47 research outputs found
Design for pre-bond testability in 3D integrated circuits
In this dissertation we propose several DFT techniques specific to 3D
stacked IC systems. The goal has explicitly been to create techniques that
integrate easily with existing IC test systems. Specifically, this means
utilizing scan- and wrapper-based techniques, two foundations
of the digital IC test industry.
First, we describe a general test architecture for 3D ICs. In this
architecture, each tier of a 3D design is wrapped in test control logic that
both manages tier test
pre-bond and integrates the tier into the large test architecture post-bond.
We describe a new kind of boundary scan to provide the necessary test control
and observation of the partial circuits, and we propose
a new design methodology for test hardcore that ensures both pre-bond functionality
and post-bond optimality. We present the application of these techniques to
the 3D-MAPS test vehicle, which has proven their effectiveness.
Second, we extend these DFT techniques to circuit-partitioned designs. We find
that boundary scan design is generally sufficient, but that some 3D designs require
special DFT treatment. Most importantly, we demonstrate that the functional
partitioning inherent in 3D design can potentially decrease the total test cost
of verifying a circuit.
Third, we present a new CAD algorithm for designing 3D test wrappers. This algorithm
co-designs the pre-bond and post-bond wrappers to simultaneously minimize test
time and routing cost. On average, our algorithm utilizes over 90% of the wires
in both the pre-bond and post-bond wrappers.
Finally, we look at the 3D vias themselves to develop a low-cost, high-volume
pre-bond test methodology appropriate for production-level test. We describe
the shorting probes methodology, wherein large test probes are used to contact
multiple small 3D vias. This technique is an all-digital test method that
integrates seamlessly into existing test flows. Our
experimental results demonstrate two key facts: neither the large capacitance
of the probe tips nor the process variation in the 3D vias and the probe tips
significantly hinders the testability of the circuits.
Taken together, this body of work defines a complete test methodology for
testing 3D ICs pre-bond, eliminating one of the key hurdles to the
commercialization of 3D technology.PhDCommittee Chair: Lee, Hsien-Hsin; Committee Member: Bakir, Muhannad; Committee Member: Lim, Sung Kyu; Committee Member: Vuduc, Richard; Committee Member: Yalamanchili, Sudhaka
Integrating simultaneous bi-direction signalling in the test fabric of 3D stacked integrated circuits.
Jennions, Ian K. - Associate SupervisorThe world has seen significant advancements in electronic devices’ capabilities,
most notably the ability to embed ultra-large-scale functionalities in lightweight,
area and power-efficient devices. There has been an enormous push towards
quality and reliability in consumer electronics that have become an indispensable
part of human life. Consequently, the tests conducted on these devices at the
final stages before these are shipped out to the customers have a very high
significance in the research community. However, researchers have always
struggled to find a balance between the test time (hence the test cost) and the
test overheads; unfortunately, these two are inversely proportional.
On the other hand, the ever-increasing demand for more powerful and compact
devices is now facing a new challenge. Historically, with the advancements in
manufacturing technology, electronic devices witnessed miniaturizing at an
exponential pace, as predicted by Moore’s law. However, further geometric or
effective 2D scaling seems complicated due to performance and power concerns
with smaller technology nodes. One promising way forward is by forming 3D
Stacked Integrated Circuits (SICs), in which the individual dies are stacked
vertically and interconnected using Through Silicon Vias (TSVs) before being
packaged as a single chip. This allows more functionality to be embedded with a
reduced footprint and addresses another critical problem being observed in 2D
designs: increasingly long interconnects and latency issues. However, as more
and more functionality is embedded into a small area, it becomes increasingly
challenging to access the internal states (to observe or control) after the device
is fabricated, which is essential for testing. This access is restricted by the limited
number of Chip Terminals (IC pins and the vertical Through Silicon Vias) that a
chip could be fitted with, the power consumption concerns, and the chip area
overheads that could be allocated for testing.
