15,062 research outputs found

    A low-speed BIST framework for high-performance circuit testing

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    Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to their limited high frequency capabilities. In this article we outline a design-for-test methodology such that high performance devices can be tested on relatively low performance testers. In addition, a BIST framework is discussed based on this methodology. Various implementation aspects of this technique are also addresse

    Testing microelectronic biofluidic systems

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    According to the 2005 International Technology Roadmap for Semiconductors, the integration of emerging nondigital CMOS technologies will require radically different test methods, posing a major challenge for designers and test engineers. One such technology is microelectronic fluidic (MEF) arrays, which have rapidly gained importance in many biological, pharmaceutical, and industrial applications. The advantages of these systems, such as operation speed, use of very small amounts of liquid, on-board droplet detection, signal conditioning, and vast digital signal processing, make them very promising. However, testable design of these devices in a mass-production environment is still in its infancy, hampering their low-cost introduction to the market. This article describes analog and digital MEF design and testing method

    Crack detection in a rotating shaft using artificial neural networks and PSD characterisation

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    A design for testability study on a high performance automatic gain control circuit.

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    A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

    Unattended network operations technology assessment study. Technical support for defining advanced satellite systems concepts

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    The results are summarized of an unattended network operations technology assessment study for the Space Exploration Initiative (SEI). The scope of the work included: (1) identified possible enhancements due to the proposed Mars communications network; (2) identified network operations on Mars; (3) performed a technology assessment of possible supporting technologies based on current and future approaches to network operations; and (4) developed a plan for the testing and development of these technologies. The most important results obtained are as follows: (1) addition of a third Mars Relay Satellite (MRS) and MRS cross link capabilities will enhance the network's fault tolerance capabilities through improved connectivity; (2) network functions can be divided into the six basic ISO network functional groups; (3) distributed artificial intelligence technologies will augment more traditional network management technologies to form the technological infrastructure of a virtually unattended network; and (4) a great effort is required to bring the current network technology levels for manned space communications up to the level needed for an automated fault tolerance Mars communications network

    Automatic programming methodologies for electronic hardware fault monitoring

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    This paper presents three variants of Genetic Programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling of electronic circuits can be best performed by the Stressor - susceptibility interaction model. A circuit or a system is considered to be failed once the stressor has exceeded the susceptibility limits. For on-line prediction, validated stressor vectors may be obtained by direct measurements or sensors, which after pre-processing and standardization are fed into the GP models. Empirical results are compared with artificial neural networks trained using backpropagation algorithm and classification and regression trees. The performance of the proposed method is evaluated by comparing the experiment results with the actual failure model values. The developed model reveals that GP could play an important role for future fault monitoring systems.This research was supported by the International Joint Research Grant of the IITA (Institute of Information Technology Assessment) foreign professor invitation program of the MIC (Ministry of Information and Communication), Korea
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