Efficient cache architectures for reliable hybrid voltage operation using EDC codes

Semiconductor technology evolution enables the design of sensor-based battery-powered ultra-low-cost chips (e.g., below 1 p) required for new market segments such as body, urban life and environment monitoring. Caches have been shown to be the highest energy and area consumer in those chips. This paper proposes a novel, hybrid-operation (high Vcc, ultra-low Vcc), single-Vcc domain cache architecture based on replacing energy-hungry bitcells (e.g., 10T) by more energy-efficient and smaller cells (e.g., 8T) enhanced with Error Detection and Correction (EDC) features for high reliability and performance predictability. Our architecture is proven to largely outperform existing solutions in terms of energy and area.Postprint (author’s final draft

Cache designs for reliable hybrid high and ultra-low voltage operation

Increasing demand for implementing highly-miniaturized battery-powered ultra-low-cost systems (e.g., below 1 USD) in emerging applications such as body, urban life and environment monitoring, etc., has introduced many challenges in the chip design. Such applications require high performance occasionally, but very little energy consumption during most of the time in order to extend battery lifetime. In addition, they require real-time guarantees. The most suitable technological solution for those devices consists of using hybrid processors able to operate at: (i) high voltage to provide high performance and (ii) near-/sub-threshold (NST) voltage to provide ultra-low energy consumption. However, the most efficient SRAM memories for each voltage level differ and it is mandatory trading off different SRAM designs, especially in cache memories, which occupy most of the processor¿s area. In this Thesis, we analyze the performance/power tradeoffs involved in the design of SRAM L1 caches for reliable hybrid high and NST Vcc operation from a microarchitectural perspective. We develop new, simple, single-Vcc domain hybrid cache architectures and data management mechanisms that satisfy all stringent needs of our target market. Proposed solutions are shown to have high energy efficiency with negligible impact on average performance while maintaining strong performance guarantees as required for our target market

A survey of system level power management schemes in the dark-silicon era for many-core architectures

Power consumption in Complementary Metal Oxide Semiconductor (CMOS) technology has escalated to a point that only a fractional part of many-core chips can be powered-on at a time. Fortunately, this fraction can be increased at the expense of performance through the dark-silicon solution. However, with many-core integration set to be heading towards its thousands, power consumption and temperature increases per time, meaning the number of active nodes must be reduced drastically. Therefore, optimized techniques are demanded for continuous advancement in technology. Existing efforts try to overcome this challenge by activating nodes from different parts of the chip at the expense of communication latency. Other efforts on the other hand employ run-time power management techniques to manage the power performance of the cores trading-off performance for power. We found out that, for a significant amount of power to saved and high temperature to be avoided, focus should be on reducing the power consumption of all the on-chip components. Especially, the memory hierarchy and the interconnect. Power consumption can be minimized by, reducing the size of high leakage power dissipating elements, turning-off idle resources and integrating power saving materials

Power, Performance, and Energy Management of Heterogeneous Architectures

abstract: Many core modern multiprocessor systems-on-chip offers tremendous power and performance optimization opportunities by tuning thousands of potential voltage, frequency and core configurations. Applications running on these architectures are becoming increasingly complex. As the basic building blocks, which make up the application, change during runtime, different configurations may become optimal with respect to power, performance or other metrics. Identifying the optimal configuration at runtime is a daunting task due to a large number of workloads and configurations. Therefore, there is a strong need to evaluate the metrics of interest as a function of the supported configurations. This thesis focuses on two different types of modern multiprocessor systems-on-chip (SoC): Mobile heterogeneous systems and tile based Intel Xeon Phi architecture. For mobile heterogeneous systems, this thesis presents a novel methodology that can accurately instrument different types of applications with specific performance monitoring calls. These calls provide a rich set of performance statistics at a basic block level while the application runs on the target platform. The target architecture used for this work (Odroid XU3) is capable of running at 4940 different frequency and core combinations. With the help of instrumented application vast amount of characterization data is collected that provides details about performance, power and CPU state at every instrumented basic block across 19 different types of applications. The vast amount of data collected has enabled two runtime schemes. The first work provides a methodology to find optimal configurations in heterogeneous architecture using classifiers and demonstrates an average increase of 93%, 81% and 6% in performance per watt compared to the interactive, ondemand and powersave governors, respectively. The second work using same data shows a novel imitation learning framework for dynamically controlling the type, number, and the frequencies of active cores to achieve an average of 109% PPW improvement compared to the default governors. This work also presents how to accurately profile tile based Intel Xeon Phi architecture while training different types of neural networks using open image dataset on deep learning framework. The data collected allows deep exploratory analysis. It also showcases how different hardware parameters affect performance of Xeon Phi.Dissertation/ThesisMasters Thesis Engineering 201