This research investigates Simultaneous Bi-Directional Signaling (SBS) for use
in Test Access Mechanism (TAM) designs in 3D SICs. SBS enables chip
terminals to simultaneously send and receive test vectors on a single Chip
Terminal (CT), effectively doubling the per-pin efficiency, which could be
translated into additional test channels for test time reduction or Chip Terminal
reduction for resource efficiency. The research shows that SBS-based test
access methods have significant potential in reducing test times and/or test
resources compared to traditional approaches, thereby opening up new avenues
towards cost-effectiveness and reliability of future electronics.PhD in Manufacturin
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
<p>As integrated circuits (ICs) continue to scale to smaller dimensions, long interconnects</p><p>have become the dominant contributor to circuit delay and a significant component of</p><p>power consumption. In order to reduce the length of these interconnects, 3D integration</p><p>and 3D stacked ICs (3D SICs) are active areas of research in both academia and industry.</p><p>3D SICs not only have the potential to reduce average interconnect length and alleviate</p><p>many of the problems caused by long global interconnects, but they can offer greater design</p><p>flexibility over 2D ICs, significant reductions in power consumption and footprint in</p><p>an era of mobile applications, increased on-chip data bandwidth through delay reduction,</p><p>and improved heterogeneous integration.</p><p>Compared to 2D ICs, the manufacture and test of 3D ICs is significantly more complex.</p><p>Through-silicon vias (TSVs), which constitute the dense vertical interconnects in a</p><p>die stack, are a source of additional and unique defects not seen before in ICs. At the same</p><p>time, testing these TSVs, especially before die stacking, is recognized as a major challenge.</p><p>The testing of a 3D stack is constrained by limited test access, test pin availability,</p><p>power, and thermal constraints. Therefore, efficient and optimized test architectures are</p><p>needed to ensure that pre-bond, partial, and complete stack testing are not prohibitively</p><p>expensive.</p><p>Methods of testing TSVs prior to bonding continue to be a difficult problem due to test</p><p>access and testability issues. Although some built-in self-test (BIST) techniques have been</p><p>proposed, these techniques have numerous drawbacks that render them impractical. In this dissertation, a low-cost test architecture is introduced to enable pre-bond TSV test through</p><p>TSV probing. This has the benefit of not needing large analog test components on the die,</p><p>which is a significant drawback of many BIST architectures. Coupled with an optimization</p><p>method described in this dissertation to create parallel test groups for TSVs, test time for</p><p>pre-bond TSV tests can be significantly reduced. The pre-bond probing methodology is</p><p>expanded upon to allow for pre-bond scan test as well, to enable both pre-bond TSV and</p><p>structural test to bring pre-bond known-good-die (KGD) test under a single test paradigm.</p><p>The addition of boundary registers on functional TSV paths required for pre-bond</p><p>probing results in an increase in delay on inter-die functional paths. This cost of test</p><p>architecture insertion can be a significant drawback, especially considering that one benefit</p><p>of 3D integration is that critical paths can be partitioned between dies to reduce their delay.</p><p>This dissertation derives a retiming flow that is used to recover the additional delay added</p><p>to TSV paths by test cell insertion.</p><p>Reducing the cost of test for 3D-SICs is crucial considering that more tests are necessary</p><p>during 3D-SIC manufacturing. To reduce test cost, the test architecture and test</p><p>scheduling for the stack must be optimized to reduce test time across all necessary test</p><p>insertions. This dissertation examines three paradigms for 3D integration - hard dies, firm</p><p>dies, and soft dies, that give varying degrees of control over 2D test architectures on each</p><p>die while optimizing the 3D test architecture. Integer linear programming models are developed</p><p>to provide an optimal 3D test architecture and test schedule for the dies in the 3D</p><p>stack considering any or all post-bond test insertions. Results show that the ILP models</p><p>outperform other optimization methods across a range of 3D benchmark circuits.</p><p>In summary, this dissertation targets testing and design-for-test (DFT) of 3D SICs.</p><p>The proposed techniques enable pre-bond TSV and structural test while maintaining a</p><p>relatively low test cost. Future work will continue to enable testing of 3D SICs to move</p><p>industry closer to realizing the true potential of 3D integration.</p>Dissertatio
