Plug & Test at System Level via Testable TLM Primitives

With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos

RT-level fast fault simulator

In this paper a new fast fault simulation technique is presented for calculation of fault propagation through HLPs (High Level Primitives). ROTDDs (Reduced Ordered Ternary Decision Diagrams) are used to describe HLP modules. The technique is implemented in the HTDD RT-level fault simulator. The simulator is evaluated with some ITC99 benchmarks. A hypothesis is proved that a test set coverage of physical failures can be anticipated with high accuracy when RTL fault model takes into account optimization strategies that are used in CAE system applied

A Cross-level Verification Methodology for Digital IPs Augmented with Embedded Timing Monitors

Smart systems are characterized by the integration in a single device of multi-domain subsystems of different technological domains, namely, analog, digital, discrete and power devices, MEMS, and power sources. Such challenges, emerging from the heterogeneous nature of the whole system, combined with the traditional challenges of digital design, directly impact on performance and on propagation delay of digital components. This article proposes a design approach to enhance the RTL model of a given digital component for the integration in smart systems with the automatic insertion of delay sensors, which can detect and correct timing failures. The article then proposes a methodology to verify such added features at system level. The augmented model is abstracted to SystemC TLM, which is automatically injected with mutants (i.e., code mutations) to emulate delays and timing failures. The resulting TLM model is finally simulated to identify timing failures and to verify the correctness of the inserted delay monitors. Experimental results demonstrate the applicability of the proposed design and verification methodology, thanks to an efficient sensor-aware abstraction methodology, by applying the flow to three complex case studies

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

High-level verification flow for a high-level synthesis-based digital logic design

Abstract. High-level synthesis (HLS) is a method for generating register-transfer level (RTL) hardware description of digital logic designs from high-level languages, such as C/C++/SystemC or MATLAB. The performance and productivity benefits of HLS stem from the untimed, high abstraction level input languages. Another advantage is that the design and verification can focus on the features and high-level architecture, instead of the low-level implementation details. The goal of this thesis was to define and implement a high-level verification (HLV) flow for an HLS design written in C++. The HLV flow takes advantage of the performance and productivity of C++ as opposed to hardware description languages (HDL) and minimises the required RTL verification work. The HLV flow was implemented in the case study of the thesis. The HLS design was verified in a C++ verification environment, and Catapult Coverage was used for pre-HLS coverage closure. Post-HLS verification and coverage closure were done in Universal Verification Methodology (UVM) environment. C++ tests used in the pre-HLS coverage closure were reimplemented in UVM, to get a high initial RTL coverage without manual RTL code analysis. The pre-HLS C++ design was implemented as a predictor into the UVM testbench to verify the equivalence of C++ versus RTL and to speed up post-HLS coverage closure. Results of the case study show that the HLV flow is feasible to implement in practice. The flow shows significant performance and productivity gains of verification in the C++ domain when compared to UVM. The UVM implementation of a somewhat incomplete set of pre-HLS tests and formal exclusions resulted in an initial post-HLS coverage of 96.90%. The C++ predictor implementation was a valuable tool in post-HLS coverage closure. A total of four weeks of coverage work in pre- and post-HLS phases was required to reach 99% RTL coverage. The total time does not include the time required to build both C++ and UVM verification environments.Korkean tason verifiointivuo korkean tason synteesiin perustuvalle digitaalilogiikkasuunnitelmalle. Tiivistelmä. Korkean tason synteesi (HLS) on menetelmä, jolla generoidaan rekisterisiirtotason (RTL) laitteistokuvausta digitaalisille logiikkasuunnitelmille käyttäen korkean tason ohjelmointikieliä, kuten C-pohjaisia kieliä tai MATLAB:ia. HLS:n suorituskykyyn ja tuottavuuteen liittyvät hyödyt perustuvat ohjelmointikielien tarjoamaan korkeampaan abstraktiotasoon. HLS:ää käyttäen suunnittelu- ja varmennustyö voi keskittyä ominaisuuksiin ja korkean tason arkkitehtuuriin matalan tason yksityiskohtien sijaan. Tämän diplomityön tavoite oli määritellä ja implementoida korkean tason verifiointivuo (HLV-vuo) C++:lla kirjoitetulle HLS-suunnitelmalle. HLV-vuo hyödyntää ohjelmointikielien tarjoamaa suorituskykyä ja korkeampaa abstraktion tasoa kovonkuvauskielien sijaan ja siten minimoi RTL:n varmennukseen vaadittavaa työtä. HLV vuo implementoitiin tapaustutkimuksessa. HLS-suunnitelma varmennettiin C++ -verifiointiympäristössä, ja Catapult Coveragea käytettiin kattavuuden analysointiin. RTL-kattavuutta mitattiin universaalilla verifiointimetodologialla (UVM) tehdyssä ympäristössä. C++ varmennuksessa käytetyt testivektorit implementoitiin uudelleen UVM-ympäristössä, jotta RTL-kattavuuden lähtötaso olisi korkea ilman manuaalista RTL-analyysiä. C++-suunnitelma implementoitiin prediktorina (referenssimallina) UVM-testipenkkiin koodikattavuuden parantamiseksi. Tapaustutkimuksen tulokset osoittavat, että määritelty HLV-vuo on toteutettavissa käytännössä. Vuota käyttämällä saavutetaan merkittäviä suorituskyky- ja tuottavuusetuja C++ -testiympäristössä verrattuna UVM-ympäristöön. 90.60% koodikattavuuden saavuttavien C++ testivektoreiden uudelleenimplementoiti UVM-ympäristössä tuotti 96.90% RTL-kattavuuden. C++-predictorin implementointi oli merkittävä työkalu RTL-kattavuustavoitteen saavuttamisessa

