55 research outputs found

    Exploitation of Unintentional Information Leakage from Integrated Circuits

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    Unintentional electromagnetic emissions are used to recognize or verify the identity of a unique integrated circuit (IC) based on fabrication process-induced variations in a manner analogous to biometric human identification. The effectiveness of the technique is demonstrated through an extensive empirical study, with results presented indicating correct device identification success rates of greater than 99:5%, and average verification equal error rates (EERs) of less than 0:05% for 40 near-identical devices. The proposed approach is suitable for security applications involving commodity commercial ICs, with substantial cost and scalability advantages over existing approaches. A systematic leakage mapping methodology is also proposed to comprehensively assess the information leakage of arbitrary block cipher implementations, and to quantitatively bound an arbitrary implementation\u27s resistance to the general class of differential side channel analysis techniques. The framework is demonstrated using the well-known Hamming Weight and Hamming Distance leakage models, and approach\u27s effectiveness is demonstrated through the empirical assessment of two typical unprotected implementations of the Advanced Encryption Standard. The assessment results are empirically validated against correlation-based differential power and electromagnetic analysis attacks

    RGB interface emulation with Infineon Aurix MCU

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    openQuesta ricerca studia l’emulazione dell’interfaccia RGB digitale parallela utilizzando il microcontrollore AurixTM TC3xx di Infineon, in particolare la variante TC375. Nonostante le caratteristiche avanzate del microcontrollore, manca un supporto nativo per questa interfaccia. Questo studio cerca di risolvere questa limitazione utilizzando il General Timer Module (GTM) della famiglia Aurixtexttrademark, con particolare attenzione alle applicazioni automotive. Una panoramica di Infineon e del suo dipartimento MC di Padova fornisce le basi e spiega le motivazioni alla base della ricerca. Viene approfondita la conoscenza delle basi tecnologiche, evidenziando l’architettura System on Chip AurixTM TC37x, il GTM e l’interfaccia RGB digitale parallela. Hardware e strumenti chiave come la scheda di sviluppo TC375 Lite Kit di Aurix, l’analizzatore logico Saleae 16 Pro e l’oscilloscopio Tektronix serie 6 sono messi in evidenza per illustrare il loro ruolo centrale nel processo di ricerca. La metodologia di ricerca è dettagliata e comprende considerazioni sulla progettazione del sistema e tecniche di implementazione del firmware. L’obiettivo primario è emulare l’interfaccia RGB a una frequenza di aggiornamento di 100 Hz per immagini in scala di grigi a 8 bit. I risultati confermano la fattibilità dello sforzo di emulazione. I test funzionali verificano la corretta temporizzazione del sistema e l’integrità del segnale. Tuttavia, sono emersi alcuni vincoli, in particolare le limitazioni hardware, come le difficoltà di trasferimento dei dati al GTM a causa del System Peripheral Bus e la mancanza di flessibilità nella selezione del clock dell’interfaccia RGB. Nonostante queste difficoltà, i risultati confermanoil potenziale dell’emulazione con il microcontrollore AurixTM TC375. Lo studio si conclude evidenziando le implicazioni e proponendo strade per la ricerca futura, suggerendo il passaggio alla serie TC39x e l’esplorazione del supporto di immagini RGB a colori. La sintesi di questa ricerca evidenzia la sua rilevanza per l’emulazione avanzata di interfacce basate su microcontrollori, in particolare nel settore automobilistico.This research investigates the emulation of the Digital Parallel RGB Interface using the InfineonAurixTMTC3xx microcontroller, specifically the TC375 variant. Despite the advanced features of the microcontroller, there is an inherent lack of native support for this interface. This study attempts to address this limitation by using the General Timer Module (GTM) inherent to the AurixTMfamily, with a primary focus on automotive applications. An overview of Infineon and its MC department in Padua provides the basis and explains the motivation behind the research. A deeper understanding of the technological basis is established, highlighting the AurixTM TC37x System on Chip Architecture, the GTM and the Digital Parallel RGB Interface. Key hardware and tools such as the AurixTM TC375 Lite Kit Development Board, the Saleae 16 Pro Logic Analyzer, and the Tektronix 6 Series Oscilloscope are highlighted to illustrate their central role in the research process. The research methodology is detailed and includes system design considerations and firmware implementation techniques. The primary objective is to emulate the RGB interface at a refresh rate of 100 Hz for 8-bit grayscale images. The results confirmthe feasibility of the emulation effort. Functional tests verify correct system timing and signal integrity. However, certain constraints are revealed, particularly hardware limitations such as the challenges of transferring data to the GTM due to the System Peripheral Bus and the lack of flexibility in selecting the RGB interface clock. Despite these challenges, the results confirmthe potential of emulation using the AurixTM TC375 microcontroller. The study concludes by highlighting the implications and offering avenues for future research, suggesting transitions to the TC39x series and the exploration of full-color RGB image support. The summary of this research highlights its relevance to advanced microcontrollerbased interface emulation, particularly in the automotive domain

