On-the-fly reconfigurable logic

©2005 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. Copyright 2004 Society of Photo-Optical Instrumentation Engineers. This paper was published in Smart Structures, Devices, and Systems II, edited by Said F. Al-Sarawi, Proceedings of SPIE Vol. 5649 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.Reconfigurable Circuit (RC) platforms can be configured to implement complex combinatorial and sequential logic. In this paper we investigate various RC technologies and discuss possible methods to optimise their power, speed and area. To address the drawbacks of existing RC technologies we propose a generic architecture we call "OFRL" (On-the-Fly Reconfigurable Logic). Our objective is to provide a low power, high speed platform for reconfigurable circuit and dynamically reconfigurable logic applications that use fewer transistors than existing technologies.Kamal Rajagopalan, Braden Phillips, and Derek Abbot

DESIGN AND TEST OF DIGITAL CIRCUITS AND SYSTEMS USING CMOS AND EMERGING RESISTIVE DEVICES

The memristor is an emerging nano-device. Low power operation, high density, scalability, non-volatility, and compatibility with CMOS Technology have made it a promising technology for memory, Boolean implementation, computing, and logic systems. This dissertation focuses on testing and design of such applications. In particular, we investigate on testing of memristor-based memories, design of memristive implementation of Boolean functions, and reliability and design of neuromorphic computing such as neural network. In addition, we show how to modify threshold logic gates to implement more functions. Although memristor is a promising emerging technology but is prone to defects due to uncertainties in nanoscale fabrication. Fast March tests are proposed in Chapter 2 that benefit from fast write operations. The test application time is reduced significantly while simultaneously reducing the average test energy per cell. Experimental evaluation in 45 nm technology show a speed-up of approximately 70% with a decrease in energy by approximately 40%. DfT schemes are proposed to implement the new test methods. In Chapter 3, an Integer Linear Programming based framework to identify current-mode threshold logic functions is presented. It is shown that threshold logic functions can be implemented in CMOS-based current mode logic with reduced transistor count when the input weights are not restricted to be integers. Experimental results show that many more functions can be implemented with predetermined hardware overhead, and the hardware requirement of a large percentage of existing threshold functions is reduced when comparing to the traditional CMOS-based threshold logic implementation. In Chapter 4, a new method to implement threshold logic functions using memristors is presented. This method benefits from the high range of memristor’s resistivity which is used to define different weight values, and reduces significantly the transistor count. The proposed approach implements many more functions as threshold logic gates when comparing to existing implementations. Experimental results in 45 nm technology show that the proposed memristive approach implements threshold logic gates with less area and power consumption. Finally, Chapter 5 focuses on current-based designs for neural networks. CMOS aging impacts the total synaptic current and this impacts the accuracy. Chapter 5 introduces an enhanced memristive crossbar array (MCA) based analog neural network architecture to improve reliability due to the aging effect. A built-in current-based calibration circuit is introduced to restore the total synaptic current. The calibration circuit is a current sensor that receives the ideal reference current for non-aged column and restores the reduced sensed current at each column to the ideal value. Experimental results show that the proposed approach restores the currents with less than 1% precision, and the area overhead is negligible

ATPG for Delay Defects in Current Mode Threshold Logic Circuits

An automatic test pattern generation approach todetect delay defects in a circuit consisting of current modethreshold logic gates is introduced. Each generated patternshould excite the maximum propagation delay at the fault site.Manufactured weights may vary, and maximum delay is ensuredby applying an appropriately generated set of patterns per fault.Experimental results show the efficiency of the proposed methods

