530 research outputs found

    Synthesis for circuit reliability

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    textElectrical and Computer Engineerin

    Delay Measurements and Self Characterisation on FPGAs

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    This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure rate and transition probability is proposed for accurate, precise and efficient measurement of propagation delays. The transition probability based method is especially attractive, since it requires no modifications in the circuit-under-test and requires little hardware resources, making it an ideal method for physical delay analysis of FPGA circuits. The relentless advancements in process technology has led to smaller and denser transistors in integrated circuits. While FPGA users benefit from this in terms of increased hardware resources for more complex designs, the actual productivity with FPGA in terms of timing performance (operating frequency, latency and throughput) has lagged behind the potential improvements from the improved technology due to delay variability in FPGA components and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA designs. The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability problem in FPGAs

    Test Cost Reduction for Logic Circuits——Reduction of Test Data Volume and Test Application Time——

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    論理回路の大規模化とともに,テストコストの増大が深刻な問題となっている.特に大規模な論理回路では,テストデータ量やテスト実行時間の削減が,テストコスト削減の重要な課題である.本論文では,高い故障検出率のテストパターンをできるだけ少ないテストベクトル数で実現するためのテストコンパクション技術,付加ハードウェアによるテストデータの展開・伸長を前提に圧縮を行うテストコンプレッション技術,及び,スキャン設計回路におけるテスト実行時間削減技術について概説する

    Proceedings of the First PhD Symposium on Sustainable Ultrascale Computing Systems (NESUS PhD 2016)

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    Proceedings of the First PhD Symposium on Sustainable Ultrascale Computing Systems (NESUS PhD 2016) Timisoara, Romania. February 8-11, 2016.The PhD Symposium was a very good opportunity for the young researchers to share information and knowledge, to present their current research, and to discuss topics with other students in order to look for synergies and common research topics. The idea was very successful and the assessment made by the PhD Student was very good. It also helped to achieve one of the major goals of the NESUS Action: to establish an open European research network targeting sustainable solutions for ultrascale computing aiming at cross fertilization among HPC, large scale distributed systems, and big data management, training, contributing to glue disparate researchers working across different areas and provide a meeting ground for researchers in these separate areas to exchange ideas, to identify synergies, and to pursue common activities in research topics such as sustainable software solutions (applications and system software stack), data management, energy efficiency, and resilience.European Cooperation in Science and Technology. COS

    A Hardware Security Solution against Scan-Based Attacks

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    Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

    Improvement of hardware reliability with aging monitors

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    Proceedings of the NSSDC Conference on Mass Storage Systems and Technologies for Space and Earth Science Applications

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    The proceedings of the National Space Science Data Center Conference on Mass Storage Systems and Technologies for Space and Earth Science Applications held July 23 through 25, 1991 at the NASA/Goddard Space Flight Center are presented. The program includes a keynote address, invited technical papers, and selected technical presentations to provide a broad forum for the discussion of a number of important issues in the field of mass storage systems. Topics include magnetic disk and tape technologies, optical disk and tape, software storage and file management systems, and experiences with the use of a large, distributed storage system. The technical presentations describe integrated mass storage systems that are expected to be available commercially. Also included is a series of presentations from Federal Government organizations and research institutions covering their mass storage requirements for the 1990's

    Use It or Lose It: Proactive, Deterministic Longevity in Future Chip Multiprocessors

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    Ever since the VLSI process technology crossed the sub-micron threshold, there is an increased interest in design of fault-tolerant systems to mitigate the wearout of transistors. Hot Carrier Injection (HCI) and Negative Bias Temperature Instability (NBTI) are two prominent usage based transistor degradation mechanisms in the deep sub-micron process technologies. This wearout of transistors can lead to timing violations along the critical paths which will eventually lead to permanent failures of the chip. While there have been many studies which concentrate on decreasing the wearout in a single core, the failure of an individual core need not be catastrophic in the context of Chip Multi-Processors (CMPs). However, a failure in the interconnect in these CMPs can lead to the failure of entire chip as it could lead to protocol-level deadlocks, or even partition away vital components such as the memory controller or other critical I/O. Analysis of HCI and NBTI stresses caused by real workloads on interconnect microachitecture shows that wearout in the CMP on-chip interconnect is correlated with lack of load observed in the network-on-chip routers. It is proven that exercising the wearout-sensitive components of routers under low load with random inputs can decelerate the NBTI wearout. In this work, we propose a novel deterministic approach for the generation of appropriate exercise mode data to maximize the life-time improvement, ensuring design parameter targets are met. The results from this new proposed design yields ~2300x decrease in the rate of CMP wear due to NBTI compared to that of ~28x decrease shown by previous work

    KAVUAKA: a low-power application-specific processor architecture for digital hearing aids

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    The power consumption of digital hearing aids is very restricted due to their small physical size and the available hardware resources for signal processing are limited. However, there is a demand for more processing performance to make future hearing aids more useful and smarter. Future hearing aids should be able to detect, localize, and recognize target speakers in complex acoustic environments to further improve the speech intelligibility of the individual hearing aid user. Computationally intensive algorithms are required for this task. To maintain acceptable battery life, the hearing aid processing architecture must be highly optimized for extremely low-power consumption and high processing performance.The integration of application-specific instruction-set processors (ASIPs) into hearing aids enables a wide range of architectural customizations to meet the stringent power consumption and performance requirements. In this thesis, the application-specific hearing aid processor KAVUAKA is presented, which is customized and optimized with state-of-the-art hearing aid algorithms such as speaker localization, noise reduction, beamforming algorithms, and speech recognition. Specialized and application-specific instructions are designed and added to the baseline instruction set architecture (ISA). Among the major contributions are a multiply-accumulate (MAC) unit for real- and complex-valued numbers, architectures for power reduction during register accesses, co-processors and a low-latency audio interface. With the proposed MAC architecture, the KAVUAKA processor requires 16 % less cycles for the computation of a 128-point fast Fourier transform (FFT) compared to related programmable digital signal processors. The power consumption during register file accesses is decreased by 6 %to 17 % with isolation and by-pass techniques. The hardware-induced audio latency is 34 %lower compared to related audio interfaces for frame size of 64 samples.The final hearing aid system-on-chip (SoC) with four KAVUAKA processor cores and ten co-processors is integrated as an application-specific integrated circuit (ASIC) using a 40 nm low-power technology. The die size is 3.6 mm2. Each of the processors and co-processors contains individual customizations and hardware features with a varying datapath width between 24-bit to 64-bit. The core area of the 64-bit processor configuration is 0.134 mm2. The processors are organized in two clusters that share memory, an audio interface, co-processors and serial interfaces. The average power consumption at a clock speed of 10 MHz is 2.4 mW for SoC and 0.6 mW for the 64-bit processor.Case studies with four reference hearing aid algorithms are used to present and evaluate the proposed hardware architectures and optimizations. The program code for each processor and co-processor is generated and optimized with evolutionary algorithms for operation merging,instruction scheduling and register allocation. The KAVUAKA processor architecture is com-pared to related processor architectures in terms of processing performance, average power consumption, and silicon area requirements
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