Special Libraries, Winter 1986

Volume 77, Issue 1https://scholarworks.sjsu.edu/sla_sl_1986/1000/thumbnail.jp

A Case for using Grid Framework for Indian Rural Healthcare to Meet the Millennium Development Goals (MDGs)

As per the September 2010, Annual Report of Department of Health and Family Welfare, Ministry of Health and Family Welfare, GOI, 75% of human resources and advanced medical technology,70% of hospitals and 40% of beds are in the private sector and mostly in the urban areas. Due to poor Infrastructure, insufficient supply of skilled doctors and dispersed populations the people living in the rural areas do not get any specialist care ,advice and treatment plan resulting in high MMR (Maternal Mortality Rate per 100,000 live births) and IMR(Infant Mortality Rate).We have proposed a HealthGrid Framework using the SWAN as an IT backbone and also formation of a Data Grid EHR to be shared by specialist doctors to provide better medical services to the rural poor which in turn helps us to meet the MDGs by 2015

Mitigating Silent Data Corruptions In Integer Matrix Products : Toward Reliable Multimedia Computing On Unreliable Hardware

Peer reviewedPostprin

Coverage Testing in a Production Software Development Environment

This project proposes that current testing methodologies used by standard testing tools are not sufficient to ensure sufficient test coverage. Test tools provide important and irreplaceable test data but are not capable of guaranteeing high percentage of path exposure (coverage). If the code path includes loop statements like, if or when then the number of paths to test grows exponentially. The growth of the code path becomes exponential when nested decision statements are considered. The most common methodology used in today\u27s testing environment verifies each line of code but does not verify all path combination. Testing per line of code can not guarantee complete test coverage when considering the variations of nested code paths. The result of lower coverage is a higher field defect rate that increases the overall product support costs

