What is the Path to Fast Fault Simulation?

Motivated by the recent advances in fast fault simulation techniques for large combinational circuits, a panel discussion has been organized for the 1988 International Test Conference. This paper is a collective account of the position statements offered by the panelists

Concurrent optimization strategies for high-performance VLSI circuits

In the next generation of VLSI circuits, concurrent optimizations will be essential to achieve the performance challenges. In this dissertation, we present techniques for combining traditional timing optimization techniques to achieve a superior performance;The method of buffer insertion is used in timing optimization to either increase the driving power of a path in a circuit, or to isolate large capacitive loads that lie on noncritical or less critical paths. The procedure of transistor sizing selects the sizes of transistors within a circuit to achieve a given timing specification. Traditional design techniques perform these two optimizations as independent steps during synthesis, even though they are intimately linked and performing them in alternating steps is liable to lead to suboptimal solutions. The first part of this thesis presents a new approach for unifying transistor sizing with buffer insertion. Our algorithm achieve from 5% to 49% area reduction compared with the results of a standard transistor sizing algorithm;The next part of the thesis deals with the problem of collapsing gates for technology mapping. Two new techniques are proposed. The first method, the odd-level transistor replacement (OTR) method, performs technology mapping without the restriction of a fixed library size, and maps a circuit to a virtual library of complex static CMOS gates. The second technique, the Static CMOS/PTL method, uses a mix of static CMOS and pass transistor logic (PTL) to realize the circuit, using the relation between PTL and binary decision diagrams. The methods are very efficient and can handle all ISCAS\u2785 benchmark circuits in minutes. On average, it was found that the OTR method gave 40%, and the Static/PTL gave 50% delay reductions over SIS, with substantial area savings;Finally, we extend the technology mapping work to interleave it with placement in a single optimization. Conventional methods that perform these steps separately will not be adequate for next-generation circuits. Our approach presents an integrated solution to this problem, and shows an average of 28.19%, and a maximum of 78.42% improvement in the delay over a method that performs the two optimizations in separate steps

Quantifying Near-Threshold CMOS Circuit Robustness

In order to build energy efficient digital CMOS circuits, the supply voltage must be reduced to near-threshold. Problematically, due to random parameter variation, supply scaling reduces circuit robustness to noise. Moreover, the effects of parameter variation worsen as device dimensions diminish, further reducing robustness, and making parameter variation one of the most significant hurdles to continued CMOS scaling. This paper presents a new metric to quantify circuit robustness with respect to variation and noise along with an efficient method of calculation. The method relies on the statistical analysis of standard cells and memories resulting an an extremely compact representation of robustness data. With this metric and method of calculation, circuit robustness can be included alongside energy, delay, and area during circuit design and optimization

Feasibility study for a generalized gate logic software simulator

Unit-delay simulation, event driven simulation, zero-delay simulation, simulation techniques, 2-valued versus multivalued logic, network initialization, gate operations and alternate network representations, parallel versus serial mode simulation fault modelling, extension of multiprocessor systems, and simulation timing are discussed. Functional level networks, gate equivalent circuits, the prototype BDX-930 network model, fault models, identifying detected faults for BGLOSS are discussed. Preprocessor tasks, postprocessor tasks, executive tasks, and a library of bliss coded macros for GGLOSS are also discussed

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

Computing the entire area/power consumption versus delay tradeoff curve for gate sizing with a piecewise linear simulator

The gate sizing problem is the problem of finding load drive capabilities for all gates in a given Boolean network such, that a given delay limit is kept, and the necessary cost in terms of active area usage and/or power consumption is minimal. This paper describes a way to obtain the entire cost versus delay tradeoff curve of a combinational logic circuit in an efficient way. Every point on the resulting curve is the global optimum of the corresponding gate sizing problem. The problem is solved by mapping it onto piecewise linear models in such a way, that a piecewise linear (circuit) simulator can do the job. It is shown that this setup is very efficient, and can produce tradeoff curves for large circuits (thousands of gates) in a few minutes. Benchmark results for the entire set of MCNC '91 two-level examples are give