    Langaton ohjausyksikkö integroidulle CMOS lähetin-vastaanotinparille

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    Tiivistelmä. Tässä kandidaatintyössä suunniteltiin Nordic Semiconductorin nRF5340 mikrokontrolleriin perustuva Bluetooth ohjausyksikkö. Työssä käytettiin Cadencen Allegro-ohjelmasarjaa piirin suunnitteluun. Levylle sijoitettiin Raytac MDBT53-P1M moduuli, jossa on nRF5340 mikropiirin lisäksi valmis antenni langatonta tiedonsiirtoa varten. Lisäksi levylle suunniteltiin paristolla toimiva jännitteenohjaus. Työ on osa tutkimusta integroidusta lähetin-vastaanotinparista optiseen biosignaalin havainnointiin, jonka ohjausyksikkönä sekä jänniteohjaimena suunniteltu piiri toimii

    Fault attacks on RSA and elliptic curve cryptosystems

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    This thesis answered how a fault attack targeting software used to program EEPROM can threaten hardware devices, for instance IoT devices. The successful fault attacks proposed in this thesis will certainly warn designers of hardware devices of the security risks their devices may face on the programming leve

    Dynamic Laser Fault Injection Aided by Quiescent Photon Emissions in Embedded Microcontrollers: Apparatus, Methodology and Attacks

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    Internet of Things (IoT) is becoming more integrated in our daily life with the increasing number of embedded electronic devices interacting together. These electronic devices are often controlled by a Micro-Controller Unit (MCU). As an example, it is estimated that today’s well-equipped automobile uses more than 50 MCUs. Some MCUs contain cryptographic co-processors to enhance the security of the exchanged and stored data with a common belief that the data is secured and safe. However many MCUs have been shown to be vulnerable to Fault Injection (FI) attacks. These attacks can reveal shared secrets, firmware, and other confidential information. In addition, this extracted information obtained by attacks can lead to identification of new vulnerabilities which may scale to attacks on many devices. In general, FI on MCUs corrupt data or corrupt instructions. Although it is assumed that only authorized personnel with access to cryptographic secrets will gain access to confidential information in MCUs, attackers in specialized labs nowadays may have access to high-tech equipment which could be used to attack these MCUs. Laser Fault Injection (LFI) is gaining more of a reputation for its ability to inject local faults rather than global ones due to its precision, thus providing a greater risk of breaking security in many devices. Although publications have generally discussed the topic of security of MCUs, attack techniques are diverse and published LFI provides few and superficial details about the used experimental setup and methodology. Furthermore, limited research has examined the combination of both LFI and Photo-Emission Microscopy (PEM), direct modification of instructions using the LFI, control of embedded processor resets using LFI, and countermeasures which simultaneously thwart other aspects including decapsulation and reverse engineering (RE). This thesis contributes to the study of the MCUs’ security by analyzing their susceptibility to LFI attacks and PEM. The proposed research aims to build a LFI bench from scratch allowing maximum control of laser parameters. In addition, a methodology for analysis of the Device Under Attack (DUA) in preparation for LFI is proposed, including frontside/backside decapsulation methods, and visualization of the structure of the DUA. Analysis of attack viability of different targets on the DUA, including One-Time Programmable (OTP) memory, Flash memory and Static Random Access Memory (SRAM) was performed. A realistic attack of a cryptographic algorithm, such as Advanced Encryption Standard (AES) using LFI was conducted. On the other hand, countermeasures to the proposed attack techniques, including decapsulation/RE, LFI and PEM, were discussed. This dissertation provides a summary for the necessary background and experimental setup to study the possibility of LFI and PEM in different DUAs of two different technologies, specifically PIC16F687 and ARM Cortex-M0 LPC1114FN28102. Attacks performed on on-chip peripherals such as Universal Asynchronous Receiver/Transmitter (UART) and debug circuity reveal new vulnerabilities. This research is important for understanding attacks in order to design countermeasures for securing future hardware