Cache architectures based on heterogeneous technologies to deal with manufacturing errors

[EN] SRAM technology has traditionally been used to implement processor caches since it is the fastest existing RAM technology.However,one of the major drawbacks of this technology is its high energy consumption.To reduce this energy consumption modern processors mainly use two complementary techniques: i)low-power operating modes and ii)low-power memory technologies.The first technique allows the processor working at low clock frequencies and supply voltages.The main limitation of this technique is that manufacturing defects can significantly affect the reliability of SRAM cells when working these modes.The second technique brings alternative technologies such as eDRAM, which provides minimum area and power consumption.The main drawback of this memory technology is that reads are destructive and eDRAM cells work slower than SRAM ones. This thesis presents three main contributions regarding low-power caches and heterogeneous technologies: i)an study that identifies the optimal capacitance of eDRAM cells, ii)a novel cache design that tolerates the faults produced by SRAM cells in low-power modes, iii)a methodology that allows obtain the optimal operating frequency/voltage level when working with low-power modes. Regarding the first contribution,in this work SRAM and eDRAM technologies are combined to achieve a low-power fast cache that requires smaller area than conventional designs and that tolerates SRAM failures.First,this dissertation focuses on one of the main critical aspects of the design of heterogeneous caches:eDRAM cell capacitance.In this dissertation the optimal capacitance for an heterogeneous L1 data cache is identified by analyzing the compromise between performance and energy consumption.Experimental results show that an heterogeneous cache implemented with 10fF capacitors offers similar performance as a conventional SRAM cache while providing 55% energy savings and reducing by 29% the cache area. Regarding the second contribution,this thesis proposes a novel organization for a fault-tolerant heterogeneous cache.Currently,reducing the supply voltage is a mechanism widely used to reduce consumption and applies when the system workload activity decreases.However,SRAM cells cause different types of failures when the supply voltage is reduced and thus they limit the minimum operating voltage of the microprocessor. In the proposal,memory cells implemented with eDRAM technology serve as backup in case of failure of SRAM cells, because the correct operation of eDRAM cells is not affected by reduced voltages. The proposed architecture has two working modes: high-performance mode for supply voltages that do not induce SRAM cell failures, and low-power mode for those voltages that cause SRAM cell failures. In high-performance mode, the cache provides full capacity, which enables the processor to achieve its maximum performance. In low-power mode, the effective capacity of the cache is reduced because some of the eDRAM cells are dedicated to recover from SRAM failures. Experimental results show that the performance is scarcely reduced (e.g. less than 2.7% across all the studied benchmarks) with respect to an ideal SRAM cache without failures. Finally,this thesis proposes a methodology to find the optimal frequency/voltage level regarding energy consumption for the designed heterogeneous cache. For this purpose, first SRAM failure types and their probabilities are characterized.Then,the energy consumption of different frequency/voltage levels is evaluated when the system works in low-power mode.The study shows that, mainly due to the impact of SRAM failures on performance,the optimal combination of voltage and frequency from the energy point of view does not always correspond to the minimum voltage.