2D Parity Product Code for TSV online fault correction and detection
Through-Silicon-Via (TSV) is one of the most promising technologies to realize 3D Integrated Circuits (3D-ICs). However, the reliability issues due to the low yield rates and the sensitivity to thermal hotspots and stress issues are preventing TSV-based 3D-ICs from being widely and efficiently used. To enhance the reliability of TSV connections, using error correction code to detect and correct faults automatically has been demonstrated as a viable solution.This paper presents a 2D Parity Product Code (2D-PPC) for TSV fault-tolerance with the ability to correct one fault and detect, at least, two faults. In an implementation of 64-bit data and 81-bit codeword, 2D-PPC can detect over 71 faults, on average. Its encoder and decoder decrease the overall latency by 38.33% when compared to the Single Error Correction Double Error Detection code. In addition to the high detection rates, the encoder can detect 100% of its gate failures, and the decoder can detect and correct around 40% of its individual gate failures. The squared 2D-PPC could be extended using orthogonal Latin square to support extra bit correction
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Test and security in a System-on-Chip environment
This dissertation outlines new approaches for test and security in a System-on-Chip (SoC) environment. A methodology is proposed for designing a single test access mechanism (TAM) architecture on each die with a "bandwidth adapter" that allows it to be efficiently used for multiple different test data bandwidths in three-dimensional integrated circuits (3D-IC) using through-silicon vias (TSVs). In this way, a single test architecture can be re-used for pre-bond, partial stack, and post-bond testing while minimizing test time across all phases of test. Unlike previous approaches, this methodology does not need multiple TAM architectures or reconfigurable wrappers in order to be efficient when the test data bandwidth changes. In industry, sequential linear decompression is widely used to reduce data and bandwidth requirements. A new scheme using a multiple polynomial linear feedback shift register (LFSR) with rotating polynomial is proposed here to increase encoding flexibility resulting in higher compression ratios. An algorithm is described to assign test cubes to polynomials in a way that enhances encoding efficiency. For hardware security, a new attack strategy against logic obfuscation is described here. It is based on applying brute force iteratively to each logic cone one at a time and is shown to significantly reduce the number of brute force key combinations that need to be tried by an attacker. It is shown that inserting key gates based on MUXes is an effective approach to increase security against this type of attack. In data security for hardware, existing techniques for computing with encrypted operands are either prohibitively expense (e.g., fully homomorphic encryption) or only work for special cases (e.g., linear circuits). A lightweight scheme implemented at the gate-level is proposed for computing with noise-obfuscated data. By carefully selecting internal locations for noise cancellation in arbitrary logic circuits, the overhead can be greatly minimized. One important application of the proposed scheme is for protecting data inside a computing unit obtained from a third party IP provider where a hidden backdoor access mechanism or hardware Trojan could be maliciously inserted.Electrical and Computer Engineerin
Reduced pin-count testing, 3D SICs, time division multiplexing, test access mechanism, simultaneous bidirectional signaling
