-designed ISA with a corresponding ultra-low-power microarchitecture implementation. The TamaRISC architecture is employed in conjunction with an ISE and standard cell memories to design a sub-threshold capable processor system targeted at compressed sensing applications. We furthermore employ TamaRISC in a hybrid SIMD/MIMD multi-core architecture targeted at moderate to high processing requirements (> 1 MOPS). A range of different microarchitectural techniques for efficient memory organization are presented. Specifically, we introduce a configurable data memory mapping technique for private and shared access, as well as instruction broadcast together with synchronized code execution based on checkpointing. We then study an inherent suboptimality due to the worst-case design principle in synchronous circuits, and introduce the concept of dynamic timing margins. We show that dynamic timing margins exist in microprocessor circuits, and that these margins are to a large extent state-dependent and that they are correlated to the sequences of instruction types which are executed within the processor pipeline. To perform this analysis we propose a circuit/processor characterization flow and tool called dynamic timing analysis. Moreover, this flow is employed in order to devise a high-level instruction set simulation environment for impact-evaluation of timing errors on application performance. The presented approach improves the state of the art significantly in terms of simulation accuracy through the use of statistical fault injection. The dynamic timing margins in microprocessors are then systematically exploited for throughput improvements or energy reductions via our proposed instruction-based dynamic clock adjustment (DCA) technique. To this end, we introduce a 6-stage 32-bit microprocessor with cycle-by-cycle DCA. Besides a comprehensive design flow and simulation environment for evaluation of the DCA approach, we additionally present a silicon prototype of a DCA-enabled OpenRISC microarchitecture fabricated in 28 nm FD-SOI CMOS. The test chip includes a suitable clock generation unit which allows for cycle-by-cycle DCA over a wide range with fine granularity at frequencies exceeding 1 GHz. Measurement results of speedups and power reductions are provided