Resiliency Mechanisms for In-Memory Column Stores

The key objective of database systems is to reliably manage data, while high query throughput and low query latency are core requirements. To date, database research activities mostly concentrated on the second part. However, due to the constant shrinking of transistor feature sizes, integrated circuits become more and more unreliable and transient hardware errors in the form of multi-bit flips become more and more prominent. In a more recent study (2013), in a large high-performance cluster with around 8500 nodes, a failure rate of 40 FIT per DRAM device was measured. For their system, this means that every 10 hours there occurs a single- or multi-bit flip, which is unacceptably high for enterprise and HPC scenarios. Causes can be cosmic rays, heat, or electrical crosstalk, with the latter being exploited actively through the RowHammer attack. It was shown that memory cells are more prone to bit flips than logic gates and several surveys found multi-bit flip events in main memory modules of today's data centers. Due to the shift towards in-memory data management systems, where all business related data and query intermediate results are kept solely in fast main memory, such systems are in great danger to deliver corrupt results to their users. Hardware techniques can not be scaled to compensate the exponentially increasing error rates. In other domains, there is an increasing interest in software-based solutions to this problem, but these proposed methods come along with huge runtime and/or storage overheads. These are unacceptable for in-memory data management systems. In this thesis, we investigate how to integrate bit flip detection mechanisms into in-memory data management systems. To achieve this goal, we first build an understanding of bit flip detection techniques and select two error codes, AN codes and XOR checksums, suitable to the requirements of in-memory data management systems. The most important requirement is effectiveness of the codes to detect bit flips. We meet this goal through AN codes, which exhibit better and adaptable error detection capabilities than those found in today's hardware. The second most important goal is efficiency in terms of coding latency. We meet this by introducing a fundamental performance improvements to AN codes, and by vectorizing both chosen codes' operations. We integrate bit flip detection mechanisms into the lowest storage layer and the query processing layer in such a way that the remaining data management system and the user can stay oblivious of any error detection. This includes both base columns and pointer-heavy index structures such as the ubiquitous B-Tree. Additionally, our approach allows adaptable, on-the-fly bit flip detection during query processing, with only very little impact on query latency. AN coding allows to recode intermediate results with virtually no performance penalty. We support our claims by providing exhaustive runtime and throughput measurements throughout the whole thesis and with an end-to-end evaluation using the Star Schema Benchmark. To the best of our knowledge, we are the first to present such holistic and fast bit flip detection in a large software infrastructure such as in-memory data management systems. Finally, most of the source code fragments used to obtain the results in this thesis are open source and freely available.:1 INTRODUCTION 1.1 Contributions of this Thesis 1.2 Outline 2 PROBLEM DESCRIPTION AND RELATED WORK 2.1 Reliable Data Management on Reliable Hardware 2.2 The Shift Towards Unreliable Hardware 2.3 Hardware-Based Mitigation of Bit Flips 2.4 Data Management System Requirements 2.5 Software-Based Techniques For Handling Bit Flips 2.5.1 Operating System-Level Techniques 2.5.2 Compiler-Level Techniques 2.5.3 Application-Level Techniques 2.6 Summary and Conclusions 3 ANALYSIS OF CODING TECHNIQUES 3.1 Selection of Error Codes 3.1.1 Hamming Coding 3.1.2 XOR Checksums 3.1.3 AN Coding 3.1.4 Summary and Conclusions 3.2 Probabilities of Silent Data Corruption 3.2.1 Probabilities of Hamming Codes 3.2.2 Probabilities of XOR Checksums 3.2.3 Probabilities of AN Codes 3.2.4 Concrete Error Models 3.2.5 Summary and Conclusions 3.3 Throughput Considerations 3.3.1 Test Systems Descriptions 3.3.2 Vectorizing Hamming Coding 3.3.3 Vectorizing XOR Checksums 3.3.4 Vectorizing AN Coding 3.3.5 Summary and Conclusions 3.4 Comparison of Error Codes 3.4.1 Effectiveness 3.4.2 Efficiency 3.4.3 Runtime Adaptability 3.5 Performance Optimizations for AN Coding 3.5.1 The Modular Multiplicative Inverse 3.5.2 Faster Softening 3.5.3 Faster Error Detection 3.5.4 Comparison to Original AN Coding 3.5.5 The Multiplicative Inverse Anomaly 3.6 Summary 4 BIT FLIP DETECTING STORAGE 4.1 Column Store Architecture 4.1.1 Logical Data Types 4.1.2 Storage Model 4.1.3 Data Representation 4.1.4 Data Layout 4.1.5 Tree Index Structures 4.1.6 Summary 4.2 Hardened Data Storage 4.2.1 Hardened Physical Data Types 4.2.2 Hardened Lightweight Compression 4.2.3 Hardened Data Layout 4.2.4 UDI Operations 4.2.5 Summary and Conclusions 4.3 Hardened Tree Index Structures 4.3.1 B-Tree Verification Techniques 4.3.2 Justification For Further Techniques 4.3.3 The Error Detecting B-Tree 4.4 Summary 5 BIT FLIP DETECTING QUERY PROCESSING 5.1 Column Store Query Processing 5.2 Bit Flip Detection Opportunities 5.2.1 Early Onetime Detection 5.2.2 Late Onetime Detection 5.2.3 Continuous Detection 5.2.4 Miscellaneous Processing Aspects 5.2.5 Summary and Conclusions 5.3 Hardened Intermediate Results 5.3.1 Materialization of Hardened Intermediates 5.3.2 Hardened Bitmaps 5.4 Summary 6 END-TO-END EVALUATION 6.1 Prototype Implementation 6.1.1 AHEAD Architecture 6.1.2 Diversity of Physical Operators 6.1.3 One Concrete Operator Realization 6.1.4 Summary and Conclusions 6.2 Performance of Individual Operators 6.2.1 Selection on One Predicate 6.2.2 Selection on Two Predicates 6.2.3 Join Operators 6.2.4 Grouping and Aggregation 6.2.5 Delta Operator 6.2.6 Summary and Conclusions 6.3 Star Schema Benchmark Queries 6.3.1 Query Runtimes 6.3.2 Improvements Through Vectorization 6.3.3 Storage Overhead 6.3.4 Summary and Conclusions 6.4 Error Detecting B-Tree 6.4.1 Single Key Lookup 6.4.2 Key Value-Pair Insertion 6.5 Summary 7 SUMMARY AND CONCLUSIONS 7.1 Future Work A APPENDIX A.1 List of Golden As A.2 More on Hamming Coding A.2.1 Code examples A.2.2 Vectorization BIBLIOGRAPHY LIST OF FIGURES LIST OF TABLES LIST OF LISTINGS LIST OF ACRONYMS LIST OF SYMBOLS LIST OF DEFINITION

Earth and environmental science in the 1980's: Part 1: Environmental data systems, supercomputer facilities and networks