[ES] La tecnología SRAM se ha utilizado tradicionalmente para implementar las memorias cache debido a que es la tecnología de memoria RAM más rápida existente.Por contra,uno de los principales inconvenientes de esta tecnología es su elevado consumo energético.Para reducirlo los procesadores modernos suelen emplear dos técnicas complementarias:i) modos de funcionamiento de bajo consumo y ii)tecnologías de bajo consumo.La primeras técnica consiste en utilizar bajas frecuencias y voltajes de funcionamiento.La principal limitación de esta técnica es que los defectos de fabricación pueden afectar notablemente a la fiabilidad de las celdas SRAM en estos modos.La segunda técnica agrupa tecnologías alternativas como la eDRAM,que ofrece área y consumo mínimos.El inconveniente de esta tecnología es que las lecturas son destructivas y es más lenta que la SRAM. Esta tesis presenta tres contribuciones principales centradas en caches de bajo consumo y tecnologías heterogéneas: i)estudio de la capacitancia óptima de las celdas eDRAM, ii)diseño de una cache tolerante a fallos producidos en las celdas SRAM en modos de bajo consumo, iii)metodología para obtener la relación óptima entre voltaje y frecuencia en procesadores con modos de bajo consumo. Respecto a la primera contribución,en este trabajo se combinan las tecnologías SRAM y eDRAM para conseguir una memoria cache rápida, de bajo consumo, área reducida, y tolerante a los fallos inherentes a la tecnología SRAM.En primer lugar,esta disertación se centra en uno de los aspectos críticos de diseño de caches heterogéneas SRAM/eDRAM: la capacitancia de los condensadores implementados con tecnología eDRAM.En esta tesis se identifica la capacitancia óptima de una cache de datos L1 heterogénea mediante el estudio del compromiso entre prestaciones y consumo energético.Los resultados experimentales muestran que condensadores de 10fF ofrecen prestaciones similares a las de una cache SRAM convencional ahorrando un 55% de consumo y reduciendo un 29% el área ocupada por la cache. Respecto a la segunda contribución,esta tesis propone una organización de cache heterogénea tolerante a fallos.Actualmente,reducir el voltaje de alimentación es un mecanismo muy utilizado para reducir el consumo en condiciones de baja carga.Sin embargo,las celdas SRAM producen distintos tipos de fallos cuando se reduce el voltaje de alimentación y por tanto limitan el voltaje mínimo de funcionamiento del microprocesador. En la cache heterogénea propuesta,las celdas de memoria implementadas con tecnología eDRAM sirven de copia de seguridad en caso de fallo de las celdas SRAM, ya que el correcto funcionamiento de las celdas eDRAM no se ve afectado por tensiones reducidas.La arquitectura propuesta consta de dos modos de funcionamiento: high-performance mode para voltajes de alimentación que no inducen fallos en celdas implementadas en tecnología SRAM, y low-power mode para aquellos que sí lo hacen. En el modo high-performance mode,el procesador dispone de toda la capacidad de la cache.En el modo low-power mode se reduce la capacidad efectiva de la cache puesto que algunas de las celdas eDRAM se dedican a la recuperación de fallos de celdas SRAM.El estudio de prestaciones realizado muestra que éstas bajan hasta un máximo de 2.7% con respecto a una cache perfecta sin fallos. Finalmente, en esta tesis se propone una metodología para encontrar la relación óptima de voltaje/frecuencia con respecto al consumo energético sobre la cache heterogénea previamente diseñada. Para ello,primero se caracterizan los tipos de fallos SRAM y las probabilidades de fallo de los mismos.Después,se evalúa el consumo energético de diferentes combinaciones de voltaje/frecuencia cuando el sistema se encuentra en un modo de bajo consumo.El estudio muestra que la combinación óptima de voltaje y frecuencia desde el punto de vista energético no siempre corresponde al mínimo voltaje debido al imp[CA] La tecnologia SRAM s'ha utilitzat tradicionalment per a implementar les memòries cau degut a que és la tecnologia de memòria