431 research outputs found

    Jitter requirements of the sampling clock in software radio receivers

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    The effective number of bits of an analog-to-digital converter (ADC) is not only limited by the quantization step inaccuracy but also by sampling time uncertainty. According to a commonly used model, the error caused by timing jitter, integrated over the whole bandwidth, should not be bigger than the quantization noise, for a full swing input signals at the maximum input frequency. This results in unfeasible phase noise requirements for the sampling clock in software radio receivers with direct RF sampling. However, for a radio receiver not the total integrated error is relevant, but only the error signal in the channel bandwidth. This paper explores the clock jitter requirements for a software radio application, using a more realistic model and taking into account the power spectrum of both the input signal and the spectrum of the sampling clock jitter. Using this model, we show that the clock jitter requirements are very similar to reciprocal mixing requirements of superheterodyne receivers

    ์ฐจ๋Ÿ‰์šฉ CIS Interface ๋ฅผ ์œ„ํ•œ All-Digital Phase-Locked Loop ์˜ ์„ค๊ณ„ ๋ฐ ๋ถ„์„

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    ํ•™์œ„๋…ผ๋ฌธ (์„์‚ฌ) -- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ๊ณต๊ณผ๋Œ€ํ•™ ์ „๊ธฐยท์ •๋ณด๊ณตํ•™๋ถ€, 2021. 2. ์ •๋•๊ท .This thesis presents design techniques for All-Digital Phase-Locked Loop (ADPLL) assisting the automotive CMOS image sensor (CIS) interface. To target Gear 3 of the automotive physical system, the proposed AD-PLL has a wide operation range, low RMS jitter, and high PVT tolerance characteristics. Detailed analysis of the loop dynamics and the noise analysis of AD-PLL are done by using Matlab and Verilog behavioral modeling simulation before an actual design. Based on that analysis, the optimal DLF gain configurations are yielded, and also, accurate output responses and performance are predictable. The design techniques to reduce the output RMS jitter are discussed thoroughly and utilized for actual implementation. The proposed AD-PLL is fabricated in the 40 nm CMOS process and occupies an effective area of 0.026 mm2. The PLL output clock pulses exhibit an RMS jitter of 827 fs at 2 GHz. The power dissipation is 5.8 mW at 2 GHz, where the overall supply voltage domain is 0.9 V excluding the buffer which is 1.1 V domain.๋ณธ ๋…ผ๋ฌธ์—์„œ๋Š” ์ž๋™์ฐจ CMOS ์ด๋ฏธ์ง€ ์„ผ์„œ (CIS) ์ธํ„ฐํŽ˜์ด์Šค๋ฅผ ์ง€์›ํ•˜ ๋Š” AD-PLL ์„ ์ œ์•ˆํ•œ๋‹ค. Automotive Physical ์‹œ์Šคํ…œ์˜ Gear 3 ๋ฅผ ์ง€์›ํ•˜๊ธฐ ์œ„ํ•ด ์ œ์•ˆ๋œ AD-PLL ์€ 1.5 GHz ์—์„œ 3 GHz ์˜ ๋™์ž‘ ์ฃผํŒŒ์ˆ˜๋ฅผ ๊ฐ€์ง€๋ฉฐ, ๋‚ฎ ์€ RMS Jitter ๋ฐ PVT ๋ณ€ํ™”์— ๋Œ€ํ•œ ๋†’์€ ๋‘”๊ฐ์„ฑ์„ ๊ฐ–๋Š”๋‹ค. ์„ค๊ณ„์— ์•ž์„œ์„œ Matlab ๋ฐ Verilog Behavioral Simulation ์„ ํ†ตํ•ด Loop system ์˜ ์—ญํ•™์— ๋Œ€ํ•œ ์ž์„ธํ•œ ๋ถ„์„ ๋ฐ AD-PLL ์˜ Noise ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜์˜€๊ณ , ์ด ๋ถ„์„์„ ๊ธฐ๋ฐ˜์œผ๋กœ ์ตœ์ ์˜ DLF gain ๊ณผ ์ •ํ™•ํ•œ ์ถœ๋ ฅ ์‘๋‹ต ๋ฐ ์„ฑ๋Šฅ์„ ์˜ˆ์ธก ํ•  ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๋˜ํ•œ, ์ถœ๋ ฅ์˜ Phase Noise ์™€ RMS Jitter ๋ฅผ ์ค„์ด๊ธฐ ์œ„ํ•œ ์„ค๊ณ„ ๊ธฐ๋ฒ•์„ ์ž์„ธํžˆ ๋‹ค๋ฃจ๊ณ  ์žˆ์œผ๋ฉฐ ์ด๋ฅผ ์‹ค์ œ ๊ตฌํ˜„์— ํ™œ์šฉํ–ˆ๋‹ค. ์ œ์•ˆ๋œ ํšŒ๋กœ๋Š” 40 nm CMOS ๊ณต์ •์œผ๋กœ ์ œ์ž‘๋˜์—ˆ์œผ๋ฉฐ Decoupling Cap ์„ ์ œ์™ธํ•˜๊ณ  0.026 mm2 ์˜ ์œ ํšจ ๋ฉด์ ์„ ์ฐจ์ง€ํ•œ๋‹ค. ์ธก์ •๋œ ์ถœ๋ ฅ Clock ์‹ ํ˜ธ์˜ RMS Jitter ๊ฐ’์€ 2 GHz ์—์„œ 827 fs ์ด๋ฉฐ, ์ด 5.8 mW์˜ Power ๋ฅผ ์†Œ๋น„ํ•œ๋‹ค. ์ด ๋•Œ, ์ „์ฒด์ ์ธ ๊ณต๊ธ‰ ์ „์••์€ 0.9 V ์ด๋ฉฐ, Buffer ์˜ Power ๋งŒ์ด 1.1 V ๋ฅผ ์‚ฌ์šฉํ•˜ ์˜€๋‹ค.ABSTRACT I CONTENTS II LIST OF FIGURES IV LIST OF TABLES VII CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 3 CHAPTER 2 BACKGROUND ON ALL-DIGITAL PLL 4 2.1 OVERVIEW 4 2.2 BUILDING BLOCKS OF AD-PLL 7 2.2.1 TIME-TO-DIGITAL CONVERTER 7 2.2.2 DIGITALLY-CONTROLLED OSCILLATOR 10 2.2.3 DIGITAL LOOP FILTER 13 2.2.4 DELTA-SIGMA MODULATOR 16 2.3 PHASE NOISE ANALYSIS OF AD-PLL 20 2.3.1 BASIC ASSUMPTION OF LINEAR ANALYSIS 20 2.3.2 NOISE SOURCES OF AD-PLL 21 2.3.3 EFFECTS OF LOOP DELAY ON AD-PLL 24 2.3.4 PHASE NOISE ANALYSIS OF PROPOSED AD-PLL 26 CHAPTER 3 DESIGN OF ALL-DIGITAL PLL 28 3.1 DESIGN CONSIDERATION 28 3.2 OVERALL ARCHITECTURE 30 3.3 CIRCUIT IMPLEMENTATION 32 3.3.1 PFD-TDC 32 3.3.2 DCO 37 3.3.3 DIGITAL BLOCK 43 3.3.4 LEVEL SHIFTING BUFFER AND DIVIDER 45 CHAPTER 4 MEASUREMENT AND SIMULATION RESULTS 52 4.1 DIE PHOTOMICROGRAPH 52 4.2 MEASUREMENT SETUP 54 4.3 TRANSIENT ANALYSIS 57 4.4 PHASE NOISE AND SPUR PERFORMANCE 59 4.4.1 FREE-RUNNING DCO 59 4.4.2 PLL PERFORMANCE 61 4.5 PERFORMANCE SUMMARY 65 CHAPTER 5 CONCLUSION 67 BIBLIOGRAPHY 68 ์ดˆ ๋ก 72Maste

    Spur Reduction Techniques for Phase-Locked Loops Exploiting A Sub-Sampling Phase Detector

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    This paper presents phase-locked loop (PLL) reference-spur reduction design techniques exploiting a sub-sampling phase detector (SSPD) (which is also referred to as a sampling phase detector). The VCO is sampled by the reference clock without using a frequency divider and an amplitude controlled charge pump is used which is inherently insensitive to mismatch. The main remaining source of the VCO reference spur is the periodic disturbance of the VCO by the sampling at the reference frequency. The underlying VCO sampling spur mechanisms are analyzed and their effect is minimized by using dummy samplers and isolation buffers. A duty-cycle-controlled reference buffer and delay-locked loop (DLL) tuning are proposed to further reduce the worst case spur level. To demonstrate the effectiveness of the\ud proposed spur reduction techniques, a 2.21 GHz PLL is designed and fabricated in 0.18 m CMOS technology. While using a high loop-bandwidth-to-reference-frequency ratio of 1/20, the reference spur measured from 20 chips is 80 dBc. The PLL consumes 3.8 mW while the in-band phase noise is 121 dBc/Hz at 200 kHz and the output jitter integrated from 10 kHz to 100 MHz is 0.3 ps rms

