686 research outputs found

    Pattern Recognition

    Get PDF
    Pattern recognition is a very wide research field. It involves factors as diverse as sensors, feature extraction, pattern classification, decision fusion, applications and others. The signals processed are commonly one, two or three dimensional, the processing is done in real- time or takes hours and days, some systems look for one narrow object class, others search huge databases for entries with at least a small amount of similarity. No single person can claim expertise across the whole field, which develops rapidly, updates its paradigms and comprehends several philosophical approaches. This book reflects this diversity by presenting a selection of recent developments within the area of pattern recognition and related fields. It covers theoretical advances in classification and feature extraction as well as application-oriented works. Authors of these 25 works present and advocate recent achievements of their research related to the field of pattern recognition

    A VISION-BASED QUALITY INSPECTION SYSTEM FOR FABRIC DEFECT DETECTION AND CLASSIFICATION

    Get PDF
    Published ThesisQuality inspection of textile products is an important issue for fabric manufacturers. It is desirable to produce the highest quality goods in the shortest amount of time possible. Fabric faults or defects are responsible for nearly 85% of the defects found by the garment industry. Manufacturers recover only 45 to 65% of their profits from second or off-quality goods. There is a need for reliable automated woven fabric inspection methods in the textile industry. Numerous methods have been proposed for detecting defects in textile. The methods are generally grouped into three main categories according to the techniques they use for texture feature extraction, namely statistical approaches, spectral approaches and model-based approaches. In this thesis, we study one method from each category and propose their combinations in order to get improved fabric defect detection and classification accuracy. The three chosen methods are the grey level co-occurrence matrix (GLCM) from the statistical category, the wavelet transform from the spectral category and the Markov random field (MRF) from the model-based category. We identify the most effective texture features for each of those methods and for different fabric types in order to combine them. Using GLCM, we identify the optimal number of features, the optimal quantisation level of the original image and the optimal intersample distance to use. We identify the optimal GLCM features for different types of fabrics and for three different classifiers. Using the wavelet transform, we compare the defect detection and classification performance of features derived from the undecimated discrete wavelet and those derived from the dual-tree complex wavelet transform. We identify the best features for different types of fabrics. Using the Markov random field, we study the performance for fabric defect detection and classification of features derived from different models of Gaussian Markov random fields of order from 1 through 9. For each fabric type we identify the best model order. Finally, we propose three combination schemes of the best features identified from the three methods and study their fabric detection and classification performance. They lead generally to improved performance as compared to the individual methods, but two of them need further improvement

    Evaluation of texture feature based on basic local binary pattern for wood defect classification

    Get PDF
    Wood defects detection has been studied a lot recently to detect the defects on the wood surface and assist the manufacturers in having a clear wood to be used to produce a high-quality product. Therefore, the defects on the wood affect and reduce the quality of wood. This research proposes an effective feature extraction technique called the local binary pattern (LBP) with a common classifier called Support Vector Machine (SVM). Our goal is to classify the natural defects on the wood surface. First, preprocessing was applied to convert the RGB images into grayscale images. Then, the research applied the LBP feature extraction technique with eight neighbors (P=8) and several radius (R) values. After that, we apply the SVM classifier for the classification and measure the proposed technique's performance. The experimental result shows that the average accuracy achieved is 65% on the balanced dataset with P=8 and R=1. It indicates that the proposed technique works moderately well to classify wood defects. This study will consequently contribute to the overall wood defect detection framework, which generally benefits the automated inspection of the wood defects

    Deep learning-based change detection in remote sensing images:a review

    Get PDF
    Images gathered from different satellites are vastly available these days due to the fast development of remote sensing (RS) technology. These images significantly enhance the data sources of change detection (CD). CD is a technique of recognizing the dissimilarities in the images acquired at distinct intervals and are used for numerous applications, such as urban area development, disaster management, land cover object identification, etc. In recent years, deep learning (DL) techniques have been used tremendously in change detection processes, where it has achieved great success because of their practical applications. Some researchers have even claimed that DL approaches outperform traditional approaches and enhance change detection accuracy. Therefore, this review focuses on deep learning techniques, such as supervised, unsupervised, and semi-supervised for different change detection datasets, such as SAR, multispectral, hyperspectral, VHR, and heterogeneous images, and their advantages and disadvantages will be highlighted. In the end, some significant challenges are discussed to understand the context of improvements in change detection datasets and deep learning models. Overall, this review will be beneficial for the future development of CD methods

    Support vector machine and parametric wavelet-based texture classification of stem cell images

    Get PDF
    Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, Operations Research Center, 2004.Includes bibliographical references (p. 117-121).This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.Stem (cell research is one of the most promising and cutting-edge fields i the miedical sciences. It is believed that this innovative research will lead to life-saving treatments in the coming years. As part of their work, stem cell researchers must first determine which of their stem cell colonies are of sufficiently high quality to be suitable for experimental studies and therapeutic treatments. Since colony texture is a major discriminating feature in determining quality. we introduce a non-invasive, semi-automated texture-based stem cell colony classification methodology to aid researchers in colony quality control. We first consider the general problem of textural image segmentation. In a new approach to this problem. we characterize image texture by the subband energies of the image's wavelet decomposition, and we employ a non-parametric support vector machine to perform the classification that yields the segmentation. We also adapt a parametric wavelet-based classifier that utilizes the Kullback-Leibler distance. We apply both methods to a set of benchmark textural images, report low segmentation error rates and comment on the applicability of and tradeoffs between the non-parametric and parametric segmentation methods.(cont.) We then apply the two classifiers to the segmentation of stem cell colony images into regions of varying quality. This provides stem cell researchers with a rich set of descriptive graphical representations of their colonies to aid in quality control. From these graphical representatiolns, we extract colony-wise textural features to which we add colony-wise border features. Taken together, these features characterize overall colony quality. Using these features as inputs to a multiclass support vector machine, we successfully categorize full stem cell colonies into several quality categories. This methodology provides stem cell researchers with a novel, non-invasive quantitative quality control tool.by Christopher G. Jeffreys.S.M
    • …
    corecore