Single-Event Upset Analysis and Protection in High Speed Circuits

The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of a flip-flop. On the other hand, increasing pipeline depth and using low power techniques such as multi-level power supply, and multi-threshold transistor convert almost all paths in a circuit to critical ones. Thus, studying the behavior of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behavior of a circuit with massive critical paths in the presence of an SET. We also propose a novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a single event upset (SEU) caused by particle strike on the internal nodes of a flip-flo

Design Solutions For Modular Satellite Architectures

The cost-effective access to space envisaged by ESA would open a wide range of new opportunities and markets, but is still many years ahead. There is still a lack of devices, circuits, systems which make possible to develop satellites, ground stations and related services at costs compatible with the budget of academic institutions and small and medium enterprises (SMEs). As soon as the development time and cost of small satellites will fall below a certain threshold (e.g. 100,000 to 500,000 €), appropriate business models will likely develop to ensure a cost-effective and pervasive access to space, and related infrastructures and services. These considerations spurred the activity described in this paper, which is aimed at: - proving the feasibility of low-cost satellites using COTS (Commercial Off The Shelf) devices. This is a new trend in the space industry, which is not yet fully exploited due to the belief that COTS devices are not reliable enough for this kind of applications; - developing a flight model of a flexible and reliable nano-satellite with less than 25,000€; - training students in the field of avionics space systems: the design here described is developed by a team including undergraduate students working towards their graduation work. The educational aspects include the development of specific new university courses; - developing expertise in the field of low-cost avionic systems, both internally (university staff) and externally (graduated students will bring their expertise in their future work activity); - gather and cluster expertise and resources available inside the university around a common high-tech project; - creating a working group composed of both University and SMEs devoted to the application of commercially available technology to space environment. The first step in this direction was the development of a small low cost nano-satellite, started in the year 2004: the name of this project was PiCPoT (Piccolo Cubo del Politecnico di Torino, Small Cube of Politecnico di Torino). The project was carried out by some departments of the Politecnico, in particular Electronics and Aerospace. The main goal of the project was to evaluate the feasibility of using COTS components in a space project in order to greatly reduce costs; the design exploited internal subsystems modularity to allow reuse and further cost reduction for future missions. Starting from the PiCPoT experience, in 2006 we began a new project called ARaMiS (Speretta et al., 2007) which is the Italian acronym for Modular Architecture for Satellites. This work describes how the architecture of the ARaMiS satellite has been obtained from the lesson learned from our former experience. Moreover we describe satellite operations, giving some details of the major subsystems. This work is composed of two parts. The first one describes the design methodology, solutions and techniques that we used to develop the PiCPoT satellite; it gives an overview of its operations, with some details of the major subsystems. Details on the specifications can also be found in (Del Corso et al., 2007; Passerone et al, 2008). The second part, indeed exploits the experience achieved during the PiCPoT development and describes a proposal for a low-cost modular architecture for satellite

High-Performance Robust Latches

First, a new high-performance robust latch (referred to as HiPeR latch) is presented that is insensitive to transient faults affecting its internal and output nodes by design, independently of the size of its transistors. Then, a modified version of the HiPeR latch (referred as HiPeR-CG) is proposed that is suitable to be used together with clock gating. Both proposed latches are faster than the latches most recently presented in the literature, while providing better or comparable robustness to transient faults, at comparable or lower costs in terms of area and power, respectively. Therefore, thanks to the good trade-offs in terms of performance, robustness, and cost, our proposed latches are particularly suitable to be adopted on critical paths

Advanced information processing system: Local system services

The Advanced Information Processing System (AIPS) is a multi-computer architecture composed of hardware and software building blocks that can be configured to meet a broad range of application requirements. The hardware building blocks are fault-tolerant, general-purpose computers, fault-and damage-tolerant networks (both computer and input/output), and interfaces between the networks and the computers. The software building blocks are the major software functions: local system services, input/output, system services, inter-computer system services, and the system manager. The foundation of the local system services is an operating system with the functions required for a traditional real-time multi-tasking computer, such as task scheduling, inter-task communication, memory management, interrupt handling, and time maintenance. Resting on this foundation are the redundancy management functions necessary in a redundant computer and the status reporting functions required for an operator interface. The functional requirements, functional design and detailed specifications for all the local system services are documented