Optimization techniques for high-performance digital circuits

The relentless push for high performance in custom dig-ital circuits has led to renewed emphasis on circuit opti-mization or tuning. The parameters of the optimization are typically transistor and interconnect sizes. The de-sign metrics are not just delay, transition times, power and area, but also signal integrity and manufacturability. This tutorial paper discusses some of the recently pro-posed methods of circuit optimization, with an emphasis on practical application and methodology impact. Circuit optimization techniques fall into three broad categories. The rst is dynamic tuning, based on time-domain simulation of the underlying circuit, typically combined with adjoint sensitivity computation. These methods are accurate but require the specication of in-put signals, and are best applied to small data- ow cir-cuits and \cross-sections " of larger circuits. Ecient sensitivity computation renders feasible the tuning of cir-cuits with a few thousand transistors. Second, static tuners employ static timing analysis to evaluate the per-formance of the circuit. All paths through the logic are simultaneously tuned, and no input vectors are required. Large control macros are best tuned by these methods. However, in the context of deep submicron custom de-sign, the inaccuracy of the delay models employed by these methods often limits their utility. Aggressive dy-namic or static tuning can push a circuit into a precip-itous corner of the manufacturing process space, which is a problem addressed by the third class of circuit op-timization tools, statistical tuners. Statistical techniques are used to enhance manufacturability or maximize yield. In addition to surveying the above techniques, topics such as the use of state-of-the-art nonlinear optimization methods and special considerations for interconnect siz-ing, clock tree optimization and noise-aware tuning will be brie y considered.

Energy-Efficient Digital Circuit Design using Threshold Logic Gates

abstract: Improving energy efficiency has always been the prime objective of the custom and automated digital circuit design techniques. As a result, a multitude of methods to reduce power without sacrificing performance have been proposed. However, as the field of design automation has matured over the last few decades, there have been no new automated design techniques, that can provide considerable improvements in circuit power, leakage and area. Although emerging nano-devices are expected to replace the existing MOSFET devices, they are far from being as mature as semiconductor devices and their full potential and promises are many years away from being practical. The research described in this dissertation consists of four main parts. First is a new circuit architecture of a differential threshold logic flipflop called PNAND. The PNAND gate is an edge-triggered multi-input sequential cell whose next state function is a threshold function of its inputs. Second a new approach, called hybridization, that replaces flipflops and parts of their logic cones with PNAND cells is described. The resulting \hybrid circuit, which consists of conventional logic cells and PNANDs, is shown to have significantly less power consumption, smaller area, less standby power and less power variation. Third, a new architecture of a field programmable array, called field programmable threshold logic array (FPTLA), in which the standard lookup table (LUT) is replaced by a PNAND is described. The FPTLA is shown to have as much as 50% lower energy-delay product compared to conventional FPGA using well known FPGA modeling tool called VPR. Fourth, a novel clock skewing technique that makes use of the completion detection feature of the differential mode flipflops is described. This clock skewing method improves the area and power of the ASIC circuits by increasing slack on timing paths. An additional advantage of this method is the elimination of hold time violation on given short paths. Several circuit design methodologies such as retiming and asynchronous circuit design can use the proposed threshold logic gate effectively. Therefore, the use of threshold logic flipflops in conventional design methodologies opens new avenues of research towards more energy-efficient circuits.Dissertation/ThesisDoctoral Dissertation Computer Science 201

IDPAL – A Partially-Adiabatic Energy-Efficient Logic Family: Theory and Applications to Secure Computing

Low-power circuits and issues associated with them have gained a significant amount of attention in recent years due to the boom in portable electronic devices. Historically, low-power operation relied heavily on technology scaling and reduced operating voltage, however this trend has been slowing down recently due to the increased power density on chips. This dissertation introduces a new very-low power partially-adiabatic logic family called Input-Decoupled Partially-Adiabatic Logic (IDPAL) with applications in low-power circuits. Experimental results show that IDPAL reduces energy usage by 79% compared to equivalent CMOS implementations and by 25% when compared to the best adiabatic implementation. Experiments ranging from a simple buffer/inverter up to a 32-bit multiplier are explored and result in consistent energy savings, showing that IDPAL could be a viable candidate for a low-power circuit implementation. This work also shows an application of IDPAL to secure low-power circuits against power analysis attacks. It is often assumed that encryption algorithms are perfectly secure against attacks, however, most times attacks using side channels on the hardware implementation of an encryption operation are not investigated. Power analysis attacks are a subset of side channel attacks and can be implemented by measuring the power used by a circuit during an encryption operation in order to obtain secret information from the circuit under attack. Most of the previously proposed solutions for power analysis attacks use a large amount of power and are unsuitable for a low-power application. The almost-equal energy consumption for any given input in an IDPAL circuit suggests that this logic family is a good candidate for securing low-power circuits again power analysis attacks. Experimental results ranging from small circuits to large multipliers are performed and the power-analysis attack resistance of IDPAL is investigated. Results show that IDPAL circuits are not only low-power but also the most secure against power analysis attacks when compared to other adiabatic low-power circuits. Finally, a hybrid adiabatic-CMOS microprocessor design is presented. The proposed microprocessor uses IDPAL for the implementation of circuits with high switching activity (e.g. ALU) and CMOS logic for other circuits (e.g. memory, controller). An adiabatic-CMOS interface for transforming adiabatic signals to square-wave signals is presented and issues associated with a hybrid implementation and their solutions are also discussed