Discrimination of surface and volume states in fully depleted field-effect devices on thick insulator substrates

The behavior of electronic devices fabricated on thin, lightly doped semiconductor layers can be significantly influenced by very low levels of non-ideal charge states. Such devices typically operate in a fully depleted mode, and can exhibit significantly different electrical properties and characteristics than their bulk material counterparts. Traditional interpretation of device characteristics may identify the existence of such non-idealities, but fail to ascertain if the origin is from within the semiconductor layer or associated with the interfaces to adjacent dielectric materials. This leads to ambiguity in how to rectify the behavior and improve device performance. Characterizing non-idealities through electrical means requires adaptations in both measurement techniques and data interpretation. Some of these adaptations have been applied in material systems like silicon-on-insulator (SOI), however in systems where the semiconductor film becomes increasingly isolated on very thick insulators (i.e., glass), the device physics of operation presents new challenges. Overcoming the obstacles in interpretation can directly aid the technology development of thin semiconductor films on thick insulator substrates. The investigation is initiated by isolating the interface of crystalline silicon bonded to a thick boro-aluminosilicate glass insulator. The interface is studied through traditional bulk capacitance-voltage (C-V) methods, and the electrical fragility of the interface is exposed. This reveals the necessity to discriminate between interface states and bulk defect states. To study methods of discrimination, the physics of field-effect devices fabricated on isolated semiconducting films is explained. These devices operate in a fully depleted state; expressions that describe the C-V relationship with a single gate electrode are derived and explored. The discussion presents an explanation of how surface and volume charge states each contribute to the C-V characteristic behavior. Application of this adapted C-V theory is then applied to the gated-diode, a novel device which has proven to be instrumental in charge state discrimination. Through this adaptation, the gated-diode is used to extract recombination-generation parameters isolated to the top surface, bottom surface and within the volume of the film. The methodology is developed through an exploration of devices fabricated on SOI and silicon-on-glass (SiOG) substrates, and furthers the understanding needed to improve material quality and device performance

The 2018 GaN Power Electronics Roadmap

Gallium nitride (GaN) is a compound semiconductor that has tremendous potential to facilitate economic growth in a semiconductor industry that is silicon-based and currently faced with diminishing returns of performance versus cost of investment. At a material level, its high electric field strength and electron mobility have already shown tremendous potential for high frequency communications and photonic applications. Advances in growth on commercially viable large area substrates are now at the point where power conversion applications of GaN are at the cusp of commercialisation. The future for building on the work described here in ways driven by specific challenges emerging from entirely new markets and applications is very exciting. This collection of GaN technology developments is therefore not itself a road map but a valuable collection of global state-of-the-art GaN research that will inform the next phase of the technology as market driven requirements evolve. First generation production devices are igniting large new markets and applications that can only be achieved using the advantages of higher speed, low specific resistivity and low saturation switching transistors. Major investments are being made by industrial companies in a wide variety of markets exploring the use of the technology in new circuit topologies, packaging solutions and system architectures that are required to achieve and optimise the system advantages offered by GaN transistors. It is this momentum that will drive priorities for the next stages of device research gathered here

A STUDY FOCUSING ON THE EFFECTS OF HTOL STRESS ON THE LUMINESCENCE SPECTRUM OF GAN DIODES TO CHARACTERIZE COMPONENT DEGRADATION

Wide bandgap (WBG) semiconductor technology allows devices to be operated at higher voltages, currents, temperatures, and frequencies than does conventional silicon-based narrow bandgap semiconductors. These characteristics are advantageous to military applications, such as uses in power converters, weapons, and radar systems. Notably, WBG semiconductors have advantages where cooling and space availability for components are concerns, such as unmanned underwater platforms. The ability to monitor the health and performance of these devices passively and remotely would reduce the man-hours required for preventative maintenance; it would also reduce the needs for invasive troubleshooting and needless component replacement. This thesis demonstrates the abilities to measure and analyze the electroluminescence spectrum of WBG devices using a custom-built high-temperature operating life (HTOL) test setup incorporating the ability to sample light spectroscopy.Lieutenant, United States NavyApproved for public release. Distribution is unlimited