    New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs

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    Tesis por compendio[EN] Relevance of electronics towards safety of common devices has only been growing, as an ever growing stake of the functionality is assigned to them. But of course, this comes along the constant need for higher performances to fulfill such functionality requirements, while keeping power and budget low. In this scenario, industry is struggling to provide a technology which meets all the performance, power and price specifications, at the cost of an increased vulnerability to several types of known faults or the appearance of new ones. To provide a solution for the new and growing faults in the systems, designers have been using traditional techniques from safety-critical applications, which offer in general suboptimal results. In fact, modern embedded architectures offer the possibility of optimizing the dependability properties by enabling the interaction of hardware, firmware and software levels in the process. However, that point is not yet successfully achieved. Advances in every level towards that direction are much needed if flexible, robust, resilient and cost effective fault tolerance is desired. The work presented here focuses on the hardware level, with the background consideration of a potential integration into a holistic approach. The efforts in this thesis have focused several issues: (i) to introduce additional fault models as required for adequate representativity of physical effects blooming in modern manufacturing technologies, (ii) to provide tools and methods to efficiently inject both the proposed models and classical ones, (iii) to analyze the optimum method for assessing the robustness of the systems by using extensive fault injection and later correlation with higher level layers in an effort to cut development time and cost, (iv) to provide new detection methodologies to cope with challenges modeled by proposed fault models, (v) to propose mitigation strategies focused towards tackling such new threat scenarios and (vi) to devise an automated methodology for the deployment of many fault tolerance mechanisms in a systematic robust way. The outcomes of the thesis constitute a suite of tools and methods to help the designer of critical systems in his task to develop robust, validated, and on-time designs tailored to his application.[ES] La relevancia que la electrónica adquiere en la seguridad de los productos ha crecido inexorablemente, puesto que cada vez ésta copa una mayor influencia en la funcionalidad de los mismos. Pero, por supuesto, este hecho viene acompañado de una necesidad constante de mayores prestaciones para cumplir con los requerimientos funcionales, al tiempo que se mantienen los costes y el consumo en unos niveles reducidos. En este escenario, la industria está realizando esfuerzos para proveer una tecnología que cumpla con todas las especificaciones de potencia, consumo y precio, a costa de un incremento en la vulnerabilidad a múltiples tipos de fallos conocidos o la introducción de nuevos. Para ofrecer una solución a los fallos nuevos y crecientes en los sistemas, los diseñadores han recurrido a técnicas tradicionalmente asociadas a sistemas críticos para la seguridad, que ofrecen en general resultados sub-óptimos. De hecho, las arquitecturas empotradas modernas ofrecen la posibilidad de optimizar las propiedades de confiabilidad al habilitar la interacción de los niveles de hardware, firmware y software en el proceso. No obstante, ese punto no está resulto todavía. Se necesitan avances en todos los niveles en la mencionada dirección para poder alcanzar los objetivos de una tolerancia a fallos flexible, robusta, resiliente y a bajo coste. El trabajo presentado aquí se centra en el nivel de hardware, con la consideración de fondo de una potencial integración en una estrategia holística. Los esfuerzos de esta tesis se han centrado en los siguientes aspectos: (i) la introducción de modelos de fallo adicionales requeridos para la representación adecuada de efectos físicos surgentes en las tecnologías de manufactura actuales, (ii) la provisión de herramientas y métodos para la inyección eficiente de los modelos propuestos y de los clásicos, (iii) el análisis del método óptimo para estudiar la robustez de sistemas mediante el uso de inyección de fallos extensiva, y la posterior correlación con capas de más alto nivel en un esfuerzo por recortar el tiempo y coste de desarrollo, (iv) la provisión de nuevos métodos de detección para cubrir los retos planteados por los modelos de fallo propuestos, (v) la propuesta de estrategias de mitigación enfocadas hacia el tratamiento de dichos escenarios de amenaza y (vi) la introducción de una metodología automatizada de despliegue de diversos mecanismos de tolerancia a fallos de forma robusta y sistemática. Los resultados de la presente tesis constituyen un conjunto de herramientas y métodos para ayudar al diseñador de sistemas críticos en su tarea de desarrollo de diseños robustos, validados y en tiempo adaptados a su aplicación.[CA] La rellevància que l'electrònica adquireix en la seguretat dels productes ha crescut inexorablement, puix cada volta més aquesta abasta una major influència en la funcionalitat dels mateixos. Però, per descomptat, aquest fet ve acompanyat d'un constant necessitat de majors prestacions per acomplir els requeriments funcionals, mentre es mantenen els costos i consums en uns nivells reduïts. Donat aquest escenari, la indústria està fent esforços per proveir una tecnologia que complisca amb totes les especificacions de potència, consum i preu, tot a costa d'un increment en la vulnerabilitat a diversos tipus de fallades conegudes, i a la introducció de nous tipus. Per oferir una solució a les noves i creixents fallades als sistemes, els dissenyadors han recorregut a tècniques tradicionalment associades a sistemes crítics per a la seguretat, que en general oferixen resultats sub-òptims. De fet, les arquitectures empotrades modernes oferixen la possibilitat d'optimitzar les propietats de confiabilitat en habilitar la interacció dels nivells de hardware, firmware i software en el procés. Tot i això eixe punt no està resolt encara. Es necessiten avanços a tots els nivells en l'esmentada direcció per poder assolir els objectius d'una tolerància a fallades flexible, robusta, resilient i a baix cost. El treball ací presentat se centra en el nivell de hardware, amb la consideració de fons d'una potencial integració en una estratègia holística. Els esforços d'esta tesi s'han centrat en els següents aspectes: (i) la introducció de models de fallada addicionals requerits per a la representació adequada d'efectes físics que apareixen en les tecnologies de fabricació actuals, (ii) la provisió de ferramentes i mètodes per a la injecció eficient del models proposats i dels clàssics, (iii) l'anàlisi del mètode òptim per estudiar la robustesa de sistemes mitjançant l'ús d'injecció de fallades extensiva, i la posterior correlació amb capes de més alt nivell en un esforç per retallar el temps i cost de desenvolupament, (iv) la provisió de nous mètodes de detecció per cobrir els reptes plantejats pels models de fallades proposats, (v) la proposta d'estratègies de mitigació enfocades cap al tractament dels esmentats escenaris d'amenaça i (vi) la introducció d'una metodologia automatitzada de desplegament de diversos mecanismes de tolerància a fallades de forma robusta i sistemàtica. Els resultats de la present tesi constitueixen un conjunt de ferramentes i mètodes per ajudar el dissenyador de sistemes crítics en la seua tasca de desenvolupament de dissenys robustos, validats i a temps adaptats a la seua aplicació.Espinosa García, J. (2016). New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/73146TESISCompendi