Combinational equivalence checking for threshold logic circuits

ABSTRACT Threshold logic is gaining prominence as an alternative to Boolean logic. The main reason for this trend is the availability of devices that implement these circuits efficiently (current mode, differential mode circuits), as well as the promise they hold for the future nano devices (RTDs, SETs, QCAs and other nano devices). This has generated renewed interest in the design automation community to design efficient CAD tools for threshold logic. Recently a lot of work has been done to synthesize threshold logic circuits. So far there has been no efficient method to verify the synthesized circuits. In this work we address the problem of combinational equivalence checking for threshold circuits. We propose a new algorithm, to obtain compact functional representation of threshold elements. We give the proof of correctness, and analyze its runtime complexity. We use this polynomial time algorithm to develop a new methodology to verify threshold circuits. We report the result of our experiments, comparing the proposed methodology to the naive approach. We get up to 189X improvement in the run time (23X on average), and could verify circuits that the naive approach could not

Energy-Efficient Digital Circuit Design using Threshold Logic Gates

abstract: Improving energy efficiency has always been the prime objective of the custom and automated digital circuit design techniques. As a result, a multitude of methods to reduce power without sacrificing performance have been proposed. However, as the field of design automation has matured over the last few decades, there have been no new automated design techniques, that can provide considerable improvements in circuit power, leakage and area. Although emerging nano-devices are expected to replace the existing MOSFET devices, they are far from being as mature as semiconductor devices and their full potential and promises are many years away from being practical. The research described in this dissertation consists of four main parts. First is a new circuit architecture of a differential threshold logic flipflop called PNAND. The PNAND gate is an edge-triggered multi-input sequential cell whose next state function is a threshold function of its inputs. Second a new approach, called hybridization, that replaces flipflops and parts of their logic cones with PNAND cells is described. The resulting \hybrid circuit, which consists of conventional logic cells and PNANDs, is shown to have significantly less power consumption, smaller area, less standby power and less power variation. Third, a new architecture of a field programmable array, called field programmable threshold logic array (FPTLA), in which the standard lookup table (LUT) is replaced by a PNAND is described. The FPTLA is shown to have as much as 50% lower energy-delay product compared to conventional FPGA using well known FPGA modeling tool called VPR. Fourth, a novel clock skewing technique that makes use of the completion detection feature of the differential mode flipflops is described. This clock skewing method improves the area and power of the ASIC circuits by increasing slack on timing paths. An additional advantage of this method is the elimination of hold time violation on given short paths. Several circuit design methodologies such as retiming and asynchronous circuit design can use the proposed threshold logic gate effectively. Therefore, the use of threshold logic flipflops in conventional design methodologies opens new avenues of research towards more energy-efficient circuits.Dissertation/ThesisDoctoral Dissertation Computer Science 201

SYNTHESIS AND TESTING OF THRESHOLD LOGIC CIRCUITS

Threshold logic gates gaining more importance in recent years due to the significant development in the switching devices. This renewed the interest in synthesis and testing of circuits with threshold logic gates. Two important synthesis considerations of threshold logic circuits are addressed namely, threshold logic function identification and reducing the total number of threshold logic gates required to represent the given boolean circuit description. A fast method to identify the given Boolean function as a threshold logic function with weight assignment is introduced. It characterizes the threshold logic function based on the modified chows parameters which results in drastic reduction in time and complexity. Experiment results shown that the proposed method is at least 10 times faster for each input and around 20 times faster for 7 and 8 input, when comparing with the algorithmic based methods. Similarly, it is 100 times faster for 8 input, when comparing with asummable method. Existing threshold logic synthesis methods decompose the larger input functions into smaller input functions and perform synthesis for them. This results in increase in the number of threshold logic gates required to represent the given circuit description. The proposed implicit synthesis methods increase the size of the functions that can be handled by the synthesis algorithm, thus the number of threshold logic gates required to implement very large input function decreases. Experiment results shown that the reduction in the TLG count is 24% in the best case and 18% on average. An automatic test pattern generation approach for transition faults on a circuit consisting of current mode threshold logic gates is introduced. The generated pattern for each fault excites the maximum propagation delay at the gate (the fault site). This is a high quality ATPG. Since current mode threshold logic gate circuits are pipelined and the combinational depth at each pipeline stage is practically one. It is experimentally shown that the fault coverage for all benchmark circuits is approximately 97%. It is also shown that the proposed method is time efficient