Characterization of self-heating effects and assessment of its impact on reliability in finfet technology

The systematically growing power (heat) dissipation in CMOS transistors with each successive technology node is reaching levels which could impact its reliable operation. The emergence of technologies such as bulk/SOI FinFETs has dramatically confined the heat in the device channel due to its vertical geometry and it is expected to further exacerbate with gate-all-around transistors. This work studies heat generation in the channel of semiconductor devices and measures its dissipation by means of wafer level characterization and predictive thermal simulation. The experimental work is based on several existing device thermometry techniques to which additional layout improvements are made in state of the art bulk FinFET and SOI FinFET 14nm technology nodes. The sensors produce excellent matching results which are confirmed through TCAD thermal simulation, differences between sensor types are quantified and error bars on measurements are established. The lateral heat transport measurements determine that heat from the source is mostly dissipated at a distance of 1µm and 1.5µm in bulk FinFET and SOI FinFET, respectively. Heat additivity is successfully confirmed to prove and highlight the fact that the whole system needs to be considered when performing thermal analysis. Furthermore, an investigation is devoted to study self-heating with different layout densities by varying the number of fins and fingers per active region (RX). Fin thermal resistance is measured at different ambient temperatures to show its variation of up to 70% between -40°C to 175°C. Therefore, the Si fin has a more dominant effect in heat transport and its varying thermal conductivity should be taken into account. The effect of ambient temperature on self-heating measurement is confirmed by supplying heat through thermal chuck and adjacent heater devices themselves. Motivation for this work is the continuous evolution of the transistor geometry and use of exotic materials, which in the recent technology nodes made heat removal more challenging. This poses reliability and performance concerns. Therefore, this work studies the impact of self-heating on reliability testing at DC conditions as well as realistic CMOS logic operating (AC) conditions. Front-end-of-line (FEOL) reliability mechanisms, such as hot carrier injection (HCI) and non-uniform time dependent dielectric breakdown (TDDB), are studied to show that self-heating effects can impact measurement results and recommendations are given on how to mitigate them. By performing an HCI stress at moderate bias conditions, this dissertation shows that the laborious techniques of heat subtraction are no longer necessary. Self-heating is also studied at more realistic device switching conditions by utilizing ring oscillators with several densities and stage counts to show that self-heating is considerably lower compared to constant voltage stress conditions and degradation is not distinguishable