RAM més ràpida existent.Per contra, un dels principals inconvenients d'aquesta tecnologia és el seu elevat consum energètic.Per a reduir el consum els processadors moderns solen emprar dues tècniques complementàries: i)modes de funcionament de baix consum i ii)tecnologies de baix consum.La primera tècnica consisteix en utilitzar baixes freqüències i voltatges de funcionament.La principal limitació d'aquesta tècnica és que els defectes de fabricació poden afectar notablement a la fiabilitat de les cel·les SRAM en aquests modes.La segona tècnica agrupa tecnologies alternatives com la eDRAM, que ofereix àrea i consum mínims.L'inconvenient d'aquesta tecnologia és que les lectures són destructives i és més lenta que la SRAM. Aquesta tesi presenta tres contribucions principals centrades en caus de baix consum i tecnologies heterogènies: i)estudi de la capacitancia òptima de les cel·les eDRAM, ii)disseny d'una cau tolerant a fallades produïdes en les cel·les SRAM en modes de baix consum, iii)metodologia per a obtenir la relació òptima entre voltatge i freqüència en processadors amb modes de baix consum. Respecte a la primera contribució, en aquest treball es combinen les tecnologies SRAM i eDRAM per a aconseguir una memòria cau ràpida, de baix consum, àrea reduïda, i tolerant a les fallades inherents a la tecnologia SRAM.En primer lloc, aquesta dissertació se centra en un dels aspectes crítics de disseny de caus heterogènies: la capacitancia dels condensadors implementats amb tecnologia eDRAM.En aquesta dissertació s'identifica la capacitancia òptima d'una cache de dades L1 heterogènia mitjançant l'estudi del compromís entre prestacions i consum energètic.Els resultats experimentals mostren que condensadors de 10fF ofereixen prestacions similars a les d'una cau SRAM convencional estalviant un 55% de consum i reduint un 29% l'àrea ocupada per la cau. Respecte a la segona contribució, aquesta tesi proposa una organització de cau heterogènia tolerant a fallades.Actualment,reduir el voltatge d'alimentació és un mecanisme molt utilitzat per a reduir el consum en condicions de baixa càrrega.Per contra, les cel·les SRAM produeixen diferents tipus de fallades quan es redueix el voltatge d'alimentació i per tant limiten el voltatge mínim de funcionament del microprocessador. En la cau heterogènia proposta, les cel·les de memòria implementades amb tecnologia eDRAM serveixen de còpia de seguretat en cas de fallada de les cel·les SRAM, ja que el correcte funcionament de les cel·les eDRAM no es veu afectat per tensions reduïdes.L'arquitectura proposada consta de dues maneres de funcionament: high-performance mode per a voltatges d'alimentació que no indueixen fallades en cel·les implementades en tecnologia SRAM,i low-power mode per a aquells que sí ho fan.En el mode high-performance,el processador disposa de tota la capacitat de la cau.En el mode low-power es redueix la capacitat efectiva de la cau posat que algunes de les cel·les eDRAM es dediquen a la recuperació de fallades de cel·les SRAM.L'estudi de prestacions realitzat mostra que aquestes baixen fins a un màxim de 2.7% pel que fa a una cache perfecta sense fallades. Finalment,en aquesta tesi es proposa una metodologia per a trobar la relació òptima de voltatge/freqüència pel que fa al consum energètic sobre la cau heterogènia prèviament dissenyada.Per a açò,primer es caracteritzen els tipus de fallades SRAM i les probabilitats de fallada de les mateixes.Després,s'avalua el consum energètic de diferents combinacions de voltatge/freqüència quan el sistema es troba en un mode de baix consum.L'estudi mostra que la combinació òptima de voltatge i freqüència des del punt de vista energètic no sempre correspon al mínim voltatge degut a l'impacte de les fallades de SRAM en les presLorente Garcés, VJ. (2015). Cache architectures based on heterogeneous technologies to deal with manufacturing errors [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/58428TESI