    A Low Jitter Wideband Fractional-N Subsampling Phase Locked Loop (SSPLL)

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    Frequency synthesizers have become a crucial building block in the evolution of modern communication systems and consumer electronics. The spectral purity performance of frequency synthesizers limits the achievable data-rate and presents a noise-power tradeoff. For communication standards such as LTE where the channel spacing is a few kHz, the synthesizers must provide high frequencies with sufficiently wide frequency tuning range and fine frequency resolutions. Such stringent performance must be met with a limited power and small chip area. In this thesis a wideband fractional-N frequency synthesizer based on a subsampling phase locked loop (SSPLL) is presented. The proposed synthesizer which has a frequency resolution less than 100Hz employs a digital fractional controller (DFC) and a 10-bit digital-to-time converter (DTC) to delay the rising edges of the reference clock to achieve fractional phase lock. For fast convergence of the delay calibration, a novel two-step delay correlation loop (DCL) is employed. Furthermore, to provide optimum settling and jitter performance, the loop transfer characteristics during frequency acquisition and phase-lock are decoupled using a dual input loop filter (DILF). The fractional-N sub-sampling PLL (FNSSPLL) is implemented in a TSMC 40nm CMOS technology and occupies a total active area of 0.41mm^2. The PLL operates over frequency range of 2.8 GHz to 4.3 GHz (42% tuning range) while consuming 9.18mW from a 1.1V supply. The integrated jitter performance is better than 390 fs across all fractional frequency channel. The worst case fractional spur of -48.3 dBc occurs at a 650 kHz offset for a 3.75GHz fractional channel. The in-band phase noise measured at a 200 kHz offset is -112.5 dBc/Hz

    Digital Intensive Mixed Signal Circuits with In-situ Performance Monitors

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    University of Minnesota Ph.D. dissertation.November 2016. Major: Electrical/Computer Engineering. Advisor: Chris Kim. 1 computer file (PDF); x, 137 pages.Digital intensive circuit design techniques of different mixed-signal systems such as data converters, clock generators, voltage regulators etc. are gaining attention for the implementation of modern microprocessors and system-on-chips (SoCs) in order to fully utilize the benefits of CMOS technology scaling. Moreover different performance improvement schemes, for example, noise reduction, spur cancellation, linearity improvement etc. can be easily performed in digital domain. In addition to that, increasing speed and complexity of modern SoCs necessitate the requirement of in-situ measurement schemes, primarily for high volume testing. In-situ measurements not only obviate the need for expensive measurement equipments and probing techniques, but also reduce the test time significantly when a large number of chips are required to be tested. Several digital intensive circuit design techniques are proposed in this dissertation along with different in-situ performance monitors for a variety of mixed signal systems. First, a novel beat frequency quantization technique is proposed in a two-step VCO quantizer based ADC implementation for direct digital conversion of low amplitude bio- potential signals. By direct conversion, it alleviates the requirement of the area and power consuming analog-frontend (AFE) used in a conventional ADC designs. This prototype design is realized in a 65nm CMOS technology. Measured SNDR is 44.5dB from a 10mVpp, 300Hz signal and power consumption is only 38ฮผW. Next, three different clock generation circuits, a phase-locked loop (PLL), a multiplying delay-locked loop (MDLL) and a frequency-locked loop (FLL) are presented. First a 0.4-to-1.6GHz sub-sampling fractional-N all digital PLL architecture is discussed that utilizes a D-flip-flop as a digital sub-sampler. Measurement results from a 65nm CMOS test-chip shows 5dB lower phase noise at 100KHz offset frequency, compared to a conventional architecture. The Digital PLL (DPLL) architecture is further extended for a digital MDLL implementation in order to suppress the VCO phase noise beyond the DPLL bandwidth. A zero-offset aperture phase detector (APD) and a digital- to-time converter (DTC) are employed for static phase-offset (SPO) cancellation. A unique in-situ detection circuitry achieves a high resolution SPO measurement in time domain. A 65nm test-chip shows 0.2-to-1.45GHz output frequency range while reducing the phase-noise by 9dB compared to a DPLL. Next, a frequency-to-current converter (FTC) based fractional FLL is proposed for a low accuracy clock generation in an extremely low area for IoT application. High density deep-trench capacitors are used for area reduction. The test-chip is fabricated in a 32nm SOI technology that takes only 0.0054mm2 active area. A high-resolution in-situ period jitter measurement block is also incorporated in this design. Finally, a time based digital low dropout (DLDO) regulator architecture is proposed for fine grain power delivery over a wide load current dynamic range and input/output voltage in order to facilitate dynamic voltage and frequency scaling (DVFS). High- resolution beat frequency detector dynamically adjusts the loop sampling frequency for ripple and settling time reduction due to load transients. A fixed steady-state voltage offset provides inherent active voltage positioning (AVP) for ripple reduction. Circuit simulations in a 65nm technology show more than 90% current efficiency for 100X load current variation, while it can operate for an input voltage range of 0.6V โ€“ 1.2V

