Reliable and Fault-Resilient Schemes for Efficient Radix-4 Complex Division

Complex division is commonly used in various applications in signal processing and control theory including astronomy and nonlinear RF measurements. Nevertheless, unless reliability and assurance are embedded into the architectures of such structures, the suboptimal (and thus erroneous) results could undermine the objectives of such applications. As such, in this thesis, we present schemes to provide complex number division architectures based on (Sweeney, Robertson, and Tocher) SRT-division with fault diagnosis mechanisms. Different fault resilient architectures are proposed in this thesis which can be tailored based on the eventual objectives of the designs in terms of area and time requirements, among which we pinpoint carefully the schemes based on recomputing with shifted operands (RESO) to be able to detect both natural and malicious faults and with proper modification achieve high throughputs. The design also implements a minimized look up table approach which favors in error detection based designs and provides high fault coverage with relatively-low overhead. Additionally, to benchmark the effectiveness of the proposed schemes, extensive fault diagnosis assessments are performed for the proposed designs through fault simulations and FPGA implementations; the design is implemented on Xilinx Spartan-VI and Xilinx Virtex-VI FPGA families

A built-in self-test technique for high speed analog-to-digital converters

Fundação para a Ciência e a Tecnologia (FCT) - PhD grant (SFRH/BD/62568/2009

Phase Locked Loop Test Methodology

Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

Methodology and Ecosystem for the Design of a Complex Network ASIC

Performance of HPC systems has risen steadily. While the 10 Petaflop/s barrier has been breached in the year 2011 the next large step into the exascale era is expected sometime between the years 2018 and 2020. The EXTOLL project will be an integral part in this venture. Originally designed as a research project on FPGA basis it will make the transition to an ASIC to improve its already excelling performance even further. This transition poses many challenges that will be presented in this thesis. Nowadays, it is not enough to look only at single components in a system. EXTOLL is part of complex ecosystem which must be optimized overall since everything is tightly interwoven and disregarding some aspects can cause the whole system either to work with limited performance or even to fail. This thesis examines four different aspects in the design hierarchy and proposes efficient solutions or improvements for each of them. At first it takes a look at the design implementation and the differences between FPGA and ASIC design. It introduces a methodology to equip all on-chip memory with ECC logic automatically without the user’s input and in a transparent way so that the underlying code that uses the memory does not have to be changed. In the next step the floorplanning process is analyzed and an iterative solution is worked out based on physical and logical constraints of the EXTOLL design. Besides, a work flow for collaborative design is presented that allows multiple users to work on the design concurrently. The third part concentrates on the high-speed signal path from the chip to the connector and how it is affected by technological limitations. All constraints are analyzed and a package layout for the EXTOLL chip is proposed that is seen as the optimal solution. The last part develops a cost model for wafer and package level test and raises technological concerns that will affect the testing methodology. In order to run testing internally it proposes the development of a stand-alone test platform that is able to test packaged EXTOLL chips in every aspect

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results

Design of frequency synthesizers for short range wireless transceivers

The rapid growth of the market for short-range wireless devices, with standards such as Bluetooth and Wireless LAN (IEEE 802.11) being the most important, has created a need for highly integrated transceivers that target drastic power and area reduction while providing a high level of integration. The radio section of the devices designed to establish communications using these standards is the limiting factor for the power reduction efforts. A key building block in a transceiver is the frequency synthesizer, since it operates at the highest frequency of the system and consumes a very large portion of the total power in the radio. This dissertation presents the basic theory and a design methodology of frequency synthesizers targeted for short-range wireless applications. Three different examples of synthesizers are presented. First a frequency synthesizer integrated in a Bluetooth receiver fabricated in 0.35μm CMOS technology. The receiver uses a low-IF architecture to downconvert the incoming Bluetooth signal to 2MHz. The second synthesizer is integrated within a dual-mode receiver capable of processing signals of the Bluetooth and Wireless LAN (IEEE 802.11b) standards. It is implemented in BiCMOS technology and operates the voltage controlled oscillator at twice the required frequency to generate quadrature signals through a divide-by-two circuit. A phase switching prescaler is featured in the synthesizer. A large capacitance is integrated on-chip using a capacitance multiplier circuit that provides a drastic area reduction while adding a negligible phase noise contribution. The third synthesizer is an extension of the second example. The operation range of the VCO is extended to cover a frequency band from 4.8GHz to 5.85GHz. By doing this, the synthesizer is capable of generating LO signals for Bluetooth and IEEE 802.11a, b and g standards. The quadrature output of the 5 - 6 GHz signal is generated through a first order RC - CR network with an automatic calibration loop. The loop uses a high frequency phase detector to measure the deviation from the 90° separation between the I and Q branches and implements an algorithm to minimize the phase errors between the I and Q branches and their differential counterparts

Enhancing Digital Controllability in Wideband RF Transceiver Front-Ends for FTTx Applications