GPU 에러 안정성 보장을 위한 컴파일러 기법

학위논문 (박사) -- 서울대학교 대학원 : 공과대학 전기·컴퓨터공학부, 2020. 8. 이재진.Due to semiconductor technology scaling and near-threshold voltage computing, soft error resilience has become more important. Nowadays, GPUs are widely used in high performance computing (HPC) because of its efficient parallel processing and modern GPUs designed for HPC use error correction code (ECC) to protect their storage including register files. However, adopting ECC in the register file imposes high area and energy overhead. To replace the expensive hardware cost of ECC, we propose Penny, a lightweight compiler-directed resilience scheme for GPU register file protection. We combine recent advances in idempotent recovery with low-cost error detection code. Our approach focuses on solving two important problems: 1. Can we guarantee correct error recovery using idempotent execution with error detection code? We show that when an error detection code is used with idempotence recovery, certain restrictions required by previous idempotent recovery schemes are no longer needed. We also propose a software-based scheme to prevent the checkpoint value from being overwritten before the end of the region where the value is required for correct recovery. 2. How do we reduce the execution overhead caused by checkpointing? In GPUs additional checkpointing store instructions inflicts considerably higher overhead compared to CPUs, due to its architectural characteristics, such as lack of store buffers. We propose a number of compiler optimizations techniques that significantly reduce the overhead.반도체 미세공정 기술이 발전하고 문턱전압 근처 컴퓨팅(near-threashold voltage computing)이 도입됨에 따라서 소프트 에러로부터의 복원이 중요한 과제가 되었다. 강력한 병렬 계산 성능을 지닌 GPU는 고성능 컴퓨팅에서 중요한 위치를 차지하게 되었고, 슈퍼 컴퓨터에서 쓰이는 GPU들은 에러 복원 코드인 ECC를 사용하여 레지스터 파일 및 메모리 등에 저장된 데이터를 보호하게 되었다. 하지만 레지스터 파일에 ECC를 사용하는 것은 큰 하드웨어나 에너지 비용을 필요로 한다. 이런 값비싼 ECC의 하드웨어 비용을 줄이기 위해 본 논문에서는 컴파일러 기반의 저비용 GPU 레지스터 파일 복원 기법인 Penny를 제안한다. 이는 최신의 멱등성(idempotency) 기반 에러 복원 기법을 저비용의 에러 검출 코드(EDC)와 결합한 것이다. 본 논문은 다음 두가지 문제를 해결하는 데에 집중한다. 1. 에러 검출 코드 기반으로 멱등성 기반 에러 복원을 사용시 소프트 에러로부터의 안전한 복원을 보장할 수 있는가?} 본 논문에서는 에러 검출 코드가 멱등성 기반 복원 기술과 같이 사용되었을 경우 기존의 복원 기법에서 필요로 했던 조건들 없이도 안전하게 에러로부터 복원할 수 있음을 보인다. 2. 체크포인팅에드는 비용을 어떻게 절감할 수 있는가?} GPU는 스토어 버퍼가 없는 등 아키텍쳐적인 특성으로 인해서 CPU와 비교하여 체크포인트 값을 저장하는 데에 큰 오버헤드가 든다. 이 문제를 해결하기 위해 본 논문에서는 다양한 컴파일러 최적화 기법을 통하여 오버헤드를 줄인다.1 Introduction 1 1.1 Why is Soft Error Resilience Important in GPUs 1 1.2 How can the ECC Overhead be Reduced 3 1.3 What are the Challenges 4 1.4 How do We Solve the Challenges 5 2 Comparison of Error Detection and Correction Coding Schemes for Register File Protection 7 2.1 Error Correction Codes and Error Detection Codes 8 2.2 Cost of Coding Schemes 9 2.3 Soft Error Frequency of GPUs 11 3 Idempotent Recovery and Challenges 13 3.1 Idempotent Execution 13 3.2 Previous Idempotent Schemes 13 3.2.1 De Kruijf's Idempotent Translation 14 3.2.2 Bolts's Idempotent Recovery 15 3.2.3 Comparison between Idempotent Schemes 15 3.3 Idempotent Recovery Process 17 3.4 Idempotent Recovery Challenges for GPUs 18 3.4.1 Checkpoint Overwriting 20 3.4.2 Performance Overhead 20 4 Correctness of Recovery 22 4.1 Proof of Safe Recovery 23 4.1.1 Prevention of Error Propagation 23 4.1.2 Proof of Correct State Recovery 24 4.1.3 Correctness in Multi-Threaded Execution 28 4.2 Preventing Checkpoint Overwriting 30 4.2.1 Register renaming 31 4.2.2 Storage Alternation by Checkpoint Coloring 33 4.2.3 Automatic Algorithm Selection 38 4.2.4 Future Works 38 5 Performance Optimizations 40 5.1 Compilation Phases of Penny 40 5.1.1 Region Formation 41 5.1.2 Bimodal Checkpoint Placement 41 5.1.3 Storage Alternation 42 5.1.4 Checkpoint Pruning 43 5.1.5 Storage Assignment 44 5.1.6 Code Generation and Low-level Optimizations 45 5.2 Cost Estimation Model 45 5.3 Region Formation 46 5.3.1 De Kruijf's Heuristic Region Formation 46 5.3.2 Region splitting and Region Stitching 47 5.3.3 Checkpoint-Cost Aware Optimal Region Formation 48 5.4 Bimodal Checkpoint Placement 52 5.5 Optimal Checkpoint Pruning 55 5.5.1 Bolt's Naive Pruning Algorithm and Overview of Penny's Optimal Pruning Algorithm 55 5.5.2 Phase 1: Collecting Global-Decision Independent Status 56 5.5.3 Phase2: Ordering and Finalizing Renaming Decisions 60 5.5.4 Effectiveness of Eliminating the Checkpoints 63 5.6 Automatic Checkpoint Storage Assignment 69 5.7 Low-Level Optimizations and Code Generation 70 6 Evaluation 74 6.1 Test Environment 74 6.1.1 GPU Architecture and Simulation Setup 74 6.1.2 Tested Applications 75 6.1.3 Register Assignment 76 6.2 Performance Evaluation 77 6.2.1 Overall Performance Overheads 77 6.2.2 Impact of Penny's Optimizations 78 6.2.3 Assigning Checkpoint Storage and Its Integrity 79 6.2.4 Impact of Optimal Checkpoint Pruning 80 6.2.5 Impact of Alias Analysis 81 6.3 Repurposing the Saved ECC Area 82 6.4 Energy Impact on Execution 83 6.5 Performance Overhead on Volta Architecture 85 6.6 Compilation Time 85 7 RelatedWorks 87 8 Conclusion and Future Works 89 8.1 Limitation and Future Work 90Docto