    Interfacing and instrumentation

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    System and circuitry to provide stable transconductance for biasing

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    An amplifier system can include an input amplifier configured to receive an analog input signal and provide an amplified signal corresponding to the analog input signal. A tracking loop is configured to employ delta modulation for tracking the amplified signal, the tracking loop providing a corresponding output signal. A biasing circuit is configured to adjust a bias current to maintain stable transconductance over temperature variations, the biasing circuit providing at least one bias signal for biasing at least one of the input amplifier and the tracking loop, whereby the circuitry receiving the at least one bias signal exhibits stable performance over the temperature variations. In another embodiment the biasing circuit can be utilized in other applications

    Design of energy efficient high speed I/O interfaces

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    Energy efficiency has become a key performance metric for wireline high speed I/O interfaces. Consequently, design of low power I/O interfaces has garnered large interest that has mostly been focused on active power reduction techniques at peak data rate. In practice, most systems exhibit a wide range of data transfer patterns. As a result, low energy per bit operation at peak data rate does not necessarily translate to overall low energy operation. Therefore, I/O interfaces that can scale their power consumption with data rate requirement are desirable. Rapid on-off I/O interfaces have a potential to scale power with data rate requirements without severely affecting either latency or the throughput of the I/O interface. In this work, we explore circuit techniques for designing rapid on-off high speed wireline I/O interfaces and digital fractional-N PLLs. A burst-mode transmitter suitable for rapid on-off I/O interfaces is presented that achieves 6 ns turn-on time by utilizing a fast frequency settling ring oscillator in digital multiplying delay-locked loop and a rapid on-off biasing scheme for current mode output driver. Fabricated in 90 nm CMOS process, the prototype achieves 2.29 mW/Gb/s energy efficiency at peak data rate of 8 Gb/s. A 125X (8 Gb/s to 64 Mb/s) change in effective data rate results in 67X (18.29 mW to 0.27 mW) change in transmitter power consumption corresponding to only 2X (2.29 mW/Gb/s to 4.24 mW/Gb/s) degradation in energy efficiency for 32-byte long data bursts. We also present an analytical bit error rate (BER) computation technique for this transmitter under rapid on-off operation, which uses MDLL settling measurement data in conjunction with always-on transmitter measurements. This technique indicates that the BER bathtub width for 10^(โˆ’12) BER is 0.65 UI and 0.72 UI during rapid on-off operation and always-on operation, respectively. Next, a pulse response estimation-based technique is proposed enabling burst-mode operation for baud-rate sampling receivers that operate over high loss channels. Such receivers typically employ discrete time equalization to combat inter-symbol interference. Implementation details are provided for a receiver chip, fabricated in 65nm CMOS technology, that demonstrates efficacy of the proposed technique. A low complexity pulse response estimation technique is also presented for low power receivers that do not employ discrete time equalizers. We also present techniques for implementation of highly digital fractional-N PLL employing a phase interpolator based fractional divider to improve the quantization noise shaping properties of a 1-bit โˆ†ฮฃ frequency-to-digital converter. Fabricated in 65nm CMOS process, the prototype calibration-free fractional-N Type-II PLL employs the proposed frequency-to-digital converter in place of a high resolution time-to-digital converter and achieves 848 fs rms integrated jitter (1 kHz-30 MHz) and -101 dBc/Hz in-band phase noise while generating 5.054 GHz output from 31.25 MHz input

