Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery

The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling soft errors in the logic and memories that allow meeting the desired failures-in-time (FIT) target are key to keep harnessing the benefits of Moore's law. The failure to scale the soft error rate caused by particle strikes, may soon limit the total number of cores that one may have running at the same time. This paper proposes a light-weight and scalable architecture to eliminate silent data corruption errors (SDC) and detected unrecoverable errors (DUE) of a core. The architecture uses acoustic wave detectors for error detection. We propose to recover by confining the errors in the cache hierarchy, allowing us to deal with the relatively long detection latencies. Our results show that the proposed mechanism protects the whole core (logic, latches and memory arrays) incurring performance overhead as low as 0.60%. © 2014 IEEE.Peer ReviewedPostprint (author's final draft

Approaches to multiprocessor error recovery using an on-chip interconnect subsystem

For future multicores, a dedicated interconnect subsystem for on-chip monitors was found to be highly beneficial in terms of scalability, performance and area. In this thesis, such a monitor network (MNoC) is used for multicores to support selective error identification and recovery and maintain target chip reliability in the context of dynamic voltage and frequency scaling (DVFS). A selective shared memory multiprocessor recovery is performed using MNoC in which, when an error is detected, only the group of processors sharing an application with the affected processors are recovered. Although the use of DVFS in contemporary multicores provides significant protection from unpredictable thermal events, a potential side effect can be an increased processor exposure to soft errors. To address this issue, a flexible fault prevention and recovery mechanism has been developed to selectively enable a small amount of per-core dual modular redundancy (DMR) in response to increased vulnerability, as measured by the processor architectural vulnerability factor (AVF). Our new algorithm for DMR deployment aims to provide a stable effective soft error rate (SER) by using DMR in response to DVFS caused by thermal events. The algorithm is implemented in real-time on the multicore using MNoC and controller which evaluates thermal information and multicore performance statistics in addition to error information. DVFS experiments with a multicore simulator using standard benchmarks show an average 6% improvement in overall power consumption and a stable SER by using selective DMR versus continuous DMR deployment

Recoverable Distributed Shared Memory Under Sequential and Relaxed Consistency

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryOffice of Naval Research / N00014-90-J-1270 and N00014-91-J-1283National Aeronautics and Space Administration / NASA NAG 1-61

TERPS: The Embedded Reliable Processing System

Electromagnetic Interference (EMI) can have an adverse effect on commercial electronics. As feature sizes of integrated circuits become smaller, their susceptibility to EMI increases. In light of this, integrated circuits will face substantial problems in the future either from electromagnetic disturbances or intentionally generated EMI from a malicious source. The Embedded Reliable Processing System (TERPS) is a fault tolerant system architecture which can significantly reduce the threat of EMI in computer systems. TERPS employs a checkpoint and rollback recovery mechanism tied with a multi-phase commit protocol and 3D IC technology. This enables it to recover from substantial EMI without having to shutdown or reboot. In the face of such EMI, only a loss in performance dictated by the strength and duration of the interference and the frequency of checkpointing will be seen. Various conditions in which chips can fail under the influence of EMI are described. The checkpoint and rollback recovery mechanism and the resulting TERPS architecture is stipulated. A thorough evaluation of the design correctness is provided. The technique is implemented in Verilog HDL using a 16-bit, 5-stage pipelined processor to show proof of concept. The performance overhead is calculated for different checkpointing intervals and is shown to be very reasonable (5-6% for checkpointing every 128 CPU cycles)

Fault-Tolerant Computing: An Overview

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryNASA / NAG-1-613Semiconductor Research Corporation / 90-DP-109Joint Services Electronics Program / N00014-90-J-127

Classification of Resilience Techniques Against Functional Errors at Higher Abstraction Layers of Digital Systems