Resilience of an embedded architecture using hardware redundancy

In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound. Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures. In this work we study the concepts of fault tolerance and dependability and extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators

Designs for increasing reliability while reducing energy and increasing lifetime

In the last decades, the computing technology experienced tremendous developments. For instance, transistors' feature size shrank to half at every two years as consistently from the first time Moore stated his law. Consequently, number of transistors and core count per chip doubles at each generation. Similarly, petascale systems that have the capability of processing more than one billion calculation per second have been developed. As a matter of fact, exascale systems are predicted to be available at year 2020. However, these developments in computer systems face a reliability wall. For instance, transistor feature sizes are getting so small that it becomes easier for high-energy particles to temporarily flip the state of a memory cell from 1-to-0 or 0-to-1. Also, even if we assume that fault-rate per transistor stays constant with scaling, the increase in total transistor and core count per chip will significantly increase the number of faults for future desktop and exascale systems. Moreover, circuit ageing is exacerbated due to increased manufacturing variability and thermal stresses, therefore, lifetime of processor structures are becoming shorter. On the other side, due to the limited power budget of the computer systems such that mobile devices, it is attractive to scale down the voltage. However, when the voltage level scales to beyond the safe margin especially to the ultra-low level, the error rate increases drastically. Nevertheless, new memory technologies such as NAND flashes present only limited amount of nominal lifetime, and when they exceed this lifetime, they can not guarantee storing of the data correctly leading to data retention problems. Due to these issues, reliability became a first-class design constraint for contemporary computing in addition to power and performance. Moreover, reliability even plays increasingly important role when computer systems process sensitive and life-critical information such as health records, financial information, power regulation, transportation, etc. In this thesis, we present several different reliability designs for detecting and correcting errors occurring in processor pipelines, L1 caches and non-volatile NAND flash memories due to various reasons. We design reliability solutions in order to serve three main purposes. Our first goal is to improve the reliability of computer systems by detecting and correcting random and non-predictable errors such as bit flips or ageing errors. Second, we aim to reduce the energy consumption of the computer systems by allowing them to operate reliably at ultra-low voltage level. Third, we target to increase the lifetime of new memory technologies by implementing efficient and low-cost reliability schemes