3D Stacked Integrated Circuits (SICs) offer a promising way to cope with the technology scaling; however, the test access requirements are highly complicated due to increased transistor density and a limited number of test channels. Moreover, although the vertical interconnects in 3D SIC are capable of high-speed data transfer, the overall test speed is restricted by scan-chains that are not optimized for timing. Reduced Pin-Count Testing (RPCT) has been effectively used under these scenarios. In particular, Time Division Multiplexing (TDM) allows full utilization of interconnect bandwidth while providing low scan frequencies supported by the scan chains. However, these methods rely on Uni-Directional Signaling (UDS), in which a chip terminal (pin or a TSV) can either be used to transmit or receive data at a given time. This requires that at least two chip terminals are available at every die interface (Tester-Die or Die-Die) to form a single test channel. In this paper, we propose Simultaneous Bi-Directional Signaling (SBS), which allows a chip terminal to be used simultaneously to send and receive data, thus forming a test channel using one pin instead of two. We demonstrate how SBS can be used in conjunction with TDM to achieve reduced pin count testing while using only half the number of pins compared to conventional TDM based methods, consuming only 22.6% additional power. Alternatively, the advantage could be manifested as a test time reduction by utilizing all available test channels, allowing more parallelism and test time reduction down to half compared to UDS-based TDM. Experiments using 45nm technology suggest that the proposed method can operate at up to 1.2 GHz test clock for a stack of 3-dies, whereas for higher frequencies, a binary-weighted transmitter is proposed capable of up to 2.46 GHz test clock
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Heterogeneous Integration on Silicon-Interconnect Fabric using fine-pitch interconnects (≤10 �m)
Today, the ever-growing data-bandwidth demand is pushing the boundaries of the traditional printed circuit board (PCB) based integration schemes. Moreover, with the apparent saturation of semiconductor scaling, commonly called Moore's law, system scaling warrants a paradigm shift in packaging technologies, assembly techniques, and integration methodologies. In this work, a superior alternative to PCBs called the Silicon-Interconnect Fabric (Si-IF) is investigated. The Si-IF is a silicon-based, package-less, fine-pitch, highly scalable, heterogeneous integration platform for wafer-scale systems. In this technology, unpackaged dielets are assembled on the Si-IF at small inter-dielet spacings (≤100 �m) using fine-pitch (≤10 �m) die-to-substrate interconnects. A novel assembly process using a solder-less direct metal-metal (gold-gold and copper-copper) thermal compression bonding was developed. Using this process, sub-10 �m pitch interconnects with a low specific contact resistance of ≤0.7 Ω-�m2 were successfully demonstrated. Because of the tightly packed Si-IF assembly, the communication links between the neighboring dies are short (≤500 �m) with low loss (≤2 dB), comparable to on-chip connections. Consequently, simple buffers can transfer data between dies using a Simple Universal Parallel intERface for chips (SuperCHIPS) at low latency (<30 ps), low energy per bit (≤0.03 pJ/b), and high data-rates (up to 10 Gbps/link), corresponding to an aggregate bandwidth up to 8 Tbps/mm. The benefits of the SuperCHIPS protocol were experimentally demonstrated to provide 5-90X higher data-bandwidth, 8-30X lower latency, and 5-40X lower energy per bit compared to existing integration schemes. This dissertation addresses the assembly technology and communication protocols of the Si-IF technology
Cross-Layer Rapid Prototyping and Synthesis of Application-Specific and Reconfigurable Many-accelerator Platforms
