Fault-tolerant fpga for mission-critical applications.

One of the devices that play a great role in electronic circuits design, specifically safety-critical design applications, is Field programmable Gate Arrays (FPGAs). This is because of its high performance, re-configurability and low development cost. FPGAs are used in many applications such as data processing, networks, automotive, space and industrial applications. Negative impacts on the reliability of such applications result from moving to smaller feature sizes in the latest FPGA architectures. This increases the need for fault-tolerant techniques to improve reliability and extend system lifetime of FPGA-based applications. In this thesis, two fault-tolerant techniques for FPGA-based applications are proposed with a built-in fault detection region. A low cost fault detection scheme is proposed for detecting faults using the fault detection region used in both schemes. The fault detection scheme primarily detects open faults in the programmable interconnect resources in the FPGAs. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can be detected. For fault recovery, each scheme has its own fault recovery approach. The first approach uses a spare module and a 2-to-1 multiplexer to recover from any fault detected. On the other hand, the second approach recovers from any fault detected using the property of Partial Reconfiguration (PR) in the FPGAs. It relies on identifying a Partially Reconfigurable block (P_b) in the FPGA that is used in the recovery process after the first faulty module is identified in the system. This technique uses only one location to recover from faults in any of the FPGA’s modules and the FPGA interconnects. Simulation results show that both techniques can detect and recover from open faults. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can also be detected. Finally, both techniques require low area overhead

Design techniques for xilinx virtex FPGA configuration memory scrubbers

SRAM-based FPGAs are in-field reconfigurable an unlimited number of times. This characteristic, together with their high performance and high logic density, proves to be very convenient for a number of ground and space level applications. One drawback of this technology is that it is susceptible to ionizing radiation, and this sensitivity increases with technology scaling. This is a first order concern for applications in harsh radiation environments, and starts to be a concern for high reliability ground applications. Several techniques exist for coping with radiation effects at user application. In order to be effective they need to be complemented with configuration memory scrubbing, which allows error mitigation and prevents failures due to error accumulation. Depending on the radiation environment and on the system dependability requirements, the configuration scrubber design can become more or less complex. This paper classifies and presents current and novel design methodologies and architectures for SRAM-based FPGAs, and in particular for Xilinx Virtex-4QV/5QV, configuration memory scrubbers

08371 Abstracts Collection -- Fault-Tolerant Distributed Algorithms on VLSI Chips

From September the $7^{text{th}}$, 2008 to September the $10^{text{th}}$, 2008 the Dagstuhl Seminar 08371 ``Fault-Tolerant Distributed Algorithms on VLSI Chips \u27\u27 was held in Schloss Dagstuhl~--~Leibniz Center for Informatics. The seminar was devoted to exploring whether the wealth of existing fault-tolerant distributed algorithms research can be utilized for meeting the challenges of future-generation VLSI chips. During the seminar, several participants from both the VLSI and distributed algorithms\u27 discipline, presented their current research, and ongoing work and possibilities for collaboration were discussed. Abstracts of the presentations given during the seminar as well as abstracts of seminar results and ideas are put together in this paper. The first section describes the seminar topics and goals in general. Links to extended abstracts or full papers are provided, if available

Adaptive reconfigurable voting for enhanced reliability in medium-grained fault tolerant architectures

The impact of SRAM-based FPGAs is constantly growing in aerospace industry despite the fact that their volatile configuration memory is highly susceptible to radiation effects. Therefore, strong fault-handling mechanisms have to be developed in order to protect the design and make it capable of fighting against both soft and permanent errors. In this paper, a fully reconfigurable medium-grained triple modular redundancy (TMR) architecture which forms part of a runtime adaptive on-board processor (OBP) is presented. Fault mitigation is extended to the voting mechanism by applying our reconfiguration methodology not only to domain replicas but also to the voter itself. The proposed approach takes advantage of adaptive configuration placement and modular property of the OBP, thus allowing on-line creation of different medium-grained TMRs and selection of their granularity level. Consequently, we are able to narrow down the fault-affected area thus making the error recovery process faster and less power consuming. The conventional hardware based voting is supported by the ICAP-based one in order to additionally strengthen the reconfigurable intermediate voting. In addition, the implementation methodology ensures using only one memory footprint for all voters and their voting adaptations thus saving storing resources in expensive rad-hard memories

Fault Tolerant Electronic System Design

Due to technology scaling, which means reduced transistor size, higher density, lower voltage and more aggressive clock frequency, VLSI devices may become more sensitive against soft errors. Especially for those devices used in safety- and mission-critical applications, dependability and reliability are becoming increasingly important constraints during the development of system on/around them. Other phenomena (e.g., aging and wear-out effects) also have negative impacts on reliability of modern circuits. Recent researches show that even at sea level, radiation particles can still induce soft errors in electronic systems. On one hand, processor-based system are commonly used in a wide variety of applications, including safety-critical and high availability missions, e.g., in the automotive, biomedical and aerospace domains. In these fields, an error may produce catastrophic consequences. Thus, dependability is a primary target that must be achieved taking into account tight constraints in terms of cost, performance, power and time to market. With standards and regulations (e.g., ISO-26262, DO-254, IEC-61508) clearly specify the targets to be achieved and the methods to prove their achievement, techniques working at system level are particularly attracting. On the other hand, Field Programmable Gate Array (FPGA) devices are becoming more and more attractive, also in safety- and mission-critical applications due to the high performance, low power consumption and the flexibility for reconfiguration they provide. Two types of FPGAs are commonly used, based on their configuration memory cell technology, i.e., SRAM-based and Flash-based FPGA. For SRAM-based FPGAs, the SRAM cells of the configuration memory highly susceptible to radiation induced effects which can leads to system failure; and for Flash-based FPGAs, even though their non-volatile configuration memory cells are almost immune to Single Event Upsets induced by energetic particles, the floating gate switches and the logic cells in the configuration tiles can still suffer from Single Event Effects when hit by an highly charged particle. So analysis and mitigation techniques for Single Event Effects on FPGAs are becoming increasingly important in the design flow especially when reliability is one of the main requirements