Vertical Gallium Nitride Power Devices: Fabrication and Characterisation

Efficient power conversion is essential to face the continuously increasing energy consumption of our society. GaN based vertical power field effect transistors provide excellent performance figures for power-conversion switches, due to their capability of handling high voltages and current densities with very low area consumption. This work focuses on a vertical trench gate metal oxide semiconductor field effect transistor (MOSFET) with conceptional advantages in a device fabrication preceded GaN epitaxy and enhancement mode characteristics. The functional layer stack comprises from the bottom an n+/n- drift/p body/n+ source GaN layer sequence. Special attention is paid to the Mg doping of the p-GaN body layer, which is a complex topic by itself. Hydrogen passivation of magnesium plays an essential role, since only the active (hydrogen-free) Mg concentration determines the threshold voltage of the MOSFET and the blocking capability of the body diode. Fabrication specific challenges of the concept are related to the complex integration, formation of ohmic contacts to the functional layers, the specific implementation and processing scheme of the gate trench module and the lateral edge termination. The maximum electric field, which was achieved in the pn- junction of the body diode of the MOSFET is estimated to be around 2.1 MV/cm. From double-sweep transfer measurements with relatively small hysteresis, steep subthreshold slope and a threshold voltage of 3 - 4 V a reasonably good Al2O3/GaN interface quality is indicated. In the conductive state a channel mobility of around 80 - 100 cm2/Vs is estimated. This obtained value is comparable to device with additional overgrowth of the channel. Further enhancement of the OFF-state and ON-state characteristics is expected for optimization of the device termination and the high-k/GaN interface of the vertical trench gate, respectively. From the obtained results and dependencies key figures of an area efficient and competitive device design with thick drift layer is extrapolated. Finally, an outlook is given and advancement possibilities as well as technological limits are discussed.:1 Motivation and boundary conditions 1.1 A comparison of competitive semiconductor materials 1.2 Vertical GaN device concepts 1.3 Target application for power switches 2 The vertical GaN MOSFET concept 2.1 Incomplete ionization of dopants 2.2 The pseudo-vertical approach 2.3 Considerations for the device OFF-state 2.3.1 The pn-junction in reverse operation 2.3.2 The gate trench MIS-structure in OFF-state 2.3.3 Dimensional constraints and field plates 2.4 Static ON-state and switching considerations 2.4.1 The pn-junction in forward operation 2.4.2 Resistance contributions 2.4.3 Device model and channel mobility 2.4.4 Threshold voltage and subthreshold slope 2.4.5 Interface and dielectric trap states in wide band semiconductors 2.4.6 The body bias effect 3 Fabrication and characterisation 3.1 Growth methods for GaN substrates and layers 3.2 Substrates and the desired starting material 3.2.1 Physical and micro-structural characterisation 3.2.2 Dislocations and impurities 3.3 Pseudo- and true-vertical MOSFET fabrication 3.3.1 Processing routes 3.3.2 Inductively-coupled plasma etching 3.3.3 Process flow modification 3.4 Electrical characterisation, structures and process control 3.4.1 Current voltage characterisation 3.4.2 C(V) measurements and charge carrier profiling 3.4.3 Cooperative characterisation structures 4 Properties of the functional layers 4.1 Morphology of the MOVPE grown layers 4.2 Hydrogen out-diffusion treatment 4.3 Morphology of the n+-source layer grown by MBE 4.4 N-type doping of the functional layers 4.5 P-type GaN by magnesium doping 4.6 Structural properties after the etching and gate module formation 4.7 Electrical layer characterization 4.7.1 Gate dielectric and interface evaluation 5 Pseudo- and true vertical device operation 5.1 Influences of the metal-line sheet resistance 5.2 Formation and characterisation of ohmic contacts 5.2.1 Ohmic contacts to n-type GaN 5.2.2 Ohmic contacts to p-GaN 5.3 The pn- body diode 5.4 MOSFET operation 5.4.1 ON-state and turn-ON operation 5.4.2 The body bias effect on the threshold voltage 5.4.3 Device OFF-state 6 Summary and conclusion 6.1 Device performance 6.2 Current limits of the vertical device technology 6.3 Possibilities for advancements Bibliography A Appendix A.1 Deduction: Forward diffusion current of the pn-diode A.2 Deduction: Operation regions in the EKV model Figures Tables Abbreviations Symbols Postamble and Acknowledgemen

Analysis and Design of Electrostatic Discharge Protection Devices and Circuits

An electrostatic discharge (ESD) is a spontaneous electrical current that flows between two objects at different electrical potentials. ESD currents can reach several amps and are typically in the order of tens of nanoseconds. Concerning microelectronics, on-chip protection against ESD events has become a main concern on the reliability of IC as dimensions continue to shrink. ESD currents could lead to on-chip voltages that are high enough to cause MOS gate oxide breakdown. ICs can thus be damaged by human handling, contact with machinery, packaging, board assembling, etc. The main goal of this study was to analyze the effectiveness of two-stage ESD protection circuits by means of mixed mode TCAD simulations. Two-dimensional device simulations were carried out using T-Suprem4 and Taurus-Medici software from Synopsis. Also, a TCAD input deck calibration for an NXP Semiconductors¿ proprietary 0.14m¿ CMOS technology was realized. In addition, two aspects on the transparency of ESD protections were studied. An excessive leakage problem found in a real product was analyzed in TCAD. Furthermore, a new approach for distributed ESD protection design for broadband applications is also discussed, resulting in improved RF performance.Pérez Monteagudo, JM. (2010). Analysis and Design of Electrostatic Discharge Protection Devices and Circuits. http://hdl.handle.net/10251/21061.Archivo delegad