    Performance and area evaluations of processor-based benchmarks on FPGA devices

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    The computing system on SoCs is being long-term research since the FPGA technology has emerged due to its personality of re-programmable fabric, reconfigurable computing, and fast development time to market. During the last decade, uni-processor in a SoC is no longer to deal with the high growing market for complex applications such as Mobile Phones audio and video encoding, image and network processing. Due to the number of transistors on a silicon wafer is increasing, the recent FPGAs or embedded systems are advancing toward multi-processor-based design to meet tremendous performance and benefit this kind of systems are possible. Therefore, is an upcoming age of the MPSoC. In addition, most of the embedded processors are soft-cores, because they are flexible and reconfigurable for specific software functions and easy to build homogenous multi-processor systems for parallel programming. Moreover, behavioural synthesis tools are becoming a lot more powerful and enable to create datapath of logic units from high-level algorithms such as C to HDL and available for partitioning a HW/SW concurrent methodology. A range of embedded processors is able to implement on a FPGA-based prototyping to integrate the CPUs on a programmable device. This research is, firstly represent different types of computer architectures in modern embedded processors that are followed in different type of software applications (eg. Multi-threading Operations or Complex Functions) on FPGA-based SoCs; and secondly investigate their capability by executing a wide-range of multimedia software codes (Integer-algometric only) in different models of the processor-systems (uni-processor or multi-processor or Co-design), and finally compare those results in terms of the benchmarks and resource utilizations within FPGAs. All the examined programs were written in standard C and executed in a variety numbers of soft-core processors or hardware units to obtain the execution times. However, the number of processors and their customizable configuration or hardware datapath being generated are limited by a target FPGA resource, and designers need to understand the FPGA-based tradeoffs that have been considered - Speed versus Area. For this experimental purpose, I defined benchmarks into DLP / HLS catalogues, which are "data" and "function" intensive respectively. The programs of DLP will be executed in LEON3 MP and LE1 CMP multi-processor systems and the programs of HLS in the LegUp Co-design system on target FPGAs. In preliminary, the performance of the soft-core processors will be examined by executing all the benchmarks. The whole story of this thesis work centres on the issue of the execute times or the speed-up and area breakdown on FPGA devices in terms of different programs
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