Using Relocatable Bitstreams for Fault Tolerance

This research develops a method for relocating reconfigurable modules on the Virtex-II (Pro) family of Field Programmable Gate Arrays (FPGAs). A bitstream translation program is developed which correctly changes the location of a partial bitstream that implements a module on the FPGA. To take advantage of relocatable modules, three fault-tolerance circuit designs are developed and tested. This circuit can operate through a fault by efficiently removing the faulty module and replacing it with a relocated module without faults. The FPGA can recover from faults at a known location, without the need for external intervention using an embedded fault recovery system. The recovery system uses an internal PowerPC to relocate the modules and reprogram the FPGA. Due to the limited architecture of the target FPGA and Xilinx tool errors, an FPGA with automatic fault recovery could not be demonstrated. However, the various components needed to do this type of recovery have been implemented and demonstrated individually

Area-driven partial reconfiguration for SEU mitigation on SRAM-based FPGAs

This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on partial reconfiguration for Single Event Upset (SEU) mitigation. The proposed method is compared with existing techniques such as blind and on-demand scrubbing on a novel SEU mitigation framework implemented on the ZYNQ platform, supporting various SEU and scrubbing rates. A design space exploration on the availability versus data transfers from a Double Data Rate Type 3 (DDR3) memory, shows that our approach outperforms blind scrubbing for a range of availability values when a second order polynomial IP is targeted. A comparison to an existing on-demand scrubbing technique based on Dual Modular Redundancy (DMR) shows that our approach saves up to 46% area for the same case study

Logic synthesis and testing techniques for switching nano-crossbar arrays

Beyond CMOS, new technologies are emerging to extend electronic systems with features unavailable to silicon-based devices. Emerging technologies provide new logic and interconnection structures for computation, storage and communication that may require new design paradigms, and therefore trigger the development of a new generation of design automation tools. In the last decade, several emerging technologies have been proposed and the time has come for studying new ad-hoc techniques and tools for logic synthesis, physical design and testing. The main goal of this project is developing a complete synthesis and optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer. New models for diode, FET, and four-terminal switch based nanoarrays are developed. The proposed methodology implements logic, arithmetic, and memory elements by considering performance parameters such as area, delay, power dissipation, and reliability. With combination of logic, arithmetic, and memory elements a synchronous state machine (SSM), representation of a computer, is realized. The proposed methodology targets variety of emerging technologies including nanowire/nanotube crossbar arrays, magnetic switch-based structures, and crossbar memories. The results of this project will be a foundation of nano-crossbar based circuit design techniques and greatly contribute to the construction of emerging computers beyond CMOS. The topic of this project can be considered under the research area of â\u80\u9cEmerging Computing Modelsâ\u80\u9d or â\u80\u9cComputational Nanoelectronicsâ\u80\u9d, more specifically the design, modeling, and simulation of new nanoscale switches beyond CMOS

Toward Biologically-Inspired Self-Healing, Resilient Architectures for Digital Instrumentation and Control Systems and Embedded Devices

Digital Instrumentation and Control (I&C) systems in safety-related applications of next generation industrial automation systems require high levels of resilience against different fault classes. One of the more essential concepts for achieving this goal is the notion of resilient and survivable digital I&C systems. In recent years, self-healing concepts based on biological physiology have received attention for the design of robust digital systems. However, many of these approaches have not been architected from the outset with safety in mind, nor have they been targeted for the automation community where a significant need exists. This dissertation presents a new self-healing digital I&C architecture called BioSymPLe, inspired from the way nature responds, defends and heals: the stem cells in the immune system of living organisms, the life cycle of the living cell, and the pathway from Deoxyribonucleic acid (DNA) to protein. The BioSymPLe architecture is integrating biological concepts, fault tolerance techniques, and operational schematics for the international standard IEC 61131-3 to facilitate adoption in the automation industry. BioSymPLe is organized into three hierarchical levels: the local function migration layer from the top side, the critical service layer in the middle, and the global function migration layer from the bottom side. The local layer is used to monitor the correct execution of functions at the cellular level and to activate healing mechanisms at the critical service level. The critical layer is allocating a group of functional B cells which represent the building block that executes the intended functionality of critical application based on the expression for DNA genetic codes stored inside each cell. The global layer uses a concept of embryonic stem cells by differentiating these type of cells to repair the faulty T cells and supervising all repair mechanisms. Finally, two industrial applications have been mapped on the proposed architecture, which are capable of tolerating a significant number of faults (transient, permanent, and hardware common cause failures CCFs) that can stem from environmental disturbances and we believe the nexus of its concepts can positively impact the next generation of critical systems in the automation industry