Design and Evaluation of Radiation-Hardened Standard Cell Flip-Flops

Use of a standard non-rad-hard digital cell library in the rad-hard design can be a cost-effective solution for space applications. In this paper we demonstrate how a standard non-rad-hard flip-flop, as one of the most vulnerable digital cells, can be converted into a rad-hard flip-flop without modifying its internal structure. We present five variants of a Triple Modular Redundancy (TMR) flip-flop: baseline TMR flip-flop, latch-based TMR flip-flop, True-Single Phase Clock (TSPC) TMR flip-flop, scannable TMR flip-flop and self-correcting TMR flip-flop. For all variants, the multi-bit upsets have been addressed by applying special placement constraints, while the Single Event Transient (SET) mitigation was achieved through the usage of customized SET filters and selection of optimal inverter sizes for the clock and reset trees. The proposed flip-flop variants feature differing performance, thus enabling to choose the optimal solution for every sensitive node in the circuit, according to the predefined design constraints. Several flip-flop designs have been validated on IHP’s 130nm BiCMOS process, by irradiation of custom-designed shift registers. It has been shown that the proposed TMR flip-flops are robust to soft errors with a threshold Linear Energy Transfer (LET) from ( 32.4 (MeV⋅cm2/mg) ) to ( 62.5 (MeV⋅cm2/mg) ), depending on the variant

STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS

Microelectronic devices and systems have been extensively utilized in a variety of radiation environments, ranging from the low-earth orbit to the ground level. A high-energy particle from such an environment may cause voltage/current transients, thereby inducing Single Event Effect (SEE) errors in an Integrated Circuit (IC). Ever since the first SEE error was reported in 1975, this community has made tremendous progress in investigating the mechanisms of SEE and exploring radiation tolerant techniques. However, as the IC technology advances, the existing hardening techniques have been rendered less effective because of the reduced spacing and charge sharing between devices. The Semiconductor Industry Association (SIA) roadmap has identified radiation-induced soft errors as the major threat to the reliable operation of electronic systems in the future. In digital systems, hardening techniques of their core components, such as latches, logic, and clock network, need to be addressed. Two single event tolerant latch designs taking advantage of feedback transistors are presented and evaluated in both single event resilience and overhead. These feedback transistors are turned OFF in the hold mode, thereby yielding a very large resistance. This, in turn, results in a larger feedback delay and higher single event tolerance. On the other hand, these extra transistors are turned ON when the cell is in the write mode. As a result, no significant write delay is introduced. Both designs demonstrate higher upset threshold and lower cross-section when compared to the reference cells. Dynamic logic circuits have intrinsic single event issues in each stage of the operations. The worst case occurs when the output is evaluated logic high, where the pull-up networks are turned OFF. In this case, the circuit fails to recover the output by pulling the output up to the supply rail. A capacitor added to the feedback path increases the node capacitance of the output and the feedback delay, thereby increasing the single event critical charge. Another differential structure that has two differential inputs and outputs eliminates single event upset issues at the expense of an increased number of transistors. Clock networks in advanced technology nodes may cause significant errors in an IC as the devices are more sensitive to single event strikes. Clock mesh is a widely used clocking scheme in a digital system. It was fabricated in a 28nm technology and evaluated through the use of heavy ions and laser irradiation experiments. Superior resistance to radiation strikes was demonstrated during these tests. In addition to mitigating single event issues by using hardened designs, built-in current sensors can be used to detect single event induced currents in the n-well and, if implemented, subsequently execute fault correction actions. These sensors were simulated and fabricated in a 28nm CMOS process. Simulation, as well as, experimental results, substantiates the validity of this sensor design. This manifests itself as an alternative to existing hardening techniques. In conclusion, this work investigates single event effects in digital systems, especially those in deep-submicron or advanced technology nodes. New hardened latch, dynamic logic, clock, and current sensor designs have been presented and evaluated. Through the use of these designs, the single event tolerance of a digital system can be achieved at the expense of varying overhead in terms of area, power, and delay

Design of Asynchronous Circuits for High Soft Error Tolerance in Deep Submicron CMOS Circuits

As the devices are scaling down, the combinational logic will become susceptible to soft errors. The conventional soft error tolerant methods for soft errors on combinational logic do not provide enough high soft error tolerant capability with reasonably small performance penalty. This paper investigates the feasibility of designing quasi-delay insensitive (QDI) asynchronous circuits for high soft error tolerance. We analyze the behavior of null convention logic (NCL) circuits in the presence of particle strikes, and propose an asynchronous pipeline for soft-error correction and a novel technique to improve the robustness of threshold gates, which are basic components in NCL, against particle strikes by using Schmitt trigger circuit and resizing the feedback transistor. Experimental results show that the proposed threshold gates do not generate soft errors under the strike of a particle within a certain energy range if a proper transistor size is applied. The penalties, such as delay and power consumption, are also presented