61,679 research outputs found

    Analysis and application of digital spectral warping in analog and mixed-signal testing

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    Spectral warping is a digital signal processing transform which shifts the frequencies contained within a signal along the frequency axis. The Fourier transform coefficients of a warped signal correspond to frequency-domain 'samples' of the original signal which are unevenly spaced along the frequency axis. This property allows the technique to be efficiently used for DSP-based analog and mixed-signal testing. The analysis and application of spectral warping for test signal generation, response analysis, filter design, frequency response evaluation, etc. are discussed in this paper along with examples of the software and hardware implementation

    Model-Based Calibration of Filter Imperfections in the Random Demodulator for Compressive Sensing

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    The random demodulator is a recent compressive sensing architecture providing efficient sub-Nyquist sampling of sparse band-limited signals. The compressive sensing paradigm requires an accurate model of the analog front-end to enable correct signal reconstruction in the digital domain. In practice, hardware devices such as filters deviate from their desired design behavior due to component variations. Existing reconstruction algorithms are sensitive to such deviations, which fall into the more general category of measurement matrix perturbations. This paper proposes a model-based technique that aims to calibrate filter model mismatches to facilitate improved signal reconstruction quality. The mismatch is considered to be an additive error in the discretized impulse response. We identify the error by sampling a known calibrating signal, enabling least-squares estimation of the impulse response error. The error estimate and the known system model are used to calibrate the measurement matrix. Numerical analysis demonstrates the effectiveness of the calibration method even for highly deviating low-pass filter responses. The proposed method performance is also compared to a state of the art method based on discrete Fourier transform trigonometric interpolation.Comment: 10 pages, 8 figures, submitted to IEEE Transactions on Signal Processin

    A VHDL-AMS Simulation Environment for an UWB Impulse Radio Transceiver

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    Ultra-Wide-Band (UWB) communication based on the impulse radio paradigm is becoming increasingly popular. According to the IEEE 802.15 WPAN Low Rate Alternative PHY Task Group 4a, UWB will play a major role in localization applications, due to the high time resolution of UWB signals which allow accurate indirect measurements of distance between transceivers. Key for the successful implementation of UWB transceivers is the level of integration that will be reached, for which a simulation environment that helps take appropriate design decisions is crucial. Owing to this motivation, in this paper we propose a multiresolution UWB simulation environment based on the VHDL-AMS hardware description language, along with a proper methodology which helps tackle the complexity of designing a mixed-signal UWB System-on-Chip. We applied the methodology and used the simulation environment for the specification and design of an UWB transceiver based on the energy detection principle. As a by-product, simulation results show the effectiveness of UWB in the so-called ranging application, that is the accurate evaluation of the distance between a couple of transceivers using the two-way-ranging metho

    A design for testability study on a high performance automatic gain control circuit.

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    A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

    Dispersive Fourier Transformation for Versatile Microwave Photonics Applications

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    Abstract: Dispersive Fourier transformation (DFT) maps the broadband spectrum of an ultrashort optical pulse into a time stretched waveform with its intensity profile mirroring the spectrum using chromatic dispersion. Owing to its capability of continuous pulse-by-pulse spectroscopic measurement and manipulation, DFT has become an emerging technique for ultrafast signal generation and processing, and high-throughput real-time measurements, where the speed of traditional optical instruments falls short. In this paper, the principle and implementation methods of DFT are first introduced and the recent development in employing DFT technique for widespread microwave photonics applications are presented, with emphasis on real-time spectroscopy, microwave arbitrary waveform generation, and microwave spectrum sensing. Finally, possible future research directions for DFT-based microwave photonics techniques are discussed as well

    Phase Locked Loop Test Methodology

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    Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

    Time-efficient fault detection and diagnosis system for analog circuits

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    Time-efficient fault analysis and diagnosis of analog circuits are the most important prerequisites to achieve online health monitoring of electronic equipments, which are involving continuing challenges of ultra-large-scale integration, component tolerance, limited test points but multiple faults. This work reports an FPGA (field programmable gate array)-based analog fault diagnostic system by applying two-dimensional information fusion, two-port network analysis and interval math theory. The proposed system has three advantages over traditional ones. First, it possesses high processing speed and smart circuit size as the embedded algorithms execute parallel on FPGA. Second, the hardware structure has a good compatibility with other diagnostic algorithms. Third, the equipped Ethernet interface enhances its flexibility for remote monitoring and controlling. The experimental results obtained from two realistic example circuits indicate that the proposed methodology had yielded competitive performance in both diagnosis accuracy and time-effectiveness, with about 96% accuracy while within 60 ms computational time.Peer reviewedFinal Published versio
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