On the suitability and development of layout templates for analog layout reuse and layout-aware synthesis

Accelerating the synthesis of increasingly complex analog integrated circuits is key to bridge the widening gap between what we can integrate and what we can design while meeting ever-tightening time-to-market constraints. It is a well-known fact in the semiconductor industry that such goal can only be attained by means of adequate CAD methodologies, techniques, and accompanying tools. This is particularly important in analog physical synthesis (a.k.a. layout generation), where large sensitivities of the circuit performances to the many subtle details of layout implementation (device matching, loading and coupling effects, reliability, and area features are of utmost importance to analog designers), render complete automation a truly challenging task. To approach the problem, two directions have been traditionally considered, knowledge-based and optimization-based, both with their own pros and cons. Besides, recently reported solutions oriented to speed up the overall design flow by means of reuse-based practices or by cutting off time-consuming, error-prone spins between electrical and layout synthesis (a technique known as layout-aware synthesis), rely on a outstandingly rapid yet efficient layout generation method. This paper analyses the suitability of procedural layout generation based on templates (a knowledge-based approach) by examining the requirements that both layout reuse and layout-aware solutions impose, and how layout templates face them. The ability to capture the know-how of experienced layout designers and the turnaround times for layout instancing are considered main comparative aspects in relation to other layout generation approaches. A discussion on the benefit-cost trade-off of using layout templates is also included. In addition to this analysis, the paper delves deeper into systematic techniques to develop fully reusable layout templates for analog circuits, either for a change of the circuit sizing (i.e., layout retargeting) or a change of the fabrication process (i.e., layout migration). Several examples implemented with the Cadence's Virtuoso tool suite are provided as demonstration of the paper's contributions.Ministerio de Educación y Ciencia TEC2004-0175

Anonymous subject identification and privacy information management in video surveillance

The widespread deployment of surveillance cameras has raised serious privacy concerns, and many privacy-enhancing schemes have been recently proposed to automatically redact images of selected individuals in the surveillance video for protection. Of equal importance are the privacy and efficiency of techniques to first, identify those individuals for privacy protection and second, provide access to original surveillance video contents for security analysis. In this paper, we propose an anonymous subject identification and privacy data management system to be used in privacy-aware video surveillance. The anonymous subject identification system uses iris patterns to identify individuals for privacy protection. Anonymity of the iris-matching process is guaranteed through the use of a garbled-circuit (GC)-based iris matching protocol. A novel GC complexity reduction scheme is proposed by simplifying the iris masking process in the protocol. A user-centric privacy information management system is also proposed that allows subjects to anonymously access their privacy information via their iris patterns. The system is composed of two encrypted-domain protocols: The privacy information encryption protocol encrypts the original video records using the iris pattern acquired during the subject identification phase; the privacy information retrieval protocol allows the video records to be anonymously retrieved through a GC-based iris pattern matching process. Experimental results on a public iris biometric database demonstrate the validity of our framework

Convolutional nets for reconstructing neural circuits from brain images acquired by serial section electron microscopy

Neural circuits can be reconstructed from brain images acquired by serial section electron microscopy. Image analysis has been performed by manual labor for half a century, and efforts at automation date back almost as far. Convolutional nets were first applied to neuronal boundary detection a dozen years ago, and have now achieved impressive accuracy on clean images. Robust handling of image defects is a major outstanding challenge. Convolutional nets are also being employed for other tasks in neural circuit reconstruction: finding synapses and identifying synaptic partners, extending or pruning neuronal reconstructions, and aligning serial section images to create a 3D image stack. Computational systems are being engineered to handle petavoxel images of cubic millimeter brain volumes

CMOS array design automation techniques

A low cost, quick turnaround technique for generating custom metal oxide semiconductor arrays using the standard cell approach was developed, implemented, tested and validated. Basic cell design topology and guidelines are defined based on an extensive analysis that includes circuit, layout, process, array topology and required performance considerations particularly high circuit speed

Expansion of CMOS array design techniques

The important features of the multiport (double entry) automatic placement and routing programs for standard cells are described. Measured performance and predicted performance were compared for seven CMOS/SOS array types and hybrids designed with the high speed CMOS/SOS cell family. The CMOS/SOS standard cell data sheets are listed and described

Printed Circuit Board (PCB) design process and fabrication

This module describes main characteristics of Printed Circuit Boards (PCBs). A brief history of PCBs is introduced in the first chapter. Then, the design processes and the fabrication of PCBs are addressed and finally a study case is presented in the last chapter of the module.Peer ReviewedPostprint (published version

A 10-Gb/s two-dimensional eye-opening monitor in 0.13-μm standard CMOS

An eye-opening monitor (EOM) architecture that can capture a two-dimensional (2-D) map of the eye diagram of a high-speed data signal has been developed. Two single-quadrant phase rotators and one digital-to-analog converter (DAC) are used to generate rectangular masks with variable sizes and aspect ratios. Each mask is overlapped with the received eye diagram and the number of signal transitions inside the mask is recorded as error. The combination of rectangular masks with the same error creates error contours that overall provide a 2-D map of the eye. The authors have implemented a prototype circuit in 0.13-μm standard CMOS technology that operates up to 12.5 Gb/s at 1.2-V supply. The EOM maps the input eye to a 2-D error diagram with up to 68-dB mask error dynamic range. The left and right halves of the eyes are monitored separately to capture horizontally asymmetric eyes. The chip consumes 330 mW and operates reliably with supply voltages as low as 1 V at 10 Gb/s. The authors also present a detailed analysis that verifies if the measurements are in good agreement with the expected results

Discrete input equipment design study

The study to improve the reliability of the LUT system by discrete input equipment (DIE) is reported. Subjects discussed include: specifications, packaging, aircraft integrated systems, and word formats DIE. It is recommended that maximal use of advanced technology be made, particularly the "know how' developed on the Saturn project

Optimizing Scrubbing by Netlist Analysis for FPGA Configuration Bit Classification and Floorplanning

Existing scrubbing techniques for SEU mitigation on FPGAs do not guarantee an error-free operation after SEU recovering if the affected configuration bits do belong to feedback loops of the implemented circuits. In this paper, we a) provide a netlist-based circuit analysis technique to distinguish so-called critical configuration bits from essential bits in order to identify configuration bits which will need also state-restoring actions after a recovered SEU and which not. Furthermore, b) an alternative classification approach using fault injection is developed in order to compare both classification techniques. Moreover, c) we will propose a floorplanning approach for reducing the effective number of scrubbed frames and d), experimental results will give evidence that our optimization methodology not only allows to detect errors earlier but also to minimize the Mean-Time-To-Repair (MTTR) of a circuit considerably. In particular, we show that by using our approach, the MTTR for datapath-intensive circuits can be reduced by up to 48.5% in comparison to standard approaches

A procedural method for the efficient implementation of full-custom VLSI designs

An imbedded language system for the layout of very large scale integration (VLSI) circuits is examined. It is shown that through the judicious use of this system, a large variety of circuits can be designed with circuit density and performance comparable to traditional full-custom design methods, but with design costs more comparable to semi-custom design methods. The high performance of this methodology is attributable to the flexibility of procedural descriptions of VLSI layouts and to a number of automatic and semi-automatic tools within the system