    A Bang-Bang All-Digital PLL for Frequency Synthesis

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    abstract: Phase locked loops are an integral part of any electronic system that requires a clock signal and find use in a broad range of applications such as clock and data recovery circuits for high speed serial I/O and frequency synthesizers for RF transceivers and ADCs. Traditionally, PLLs have been primarily analog in nature and since the development of the charge pump PLL, they have almost exclusively been analog. Recently, however, much research has been focused on ADPLLs because of their scalability, flexibility and higher noise immunity. This research investigates some of the latest all-digital PLL architectures and discusses the qualities and tradeoffs of each. A highly flexible and scalable all-digital PLL based frequency synthesizer is implemented in 180 nm CMOS process. This implementation makes use of a binary phase detector, also commonly called a bang-bang phase detector, which has potential of use in high-speed, sub-micron processes due to the simplicity of the phase detector which can be implemented with a simple D flip flop. Due to the nonlinearity introduced by the phase detector, there are certain performance limitations. This architecture incorporates a separate frequency control loop which can alleviate some of these limitations, such as lock range and acquisition time.Dissertation/ThesisM.S. Electrical Engineering 201

    ์ตœ์ ์— ๊ฐ€๊นŒ์šด ํƒ€์ด๋ฐ ์ ์‘์„ ์œ„ํ•ด ์น˜์šฐ์นœ ๋ฐ์ดํ„ฐ ๋ ˆ๋ฒจ๊ณผ ๋ˆˆ ๊ฒฝ์‚ฌ ๋””ํ…ํ„ฐ๋ฅผ ์‚ฌ์šฉํ•œ ์ตœ๋Œ€ ๋ˆˆํฌ๊ธฐ์ถ”์  ํด๋Ÿญ ๋ฐ ๋ฐ์ดํ„ฐ ๋ณต์›ํšŒ๋กœ ์„ค๊ณ„