Overview descriptions of on-line environmental data systems, supercomputer facilities, and networks are presented. Each description addresses the concepts of content, capability, and user access relevant to the point of view of potential utilization by the Earth and environmental science community. The information on similar systems or facilities is presented in parallel fashion to encourage and facilitate intercomparison. In addition, summary sheets are given for each description, and a summary table precedes each section

Computer Science Research at Langley

A workshop was held at Langley Research Center, November 2-5, 1981, to highlight ongoing computer science research at Langley and to identify additional areas of research based upon the computer user requirements. A panel discussion was held in each of nine application areas, and these are summarized in the proceedings. Slides presented by the invited speakers are also included. A survey of scientific, business, data reduction, and microprocessor computer users helped identify areas of focus for the workshop. Several areas of computer science which are of most concern to the Langley computer users were identified during the workshop discussions. These include graphics, distributed processing, programmer support systems and tools, database management, and numerical methods

An extensive study on iterative solver resilience : characterization, detection and prediction

Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's behavior. This has motivated the design of an array of techniques to detect, isolate, and correct soft errors using microarchitectural, architectural, compilation­based, or application-level techniques to minimize their impact on the executing application. The first step toward the design of good error detection/correction techniques involves an understanding of an application's vulnerability to soft errors. This work focuses on silent data e orruption's effects on iterative solvers and efforts to mitigate those effects. In this thesis, we first present the first comprehensive characterizalion of !he impact of soft errors on !he convergen ce characteris tics of six iterative methods using application-level fault injection. We analyze the impact of soft errors In terms of the type of error (single-vs multi-bit), the distribution and location of bits affected, the data structure and statement impacted, and varialion with time. We create a public access database with more than 1.5 million fault injection results. We then analyze the performance of soft error detection mechanisms and present the comparalive results. Molivated by our observations, we evaluate a machine-learning based detector that takes as features that are the runtime features observed by the individual detectors to arrive al their conclusions. Our evalualion demonstrates improved results over individual detectors. We then propase amachine learning based method to predict a program's error behavior to make fault injection studies more efficient. We demonstrate this method on asse ssing the performance of soft error detectors. We show that our method maintains 84% accuracy on average with up to 53% less cost. We also show, once a model is trained further fault injection tests would cost 10% of the expected full fault injection runs.“Soft errors” causados por cambios de estado transitorios en bits, tienen el potencial de impactar significativamente el comportamiento de una aplicación. Esto, ha motivado el diseño de una variedad de técnicas para detectar, aislar y corregir soft errors aplicadas a micro-arquitecturas, arquitecturas, tiempo de compilación y a nivel de aplicación para minimizar su impacto en la ejecución de una aplicación. El primer paso para diseñar una buna técnica de detección/corrección de errores, implica el conocimiento de las vulnerabilidades de la aplicación ante posibles soft errors. Este trabajo se centra en los efectos de la corrupción silenciosa de datos en soluciones iterativas, así como en los esfuerzos para mitigar esos efectos. En esta tesis, primeramente, presentamos la primera caracterización extensiva del impacto de soft errors sobre las características convergentes de seis métodos iterativos usando inyección de fallos a nivel de aplicación. Analizamos el impacto de los soft errors en términos del tipo de error (único vs múltiples-bits), de la distribución y posición de los bits afectados, las estructuras de datos, instrucciones afectadas y de las variaciones en el tiempo. Creamos una base de datos pública con más de 1.5 millones de resultados de inyección de fallos. Después, analizamos el desempeño de mecanismos de detección de soft errors actuales y presentamos los resultados de su comparación. Motivados por las observaciones de los resultados presentados, evaluamos un detector de soft errors basado en técnicas de machine learning que toma como entrada las características observadas en el tiempo de ejecución individual de los detectores anteriores al llegar a su conclusión. La evaluación de los resultados obtenidos muestra una mejora por sobre los detectores individualmente. Basados en estos resultados propusimos un método basado en machine learning para predecir el comportamiento de los errores en un programa con el fin de hacer el estudio de inyección de errores mas eficiente. Presentamos este método para evaluar el rendimiento de los detectores de soft errors. Demostramos que nuestro método mantiene una precisión del 84% en promedio con hasta un 53% de mejora en el tiempo de ejecución. También mostramos que una vez que un modelo ha sido entrenado, las pruebas de inyección de errores siguientes costarían 10% del tiempo esperado de ejecución.Postprint (published version