Functional Verification of Digital Systems Using Meta-Heuristic Algorithms

Trends in technological developments, such as autonomous vehicles, home automation, connected cars, IoT, etc., are based on integrated systems or application-specific integrated circuits with high capacities, where these systems require even more complex devices. Thus, new techniques to design more secure systems in a short time in the market are needed. At this point, verification is one of the highest costs in the manufacturing stage and most expensive in the design process. To reduce the time and cost of the verification process, artificial intelligence techniques based on the optimization of the coverage of behavioral areas have been proposed. In this chapter, we will describe the main techniques used in the functional verification of digital systems of medium complexity, focusing especially on meta-heuristic algorithms such as particle swarm optimization, genetic algorithms, and so on. Several results are presented and compared, where the opportunity areas will be described

Driving the Network-on-Chip Revolution to Remove the Interconnect Bottleneck in Nanoscale Multi-Processor Systems-on-Chip

The sustained demand for faster, more powerful chips has been met by the availability of chip manufacturing processes allowing for the integration of increasing numbers of computation units onto a single die. The resulting outcome, especially in the embedded domain, has often been called SYSTEM-ON-CHIP (SoC) or MULTI-PROCESSOR SYSTEM-ON-CHIP (MP-SoC). MPSoC design brings to the foreground a large number of challenges, one of the most prominent of which is the design of the chip interconnection. With a number of on-chip blocks presently ranging in the tens, and quickly approaching the hundreds, the novel issue of how to best provide on-chip communication resources is clearly felt. NETWORKS-ON-CHIPS (NoCs) are the most comprehensive and scalable answer to this design concern. By bringing large-scale networking concepts to the on-chip domain, they guarantee a structured answer to present and future communication requirements. The point-to-point connection and packet switching paradigms they involve are also of great help in minimizing wiring overhead and physical routing issues. However, as with any technology of recent inception, NoC design is still an evolving discipline. Several main areas of interest require deep investigation for NoCs to become viable solutions: • The design of the NoC architecture needs to strike the best tradeoff among performance, features and the tight area and power constraints of the onchip domain. • Simulation and verification infrastructure must be put in place to explore, validate and optimize the NoC performance. • NoCs offer a huge design space, thanks to their extreme customizability in terms of topology and architectural parameters. Design tools are needed to prune this space and pick the best solutions. • Even more so given their global, distributed nature, it is essential to evaluate the physical implementation of NoCs to evaluate their suitability for next-generation designs and their area and power costs. This dissertation performs a design space exploration of network-on-chip architectures, in order to point-out the trade-offs associated with the design of each individual network building blocks and with the design of network topology overall. The design space exploration is preceded by a comparative analysis of state-of-the-art interconnect fabrics with themselves and with early networkon- chip prototypes. The ultimate objective is to point out the key advantages that NoC realizations provide with respect to state-of-the-art communication infrastructures and to point out the challenges that lie ahead in order to make this new interconnect technology come true. Among these latter, technologyrelated challenges are emerging that call for dedicated design techniques at all levels of the design hierarchy. In particular, leakage power dissipation, containment of process variations and of their effects. The achievement of the above objectives was enabled by means of a NoC simulation environment for cycleaccurate modelling and simulation and by means of a back-end facility for the study of NoC physical implementation effects. Overall, all the results provided by this work have been validated on actual silicon layout