Time interleaved counter analog to digital converters

The work explores extending time interleaving in A/D converters, by applying a high-level of parallelism to one of the slowest and simplest types of data-converters, the counter ADC. The motivation for the work is to realise high-performance re-configurable A/D converters for use in multi-standard and multi-PHY communication receivers with signal bandwidths in the 10s to 100s of MHz. The counter ADC requires only a comparator, a ramp signal, and a digital counter, where the comparator compares the sampled input against all possible quantisation levels sequentially. This work explores arranging counter ADCs in large time-interleaved arrays, building a Time Interleaved Counter (TIC) ADC. The key to realising a TIC ADC is distributed sampling and a global multi-phase ramp generator realised with a novel figure-of-8 rotating resistor ring. Furthermore Counter ADCs allow for re-configurability between effective sampling rate and resolution due to their sequential comparison of reference levels in conversion. A prototype TIC ADC of 128-channels was fabricated and measured in 0.13μm CMOS technology, where the same block can be configured to operate as a 7-bit 1GS/s, 8-bit 500MS/s, or 9-bit 250MS/s dataconverter. The ADC achieves a sub 400fJ/step FOM in all modes of configuration

Shifting the frontiers of analog and mixed-signal electronics

Nowadays, analog and mixed-signal (AMS) IC designs, mainly found in the frontends of large ICs, are highly dedicated, complex, and costly. They form a bottleneck in the communication with the outside world, determine an upper bound in quality, yield, and flexibility for the IC, and require a significant part of the power dissipation. Operating very close to physical limits, serious boundaries are faced. This paper relates, from a high-level point of view, these boundaries to the Shannon channel capacity and shows how the AMS circuitry forms a matching link in transforming the external analog signals, optimized for the communication medium, to the optimal on-chip signal representation, the digital one, for the IC medium. The signals in the AMS part itself are consequently not optimally matched to the IC medium. To further shift the frontiers of AMS design, a matching-driven design approach is crucial for AMS. Four levels will be addressed: technology-driven, states-driven, redundancy-driven, and nature-driven design. This is done based on an analysis of the various classes of AMS signals and their specific properties, seen from the angle of redundancy. This generic, but abstract way of looking at the design process will be substantiated with many specific examples

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Design of Power/Analog/Digital Systems Through Mixed-Level Simulations

In recent years the development of the applications in the field of telecommunications, data processing, control, renewable energy generation, consumer and automotive electronics determined the need for increasingly complex systems, also in shorter time to meet the growing market demand. The increasing complexity is mainly due to the mixed nature of these systems that must be developed to accommodate the new functionalities and to satisfy the more stringent performance requirements of the emerging applications. This means a more complex design and verification process. The key to managing the increased design complexity is a structured and integrated design methodology which allows the sharing of different circuit implementations that can be at transistor level and/or at a higher level (i.e.HDL languages).In order to expedite the mixed systems design process it is necessary to provide: an integrated design methodology; a suitable supporting tool able to manage the entire design process and design complexity and its successive verification.It is essential that the different system blocks (power, analog, digital), described at different level of abstraction, can be co-simulated in the same design context. This capability is referred to as mixed-level simulation.One of the objectives of this research is to design a mixed system application referred to the control of a coupled step-up dc-dc converter. This latter consists of a power stage designed at transistor-level, also including accurate power device models, and the analog controller implemented using VerilogA modules. Digital controllers are becoming very attractive in dc-dc converters for their programmability, ability to implement sophisticated control schemes, and ease of integration with other digital systems. Thus, in this dissertation it will be presented a detailed design of a Flash Analog-to-Digital Converter (ADC). The designed ADC provides medium-high resolution associated to high-speed performance. This makes it useful not only for the control application aforementioned but also for applications with huge requirements in terms of speed and signal bandwidth. The entire design flow of the overall system has been conducted in the Cadence Design Environment that also provides the ability to mixed-level simulations. Furthermore, the technology process used for the ADC design is the IHP BiCMOS 0.25 µm by using 50 GHz NPN HBT devices

Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

Energy-efficient analog-to-digital conversion for ultra-wideband radio

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.Includes bibliographical references (p. 207-222).In energy constrained signal processing and communication systems, a focus on the analog or digital circuits in isolation cannot achieve the minimum power consumption. Furthermore, in advanced technologies with significant variation, yield is traditionally achieved only through conservative design and a sacrifice of energy efficiency. In this thesis, these limitations are addressed with both a comprehensive mixed-signal design methodology and new circuits and architectures, as presented in the context of an analog-to-digital converter (ADC) for ultra-wideband (UWB) radio. UWB is an emerging technology capable of high-data-rate wireless communication and precise locationing, and it requires high-speed (>500MS/s), low-resolution ADCs. The successive approximation register (SAR) topology exhibits significantly reduced complexity compared to the traditional flash architecture. Three time-interleaved SAR ADCs have been implemented. At the mixed-signal optimum energy point, parallelism and reduced voltage supplies provide more than 3x energy savings. Custom control logic, a new capacitive DAC, and a hierarchical sampling network enable the high-speed operation. Finally, only a small amount of redundancy, with negligible power penalty, dramatically improves the yield of the highly parallel ADC in deep sub-micron CMOS.by Brian P. Ginsburg.Ph.D