Enhancing the digital controllability of wideband RF transceiver front-ends helps in widening the range of operating conditions and applications in which such systems can be employed. Technology limitations and design challenges often constrain the extensive adoption of digital controllability in RF front-ends. This work focuses on three major aspects associated with the design and implementation of a digitally controllable RF transceiver front-end for enhanced digital control. Firstly, the influence of the choice of semiconductor technology for a system-on-chip integration of digital gain control circuits are investigated. The digital control of gain is achieved by utilizing step attenuators that consist of cascaded switched attenuation stages. A design methodology is presented to evaluate the influence of the chosen technology on the performance of the three conventionally used switched attenuator topologies for desired attenuation levels, and the constraints that the technology suitable for high amplification places on the attenuator performance are examined. Secondly, a novel approach to the integrated implementation of gain slope equalization is presented, and the suitability of the proposed approach for integration within the RF front-end is verified. Thirdly, a sensitivity-aware implementation of a peak power detector is presented. The increased employment of digital gain control also increases the requirements on the sensitivity of the power detector employed for adaptive power and gain control. The design, implementation, and measurement results of a state-of-the-art wideband power detector with high sensitivity and large dynamic range are presented. The design is optimized to provide a large offset cancellation range, and the influence of offset cancellation circuits on the sensitivity of the power detector is studied. Moreover, design considerations for high sensitivity performance of the power detector are investigated, and the noise contributions from individual sub-circuits are evaluated. Finally, a wideband RF transceiver front-end is realized using a commercially available SiGe BiCMOS technology to demonstrate the enhancements in the digital controllability of the system. The RF front-end has a bandwidth of 500 MHz to 2.5 GHz, an input dynamic range of 20 dB, a digital gain control range larger than 30 dB, a digital gain slope equalization range from 1.49 dB/GHz to 3.78 dB/GHz, and employs a power detector with a sensitivity of -56 dBm and dynamic range of 64 dB. The digital control in the RF front-end is implemented using an on-chip serial-parallel-interface (SPI) that is controlled by an external micro-controller. A prototype implementation of the RF front-end system is presented as part of an RFIC intended for use in optical transceiver modules for fiber-to-the-x applications

Defect-based testing of LTS digital circuits

A Defect-Based Test (DBT) methodology for Superconductor Electronics (SCE) is presented in this thesis, so that commercial production and efficient testing of systems can be implemented in this technology in the future. In the first chapter, the features and prospects for SCE have been presented. The motivation for this research and the outline of the thesis were also described in Chapter 1. It has been shown that high-end applications such as Software-Defined Radio (SDR) and petaflop computers which are extremely difficult to implement in top-of-the-art semiconductor technologies can be realised using SCE. But, a systematic structural test methodology had yet to be developed for SCE and has been addressed in this thesis. A detailed introduction to Rapid Single-Flux Quantum (RSFQ) circuits was presented in Chapter 2. A Josephson Junction (JJ) was described with associated theory behind its operation. The JJ model used in the simulator used in this research work was also presented. RSFQ logic with logic protocols as well as the design and implementation of an example D-type flip-flop (DFF) was also introduced. Finally, advantages and disadvantages of RSFQ circuits have been discussed with focus on the latest developments in the field. Various techniques for testing RSFQ circuits were discussed in Chapter 3. A Process Defect Monitor (PDM) approach was presented for fabrication process analysis. The presented defect-monitor structures were used to gather measurement data, to find the probability of the occurrence of defects in the process which forms the first step for Inductive Fault Analysis (IFA). Results from measurements on these structures were used to create a database for defects. This information can be used as input for performing IFA. "Defect-sprinkling" over a fault-free circuit can be carried out according to the measured defect densities over various layers. After layout extraction and extensive fault simulation, the resulting information will indicate realistic faults. In addition, possible Design-for-Testability (DfT) schemes for monitoring Single-Flux Quantum (SFQ) pulses within an RSFQ circuit has also been discussed in Chapter 3. The requirement for a DfT scheme is inevitable for RSFQ circuits because of their very high frequency of operation and very low operating temperature. It was demonstrated how SFQ pulses can be monitored at an internal node of an SCE circuit, introducing observability using Test-Point Insertion (TPI). Various techniques were discussed for the introduction of DfT and to avoid the delay introduced by the DfT structure if it is required. The available features in the proposed design for customising the detector make it attractive for a detailed DBT of RSFQ circuits. The control of internal nodes has also been illustrated using TPI. The test structures that were designed and implemented to determine the occurrence of defects in the processes can also be used to locate the position for the insertion of the above mentioned DfT structures

Co-Emulation of Scan-Chain Based Designs Utilizing SCE-MI Infrastructure

Simulation times of complex System-on-Chips (SoC) have grown exponentially as designs reach the multi-million ASIC gate range. Verification teams have adopted emulation as a prominent methodology, incorporating high-level testbenches and FPGA/ASIC hardware for system-level testing (SLT). In addition to SLT, emulation enables software teams to incorporate software applications with cycle-accurate hardware early on in the design cycle. The Standard for Co-Emulation Modeling Interface (SCE-MI) developed by the Accelera Initiative, is a widely used communication protocol for emulation which has been accepted by major electronic design automation (EDA) companies. Scan-chain is a design-for-test (DFT) methodology used for testing digital circuits. To allow more controllability and observability of the system, design registers are transformed into scan registers, allowing verification teams to shift in test vectors and observe the behavior of combinatorial logic. As SoC complexity increases, thousands of registers can be used in a design, which makes it difficult to implement full-scan testing. More so, as the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan designs can no longer be verified in RTL simulation unless portioned into smaller sub-blocks. To complete a full scan cycle in RTL simulation for large system-level designs, it may take hours, days, or even weeks depending on the complexity of the circuit. This thesis proposes a methodology to decrease scan-chain verification time utilizing SCE-MI protocol and an FPGA-based emulation platform. A high-level (SystemC) testbench and FPGA synthesizable hardware transactor models are developed for the ISCAS89 S400 benchmark circuit for high-speed communication between the CPU workstation and FPGA emulator. The emulation results are compared to other verification methodologies, and found to be 82% faster than regular RTL simulation. In addition, the emulation runs in the MHz speed range, allowing the incorporation of software applications, drivers, and operating systems, as opposed to the Hz range in RTL simulation