Technological advances of recent years laid the foundation consolidation of informatisationof society, impacting on economic, political, cultural and socialdimensions. At the peak of this realization, today, more and more everydaydevices are connected to the web, giving the term ”Internet of Things”. The futureholds the full connection and interaction of IT and communications systemsto the natural world, delimiting the transition to natural cyber systems and offeringmeta-services in the physical world, such as personalized medical care, autonomoustransportation, smart energy cities etc. . Outlining the necessities of this dynamicallyevolving market, computer engineers are required to implement computingplatforms that incorporate both increased systemic complexity and also cover awide range of meta-characteristics, such as the cost and design time, reliabilityand reuse, which are prescribed by a conflicting set of functional, technical andconstruction constraints. This thesis aims to address these design challenges bydeveloping methodologies and hardware/software co-design tools that enable therapid implementation and efficient synthesis of architectural solutions, which specifyoperating meta-features required by the modern market. Specifically, this thesispresents a) methodologies to accelerate the design flow for both reconfigurableand application-specific architectures, b) coarse-grain heterogeneous architecturaltemplates for processing and communication acceleration and c) efficient multiobjectivesynthesis techniques both at high abstraction level of programming andphysical silicon level.Regarding to the acceleration of the design flow, the proposed methodologyemploys virtual platforms in order to hide architectural details and drastically reducesimulation time. An extension of this framework introduces the systemicco-simulation using reconfigurable acceleration platforms as co-emulation intermediateplatforms. Thus, the development cycle of a hardware/software productis accelerated by moving from a vertical serial flow to a circular interactive loop.Moreover the simulation capabilities are enriched with efficient detection and correctiontechniques of design errors, as well as control methods of performancemetrics of the system according to the desired specifications, during all phasesof the system development. In orthogonal correlation with the aforementionedmethodological framework, a new architectural template is proposed, aiming atbridging the gap between design complexity and technological productivity usingspecialized hardware accelerators in heterogeneous systems-on-chip and networkon-chip platforms. It is presented a novel co-design methodology for the hardwareaccelerators and their respective programming software, including the tasks allocationto the available resources of the system/network. The introduced frameworkprovides implementation techniques for the accelerators, using either conventionalprogramming flows with hardware description language or abstract programmingmodel flows, using techniques from high-level synthesis. In any case, it is providedthe option of systemic measures optimization, such as the processing speed,the throughput, the reliability, the power consumption and the design silicon area.Finally, on addressing the increased complexity in design tools of reconfigurablesystems, there are proposed novel multi-objective optimization evolutionary algo-rithms which exploit the modern multicore processors and the coarse-grain natureof multithreaded programming environments (e.g. OpenMP) in order to reduce theplacement time, while by simultaneously grouping the applications based on theirintrinsic characteristics, the effectively explore the design space effectively.The efficiency of the proposed architectural templates, design tools and methodologyflows is evaluated in relation to the existing edge solutions with applicationsfrom typical computing domains, such as digital signal processing, multimedia andarithmetic complexity, as well as from systemic heterogeneous environments, suchas a computer vision system for autonomous robotic space navigation and manyacceleratorsystems for HPC and workstations/datacenters. The results strengthenthe belief of the author, that this thesis provides competitive expertise to addresscomplex modern - and projected future - design challenges.Οι τεχνολογικές εξελίξεις των τελευταίων ετών έθεσαν τα θεμέλια εδραίωσης της πληροφοριοποίησης της κοινωνίας, επιδρώντας σε οικονομικές,πολιτικές, πολιτιστικές και κοινωνικές διαστάσεις. Στο απόγειο αυτής τη ςπραγμάτωσης, σήμερα, ολοένα και περισσότερες καθημερινές συσκευές συνδέονται στο παγκόσμιο ιστό, αποδίδοντας τον όρο «Ίντερνετ των πραγμάτων».Το μέλλον επιφυλάσσει την πλήρη σύνδεση και αλληλεπίδραση των συστημάτων πληροφορικής και επικοινωνιών με τον φυσικό κόσμο, οριοθετώντας τη μετάβαση στα συστήματα φυσικού κυβερνοχώρου και προσφέροντας μεταυπηρεσίες στον φυσικό κόσμο όπως προσωποποιημένη ιατρική περίθαλψη, αυτόνομες μετακινήσεις, έξυπνες ενεργειακά πόλεις κ.