Nonlinear models and algorithms for RF systems digital calibration

Focusing on the receiving side of a communication system, the current trend in pushing the digital domain ever more closer to the antenna sets heavy constraints on the accuracy and linearity of the analog front-end and the conversion devices. Moreover, mixed-signal implementations of Systems-on-Chip using nanoscale CMOS processes result in an overall poorer analog performance and a reduced yield. To cope with the impairments of the low performance analog section in this "dirty RF" scenario, two solutions exist: designing more complex analog processing architectures or to identify the errors and correct them in the digital domain using DSP algorithms. In the latter, constraints in the analog circuits' precision can be offloaded to a digital signal processor. This thesis aims at the development of a methodology for the analysis, the modeling and the compensation of the analog impairments arising in different stages of a receiving chain using digital calibration techniques. Both single and multiple channel architectures are addressed exploiting the capability of the calibration algorithm to homogenize all the channels' responses of a multi-channel system in addition to the compensation of nonlinearities in each response. The systems targeted for the application of digital post compensation are a pipeline ADC, a digital-IF sub-sampling receiver and a 4-channel TI-ADC. The research focuses on post distortion methods using nonlinear dynamic models to approximate the post-inverse of the nonlinear system and to correct the distortions arising from static and dynamic errors. Volterra model is used due to its general approximation capabilities for the compensation of nonlinear systems with memory. Digital calibration is applied to a Sample and Hold and to a pipeline ADC simulated in the 45nm process, demonstrating high linearity improvement even with incomplete settling errors enabling the use of faster clock speeds. An extended model based on the baseband Volterra series is proposed and applied to the compensation of a digital-IF sub-sampling receiver. This architecture envisages frequency selectivity carried out at IF by an active band-pass CMOS filter causing in-band and out-of-band nonlinear distortions. The improved performance of the proposed model is demonstrated with circuital simulations of a 10th-order band pass filter, realized using a five-stage Gm-C Biquad cascade, and validated using out-of-sample sinusoidal and QAM signals. The same technique is extended to an array receiver with mismatched channels' responses showing that digital calibration can compensate the loss of directivity and enhance the overall system SFDR. An iterative backward pruning is applied to the Volterra models showing that complexity can be reduced without impacting linearity, obtaining state-of-the-art accuracy/complexity performance. Calibration of Time-Interleaved ADCs, widely used in RF-to-digital wideband receivers, is carried out developing ad hoc models because the steep discontinuities generated by the imperfect canceling of aliasing would require a huge number of terms in a polynomial approximation. A closed-form solution is derived for a 4-channel TI-ADC affected by gain errors and timing skews solving the perfect reconstruction equations. A background calibration technique is presented based on cyclo-stationary filter banks architecture. Convergence speed and accuracy of the recursive algorithm are discussed and complexity reduction techniques are applied

Multi-gigabit CMOS analog-to-digital converter and mixed-signal demodulator for low-power millimeter-wave communication systems

The objective of the research is to develop high-speed ADCs and mixed-signal demodulator for multi-gigabit communication systems using millimeter-wave frequency bands in standard CMOS technology. With rapid advancements in semiconductor technologies, mobile communication devices have become more versatile, portable, and inexpensive over the last few decades. However, plagued by the short lifetime of batteries, low power consumption has become an extremely important specification in developing mobile communication devices. The ever-expanding demand of consumers to access and share information ubiquitously at faster speeds requires higher throughputs, increased signal-processing functionalities at lower power and lower costs. In today’s technology, high-speed signal processing and data converters are incorporated in almost all modern multi-gigabit communication systems. They are key enabling technologies for scalable digital design and implementation of baseband signal processors. Ultimately, the merits of a high performance mixed-signal receiver, such as data rate, sensitivity, signal dynamic range, bit-error rate, and power consumption, are directly related to the quality of the embedded ADCs. Therefore, this dissertation focuses on the analysis and design of high-speed ADCs and a novel broadband mixed-signal demodulator with a fully-integrated DSP composed of low-cost CMOS circuitry. The proposed system features a novel dual-mode solution to demodulate multi-gigabit BPSK and ASK signals. This approach reduces the resolution requirement of high-speed ADCs, while dramatically reducing its power consumption for multi-gigabit wireless communication systems.PhDGee-Kung Chang - Committee Chair; Chang-Ho Lee - Committee Member; Geoffrey Ye Li - Committee Member; Paul A. Kohl - Committee Member; Shyh-Chiang Shen - Committee Membe