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    ํ•™์œ„๋…ผ๋ฌธ (๋ฐ•์‚ฌ) -- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ๊ณต๊ณผ๋Œ€ํ•™ ์ „๊ธฐยท์ •๋ณด๊ณตํ•™๋ถ€, 2021. 2. ์ •๋•๊ท .์ด ๋…ผ๋ฌธ์—์„œ๋Š” ์ตœ์†Œ-๋น„ํŠธ ๋น„ํŠธ ์—๋Ÿฌ์œจ (BER)์— ๋Œ€ํ•œ ์ตœ๋Œ€ ๋ˆˆํฌ๊ธฐ ์ถ”์  CDR (MET-CDR)์˜ ์„ค๊ณ„๊ฐ€ ์ œ์•ˆ๋˜์—ˆ๋‹ค. ์ œ์•ˆ ๋œ CDR ์€ ์ตœ์ ์˜ ์ƒ˜ํ”Œ๋ง ๋‹จ๊ณ„๋ฅผ ์ฐพ๊ธฐ ์œ„ํ•ด ๋ฐ˜๋ณต ์ ˆ์ฐจ๋ฅผ ๊ฐ€์ง„ BER ์นด์šดํ„ฐ ๋˜๋Š” ์•„์ด ๋ชจ๋‹ˆํ„ฐ๊ฐ€ ํ•„ ์š”ํ•˜์ง€ ์•Š๋‹ค. ์—๋Ÿฌ ์ƒ˜ํ”Œ๋Ÿฌ ์ถœ๋ ฅ์— ๊ฐ€์ค‘์น˜๋ฅผ ๋‘์–ด ๋”ํ•˜์—ฌ ์–ป์€ ์น˜์šฐ์นœ ๋ฐ ์ดํ„ฐ ๋ ˆ๋ฒจ (biased dLev) ์€ ์‚ฌ์ „ ์ปค์„œ ISI(pre-cursor ISI) ์˜ ์ •๋ณด๋„ ๊ณ ๋ คํ•œ ๋ˆˆ ๋†’์ด ์ •๋ณด๋ฅผ ์ถ”์ถœํ•œ๋‹ค. ๋ธํƒ€ T ๋งŒํผ์˜ ์‹œ๊ฐ„ ์ฐจ์ด๋ฅผ ๋‘” ์ง€์ ์—์„œ ์ž‘๋™ ํ•˜๋Š” ๋‘ ์ƒ˜ํ”Œ๋Ÿฌ๋Š” ํ˜„์žฌ ๋ˆˆ ๋†’์ด์™€ ๋ˆˆ ๊ธฐ์šธ๊ธฐ์˜ ๊ทน์„ฑ์„ ๊ฐ์ง€ํ•˜๊ณ , ์ด ์ •๋ณด ๋ฅผ ํ†ตํ•ด ์ œ์•ˆํ•˜๋Š” CDR ์€ ๋ˆˆ ๊ธฐ์šธ๊ธฐ๊ฐ€ 0 ์ด๋˜๋Š” ์ตœ๋Œ€ ๋ˆˆ ๋†’์ด๋กœ ์ˆ˜๋ ดํ•œ ๋‹ค. ์ธก์ • ๊ฒฐ๊ณผ๋Š” ์ตœ๋Œ€ ๋ˆˆ ๋†’์ด์™€ ์ตœ์†Œ BER ์˜ ์ƒ˜ํ”Œ๋ง ์œ„์น˜๊ฐ€ ์ž˜ ์ผ์น˜ ํ•จ ์„ ๋ณด์—ฌ์ค€๋‹ค. 28nm CMOS ๊ณต์ •์œผ๋กœ ๊ตฌํ˜„๋œ ์ˆ˜์‹ ๊ธฐ ์นฉ์€ 23.5dB ์˜ ์ฑ„๋„ ์†์‹ค์ด ์žˆ๋Š” ์ƒํƒœ์—์„œ 26Gb/s ์—์„œ ๋™์ž‘ ๊ฐ€๋Šฅํ•˜๋‹ค. 0.25UI ์˜ ์•„์ด ์˜คํ”„๋‹ ์„ ๊ฐ€์ง€๋ฉฐ, 87mW ์˜ ํŒŒ์›Œ๋ฅผ ์†Œ๋น„ํ•œ๋‹ค.In this thesis, design of a maximum-eye-tracking CDR (MET-CDR) for minimum bit error rate (BER) is proposed. The proposed CDR does not require a BER coun-ter or an eye-opening monitor with any iterative procedure to find the near-optimal sampling phase. The biased data-level obtained from the weighted sum of error sampler outputs, UP and DN, extracts the actual eye height information in the presence of pre-cursor ISI. Two samplers operating on two slightly different tim-ings detect the current eye height and the polarity of the eye slope so that the CDR tracks the maximum eye height where the slope becomes zero. Measured results show that the sampling phase of the maximum eye height and that of the mini-mum BER match well. A prototype receiver fabricated in 28 nm CMOS process operates at 26 Gb/s with an eye-opening of 0.25 UI and consumes 87 mW while equalizing 23.5 dB of loss at 13 GHz.ABSTRACT I CONTENTS II LIST OF FIGURES IV LIST OF TABLES VIII CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 4 CHAPTER 2 BACKGROUNDS 5 2.1 RECEIVER FRONT-END 5 2.1.1 CHANNEL 7 2.1.2 EQUALIZER 17 2.1.3 CDR 32 2.2 PRIOR ARTS ON CLOCK RECOVERY 39 2.2.1 BB-CDR 39 2.2.2 BER-BASED CDR 41 2.2.3 EOM-BASED CDR 44 2.3 CONCEPT OF THE PROPOSED CDR 47 CHAPTER 3 MAXIMUM-EYE-TRACKING CDR WITH BIASED DATA-LEVEL AND EYE SLOPE DETECTOR 49 3.1 OVERVIEW 49 3.2 DESIGN OF MET-CDR 50 3.2.1 EYE HEIGHT INFORMATION FROM BIASED DATA-LEVEL 50 3.2.2 EYE SLOPE DETECTOR AND ADAPTATION ALGORITHM 60 3.2.3 ARCHITECTURE AND IMPLEMENTATION 67 3.2.4 VERIFICATION OF THE ALGORITHM 71 3.2.5 ANALYSIS ON THE BIASED DATA-LEVEL 76 3.3 EXPANSION OF MET-CDR TO PAM4 SIGNALING 84 3.3.1 MET-CDR WITH PAM4 84 3.3.2 CONSIDERATIONS FOR PAM4 87 CHAPTER 4 MEASUREMENT RESULTS 89 CHAPTER 5 CONCLUSION 99 APPENDIX A MATLAB CODE FOR SIMULATING RECEIVER WITH MET-CDR 100 BIBLIOGRAPHY 105 ์ดˆ ๋ก 113Docto
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