α. . Σκιαγραφώντας τις ανάγκες αυτής της δυναμικά εξελισσόμενης αγοράς, οι μηχανικοί υπολογιστών καλούνται να υλοποιήσουν υπολογιστικές πλατφόρμες που αφενός ενσωματώνουν αυξημένη συστημική πολυπλοκότητα και αφετέρου καλύπτουν ένα ευρύ φάσμα μεταχαρακτηριστικών, όπως λ.χ. το κόστος σχεδιασμού, ο χρόνος σχεδιασμού, η αξιοπιστία και η επαναχρησιμοποίηση, τα οποία προδιαγράφονται από ένα αντικρουόμενο σύνολο λειτουργικών, τεχνολογικών και κατασκευαστικών περιορισμών. Η παρούσα διατριβή στοχεύει στην αντιμετώπιση των παραπάνω σχεδιαστικών προκλήσεων, μέσω της ανάπτυξης μεθοδολογιών και εργαλείων συνσχεδίασης υλικού/λογισμικού που επιτρέπουν την ταχεία υλοποίηση καθώς και την αποδοτική σύνθεση αρχιτεκτονικών λύσεων, οι οποίες προδιαγράφουν τα μετα-χαρακτηριστικά λειτουργίας που απαιτεί η σύγχρονη αγορά. Συγκεκριμένα, στα πλαίσια αυτής της διατριβής, παρουσιάζονται α) μεθοδολογίες επιτάχυνσης της ροής σχεδιασμού τόσο για επαναδιαμορφούμενες όσο και για εξειδικευμένες αρχιτεκτονικές, β) ετερογενή αδρομερή αρχιτεκτονικά πρότυπα επιτάχυνσης επεξεργασίας και επικοινωνίας και γ) αποδοτικές τεχνικές πολυκριτηριακής σύνθεσης τόσο σε υψηλό αφαιρετικό επίπεδο προγραμματισμού,όσο και σε φυσικό επίπεδο πυριτίου.Αναφορικά προς την επιτάχυνση της ροής σχεδιασμού, προτείνεται μια μεθοδολογία που χρησιμοποιεί εικονικές πλατφόρμες, οι οποίες αφαιρώντας τις αρχιτεκτονικές λεπτομέρειες καταφέρνουν να μειώσουν σημαντικά το χρόνο εξομοίωσης. Παράλληλα, εισηγείται η συστημική συν-εξομοίωση με τη χρήση επαναδιαμορφούμενων πλατφορμών, ως μέσων επιτάχυνσης. Με αυτόν τον τρόπο, ο κύκλος ανάπτυξης ενός προϊόντος υλικού, μετατεθειμένος από την κάθετη σειριακή ροή σε έναν κυκλικό αλληλεπιδραστικό βρόγχο, καθίσταται ταχύτερος, ενώ οι δυνατότητες προσομοίωσης εμπλουτίζονται με αποδοτικότερες μεθόδους εντοπισμού και διόρθωσης σχεδιαστικών σφαλμάτων, καθώς και μεθόδους ελέγχου των μετρικών απόδοσης του συστήματος σε σχέση με τις επιθυμητές προδιαγραφές, σε όλες τις φάσεις ανάπτυξης του συστήματος. Σε ορθογώνια συνάφεια με το προαναφερθέν μεθοδολογικό πλαίσιο, προτείνονται νέα αρχιτεκτονικά πρότυπα που στοχεύουν στη γεφύρωση του χάσματος μεταξύ της σχεδιαστικής πολυπλοκότητας και της τεχνολογικής παραγωγικότητας, με τη χρήση συστημάτων εξειδικευμένων επιταχυντών υλικού σε ετερογενή συστήματα-σε-ψηφίδα καθώς και δίκτυα-σε-ψηφίδα. Παρουσιάζεται κατάλληλη μεθοδολογία συν-σχεδίασης των επιταχυντών υλικού και του λογισμικού προκειμένου να αποφασισθεί η κατανομή των εργασιών στους διαθέσιμους πόρους του συστήματος/δικτύου. Το μεθοδολογικό πλαίσιο προβλέπει την υλοποίηση των επιταχυντών είτε με συμβατικές μεθόδους προγραμματισμού σε γλώσσα περιγραφής υλικού είτε με αφαιρετικό προγραμματιστικό μοντέλο με τη χρήση τεχνικών υψηλού επιπέδου σύνθεσης. Σε κάθε περίπτωση, δίδεται η δυνατότητα στο σχεδιαστή για βελτιστοποίηση συστημικών μετρικών, όπως η ταχύτητα επεξεργασίας, η ρυθμαπόδοση, η αξιοπιστία, η κατανάλωση ενέργειας και η επιφάνεια πυριτίου του σχεδιασμού. Τέλος, προκειμένου να αντιμετωπισθεί η αυξημένη πολυπλοκότητα στα σχεδιαστικά εργαλεία επαναδιαμορφούμενων συστημάτων, προτείνονται νέοι εξελικτικοί αλγόριθμοι πολυκριτηριακής βελτιστοποίησης, οι οποίοι εκμεταλλευόμενοι τους σύγχρονους πολυπύρηνους επεξεργαστές και την αδρομερή φύση των πολυνηματικών περιβαλλόντων προγραμματισμού (π.χ. OpenMP), μειώνουν το χρόνο επίλυσης του προβλήματος της τοποθέτησης των λογικών πόρων σε φυσικούς,ενώ ταυτόχρονα, ομαδοποιώντας τις εφαρμογές βάση των εγγενών χαρακτηριστικών τους, διερευνούν αποτελεσματικότερα το χώρο σχεδίασης.Η αποδοτικότητά των προτεινόμενων αρχιτεκτονικών προτύπων και μεθοδολογιών επαληθεύτηκε σε σχέση με τις υφιστάμενες λύσεις αιχμής τόσο σε αυτοτελής εφαρμογές, όπως η ψηφιακή επεξεργασία σήματος, τα πολυμέσα και τα προβλήματα αριθμητικής πολυπλοκότητας, καθώς και σε συστημικά ετερογενή περιβάλλοντα, όπως ένα σύστημα όρασης υπολογιστών για αυτόνομα διαστημικά ρομποτικά οχήματα και ένα σύστημα πολλαπλών επιταχυντών υλικού για σταθμούς εργασίας και κέντρα δεδομένων, στοχεύοντας εφαρμογές υψηλής υπολογιστικής απόδοσης (HPC). Τα αποτελέσματα ενισχύουν την πεποίθηση του γράφοντα, ότι η παρούσα διατριβή παρέχει ανταγωνιστική τεχνογνωσία για την αντιμετώπιση των πολύπλοκων σύγχρονων και προβλεπόμενα μελλοντικών σχεδιαστικών προκλήσεων