Nanoscale technology nodes bring reliability concerns back to the center stage of digital system design. A systematic classification of approaches that increase system resilience in the presence of functional hardware (HW)-induced errors is presented, dealing with higher system abstractions, such as the (micro) architecture, the mapping, and platform software (SW). The field is surveyed in a systematic way based on nonoverlapping categories, which add insight into the ongoing work by exposing similarities and differences. HW and SW solutions are discussed in a similar fashion so that interrelationships become apparent. The presented categories are illustrated by representative literature examples to illustrate their properties. Moreover, it is demonstrated how hybrid schemes can be decomposed into their primitive components

RGLock: Recoverable Mutual Exclusion for Non-Volatile Main Memory Systems

Mutex locks have traditionally been the most popular concurrent programming mechanisms for inter-process synchronization in the rapidly advancing field of concurrent computing systems that support high-performance applications. However, the concept of recoverability of these algorithms in the event of a crash failure has not been studied thoroughly. Popular techniques like transaction roll-back are widely known for providing fault-tolerance in modern Database Management Systems. Whereas in the context of mutual exclusion in shared memory systems, none of the prominent lock algorithms (e.g., Lamport’s Bakery algorithm, MCS lock, etc.) are designed to tolerate crash failures, especially in operations carried out in the critical sections. Each of these algorithms may fail to maintain mutual exclusion, or sacrifice some of the liveness guarantees in presence of crash failures. Storing application data and recovery information in the primary storage with conventional volatile memory limits the development of efficient crash-recovery mechanisms since a failure on any component in the system causes a loss of program data. With the advent of Non-Volatile Main Memory technologies, opportunities have opened up to redefine the problem of Mutual Exclusion in the context of a crash-recovery model where processes may recover from crash failures and resume execution. When the main memory is non-volatile, an application’s entire state can be recovered from a crash using the in-memory state near-instantaneously, making a process’s failure appear as a suspend/resume event. This thesis proceeds to envision a solution for the problem of mutual exclusion in such systems. The goal is to provide a first-of-its-kind mutex lock that guarantees mutual exclusion and starvation freedom in emerging shared-memory architectures that incorporate non-volatile main memory (NVMM)

Designs for increasing reliability while reducing energy and increasing lifetime

In the last decades, the computing technology experienced tremendous developments. For instance, transistors' feature size shrank to half at every two years as consistently from the first time Moore stated his law. Consequently, number of transistors and core count per chip doubles at each generation. Similarly, petascale systems that have the capability of processing more than one billion calculation per second have been developed. As a matter of fact, exascale systems are predicted to be available at year 2020. However, these developments in computer systems face a reliability wall. For instance, transistor feature sizes are getting so small that it becomes easier for high-energy particles to temporarily flip the state of a memory cell from 1-to-0 or 0-to-1. Also, even if we assume that fault-rate per transistor stays constant with scaling, the increase in total transistor and core count per chip will significantly increase the number of faults for future desktop and exascale systems. Moreover, circuit ageing is exacerbated due to increased manufacturing variability and thermal stresses, therefore, lifetime of processor structures are becoming shorter. On the other side, due to the limited power budget of the computer systems such that mobile devices, it is attractive to scale down the voltage. However, when the voltage level scales to beyond the safe margin especially to the ultra-low level, the error rate increases drastically. Nevertheless, new memory technologies such as NAND flashes present only limited amount of nominal lifetime, and when they exceed this lifetime, they can not guarantee storing of the data correctly leading to data retention problems. Due to these issues, reliability became a first-class design constraint for contemporary computing in addition to power and performance. Moreover, reliability even plays increasingly important role when computer systems process sensitive and life-critical information such as health records, financial information, power regulation, transportation, etc. In this thesis, we present several different reliability designs for detecting and correcting errors occurring in processor pipelines, L1 caches and non-volatile NAND flash memories due to various reasons. We design reliability solutions in order to serve three main purposes. Our first goal is to improve the reliability of computer systems by detecting and correcting random and non-predictable errors such as bit flips or ageing errors. Second, we aim to reduce the energy consumption of the computer systems by allowing them to operate reliably at ultra-low voltage level. Third, we target to increase the lifetime of new memory technologies by implementing efficient and low-cost reliability schemes