A design for testability study on a high performance automatic gain control circuit.

A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

MISSED: an environment for mixed-signal microsystem testing and diagnosis

A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debuggin

Fault simulation for structural testing of analogue integrated circuits

In this thesis the ANTICS analogue fault simulation software is described which provides a statistical approach to fault simulation for accurate analogue IC test evaluation. The traditional figure of fault coverage is replaced by the average probability of fault detection. This is later refined by considering the probability of fault occurrence to generate a more realistic, weighted test metric. Two techniques to reduce the fault simulation time are described, both of which show large reductions in simulation time with little loss of accuracy. The final section of the thesis presents an accurate comparison of three test techniques and an evaluation of dynamic supply current monitoring. An increase in fault detection for dynamic supply current monitoring is obtained by removing the DC component of the supply current prior to measurement

Compact Structural Test Generation for Analog Macros

A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test se

Fan-In analysis of a leaky integrator circuit using charge transfer synapses

It is shown that a simple leaky integrator (LI) circuit operating in a dynamic mode can allow spatial and temporal summation of weighted synaptic outputs. The circuit incorporates a current mirror configuration to sum charge packets released from charge transfer synapses and an n-channel MOSFET, operating in subthreshold, serves to implement a leakage capability, which sets the decay time for the postsynaptic response. The focus of the paper is to develop an analytical model for fan-in and validate the model against simulation and experimental results obtained from a prototype chip fabricated in the AMS 0.35 μm mixed signal CMOS technology. We show that the model predicts the theoretical limit on fan-in, relates the magnitude of the postsynaptic response to weighted synaptic inputs and captures the transient response of the LI when stimulated with spike inputs

Phase Locked Loop Test Methodology

Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

Testing a CMOS operational amplifier circuit using a combination of oscillation and IDDQ test methods

This work presents a case study, which attempts to improve the fault diagnosis and testability of the oscillation testing methodology applied to a typical two-stage CMOS operational amplifier. The proposed test method takes the advantage of good fault coverage through the use of a simple oscillation based test technique, which needs no test signal generation and combines it with quiescent supply current (IDDQ) testing to provide a fault confirmation. A built in current sensor (BICS), which introduces insignificant performance degradation of the circuit-under-test (CUT), has been utilized to monitor the power supply quiescent current changes in the CUT. The testability has also been enhanced in the testing procedure using a simple fault-injection technique. The approach is attractive for its simplicity, robustness and capability of built-in-self test (BIST) implementation. It can also be generalized to the oscillation based test structures of other CMOS analog and mixed-signal integrated circuits. The practical results and simulations confirm the functionality of the proposed test method

Modeling and simulation of magnetic components in electric circuits

This thesis demonstrates how by using a variety of model constructions and parameter extraction techniques, a range of magnetic component models can be developed for a wide range of application areas, with different levels of accuracy appropriate for the simulation required. Novel parameter extraction and model optimization methods are developed, including the innovative use of Genetic Algorithms and Metrics, to ensure the accuracy of the material models used. Multiple domain modeling, including the magnetic, thermal and magnetic aspects are applied in integrated simulations to ensure correct and complete dynamic behaviour under a range of environmental conditions. Improvements to the original Jiles-Atherton theory to more accurately model loop closure and dynamic thermal behaviour are proposed, developed and tested against measured results. Magnetic Component modeling techniques are reviewed and applied in practical examples to evaluate the effectiveness of lumped models, 1D and 2D Finite Element Analysis models and coupling Finite Element Analysis with Circuit Simulation. An original approach, linking SPICE with a Finite Element Analysis solver is presented and evaluated. Practical test cases illustrate the effectiveness of the models used in a variety of contexts. A Passive Fault Current Limiter (FCL) was investigated using a saturable inductor with a magnet offset, and the comparison between measured and simulated results allows accurate prediction of the behaviour of the device. A series of broadband hybrid transformers for ADSL were built, tested, modeled and simulated. Results show clearly how the Total Harmonic Distortion (THD), Inter Modulation Distortion (IMD) and Insertion Loss (IL) can be accurately predicted using simulation.A new implementation of ADSL transformers using a planar magnetic structure is presented, with results presented that compare favourably with current wire wound techniques. The inclusion of transformer models in complete ADSL hybrid simulations demonstrate the effectiveness of the models in the context of a complete electrical system in predicting the overall circuit performance